Electron microscope
Latest MicroLinks Technology Corp. Patents:
Description
The broken lines illustrate portions of the electron microscope that form no part of the claimed design.
Claims
The ornamental design for an electron microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
3582181 | June 1971 | Manau de Chveca |
D275575 | September 18, 1984 | Henderson |
4729635 | March 8, 1988 | Saferstein et al. |
D331934 | December 22, 1992 | Tak |
5267087 | November 30, 1993 | Weidemann |
D349295 | August 2, 1994 | Weidemann |
D361078 | August 8, 1995 | Atamian |
D366200 | January 16, 1996 | Di Vittorio |
5644425 | July 1, 1997 | Palmer |
D418853 | January 11, 2000 | Kubota |
D523883 | June 27, 2006 | Distasio et al. |
D532026 | November 14, 2006 | Sosniak et al. |
D537459 | February 27, 2007 | Yip et al. |
D537965 | March 6, 2007 | Lee |
D539317 | March 27, 2007 | Tonhofer |
7221402 | May 22, 2007 | Cheng |
7336884 | February 26, 2008 | Zhou et al. |
D564553 | March 18, 2008 | Yip et al. |
D564554 | March 18, 2008 | Shih et al. |
D571386 | June 17, 2008 | Lipsiner et al. |
D637218 | May 3, 2011 | Shih et al. |
D655325 | March 6, 2012 | Nojima et al. |
D655326 | March 6, 2012 | Nojima et al. |
Patent History
Patent number: D663337
Type: Grant
Filed: May 17, 2011
Date of Patent: Jul 10, 2012
Assignee: MicroLinks Technology Corp. (Kaohsiung)
Inventors: Yi-Chia Chan (Kaohsiung), Yu-Jen Chen (Kaohsiung), Po-Song Li (Kaohsiung), Jiun-Ching Ruan (Kaohsiung)
Primary Examiner: Paula Greene
Attorney: Muncy, Geissler, Olds & Lowe, PLLC
Application Number: 29/392,067
Type: Grant
Filed: May 17, 2011
Date of Patent: Jul 10, 2012
Assignee: MicroLinks Technology Corp. (Kaohsiung)
Inventors: Yi-Chia Chan (Kaohsiung), Yu-Jen Chen (Kaohsiung), Po-Song Li (Kaohsiung), Jiun-Ching Ruan (Kaohsiung)
Primary Examiner: Paula Greene
Attorney: Muncy, Geissler, Olds & Lowe, PLLC
Application Number: 29/392,067
Classifications
Current U.S. Class:
Microscope (D16/131)