Electron microscope

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Description

FIG. 1 is a perspective view of the electron microscope showing our new design;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top elevation view thereof; and,

FIG. 7 is a bottom perspective view.

The broken lines illustrate portions of the electron microscope that form no part of the claimed design.

Claims

The ornamental design for an electron microscope, as shown and described.

Referenced Cited
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Patent History
Patent number: D663337
Type: Grant
Filed: May 17, 2011
Date of Patent: Jul 10, 2012
Assignee: MicroLinks Technology Corp. (Kaohsiung)
Inventors: Yi-Chia Chan (Kaohsiung), Yu-Jen Chen (Kaohsiung), Po-Song Li (Kaohsiung), Jiun-Ching Ruan (Kaohsiung)
Primary Examiner: Paula Greene
Attorney: Muncy, Geissler, Olds & Lowe, PLLC
Application Number: 29/392,067
Classifications
Current U.S. Class: Microscope (D16/131)