Sample holder for an electron microscope
Latest Hitachi High-Technologies Corporation Patents:
Description
Claims
The ornamental design for a sample holder for an electron microscope, as shown and described.
Referenced Cited
Patent History
Patent number: D684274
Type: Grant
Filed: Jan 19, 2012
Date of Patent: Jun 11, 2013
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kotaro Hosoya (Hitachinaka), Yoshihiro Takahoko (Hitachinaka)
Primary Examiner: Anhdao Doan
Application Number: 29/411,276
Type: Grant
Filed: Jan 19, 2012
Date of Patent: Jun 11, 2013
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kotaro Hosoya (Hitachinaka), Yoshihiro Takahoko (Hitachinaka)
Primary Examiner: Anhdao Doan
Application Number: 29/411,276
Classifications
Current U.S. Class:
Vessel, Specimen Holder Or Reagent Material (65) (D24/224)