Sample holder for an electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of a sample holder for an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Claims

The ornamental design for a sample holder for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D249708 September 26, 1978 Smith et al.
D290042 May 26, 1987 Ford
4981345 January 1, 1991 Berry et al.
D333187 February 9, 1993 Omi
D431300 September 26, 2000 Fisch
D628709 December 7, 2010 Burdett et al.
Patent History
Patent number: D684274
Type: Grant
Filed: Jan 19, 2012
Date of Patent: Jun 11, 2013
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kotaro Hosoya (Hitachinaka), Yoshihiro Takahoko (Hitachinaka)
Primary Examiner: Anhdao Doan
Application Number: 29/411,276