Analysis system

- Cepheid
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Description

FIG. 1 is a perspective view of an analysis system showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The portions shown in broken lines form no part of the claimed design.

Claims

The ornamental design for an analysis system, as shown and described.

Referenced Cited
U.S. Patent Documents
D320443 October 1, 1991 Yokoyama et al.
D333007 February 2, 1993 LaBarbera
D380273 June 24, 1997 Emerson et al.
D419235 January 18, 2000 Doms et al.
D454399 March 12, 2002 Doms et al.
D522391 June 6, 2006 Onuma et al.
D670401 November 6, 2012 Tsuda et al.
Patent History
Patent number: D690023
Type: Grant
Filed: Feb 3, 2012
Date of Patent: Sep 17, 2013
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/412,457
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)