Contact probe

Info

Patent number: D699607
Type: Grant
Filed: Aug 31, 2012
Date of Patent: Feb 18, 2014
Assignee: Yamaichi Electronics Co., Ltd. (Tokyo)
Inventors: Yuji Nakamura (Tokyo), Katsumi Suzuki (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/431,034

Description

Description

FIG. 1 is a perspective view of the front, top and left side of a contact probe of a first embodiment showing our new design;

FIG. 2 is a perspective view of the rear, top and right side thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof;

FIG. 8 is a bottom view thereof;

FIG. 9 is an enlarged view of tip side from 9-9 section in FIG. 1 thereof;

FIG. 10 is an enlarged view of tip side from 10-10 section in FIG. 2 thereof;

FIG. 11 is an enlarged view of tip side from 11-11 section in FIG. 3 thereof; and

FIG. 12 is an enlarged view of tip side from 12-12 section in FIG. 6 thereof,

FIG. 13 is a perspective view of the front, top and left side of a contact probe of a second embodiment showing our new design;

FIG. 14 is a perspective view of the rear, top and right side thereof;

FIG. 15 is a front view thereof;

FIG. 16 is a rear view thereof;

FIG. 17 is a left side view thereof;

FIG. 18 is a right side view thereof;

FIG. 19 is a top view thereof;

FIG. 20 is a bottom view thereof;

FIG. 21 is an enlarged view of tip side from 21-21 section in FIG. 13 thereof;

FIG. 22 is an enlarged view of tip side from 22-22 section in FIG. 14 thereof;

FIG. 23 is an enlarged view of tip side from 23-23 section in FIG. 15 thereof; and

FIG. 24 is an enlarged view of tip side from 24-24 section in FIG. 18 thereof,

FIG. 25 is a perspective view of the front, top and left side of a contact probe of a third embodiment showing our new design;

FIG. 26 is a perspective view of the rear, top and right side thereof;

FIG. 27 is a front view thereof;

FIG. 28 is a rear view thereof;

FIG. 29 is a left side view thereof;

FIG. 30 is a right side view thereof;

FIG. 31 is a top view thereof;

FIG. 32 is a bottom view thereof;

FIG. 33 is an enlarged view of tip side from 33-33 section in FIG. 25 thereof;

FIG. 34 is an enlarged view of tip side from 34-34 section in FIG. 26 thereof;

FIG. 35 is an enlarged view of tip side from 35-35 section in FIG. 27 thereof; and

FIG. 36 is an enlarged view of tip side from 36-36 section in FIG. 30 thereof,

FIG. 37 is a perspective view of the front, top and left side of a contact probe of a fourth embodiment showing our new design;

FIG. 38 is a perspective view of the rear, top and right side thereof;

FIG. 39 is a front view thereof;

FIG. 40 is a rear view thereof;

FIG. 41 is a left side view thereof;

FIG. 42 is a right side view thereof;

FIG. 43 is a top view thereof;

FIG. 44 is a bottom view thereof;

FIG. 45 is an enlarged view of tip side from 45-45 section in FIG. 37 thereof;

FIG. 46 is an enlarged view of tip side from 46-46 section in FIG. 38 thereof;

FIG. 47 is an enlarged view of tip side from 47-47 section in FIG. 39 thereof; and,

FIG. 48 is an enlarged view of tip side from 48-48 section in FIG. 42 thereof.

The portions of the article in broken lines are shown for illustrative purposes only and form no part of the claimed design.

Claims

The ornamental design(s) for a contact probe, as shown and described.