Electronic device
Latest Hon Hai Precision Industry Co., Ltd. Patents:
- Method for measuring growth height of plant, electronic device, and storage medium
- Manufacturing method of semiconductor structure
- Microbolometer and method of manufacturing the same
- Image processing method and computing device
- Chip pin connection status display method, computer device and storage medium
Description
The broken lines shown are for the purpose of illustration and form no part of the claimed design.
Claims
The ornamental design for an electronic device, as shown and described.
Referenced Cited
U.S. Patent Documents
D313431 | January 1, 1991 | Jaskiel et al. |
6807051 | October 19, 2004 | Takahashi |
D536337 | February 6, 2007 | Chuang |
D556757 | December 4, 2007 | Kim et al. |
D579930 | November 4, 2008 | Maskatia |
D586565 | February 17, 2009 | Ko et al. |
D610139 | February 16, 2010 | Kamata et al. |
D620937 | August 3, 2010 | Shih et al. |
D653254 | January 31, 2012 | Lu et al. |
Patent History
Patent number: D700602
Type: Grant
Filed: Dec 27, 2012
Date of Patent: Mar 4, 2014
Assignee: Hon Hai Precision Industry Co., Ltd. (New Taipei)
Inventors: Hong-Sheng Chen (New Taipei), Kuo-Chun Huang (New Taipei)
Primary Examiner: Freda S Nunn
Application Number: 29/440,847
Type: Grant
Filed: Dec 27, 2012
Date of Patent: Mar 4, 2014
Assignee: Hon Hai Precision Industry Co., Ltd. (New Taipei)
Inventors: Hong-Sheng Chen (New Taipei), Kuo-Chun Huang (New Taipei)
Primary Examiner: Freda S Nunn
Application Number: 29/440,847
Classifications