Oven
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Description
The rectangular shape depicted by broken lines in
Claims
The ornamental design for an oven, as shown and described.
Referenced Cited
U.S. Patent Documents
| D277449 | February 5, 1985 | Vetter et al. |
| 5406932 | April 18, 1995 | Joseph et al. |
| 5568804 | October 29, 1996 | Joseph et al. |
| D464229 | October 15, 2002 | Baldwin et al. |
| D530971 | October 31, 2006 | Kim |
| D536208 | February 6, 2007 | Ostlund et al. |
| D555976 | November 27, 2007 | Baldwin |
| D560956 | February 5, 2008 | Shin et al. |
| D560959 | February 5, 2008 | Shin et al. |
| D564281 | March 18, 2008 | Kim |
| D604987 | December 1, 2009 | Jung et al. |
| D612678 | March 30, 2010 | Baker et al. |
| D612680 | March 30, 2010 | Baker et al. |
| D612684 | March 30, 2010 | Baker et al. |
| D612685 | March 30, 2010 | Baker et al. |
| 7690374 | April 6, 2010 | Lee et al. |
| D646519 | October 11, 2011 | Kim et al. |
| 20060070616 | April 6, 2006 | Lee et al. |
| 20070023029 | February 1, 2007 | Kelley et al. |
| 20090194527 | August 6, 2009 | Okada |
Patent History
Patent number: D704978
Type: Grant
Filed: May 15, 2013
Date of Patent: May 20, 2014
Assignee: Samsung Electronics Co., Ltd. (Gyeonggi-do)
Inventors: Tai Kyung Kim (Seoul), Jaejun Kim (Seoul), Byungkook Baek (Anyang-si), Ji-Young Shin (Seoul), Yoon-Jung Choi (Seoul), Sungjae Lee (Kwangmyung-si)
Primary Examiner: Caron D Veynar
Assistant Examiner: Martie K Holtje
Application Number: 29/454,874
Type: Grant
Filed: May 15, 2013
Date of Patent: May 20, 2014
Assignee: Samsung Electronics Co., Ltd. (Gyeonggi-do)
Inventors: Tai Kyung Kim (Seoul), Jaejun Kim (Seoul), Byungkook Baek (Anyang-si), Ji-Young Shin (Seoul), Yoon-Jung Choi (Seoul), Sungjae Lee (Kwangmyung-si)
Primary Examiner: Caron D Veynar
Assistant Examiner: Martie K Holtje
Application Number: 29/454,874
Classifications
Current U.S. Class:
D7/340;
D7/346