Microscope measurement apparatus
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Description
Claims
The ornamental design for a microscope measurement apparatus, as shown and described.
Referenced Cited
Patent History
Patent number: D720999
Type: Grant
Filed: Jul 29, 2013
Date of Patent: Jan 13, 2015
Assignee: Hon Hai Precision Industry Co., Ltd. (New Taipei)
Inventors: Chih-Kuang Chang (New Taipei), Li Jiang (Shenzhen), Dong-Hai Li (Shenzhen)
Primary Examiner: Antoine D Davis
Application Number: 29/461,843
Type: Grant
Filed: Jul 29, 2013
Date of Patent: Jan 13, 2015
Assignee: Hon Hai Precision Industry Co., Ltd. (New Taipei)
Inventors: Chih-Kuang Chang (New Taipei), Li Jiang (Shenzhen), Dong-Hai Li (Shenzhen)
Primary Examiner: Antoine D Davis
Application Number: 29/461,843
Classifications