Microscope measurement apparatus

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Description

FIG. 1 is a perspective view of a microscope measurement apparatus showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Claims

The ornamental design for a microscope measurement apparatus, as shown and described.

Referenced Cited
U.S. Patent Documents
7599073 October 6, 2009 Yoshiki
8303125 November 6, 2012 Chang et al.
8559119 October 15, 2013 Seifert
8650767 February 18, 2014 Matsumiya et al.
8749882 June 10, 2014 Kennedy
Patent History
Patent number: D720999
Type: Grant
Filed: Jul 29, 2013
Date of Patent: Jan 13, 2015
Assignee: Hon Hai Precision Industry Co., Ltd. (New Taipei)
Inventors: Chih-Kuang Chang (New Taipei), Li Jiang (Shenzhen), Dong-Hai Li (Shenzhen)
Primary Examiner: Antoine D Davis
Application Number: 29/461,843
Classifications
Current U.S. Class: Drafting Machine (D10/63); Chemical (12) (D10/81)