Analyzing machine having X-ray

- Shimadzu Corporation
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Description

FIG. 1 is a perspective view of an analyzing machine having X-ray showing my new design;

FIG. 2 is another perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof; and,

FIG. 8 is a bottom view thereof.

Claims

The ornamental design for an analyzing machine having X-ray, as shown and described.

Referenced Cited
U.S. Patent Documents
D424199 May 2, 2000 Wells
D441080 April 24, 2001 Herekar et al.
D489816 May 11, 2004 Ross
D508565 August 16, 2005 Nephin et al.
D647209 October 18, 2011 Muller et al.
D689193 September 3, 2013 Shinohara et al.
D702350 April 8, 2014 Nasella
20130272498 October 17, 2013 Goto et al.
Patent History
Patent number: D724214
Type: Grant
Filed: Nov 6, 2013
Date of Patent: Mar 10, 2015
Assignee: Shimadzu Corporation (Kyoto)
Inventor: Kaoru Ihara (Kyoto)
Primary Examiner: Anhdao Doan
Application Number: 29/471,850