Analyzing machine having X-ray
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Description
Claims
The ornamental design for an analyzing machine having X-ray, as shown and described.
Referenced Cited
U.S. Patent Documents
Patent History
Patent number: D724214
Type: Grant
Filed: Nov 6, 2013
Date of Patent: Mar 10, 2015
Assignee: Shimadzu Corporation (Kyoto)
Inventor: Kaoru Ihara (Kyoto)
Primary Examiner: Anhdao Doan
Application Number: 29/471,850
Type: Grant
Filed: Nov 6, 2013
Date of Patent: Mar 10, 2015
Assignee: Shimadzu Corporation (Kyoto)
Inventor: Kaoru Ihara (Kyoto)
Primary Examiner: Anhdao Doan
Application Number: 29/471,850
Classifications