Microscope base and arm
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Description
The broken lines shown represent unclaimed subject matter and form no part of the claimed design. The bottom side of the microscope base and arm forms no part of the claimed design.
Claims
We claim the ornamental design for a microscope base and arm, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
4606616 | August 19, 1986 | Parker |
D439258 | March 20, 2001 | Kawahata |
D461201 | August 6, 2002 | Apotheloz |
D464068 | October 8, 2002 | Asaka et al. |
D498247 | November 9, 2004 | Suzuki et al. |
D546355 | July 10, 2007 | Apotheloz |
D546356 | July 10, 2007 | Apotheloz |
D592689 | May 19, 2009 | Dunn |
D611972 | March 16, 2010 | Apotheloz |
20040263960 | December 30, 2004 | Obuchi |
20100259816 | October 14, 2010 | Feger |
20110080638 | April 7, 2011 | Feger |
20110085234 | April 14, 2011 | Feger |
20130070336 | March 21, 2013 | Thomas et al. |
- Brochure of Stemi DR, Stemi DV4 and Stemi 2000 Stereomicroscopes, 30 pages, published by Carl Zeiss Microscopy GmbH, Jena, Germany.
- Brochure of Stemi 2000 Stereomicroscopes, 6 pages, published by Carl Zeiss Microscopy GmbH, Jena, Germany.
Patent History
Patent number: D738415
Type: Grant
Filed: Jun 24, 2014
Date of Patent: Sep 8, 2015
Assignee: Carl Zeiss Microscopy GmbH (Jena)
Inventors: Kerstin Hofmann (Goettingen), Axel Laschke (Waake), Ilka Schlesiger (Jena), Michael Winterot (Jena), Martin Stohr (Jena)
Primary Examiner: Derrick Holland
Assistant Examiner: Lauren Calve
Application Number: 29/494,788
Type: Grant
Filed: Jun 24, 2014
Date of Patent: Sep 8, 2015
Assignee: Carl Zeiss Microscopy GmbH (Jena)
Inventors: Kerstin Hofmann (Goettingen), Axel Laschke (Waake), Ilka Schlesiger (Jena), Michael Winterot (Jena), Martin Stohr (Jena)
Primary Examiner: Derrick Holland
Assistant Examiner: Lauren Calve
Application Number: 29/494,788
Classifications
Current U.S. Class:
Microscope (D16/131)