Microscope
Latest Leica Microsystems (Schweiz) AG Patents:
Description
The broken lines form no part of the claimed design.
Claims
The ornamental design for a microscope, as shown and described.
Referenced Cited
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Patent History
Patent number: D611972
Type: Grant
Filed: Mar 4, 2009
Date of Patent: Mar 16, 2010
Assignee: Leica Microsystems (Schweiz) AG (Heerbrugg)
Inventor: Christophe Apothéloz (Zurich)
Primary Examiner: Paula Greene
Attorney: Crowell & Moring LLP
Application Number: 29/333,144
Type: Grant
Filed: Mar 4, 2009
Date of Patent: Mar 16, 2010
Assignee: Leica Microsystems (Schweiz) AG (Heerbrugg)
Inventor: Christophe Apothéloz (Zurich)
Primary Examiner: Paula Greene
Attorney: Crowell & Moring LLP
Application Number: 29/333,144
Classifications
Current U.S. Class:
Microscope (D16/131)