Substrate for spectroscopic analysis

- HAMAMATSU PHOTONICS K.K.
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Description

FIG. 1 is a front view of a substrate for spectroscopic analysis of the first embodiment of our new design.

FIG. 2 is a rear view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 3 is a top plan view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 4 is a bottom view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 5 is a right side view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 6 is a left side view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 7 is a perspective of the substrate for spectroscopic analysis of FIG. 1.

FIG. 8 is a top plan view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

FIG. 9 is a perspective view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

FIG. 10 is a sectional view taken along the line 10-10 of the substrate for spectroscopic analysis of FIG. 3.

FIG. 11 is a sectional view taken along the line 11-11 of the substrate for spectroscopic analysis of FIG. 1.

FIG. 12 is a sectional view taken along the line 12-12 of the substrate for spectroscopic analysis of FIG. 8.

FIG. 13 is an enlarged sectional view taken along the line 13-13 of the substrate for spectroscopic analysis of FIG. 10.

FIG. 14 is a reference sectional view taken along the line 10-10 of the substrate for spectroscopic analysis of FIG. 3 in use, wherein the element is inserted in the concave part for element and the glass plate is set above the cover part.

FIG. 15 is a front view of a substrate for spectroscopic analysis of the second embodiment of our new design.

FIG. 16 is a rear view of the substrate for spectroscopic analysis of FIG. 15.

FIG. 17 is a top plan view of the substrate for spectroscopic analysis of FIG. 15.

FIG. 18 is a bottom view of the substrate for spectroscopic analysis of FIG. 15.

FIG. 19 is a right side view of the substrate for spectroscopic analysis of FIG. 15.

FIG. 20 is a left side view of the substrate for spectroscopic analysis of FIG. 15.

FIG. 21 is a perspective of the substrate for spectroscopic analysis of FIG. 15.

FIG. 22 is a top plan view without the cover part of the substrate for spectroscopic analysis of FIG. 15.

FIG. 23 is a perspective view without the cover part of the substrate for spectroscopic analysis of FIG. 15.

FIG. 24 is a sectional view taken along the line 24-24 of the substrate for spectroscopic analysis of FIG. 17.

FIG. 25 is a sectional view taken along the line 25-25 of the substrate for spectroscopic analysis of FIG. 15.

FIG. 26 is a sectional view taken along the line 26-26 of the substrate for spectroscopic analysis of FIG. 22.

FIG. 27 is an enlarged sectional view taken along the line 27-27 of the substrate for spectroscopic analysis of FIG. 24; and,

FIG. 28 is a reference sectional view taken along the line 24-24 of the substrate for spectroscopic analysis of FIG. 17 in use, wherein the element is inserted in the concave part for element and the glass plate is set above the cover part.

The dot and dashed lines define the bounds of the claimed design. The dot and dot lines show portions of the substrate for spectroscopic analysis that form no part of the claimed design.

The whole of the substrate for spectroscopic analysis of the first embodiment is transparent.

Claims

The ornamental design for a substrate for spectroscopic analysis, as shown and described.

Referenced Cited
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Foreign Patent Documents
WO-2013/062540 May 2013 WO
Other references
  • U.S. Appl. No. 29/477,936, Hamamatsu Photonics K.K.
  • U.S. Appl. No. 29/477,940, Hamamatsu Photonics K.K.
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  • Leaflet “rSERS™ Raman Enhancing Media,” Raman Systems, a wholly owned subsidiary of Agiltron, Inc., www.ramansystems.com.
Patent History
Patent number: D740439
Type: Grant
Filed: Dec 30, 2013
Date of Patent: Oct 6, 2015
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Hiroki Oyama (Hamamatsu), Yoshihiro Maruyama (Hamamatsu)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Application Number: 29/477,934
Classifications
Current U.S. Class: Slide Or Reagent Sheet Type (D24/225)