Substrate for spectroscopic analysis

- HAMAMATSU PHOTONICS K.K.
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Description

FIG. 1 is a front view of a substrate for spectroscopic analysis of our new design.

FIG. 2 is a rear view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 3 is a top plan view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 4 is a bottom view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 5 is a right side view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 6 is a left side view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 7 is a perspective of the substrate for spectroscopic analysis of FIG. 1.

FIG. 8 is a top plan view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

FIG. 9 is a perspective view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

FIG. 10 is a sectional view taken along the line 10-10 of the substrate for spectroscopic analysis of FIG. 3.

FIG. 11 is a sectional view taken along the line 11-11 of the substrate for spectroscopic analysis of FIG. 1.

FIG. 12 is a sectional view taken along the line 12-12 of the substrate for spectroscopic analysis of FIG. 8.

FIG. 13 is an enlarged sectional view taken along the line 13-13 of the substrate for spectroscopic analysis of FIG. 10, and,

FIG. 14 is a reference sectional view taken along the line 10-10 of the substrate for spectroscopic analysis of FIG. 3 in use, wherein the element is inserted in the concave part for element and the glass plate is set above the cover part.

The features shown in dotted lines depict environmental subject matter only and form no part of the claimed design.

The broken lines having alternating long and short segments define bounds of the claimed design and form no part thereof.

Claims

The ornamental design for a substrate for spectroscopic analysis, as shown and described.

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Other references
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Patent History
Patent number: D750799
Type: Grant
Filed: Jun 1, 2015
Date of Patent: Mar 1, 2016
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Hiroki Oyama (Hamamatsu), Yoshihiro Maruyama (Hamamatsu)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Application Number: 29/528,795
Classifications