Headset for measuring brain waves
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Description
The broken lines in the drawing show unclaimed environment only and form no part of the claimed design.
The dot-dash broken lines encircling portions of the claimed design that are illustrated in enlargements form no part of the claimed design.
Claims
We claim the ornamental design for a headset for measuring brain waves, as shown and described.
Referenced Cited
U.S. Patent Documents
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Patent History
Patent number: D771822
Type: Grant
Filed: Jun 25, 2015
Date of Patent: Nov 15, 2016
Assignee: SAMSUNG EECTRONICS CO., LTD. (Suwon-Si, Gyeonggi-Do)
Inventors: Hee Jae Jo (Suwon-si), Se Hoon Lim (Gwangju), Jun Hyung Park (Seoul), Jang Beom Yang (Gwangju), Jae Min Jung (Seoul), Jun Ho Koh (Suwon-si), Chang Hyun Lee (Suwon-si), Yong Hyun Lim (Suwon-si), Hae In Chun (Daegu)
Primary Examiner: Anhdao Doan
Application Number: 29/531,374
Type: Grant
Filed: Jun 25, 2015
Date of Patent: Nov 15, 2016
Assignee: SAMSUNG EECTRONICS CO., LTD. (Suwon-Si, Gyeonggi-Do)
Inventors: Hee Jae Jo (Suwon-si), Se Hoon Lim (Gwangju), Jun Hyung Park (Seoul), Jang Beom Yang (Gwangju), Jae Min Jung (Seoul), Jun Ho Koh (Suwon-si), Chang Hyun Lee (Suwon-si), Yong Hyun Lim (Suwon-si), Hae In Chun (Daegu)
Primary Examiner: Anhdao Doan
Application Number: 29/531,374
Classifications
Current U.S. Class:
Patient Monitor Or Diagnostic Instrument Not Elsewhere Specified (50) (D24/186)