Surveillance camera

- Samsung Electronics
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Description

FIG. 1 is a front perspective view of a surveillance camera showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left-side view thereof;

FIG. 5 is a right-side view thereof;

FIG. 6 is a top view thereof;

FIG. 7 is a bottom view thereof; and,

FIG. 8 is a front perspective view thereof in which the lens portion of the surveillance camera is shown in an alternate position.

The broken lines in the figures show portions of the surveillance camera which form no part of the claimed design.

Claims

We claim the ornamental design for a surveillance camera, as shown and described.

Referenced Cited
U.S. Patent Documents
D442202 May 15, 2001 Pfeifer
D467952 December 31, 2002 Nakamura
D527406 August 29, 2006 Lin
D547347 July 24, 2007 Kim
D552650 October 9, 2007 Yamakawa
D628223 November 30, 2010 Kao
D728654 May 5, 2015 Lee
D741931 October 27, 2015 Huang
D742955 November 10, 2015 Kozko
D745076 December 8, 2015 Pfeil
D749661 February 16, 2016 Yang
D750147 February 23, 2016 Muller
D753204 April 5, 2016 Luo
Foreign Patent Documents
000320155-0004 May 2005 EM
002277046-0001 October 2013 EM
Other references
  • China Quality Suppliers. “2.0 Megapixel Dome Mini CCTV Security Camera 1080P Onvif Wireless Wifi IP Camera With ICR”. [2015]. http://korean.ip-cctvcamera.com. <http://korean.ip-cctvcamera.com/sale-1778312-2-0-megapixel-dome-mini-cctv-security-camera-1080p-onvif-wireless-wifi-ip-camera-with-icr.html>.
  • Bluefog. “Prices of CCTV cameras : Dome Camera?”. [2012]. http://cctvuser.blogspot.kr/. <http://cctvuser.blogspotkr/2012/04/cctv13.html>.
Patent History
Patent number: D777235
Type: Grant
Filed: Aug 11, 2015
Date of Patent: Jan 24, 2017
Assignee: Samsung Electronics Co., Ltd. (Suwon-si)
Inventors: Euijung Jang (Seoul), Jieun Kang (Anyang-si), Kiseong Kim (Gwangmyeong-si), Seonkeun Park (Seoul), Jungmin Yeo (Seoul), Na-Kyoung Lee (Seoul), Junghun Lee (Seoul), Yunsu Cho (Seoul), Hankyung Ji (Goyang-si), Sunghoon Hong (Seoul)
Primary Examiner: Philip S Hyder
Assistant Examiner: Ramzi Almatrahi
Application Number: 29/535,859
Classifications