Optical measuring theodolite using light wave

- KABUSHIKI KAISHA TOPCON
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Description

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side perspective view thereof; and,

FIG. 8 is a rear, left-side perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims

The ornamental design for an optical measuring theodolite using light wave, as shown and described.

Referenced Cited
U.S. Patent Documents
D723953 March 10, 2015 Ishii
Patent History
Patent number: D778745
Type: Grant
Filed: Aug 20, 2015
Date of Patent: Feb 14, 2017
Assignee: KABUSHIKI KAISHA TOPCON (Tokyo)
Inventor: Mitsuo Ishii (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/536,904
Classifications
Current U.S. Class: Transit Or Theodolite (D10/66)