Optical measuring theodolite using light wave
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Description
The broken lines depict environmental subject matter only and form no part of the claimed design.
Claims
The ornamental design for an optical measuring theodolite using light wave, as shown and described.
Referenced Cited
U.S. Patent Documents
D723953 | March 10, 2015 | Ishii |
Patent History
Patent number: D778745
Type: Grant
Filed: Aug 20, 2015
Date of Patent: Feb 14, 2017
Assignee: KABUSHIKI KAISHA TOPCON (Tokyo)
Inventor: Mitsuo Ishii (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/536,904
Type: Grant
Filed: Aug 20, 2015
Date of Patent: Feb 14, 2017
Assignee: KABUSHIKI KAISHA TOPCON (Tokyo)
Inventor: Mitsuo Ishii (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/536,904
Classifications
Current U.S. Class:
Transit Or Theodolite (D10/66)