Socket for electronic device testing apparatus
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The bottom plan view, the front view, the rear view, the right side view, and the left side view of the second embodiment are the same as the bottom plan view, the front view, the rear view, the right side view, and the left side view of the first embodiment, respectively.
The present design is embodied in a socket to be installed in an electronic device testing apparatus that tests electrical characteristics of an electronic device such as a semiconductor integrated circuit. As shown in the reference cross-sectional view showing the usage state, when an electronic device is tested, the electronic device retained by an insert is pressed into the socket from above, and external connection terminals led out from the electronic device are brought into contact with terminals of the socket (the terminals are represented by a large number of circles in the top plan views) so that the electronic device and the electronic device testing apparatus are electrically connected with each other via the socket. In this state, the electronic device testing apparatus tests the electronic device. Eight recessed parts shown in
The part represented by solid lines is a part of the claimed design. The dot-dash broken lines (the alternate long and short dash lines) represent only a border between the part of the claimed design and other part. The dashed broken lines (the broken lines) are for illustrative purposes only and form no part of the claimed design.
Claims
We claim the ornamental design for a socket for an electronic device testing apparatus, as shown and described.
30-0799416 | June 2015 | KR |
30-0809423 | August 2015 | KR |
D174139 | March 2016 | TW |
D174140 | March 2016 | TW |
- Office Action issued in Korea Counterpart Patent Appl. No. 30-2016-0017017, dated Oct. 4, 2016 , along with an English translation thereof.
- Office Action issued in China Appl. No. 201630224369.0, dated Nov. 1, 2016 , along with an English translation thereof.
- Office Action issued in China Appl. No. 201630224369.0, dated Dec. 9, 2016 , along with an English translation thereof.
- Taiwanese Official Action in TW Appl. No. 103306664, Jul. 20, 2015.
- Taiwanese Official Action in TW Appl. No. 103306665, Jul. 20, 2015.
Type: Grant
Filed: Apr 5, 2016
Date of Patent: Sep 12, 2017
Assignee: ADVANTEST CORPORATION (Tokyo)
Inventors: Takashi Kawashima (Saitama), Shintaro Takaki (Saitama)
Primary Examiner: Antoine D Davis
Application Number: 29/560,253