Probe

- Edan Instruments, Inc.
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Description

FIG. 1 is a front elevation view of the probe of the present invention;

FIG. 2 is a rear elevation view thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top view thereof;

FIG. 6 is a bottom view thereof;

FIG. 7 is a rear perspective view thereof;

FIG. 8 is another rear perspective view thereof;

FIG. 9 is a front perspective view thereof; and,

FIG. 10 is another front perspective view thereof.

Claims

The ornamental design for a probe, as shown and described.

Referenced Cited
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Patent History
Patent number: D825765
Type: Grant
Filed: Jan 20, 2017
Date of Patent: Aug 14, 2018
Assignee: Edan Instruments, Inc. (Shenzhen)
Inventors: Kai Yang (Shenzhen), Wuchao Mao (Shenzhen), Richard Henderson (Sunnyvale, CA), Hua Luo (Shenzhen)
Primary Examiner: Ian Simmons
Assistant Examiner: Mark Cavanna
Application Number: 29/591,556