Probe
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Description
Claims
The ornamental design for a probe, as shown and described.
Referenced Cited
U.S. Patent Documents
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Patent History
Patent number: D825765
Type: Grant
Filed: Jan 20, 2017
Date of Patent: Aug 14, 2018
Assignee: Edan Instruments, Inc. (Shenzhen)
Inventors: Kai Yang (Shenzhen), Wuchao Mao (Shenzhen), Richard Henderson (Sunnyvale, CA), Hua Luo (Shenzhen)
Primary Examiner: Ian Simmons
Assistant Examiner: Mark Cavanna
Application Number: 29/591,556
Type: Grant
Filed: Jan 20, 2017
Date of Patent: Aug 14, 2018
Assignee: Edan Instruments, Inc. (Shenzhen)
Inventors: Kai Yang (Shenzhen), Wuchao Mao (Shenzhen), Richard Henderson (Sunnyvale, CA), Hua Luo (Shenzhen)
Primary Examiner: Ian Simmons
Assistant Examiner: Mark Cavanna
Application Number: 29/591,556
Classifications
Current U.S. Class:
Electrode, Transducer Or Contact Not Elsewhere Specified (51) (D24/187)