Probe

- SINTOKOGIO, LTD.
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Description

FIG. 1 is a perspective view of a probe showing my new design;

FIG. 2 is a front view thereof, the rear view being a mirror image thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan side view thereof.

The parallel dash-dot broken lines represent a symbolic break and form no part of the claimed design.

Claims

The ornamental design for a probe, as shown and described.

Referenced Cited
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D263228 March 2, 1982 Nitz
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Foreign Patent Documents
2803794 January 2012 CA
WO-9116638 October 1991 WO
Patent History
Patent number: D828190
Type: Grant
Filed: Mar 24, 2017
Date of Patent: Sep 11, 2018
Assignee: SINTOKOGIO, LTD.
Inventor: Yoshiyasu Makino (Toyokawa)
Primary Examiner: Melanie H Tung
Assistant Examiner: Fritzgerald L Butac
Application Number: 29/598,352
Classifications