Probe
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The broken lines show portions of the probe that form no part of the claimed design. The drawings include surface shading which represents contour and not surface ornamentation.
The parallel dash-dot-dash broken lines represent a symbolic break in the length of an unclaimed element of the probe and form no part of the claimed design. The appearance of any portion of the probe between the break lines forms no part of the claimed design.
Claims
The ornamental design for a probe, as shown and described.
5532591 | July 2, 1996 | Logue |
D381030 | July 15, 1997 | Tepman |
D431867 | October 10, 2000 | Maynard |
D571833 | June 24, 2008 | Ota |
D579809 | November 4, 2008 | Lin |
D697224 | January 7, 2014 | Judson |
D744360 | December 1, 2015 | Makino |
D747267 | January 12, 2016 | Aumiller |
9325817 | April 26, 2016 | Vossoughi |
D782973 | April 4, 2017 | Zhou |
D797042 | September 12, 2017 | Miller |
D798807 | October 3, 2017 | Shi |
D808901 | January 30, 2018 | Kelly |
D810015 | February 13, 2018 | Carreon |
2803794 | January 2012 | CA |
WO-9116638 | October 1991 | WO |
Type: Grant
Filed: Mar 24, 2017
Date of Patent: Oct 16, 2018
Assignee: SINTOKOGIO, LTD.
Inventor: Yoshiyasu Makino (Toyokawa)
Primary Examiner: Garth Rademaker
Assistant Examiner: Fritzgerald L Butac
Application Number: 29/598,347