Probe

- SINTOKOGIO, LTD.
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Description

FIG. 1 is a perspective view of a probe showing my new design;

FIG. 2 is a front view thereof, the rear view being a mirror image thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan side view thereof.

The broken lines show portions of the probe that form no part of the claimed design. The drawings include surface shading which represents contour and not surface ornamentation.

The parallel dash-dot-dash broken lines represent a symbolic break in the length of an unclaimed element of the probe and form no part of the claimed design. The appearance of any portion of the probe between the break lines forms no part of the claimed design.

Claims

The ornamental design for a probe, as shown and described.

Referenced Cited
U.S. Patent Documents
5532591 July 2, 1996 Logue
D381030 July 15, 1997 Tepman
D431867 October 10, 2000 Maynard
D571833 June 24, 2008 Ota
D579809 November 4, 2008 Lin
D697224 January 7, 2014 Judson
D744360 December 1, 2015 Makino
D747267 January 12, 2016 Aumiller
9325817 April 26, 2016 Vossoughi
D782973 April 4, 2017 Zhou
D797042 September 12, 2017 Miller
D798807 October 3, 2017 Shi
D808901 January 30, 2018 Kelly
D810015 February 13, 2018 Carreon
Foreign Patent Documents
2803794 January 2012 CA
WO-9116638 October 1991 WO
Patent History
Patent number: D830865
Type: Grant
Filed: Mar 24, 2017
Date of Patent: Oct 16, 2018
Assignee: SINTOKOGIO, LTD.
Inventor: Yoshiyasu Makino (Toyokawa)
Primary Examiner: Garth Rademaker
Assistant Examiner: Fritzgerald L Butac
Application Number: 29/598,347
Classifications