Apparatus for detecting particle on test film

- JEDEX INC.
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Description

FIG. 1 is a perspective view of an apparatus for detecting particles on test film, showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Claims

I claim, the ornamental design for an apparatus for detecting particles on test film, as shown and described.

Referenced Cited
U.S. Patent Documents
9599844 March 21, 2017 Kudo
9983596 May 29, 2018 Neander
Patent History
Patent number: D838609
Type: Grant
Filed: Sep 13, 2017
Date of Patent: Jan 22, 2019
Assignee: JEDEX INC. (Yongin-si)
Inventor: Jin Ho Kim (Suwon-si)
Primary Examiner: Antoine Duval Davis
Application Number: 29/617,261