Apparatus for detecting particle on test film
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Description
Claims
I claim, the ornamental design for an apparatus for detecting particles on test film, as shown and described.
Patent History
Patent number: D838609
Type: Grant
Filed: Sep 13, 2017
Date of Patent: Jan 22, 2019
Assignee: JEDEX INC. (Yongin-si)
Inventor: Jin Ho Kim (Suwon-si)
Primary Examiner: Antoine Duval Davis
Application Number: 29/617,261
Type: Grant
Filed: Sep 13, 2017
Date of Patent: Jan 22, 2019
Assignee: JEDEX INC. (Yongin-si)
Inventor: Jin Ho Kim (Suwon-si)
Primary Examiner: Antoine Duval Davis
Application Number: 29/617,261