Window E-chip for an electron microscope
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Broken lines, which form no part of the claimed design, are used for illustrative purposes to show an environment of the claimed design in a condition of use.
Claims
We claim the ornamental design for a window E-chip for an electron microscope, as shown and described.
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Type: Grant
Filed: Mar 8, 2016
Date of Patent: Feb 19, 2019
Assignee: PROTOCHIPS, INC. (Morrisville, NC)
Inventors: Franklin Stampley Walden, II (Raleigh, NC), John Damiano, Jr. (Apex, NC), David P. Nackashi (Raleigh, NC), Daniel S. Gardiner (Wake Forest, NC)
Primary Examiner: Susan Bennett Hattan
Assistant Examiner: Rebecca Tsehaye
Application Number: 29/557,335