Sample holder for an electron microscope

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Description

FIG. 1 is a front, top and left side perspective view of a sample holder for an electron microscope showing our new design;

FIG. 2 is a rear, top and right side perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a top plan view thereof; and,

FIG. 8 is a bottom plan view thereof.

The broken lines are included for the purpose of illustrating unclaimed portions of the sample holder for an electron microscope and form no part of the claimed design.

Claims

We claim the ornamental design for a sample holder for an electron microscope, as shown and described.

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Patent History
Patent number: D794816
Type: Grant
Filed: Apr 23, 2014
Date of Patent: Aug 15, 2017
Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION (Tokyo)
Inventors: Kazuhiro Koyama (Tokyo), Masahiro Sasajima (Tokyo)
Primary Examiner: Ian Simmons
Assistant Examiner: Mark Cavanna
Application Number: 29/488,729