Test kit

- LIA DIAGNOSTICS, INC.
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is an upper perspective view of a first embodiment of the test kit;

FIG. 2 is a lower perspective view of the test kit in FIG. 1;

FIG. 3 is a top plan view of the test kit shown in FIG. 1;

FIG. 4 is a bottom plan view of the test kit shown in FIG. 1;

FIG. 5 is a right side view of the test kit shown in FIG. 1;

FIG. 6 is a left side view of the test kit shown in FIG. 1;

FIG. 7 is a forward plan view of the test kit shown in FIG. 1; and,

FIG. 8 is a rear plan view of the test kit shown in FIG. 1.

The broken lines in the drawings illustrate portions of the test kit that form no part of the claimed design.

Claims

We claim the ornamental design for a test kit, as shown and described.

Referenced Cited
U.S. Patent Documents
D383668 September 16, 1997 Siegel
D427320 June 27, 2000 Clawson
D445906 July 31, 2001 Clawson
D445909 July 31, 2001 Pogorzelski
D540953 April 17, 2007 Ramel
D571928 June 24, 2008 Rannikko
D606664 December 22, 2009 Jacono
D640389 June 21, 2011 Francis
D734482 July 14, 2015 Peterman
D824532 July 31, 2018 Novak
D830572 October 9, 2018 Edwards
D831845 October 23, 2018 Sugie
20090117660 May 7, 2009 Dai
Patent History
Patent number: D848021
Type: Grant
Filed: Dec 4, 2017
Date of Patent: May 7, 2019
Assignee: LIA DIAGNOSTICS, INC. (Philadelphia, PA)
Inventors: Bethany Edwards (Harveys Lake, PA), Anna Couturier (Philadelphia, PA), Jino Lee (Philadelphia, PA)
Primary Examiner: Anhdao Doan
Application Number: 29/628,346