End portion of handicraft gauge

- CLOVER MFG. CO., LTD.
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view showing a handicraft gauge according to a first embodiment of our design;

FIG. 2 is a top plan view of the same;

FIG. 3 is a bottom view of the same;

FIG. 4 is a front view of the same;

FIG. 5 is a rear view of the same;

FIG. 6 is a left side view of the same;

FIG. 7 is a right side view of the same;

FIG. 8 is a perspective view showing a handicraft gauge according to a second embodiment of our design;

FIG. 9 is a top plan view of the second embodiment handicraft gauge;

FIG. 10 is a bottom view of the second embodiment handicraft gauge;

FIG. 11 is a front view of the second embodiment handicraft gauge;

FIG. 12 is a rear view of the second embodiment handicraft gauge;

FIG. 13 is a left side view of the second embodiment handicraft gauge; and,

FIG. 14 is a right side view of the same.

The handicraft gauge is usable in making a macrame plant hanger for example. The gauge includes a plurality of lateral projections each having a leading edge used to provide a predetermined measure of length from a base end of the gauge. In use, the gauge is used to provide a constant interval between macrame knots in making a macrame plant hanger. The broken lines showing the base portion and two cooperative lateral projections are for illustrative purpose only and form no part of the claimed design.

The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.

Claims

We claim the ornamental design for an end portion of a handicraft gauge, as shown and described.

Referenced Cited
U.S. Patent Documents
D245587 August 30, 1977 Chaves
5163231 November 17, 1992 Craig
Patent History
Patent number: D848870
Type: Grant
Filed: Oct 18, 2017
Date of Patent: May 21, 2019
Assignee: CLOVER MFG. CO., LTD. (Osaka)
Inventors: Kumiko Nitta (Osaka), Katsuhiko Ozeki (Osaka)
Primary Examiner: Antoine Duval Davis
Application Number: 29/622,632