Immunochromatographic test device

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Description

FIG. 1 is a front right perspective view of an immunochromatographic test device according to the present invention.

FIG. 2 is a front view of the immunochromatographic test device of FIG. 1.

FIG. 3 is a rear view of the immunochromatographic test device of FIG. 1.

FIG. 4 is a top view of the immunochromatographic test device of FIG. 1.

FIG. 5 is a bottom view of the immunochromatographic test device of FIG. 1.

FIG. 6 is a right side view of the immunochromatographic test device of FIG. 1.

FIG. 7 is a left side view of the immunochromatographic test device of FIG. 1.

FIG. 8 is a front right perspective of the immunochromatographic test device of FIG. 1 with an open test drawer.

FIG. 9 is a front right perspective of the immunochromatographic test device of FIG. 1 with an open test drawer and a tester cartridge inserted therein for testing; and,

FIG. 10 is a front right perspective of the immunochromatographic test device of FIG. 1 with an open test drawer and a tester cartridge inserted therein for testing.

The broken lines shown in the figures represent portions of the immunochromatographic test device that form no part of the claimed design.

Claims

The ornamental design for an immunochromatographic test device, as shown and described.

Referenced Cited
U.S. Patent Documents
D678530 March 19, 2013 Khan et al.
D686311 July 16, 2013 Mori
D733917 July 7, 2015 Klein et al.
D734484 July 14, 2015 Nishikawa
D753311 April 5, 2016 Long
D772086 November 22, 2016 Schueren et al.
D796049 August 29, 2017 Nishikawa
D796050 August 29, 2017 Nishikawa
D797295 September 12, 2017 Nishikawa
D800320 October 17, 2017 Nishikawa
D819470 June 5, 2018 Schueren
D827859 September 4, 2018 Mathers
D833033 November 6, 2018 Foster
20150031136 January 29, 2015 Gwon
Patent History
Patent number: D851773
Type: Grant
Filed: Sep 7, 2017
Date of Patent: Jun 18, 2019
Assignee: SEKISUI Medical Co., Ltd. (Tokyo)
Inventors: Masato Nishikawa (Osaka), Kazuo Kotani (Tokyo), Motoki Morita (Tokyo), Keigo Kohno (Tokyo)
Primary Examiner: Wan Laymon
Assistant Examiner: Mark Booker
Application Number: 29/616,618