Control panel

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Description

FIG. 1 is perspective view of a first embodiment of a control panel showing our new design;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a rear elevation view thereof;

FIG. 4 is a right side elevation view thereof;

FIG. 5 is a left side elevation view thereof;

FIG. 6 is a bottom plan view thereof; and,

FIG. 7 is a top plan view thereof.

The broken lines illustrate unclaimed portions of the control panel that form no part of the claimed design.

Claims

The ornamental design for a control panel, as shown and described.

Referenced Cited
U.S. Patent Documents
3447594 June 1969 Andrews
D256230 August 5, 1980 Beale
D352025 November 1, 1994 Dellavecchia
D549184 August 21, 2007 Riley
D579800 November 4, 2008 Mobley
D608302 January 19, 2010 Liu
D776627 January 17, 2017 Shimohama
D788716 June 6, 2017 Ewringmann
D802540 November 14, 2017 Kurokawa
D807306 January 9, 2018 Suwa
Other references
  • Leica RM Rotary Microtone with controller; prior to Jan. 31, 2018; 1 pg. 1; https://www.google.com/search?q=controller+for+microtome&hl=en&biw=1536&bih=813&source=lnt&tbs=cdr%3A1%2Ccd_min%3A%2Ccd_max%3A1%2F31%2F2018&tbm=isch#imgrc=G9dE8LkxHuL59M:&spf=1561485663238.
  • Leica RM2255 Microtome, prior to Jan. 31, 2018; 1 pg. 1; https://www.google.com/search?q=controller+for+microtome&hl=en&biw=1536&bih=813&source=lnt&tbs=cdr%3A1%2Ccd_min%3A%2Ccd_max%3A1%2F31%2F2018&tbm=isch#imgrc=gevAFoeqOcj-nM:&spf=1561485663243.
  • Leica RM2145 Microtome; prior to Jan. 31, 2017; 1 pg.; https://www.google.com/search?q=controller+for+microtome&hl=en&biw=1536&bih=813&source=lnt&tbs=cdr%3A1%2Ccd_min%3A%2Ccd_max%3A1%2F31%2F2017&tbm=isch#imgrc=CeonZuevd5S_tM:&spf=1561486237241.
  • Cole Parmer, TBS SC4500; prior to Jan. 31, 2017; 1 pg.; https://www.google.com/search?q=controller+for+microtome&hl=en&biw=1536&bih=813&source=lnt&tbs=cdr%3A1%2Ccd_min%3A%2Ccd_max%3A1%2F31%2F2017&tbm=isch#imgrc=ok9DwQQPJM_ATM:&spf=1561486477574.
Patent History
Patent number: D875052
Type: Grant
Filed: Jan 31, 2018
Date of Patent: Feb 11, 2020
Assignee: LEICA MICROSYSTEMS LTD., SHANGHAI (Shanghai)
Inventors: Gang Zhou (Shanghai), Zheguang Fan (Shanghai), Jingtian Zhang (Shanghai), Xiang Liang (Shanghai)
Primary Examiner: Selina Sikder
Application Number: 29/635,586