Housing for a test and measurement instrument

- Tektronix, Inc.
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Description

FIG. 1 is a front-side isometric view of a housing for a test and measurement instrument.

FIG. 2 is a rear-side isometric view of the housing for the test and measurement instrument of FIG. 1.

FIG. 3 is a front view of the housing for the test and measurement instrument of FIG. 1.

FIG. 4 is a rear view of the housing for the test and measurement instrument of FIG. 1.

FIG. 5 is a left-side view of the housing for the test and measurement instrument of FIG. 1.

FIG. 6 is a right-side view of the housing for the test and measurement instrument of FIG. 1.

FIG. 7 is a top view of the housing for the test and measurement instrument of FIG. 1.

FIG. 8 is a bottom view of the housing for the test and measurement instrument of FIG. 1.

FIG. 9 is a front-side perspective view of an alternative embodiment of the test and measurement instrument of FIG. 1.

FIG. 10 is a rear-side isometric view of the housing for the test and measurement instrument of FIG. 9.

FIG. 11 is a front view of the housing for the test and measurement instrument of FIG. 9.

FIG. 12 is a rear view of the housing for the test and measurement instrument of FIG. 9.

FIG. 13 is a left-side view of the housing for the test and measurement instrument of FIG. 9.

FIG. 14 is a right-side view of the housing for the test and measurement instrument of FIG. 9.

FIG. 15 is a top view of the housing for the test and measurement instrument of FIG. 9.

FIG. 16 is a bottom view of the housing for the test and measurement instrument of FIG. 9.

The portions of the housing for the test and measurement instrument shown in broken lines form no part of the claimed design.

Claims

The ornamental design for a housing for a test and measurement instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
8195413 June 5, 2012 Freidhof
Patent History
Patent number: D894024
Type: Grant
Filed: Dec 14, 2018
Date of Patent: Aug 25, 2020
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Brian A. Hollenberg (Sherwood, OR), Jessica Anna Dunn (Beaverton, OR), Stephen LaFrance (Portland, OR), Taylor S. K. Heen (Beaverton, OR), Jonathan D. Clem (Hillsboro, OR), Joshua J. O'Brien (Aloha, OR), Preston S. Gabel (Mill Creek, WA), Marc A. Gessford (North Plains, OR)
Primary Examiner: Antoine Duval Davis
Application Number: 29/673,538
Classifications
Current U.S. Class: Oscilloscope Or Oscillograph (D10/76)