Electric contact

Info

Patent number: D918150
Type: Grant
Filed: Jul 23, 2019
Date of Patent: May 4, 2021
Assignee: KABUSHIKI KAISHA NIHON MICRONICS (Musashino)
Inventor: Eichi Osato (Musashino)
Primary Examiner: Darcey E Gottschalk
Application Number: 29/699,208

Description

Description

FIG. 1 is a front view of a first embodiment of an electric contact according to the present disclosure.

FIG. 2 is a rear view of the electric contact of FIG. 1.

FIG. 3 is a right side view of the electric contact of FIG. 1.

FIG. 4 is a left side view of the electric contact of FIG. 1.

FIG. 5 is a top view of the electric contact of FIG. 1.

FIG. 6 is a bottom view of the electric contact of FIG. 1.

FIG. 7 is a top front-left perspective view of the electric contact of FIG. 1.

FIG. 8 is a front view of a second embodiment of an electric contact according to the present disclosure.

FIG. 9 is a rear view of the electric contact of FIG. 8.

FIG. 10 is a right side view of the electric contact of FIG. 8.

FIG. 11 is a left side view of the electric contact of FIG. 8.

FIG. 12 is a top view of the electric contact of FIG. 8.

FIG. 13 is a bottom view of the electric contact of FIG. 8; and,

FIG. 14 is a top front-left perspective view of the electric contact of FIG. 8.

This article is an electric contact for testing and inspecting the electric characteristics of semiconductor devices such as semiconductor chips, etc.

Claims

The ornamental design for an electric contact, as shown and described.