Testing device

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Description

FIG. 1 is a front elevational view of the testing device;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a left-side elevational view thereof;

FIG. 5 is a right-side elevational view thereof;

FIG. 6 is a front, top, right perspective view thereof; and,

FIG. 7 is a back, top, left perspective view thereof.

The evenly spaced broken lines depict unclaimed parts of the testing device and form no part of the claimed design.

Claims

The ornamental design for a testing device, as shown and described.

Referenced Cited
U.S. Patent Documents
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D712447 September 2, 2014 He et al.
D787695 May 23, 2017 Mottscheller
D796360 September 5, 2017 Schulz et al.
D801202 October 31, 2017 Johnston
D823149 July 17, 2018 Schulze
10156586 December 18, 2018 Adams et al.
D840847 February 19, 2019 Doi et al.
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D847676 May 7, 2019 Matsumiya et al.
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Patent History
Patent number: D920818
Type: Grant
Filed: Feb 3, 2020
Date of Patent: Jun 1, 2021
Assignee: KOKUSAI KEISOKUKI KABUSHIKI KAISHA (Tama)
Inventors: Sigeru Matsumoto (Tokyo), Hiroshi Miyashita (Tokyo), Kazuyoshi Tashiro (Kanagawa), Kazuhiro Murauchi (Tokyo)
Primary Examiner: Richard E Chilcot
Application Number: 29/722,228
Classifications
Current U.S. Class: Balancer (D10/82)