Probe microscope

- SHIMADZU CORPORATION
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of a probe microscope showing my new design;

FIG. 2 is another perspective view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a right side view thereof;

FIG. 7 is a top view thereof; and,

FIG. 8 is a bottom view thereof.

Claims

The ornamental design for a probe microscope, as shown.

Referenced Cited
U.S. Patent Documents
D663338 July 10, 2012 Okamoto
D723079 February 24, 2015 Nauli
D750989 March 8, 2016 Shimizu
D811251 February 27, 2018 Barton
D812665 March 13, 2018 Klein
D866629 November 12, 2019 Chen
D872789 January 14, 2020 Haavisto
D876506 February 25, 2020 Apotheloz
D886653 June 9, 2020 Sugie
D887295 June 16, 2020 Carney
D888123 June 23, 2020 Han
D913523 March 16, 2021 Gardner
D933730 October 19, 2021 Kang
Patent History
Patent number: D956120
Type: Grant
Filed: Mar 18, 2020
Date of Patent: Jun 28, 2022
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Ryo Takegawa (Kyoto)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/728,338
Classifications
Current U.S. Class: Microscope (D16/131)