Probe microscope
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Description
Claims
The ornamental design for a probe microscope, as shown.
Referenced Cited
U.S. Patent Documents
D663338 | July 10, 2012 | Okamoto |
D723079 | February 24, 2015 | Nauli |
D750989 | March 8, 2016 | Shimizu |
D811251 | February 27, 2018 | Barton |
D812665 | March 13, 2018 | Klein |
D866629 | November 12, 2019 | Chen |
D872789 | January 14, 2020 | Haavisto |
D876506 | February 25, 2020 | Apotheloz |
D886653 | June 9, 2020 | Sugie |
D887295 | June 16, 2020 | Carney |
D888123 | June 23, 2020 | Han |
D913523 | March 16, 2021 | Gardner |
D933730 | October 19, 2021 | Kang |
Patent History
Patent number: D956120
Type: Grant
Filed: Mar 18, 2020
Date of Patent: Jun 28, 2022
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Ryo Takegawa (Kyoto)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/728,338
Type: Grant
Filed: Mar 18, 2020
Date of Patent: Jun 28, 2022
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Ryo Takegawa (Kyoto)
Primary Examiner: Richard Kearney
Assistant Examiner: Benjamin M Weeks
Application Number: 29/728,338
Classifications
Current U.S. Class:
Microscope (D16/131)