Mass microscope
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Description
The broken lines showing in the bottom view represent the portion of the mass microscope that forms no part of the claimed design.
Claims
The ornamental design for a mass microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
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Patent History
Patent number: D933730
Type: Grant
Filed: May 22, 2020
Date of Patent: Oct 19, 2021
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Hyeri Kang (Kyoto)
Primary Examiner: Mark A Goodwin
Assistant Examiner: Benjamin M Weeks
Application Number: 29/735,566
Type: Grant
Filed: May 22, 2020
Date of Patent: Oct 19, 2021
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Hyeri Kang (Kyoto)
Primary Examiner: Mark A Goodwin
Assistant Examiner: Benjamin M Weeks
Application Number: 29/735,566
Classifications
Current U.S. Class:
Microscope (D16/131)