Mass microscope
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Description
The broken lines showing in the bottom view represent the portion of the mass microscope that forms no part of the claimed design.
Claims
The ornamental design for a mass microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
| D418596 | January 4, 2000 | Dorns |
| D591864 | May 5, 2009 | Schmidt |
| D632323 | February 8, 2011 | Oonuma |
| D674830 | January 22, 2013 | Stoiakine |
| D715843 | October 21, 2014 | Kawai |
| D745185 | December 8, 2015 | Kimura |
| D750989 | March 8, 2016 | Shimizu |
| D766762 | September 20, 2016 | Kawai |
| D811251 | February 27, 2018 | Barton |
| D811913 | March 6, 2018 | Barton |
| D886653 | June 9, 2020 | Sugie |
| D887295 | June 16, 2020 | Carney |
| D895462 | September 8, 2020 | Kimura |
| D900331 | October 27, 2020 | Livingston |
| D913523 | March 16, 2021 | Gardner |
| D915914 | April 13, 2021 | Kojima |
| D925381 | July 20, 2021 | Nakatsukasa |
Patent History
Patent number: D933730
Type: Grant
Filed: May 22, 2020
Date of Patent: Oct 19, 2021
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Hyeri Kang (Kyoto)
Primary Examiner: Mark A Goodwin
Assistant Examiner: Benjamin M Weeks
Application Number: 29/735,566
Type: Grant
Filed: May 22, 2020
Date of Patent: Oct 19, 2021
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Hyeri Kang (Kyoto)
Primary Examiner: Mark A Goodwin
Assistant Examiner: Benjamin M Weeks
Application Number: 29/735,566
Classifications
Current U.S. Class:
Microscope (D16/131)