Examination suit
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The broken lines depict portions of the examination suit that form no part of the claimed design. The dot-dash lines in the drawings depict the boundaries of the enlarged views that form no part of the claimed design.
Claims
The ornamental design for an examination suit, as shown and described.
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Type: Grant
Filed: Apr 2, 2020
Date of Patent: Aug 2, 2022
Assignee: ANKON TECHNOLOGIES CO., LTD. (Wuhan)
Inventors: Yun Chen (Wuhan), Shiyu Huang (Wuhan), Pan Zhou (Wuhan)
Primary Examiner: Omeed Agilee
Application Number: 29/730,292