Test chip
Description
The rear view is omitted since it is symmetrical to the front view. The broken lines represent portions of the test chip and form no part of the claimed design.
Claims
The ornamental design for a test chip, as shown and described.
Referenced Cited
U.S. Patent Documents
| 4965047 | October 23, 1990 | Hammond |
| D392391 | March 17, 1998 | Douglas |
| D420141 | February 1, 2000 | Casterlin |
| D477670 | July 22, 2003 | Jurik |
| D483496 | December 9, 2003 | Kjendlie |
| D694425 | November 26, 2013 | Markovsky |
| D800001 | October 17, 2017 | Winter |
| D889684 | July 7, 2020 | Johnson |
| D895140 | September 1, 2020 | Heron |
| 20110030458 | February 10, 2011 | Park |
| 20190374945 | December 12, 2019 | Hallock |
| 20200376485 | December 3, 2020 | Azpiroz |
Patent History
Patent number: D968638
Type: Grant
Filed: Jun 17, 2021
Date of Patent: Nov 1, 2022
Assignee: CELLSPECT CO., LTD. (Iwate)
Inventors: Seung Kyum Kim (Iwate), Takashi Ito (Iwate), Tomohiko Edura (Iwate)
Primary Examiner: Anhdao Doan
Application Number: 29/795,339
Type: Grant
Filed: Jun 17, 2021
Date of Patent: Nov 1, 2022
Assignee: CELLSPECT CO., LTD. (Iwate)
Inventors: Seung Kyum Kim (Iwate), Takashi Ito (Iwate), Tomohiko Edura (Iwate)
Primary Examiner: Anhdao Doan
Application Number: 29/795,339
Classifications