Portion of a display panel with a graphical user interface

- Applied Materials, Inc.
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front view of a portion of a display panel with a graphical user interface showing our new design in a first image.

FIG. 2 is a front view of a portion of a display panel with a graphical user interface showing our new design in a second image; and,

FIG. 3 is a front view of a portion of a display panel with a graphical user interface showing our new design in a third image.

The broken lines including the showing of a portion of a display panel with the illustrated graphical user interface and the portions of the graphical user interface are included for the purpose of illustrating environmental structure and form no part of the claimed design.

The appearance of the transitional image sequentially transitions between the images shown in FIGS. 1-3. No ornamental aspects are associated with the process or period in which one image transitions to another image.

Claims

The ornamental design for a portion of a display panel with a graphical user interface, as shown and described.

Referenced Cited
U.S. Patent Documents
5226118 July 6, 1993 Baker
5427878 June 27, 1995 Corliss
D605652 December 8, 2009 Plaisted
D618695 June 29, 2010 Bennett
8257546 September 4, 2012 Davis et al.
D756371 May 17, 2016 Bertnick
D766940 September 20, 2016 Napper
D767612 September 27, 2016 Hemsley
D781300 March 14, 2017 Rhodes
D819066 May 29, 2018 Anderson
D829749 October 2, 2018 Kang
D874481 February 4, 2020 Kumar
D884015 May 12, 2020 Walfridsson et al.
D890799 July 21, 2020 Heffernan et al.
D892143 August 4, 2020 Dascola
D897372 September 29, 2020 Levy
D914703 March 30, 2021 Capela
D924910 July 13, 2021 Laumann
D928818 August 24, 2021 Yuk
D937861 December 7, 2021 Torrance
D938465 December 14, 2021 Shen
D940169 January 4, 2022 Boutros
D941851 January 25, 2022 Anderson
D946019 March 15, 2022 Swango
D948543 April 12, 2022 Friedland
D960913 August 16, 2022 Kiikkala
D961605 August 23, 2022 Starr
20020018217 February 14, 2002 Weber-Grabau et al.
20050041255 February 24, 2005 Hyun et al.
20050187649 August 25, 2005 Funk et al.
20070134829 June 14, 2007 Wilke
20110172952 July 14, 2011 Ummethala et al.
20150004721 January 1, 2015 Akimoto et al.
20160077025 March 17, 2016 Zhang et al.
20160313658 October 27, 2016 Bringoltz et al.
20170038201 February 9, 2017 Bozdog
20180150052 May 31, 2018 Cherian
20190064751 February 28, 2019 Oh
20190121928 April 25, 2019 Wu et al.
20190286075 September 19, 2019 Yennie et al.
20190347527 November 14, 2019 Bhaviripudi et al.
20200083070 March 12, 2020 Clark et al.
20200110341 April 9, 2020 Mossavat et al.
20200110390 April 9, 2020 Banna
20220026817 January 27, 2022 Ummethala
20220246457 August 4, 2022 Sundar
Foreign Patent Documents
305860013 June 2020 CN
306604020 June 2021 CN
2020-004817 January 2002 JP
2018037559 March 2018 JP
D1644619 August 2019 JP
D1651220 January 2020 JP
D1659894 May 2020 JP
D1664109 July 2020 JP
101910268 October 2018 KR
0229393 April 2002 WO
2012099907 July 2012 WO
2019200015 October 2019 WO
020094325 May 2020 WO
Other references
  • “Production-centric Yield Management for Wafer Manufacturing” Jan. 5, 2018, Synopisis, site visited Jan. 6, 2022: https://www.synopsys.com/content/dam/synopsys/silicon/datasheets/odyssey-ds.pdf (Year: 2018).
  • Zalusky, Sarah et al. “Developing a Non-destructive Manufacturing Test to Detect Crystal Defects in Semiconductor Wafers” Apr. 8, 2020, JKI, site visited Sep. 2, 2022: https://www.jki.net/femtometrix-case-study (Year: 2020).
  • Ronald L. Allen et al.,“Application of neural networks to plasma etch end point detection”, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 14, 498 (1996), pp. 498-503.
  • PCT International Search Report and Written Opinion for International Application No. PCT/US2021/048061 dated Dec. 17, 2021, 9 pages.
  • PCT International Search Report and Written Opinion for International Application No. PCT/US2021/042646 dated Nov. 2, 2021,10 pages.
  • PCT International Search Report and Written Opinion for International Application No. PCT/US2021/042639 dated Nov. 11, 2021,10 pages.
  • PCT International Search Report and Written Opinion for International Application No. PCT/US2021/042643 dated Nov. 11, 2021,9 pages.
  • Taiwan Search report of Taiwan Application No. 110300382 dated Sep. 27, 2021, 7 pages.
Patent History
Patent number: D977504
Type: Grant
Filed: Jul 22, 2020
Date of Patent: Feb 7, 2023
Assignee: Applied Materials, Inc. (Santa Clara, CA)
Inventors: Upendra V. Ummethala (Cupertino, CA), Blake Erickson (Gilroy, CA), Prashanth Kumar (Union City, CA), Michael Kutney (Santa Clara, CA), Steven Trey Tindel (Austin, TX), Zhaozhao Zhu (Milpitas, CA)
Primary Examiner: Katherine A Holbrow
Assistant Examiner: Christopher M Spivey
Application Number: 29/743,600
Classifications
Current U.S. Class: Drop Down Menu Or Full Screen Menu Type (D14/486)