Patents Issued in December 20, 2001
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Publication number: 20010052741Abstract: The present invention aims to construct a display unit installed in a front surface of a door of a refrigerator such that its installation angle can be adjusted.Type: ApplicationFiled: June 18, 2001Publication date: December 20, 2001Applicant: LG Electronics IncInventor: Keyong-Seok Yun
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Publication number: 20010052742Abstract: A cathode structure comprises a cathode, a cathode sleeve, a cathode holder and a cathode strap. The cathode sleeve contains a heater. A hold structure includes a cylindrical cathode support cylinder for holding the cathode structure, and a cathode support strap having an elongated plate shape and having a cylindrically curved portion engaging the cathode support cylinder. An opening portion is formed in the cylindrically curved portion of the cathode support strap. The cathode support cylinder of the hold structure and the cathode holder of the cathode structure are welded through the opening portion, and the cathode structure is held by the hold structure.Type: ApplicationFiled: April 21, 1999Publication date: December 20, 2001Inventors: SHIGERU SUGAWARA, HIROFUMI UENO, TSUTOMU TAKEKAWA
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Publication number: 20010052743Abstract: A directly thermionic flat emitter is presented whose emitting surface contains meandering conductor tracks. The conductor tracks are formed by slots in the emitting surface. The slots are arranged as claimed in a pattern of cuts which comprises a multiplicity of straight slots (3; 8, 9) which run at least transverse to the course of the main current direction and are arranged in a plurality of rows offset from one another. Meandering current paths (4) are thereby produced.Type: ApplicationFiled: June 11, 2001Publication date: December 20, 2001Inventors: Erich Hell, Detlef Mattern, Markus Schild
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Publication number: 20010052744Abstract: A monochrometer mounted with the electron gun of an electron microscope or the like. This monochrometer does not need movement of a slit. An electron source consisting of any one of a thermal emission-type electron source (such as an LaB6 electron source or a tungsten hairpin), a Schottky emission-type electron source, and a tunneling field emission-type electron source is used. The slit is made of a single metal plate and mounted in position fixedly. Electrons are emitted from the electron source and dispersed within a plane including the slit according to energies. The slit is so positioned that it passes only those of the dispersed electrons which have energies close to the peak energy and blocks electrons having energies higher or lower than the peak energy.Type: ApplicationFiled: April 10, 2001Publication date: December 20, 2001Applicant: JEOL Ltd.Inventor: Katsushige Tsuno
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Publication number: 20010052745Abstract: A shadow mask includes a mask body having a principal mask surface with electron beam passage apertures, a skirt portion, and long and short axes, and a mask frame attached to outside the skirt portion. The mask frame has a coefficient of thermal expansion higher than that of the mask body. The skirt portion includes first and second tongue portions situated on the short and long axes, respectively. Each of the first and second tongue portions is fixed to the mask frame.Type: ApplicationFiled: May 24, 2001Publication date: December 20, 2001Inventors: Takashi Murai, Shinichiro Nakagawa, Yoshiaki Ito
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Publication number: 20010052746Abstract: A tension mask frame assembly for a color picture tube includes a tension mask where a plurality of strips formed on a thin plate to be separated a predetermined distance forming slots, a plurality of tie bars for connecting the strips and sectioning the slots at a predetermined pitch, and a plurality of dummy bridges extending from at least one strip toward a facing strip in the slots sectioned by the tie bars, and a frame supporting the edge of the tension mask so that a not less than can be applied to the tension mask. In the tension mask frame assembly, the area of the dummy bridge of the tension mask is smaller from the central portion of the tension mask to the peripheral portion thereof.Type: ApplicationFiled: April 20, 2001Publication date: December 20, 2001Inventors: Soon-Cheol Shin, Sung-Oh Rho, Chan-Yong Kim, Jong-Han Rhee
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Publication number: 20010052747Abstract: The invention relates to a color cathode ray tube. The color cathode ray tube comprises a display screen, an electron gun for generating three electron beams, wherein the electron beams are directed towards the display screen. Also deflection means are present for generating a magnetic field in a first direction for deflecting the electron beams across the display screen. The electron gun comprises a centering cup having a first part provided with a central aperture and two outer apertures for passing the three electron beams, and a second part extending in the direction of the display screen.Type: ApplicationFiled: June 18, 2001Publication date: December 20, 2001Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.Inventors: Reiner Maria Jungbult, Ronald Van Der Wilk
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Publication number: 20010052748Abstract: The present invention relates to a deflection unit for mounting on a color cathode ray tube. The deflection unit comprises a coil body for a vertical deflection coil and a first and second means for displacing the coil body into a first and second direction. The first and second directions are offset by 90° and are positioned in parallel with the screen plane of the color cathode ray tube. In a preferred embodiment of the invention the first and second means respectively comprise displacement bow members which can be displaced by means of a screw. The screws are preferably identical. To secure the Z-position, the coil body is preferably slid into a cap and rotated in the stop position.Type: ApplicationFiled: March 29, 2001Publication date: December 20, 2001Applicant: Matsushita Display Devices (Germany) GmbHInventor: Heinz Lehner
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Publication number: 20010052749Abstract: A cathode ray tube includes a panel having a substantially flat outer surface and an inner curved surface with a phosphor screen. The panel has a substantially rectangular effective screen portion with two long sides parallel to each other, two short sides parallel to each other and four rounded edges interconnecting each long side and the neighboring short side. The effective screen portion is structured such that a first line V1 interconnecting centers of the long sides, a second line H1 interconnecting centers of the short sides and a third line D1 interconnecting centers of the rounded edges opposite to each other meet at a point. The effective screen portion has a first thickness Tv at the centers of the long sides, a second thickness Th at the centers of the short sides, a third thickness Td at the centers of the edges and a fourth thickness Tc at the meeting point of the first to third lines V1, H1 and D1.Type: ApplicationFiled: January 22, 2001Publication date: December 20, 2001Applicant: Samsung Display Devices Co., Ltd.Inventors: Do-Houn Pyun, Wan Kim, Chan-Yong Kim
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Publication number: 20010052750Abstract: Disclosed is a color cathode ray tube, comprising a glass bulb having a phosphor screen formed on the inner surface, a mask frame having a frame-like body arranged within the glass bulb, a shadow mask stretched between the mutually facing two sides of the mask frame, and a reinforcing band mounted to the outer circumferential surface of the glass bulb, wherein the reinforcing band exhibits a permeability &mgr; falling within a range of between 430 and 640 under a magnetic field of 0.3 Oe.Type: ApplicationFiled: June 5, 2001Publication date: December 20, 2001Applicant: NKK CorporationInventors: Yasushi Tanaka, Hideki Matsuoka, Kenji Tahara, Susumu Kitajima, Hiromi Wakasono
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Publication number: 20010052751Abstract: An organic electroluminescence element is comprised of a laminate of an anode, a light emitting layer made of an organic compound, an electron transport layer made of an organic compound, and a cathode. In the electroluminescence element, a hole blocking layer made of an organic compound is laminated between the light emitting layer and the electron transport layer. The hole blocking layer is a mixed layer made of plural kinds of electron transport materials.Type: ApplicationFiled: February 22, 2001Publication date: December 20, 2001Inventors: Takeo Wakimoto, Teruichi Watanabe, Kenji Nakamura
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Publication number: 20010052752Abstract: The present invention is directed to an OLED display device including an encapsulation assembly and methods for making such devices. The encapsulation assembly includes at least two layers, one of which is a dielectric oxide layer directly in contact with at least part of a substrate, and the other of which is preferably a polymer layer.Type: ApplicationFiled: February 15, 2001Publication date: December 20, 2001Inventors: Amalkumar P. Ghosh, Gary W. Jones, Webster E. Howard
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Publication number: 20010052753Abstract: A discharge inhibiting film is formed in an area corresponding to a space defined between adjacent electrode pairs on a surface of a cathode film of a front panel. The discharge inhibiting film is formed by a process using a paste, such as a printing process. The paste comprises, for example, a kneaded mixture of: (a) a powder of discharge inhibiting material such as TiO2 and Al2O3; (b) a glass powder such as PbO; (c) a resin such as ethyl cellulose; and (d) an organic solvent such as terpineol. The powders used here are not greater than 1 &mgr;m in average particle size. Further, for example, the viscosity of the paste is controlled to, e.g., 30 to 100 Pa·s. Such a paste is printed, dried and fired to produce the discharge inhibiting film.Type: ApplicationFiled: June 1, 2001Publication date: December 20, 2001Inventor: Keisuke Jo
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Publication number: 20010052754Abstract: A direct-current-lighting, ultra-high-pressure mercury lamp that is resistant to loss of transparency even after being lit for a long period, and has little wastage of electrodes and particularly the cathode tip, and also exhibits a long service life. The direct-current ultra-high-pressure mercury lamp includes a cathode and anode of tungsten facing each other within a quartz glass tube, and a cathode coil which is wrapped around the cathode. The cathode is composed of tungsten doped with potassium, and the anode is composed of tungsten having a purity of at least 99.99%. The cathode coil can also be advantageously formed of tungsten having a purity of at least 99.99%.Type: ApplicationFiled: April 23, 2001Publication date: December 20, 2001Inventor: Shoji Miyanaga
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Publication number: 20010052755Abstract: A discharge tube is comprised of a glass bulb, a cathode, and an anode. Impregnating porous tungsten with barium makes the cathode tip portion. A clearance between the end face of a lead rod and the end face of the cathode tip portion is filled with a molybdenum-ruthenium brazing filler metal.Type: ApplicationFiled: July 26, 2001Publication date: December 20, 2001Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Nobuharu Harada, Syoji Ishihara
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Publication number: 20010052756Abstract: The controller possesses a reference torque signal setting unit which generates a reference signal which becomes high when the detected signal becomes high based on at least the signal detected from the steering torque sensor; a correction torque signal setting unit which generates a correction torque signal (DN*RT*RV), which becomes high when the detected signal becomes high based on at least the signals detected from the revolution number sensor for the electric motor and from the vehicle speed sensor; and a target torque signal calculator which subtracts the correction torque signal from the reference torque signal (DN*RT*RV) to output a target torque signal (DT+−DN*RT*RV) to the electric motor; and the controller also making the correction torque signal high when failure of the vehicle speed sensor is detected.Type: ApplicationFiled: March 27, 2001Publication date: December 20, 2001Applicant: Honda Giken Kogyo Kabushiki KaishaInventors: Yoshiki Noro, Yoshinobu Mukai
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Publication number: 20010052757Abstract: A control apparatus for an automatic lathe includes a numerical controller, and comprises an input device, a readout section, and a machining program storage section. The input device inputs a machining program expressed by a predetermined language. The readout section reads out the machining program from the input device and digitizes it. The machining program storage section stores the digitized machining program into a timing table form in the order of execution. From the machining program storage section, various kinds of data such as the positional data of tools stated in the stored machining program, rotational data and movement data of a workpiece, and the like are sent out to an editing section. In the editing section, these various kinds of data are reedited and stored by a movement data editing portion.Type: ApplicationFiled: June 15, 2001Publication date: December 20, 2001Applicant: STAR MICRONICS CO., LTD.Inventor: Tetsuya Sugiyama
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Publication number: 20010052758Abstract: The present invention relates to a power supply system, in particular, to a power supply apparatus and a power supply method that each use a high impedance battery used for electric equipment such as a notebook PC (notebook type personal computer).Type: ApplicationFiled: March 2, 2001Publication date: December 20, 2001Inventor: Shigefumi Odaohhara
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Publication number: 20010052759Abstract: A charge/discharge control circuit has a circuit structure having another return detection voltage different from a detection voltage for detecting an over-current when returning from an over-current state to a normal state. With the structure, the charge/discharge control circuit surely returns from the over-current state to the normal state even it a load of 1 M&OHgr; or less in a low impedance is opened.Type: ApplicationFiled: May 11, 2001Publication date: December 20, 2001Inventors: Atsushi Sakurai, Koichi Yamasaki
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Publication number: 20010052760Abstract: In an automobile power supply where plural voltages can be supplied, a plurality of batteries and a DC/DC converter are assumed to be unnecessary, and it is possible to operate even when the controller breaks down.Type: ApplicationFiled: June 19, 2001Publication date: December 20, 2001Applicant: Hitachi, Ltd.Inventors: Masahiko Amano, Ryoso Masaki, Yasuo Morooka
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Publication number: 20010052761Abstract: A vehicular AC generator comprises a resistor for ground one-phase output terminal in an armature coil, a switch means for connecting and disconnecting at least one-phase output terminal out of the other phases of the armature coil to and from the ground, and a control unit for controlling the switch means. The switch means is controlled ON and OFF in accordance with a voltage generated across the resistor. According to this configuration, in the event of occurrence of leakage current in the armature coil, the occurrence of the leakage current is detected based on the voltage generated across the resistor and the switch means is closed, whereby the leakage current is allowed to escape to ground and an actual signal from the resistor is detected easily.Type: ApplicationFiled: June 19, 2001Publication date: December 20, 2001Applicant: DENSO CORPORATIONInventors: Makoto Taniguchi, Hiroaki Ishikawa, Koji Tanaka
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Publication number: 20010052762Abstract: The present invention is a power supply device including a power input terminal which inputs a DC voltage, a DC/DC converter which has a feedback terminal and converts the input DC voltage from the power input terminal, a power output terminal which outputs the DC voltage converted by the DC/DC converter, a voltage generator which supplies a voltage, and a resistor which is connected between the power output terminal and the voltage generator. The feedback terminal is connected between the register and voltage generator.Type: ApplicationFiled: March 15, 2001Publication date: December 20, 2001Applicant: KABUSHIKI KAISHA TOSHIBAInventor: Hiroyuki Tsuji
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Publication number: 20010052763Abstract: An orifice arrangement for sensing by the electrical resistance pulse method the volume of particles in a fluid suspension passing through an orifice which comprises an orifice member made of electrically insulating material (1) and electrically resistive material (2) disposed before, within, and after the orifice. The orifice is cylindrical with well rounded entry and exit corners. The resistive material has an aperture for the passage of particles through it and the orifice generally centered with the orifice center. The resistive material has an electrical resistivity matching that of the particle suspending fluid. Thus the electric field within the orifice is substantially the same with or without the resistive material. The aperture restricts particles to trajectories through the orifice where the maximum electric field intensity is substantially uniform thus accurately sizing the particles.Type: ApplicationFiled: December 22, 2000Publication date: December 20, 2001Inventor: Howard L. North
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Publication number: 20010052764Abstract: What is described here is a magnetic-field device for stimulating and/or supporting physical functions such as the treatment of fractures, comprisingType: ApplicationFiled: January 26, 2001Publication date: December 20, 2001Inventor: Werner Siekmann
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Publication number: 20010052765Abstract: A non-contact type current measuring instrument includes an armoring member having a pair of guide portions for a conductor under measurement that form therebetween a guide path with an open end; a magnetic core ring for seizing a magnetic flux that has an open space, is embedded in the armoring member, and comprises a semicircular portion, a pair of straight portions continuous to opposite ends of the semicircular portion and parallel to the guide path and a pair of projecting portions continuous to inside edges of the straight portions and bent so as to face each other and be perpendicular to the guide path; and Hall elements each inserted into and brought into intimate contact with an end face of each of the projecting portions, the conductor being inserted via the open end into the guide path and disposed within the core ring.Type: ApplicationFiled: May 15, 2001Publication date: December 20, 2001Applicant: KYORITSU ELECTRICAL INSTRUMENTS WORKS, LTD.Inventor: Takashi Seike
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Publication number: 20010052766Abstract: An apparatus, in particular for simulating electrical sensor/actuator components, having a drive module (4), which provides a model (5, 6, 7) of the S/A component to be simulated and generates interface signals (U1n, Un) in accordance with the signals of the real S/A component to be simulated, and having a signal interface (12, 26) for each connection pin (28, 29) of the apparatus (1), which is driven by the real-time signals (8, 9, 10, 11) of the drive module (4) and generates, for each interface connection pin (28, 29), an interface signal (U1n, Un) corresponding to the electrical signals of the real S/A component, in which case the current direction or the energy flow of the interface signals (U1n, Un) can be directed, in a manner influenced by a control/regulation circuit of the signal interface (12, 26), towards the signal interface (12, 26) or away from the latter, with the result that the apparatus can optionally simulate a sensor or an actuator.Type: ApplicationFiled: January 16, 2001Publication date: December 20, 2001Inventors: Joerg Drescher, Dieter Grohmann, Wolfgang Kull, Andreas Riemer, Bernhard Spitzer
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Publication number: 20010052767Abstract: A sorting control method of tested ICs for sorting and reloading tested ICs held on a test tray to customer trays in accordance with test results, wherein a calculating from the test results an occurrence rate of each category of tested ICs held on the test tray and starting reloading from ICs of a category having a low occurrence rate and when a second tray for holding ICs of the category is being changed, reloading of ICs of a category having a high occurrence rate is performed.Type: ApplicationFiled: June 13, 2001Publication date: December 20, 2001Inventors: Yutaka Watanabe, Haruki Nakajima, Hiroki Ikeda
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Publication number: 20010052768Abstract: A proximity sensor for determining the gap between a sensor and a metal target which is insensitive to noise, changes in temperature of the sensor and different lengths of wire by measuring the AC conductance, DC conductance and susceptance of the sensor and using the measured values with a predetermined data base to derive the desired gap distance.Type: ApplicationFiled: May 13, 1999Publication date: December 20, 2001Inventors: NICK ANTHONY DEMMA, LEROY ERNEST VETSCH, STEPHEN FORREST ROGOFF
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Publication number: 20010052769Abstract: An apparatus is provided for quantitatively measuring groups of magnetic particles. The particles are complexed with substances to be determined and are excited in a magnetic field. The magnetizations of the magnetic particles are thereby caused to oscillate at the excitation frequency in the manner of a dipole to create their own fields. These fields are inductively coupled to at least one sensor such as sensing coils fabricated in a gradiometer configuration. The output signals from the sensing coils are appropriately amplified and processed to provide useful output indications.Type: ApplicationFiled: July 23, 2001Publication date: December 20, 2001Inventors: Michael Bancroft Simmonds, Kurt Gordon Jensen, Jost Hermann Diederichs, Randall Christopher Black
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Publication number: 20010052770Abstract: An apparatus is provided for quantitatively measuring groups of magnetic particles. The particles are complexed with substances to be determined and are excited in a magnetic field. The magnetizations of the magnetic particles are thereby caused to oscillate at the excitation frequency in the manner of a dipole to create their own fields. These fields are inductively coupled to at least one sensor such as sensing coils fabricated in a gradiometer configuration. The output signals from the sensing coils are appropriately amplified and processed to provide useful output indications.Type: ApplicationFiled: July 23, 2001Publication date: December 20, 2001Inventors: Michael Bancroft Simmonds, Kurt Gordon Jensen, Jost Hermann Diederichs, Randall Christopher Black
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Publication number: 20010052771Abstract: In order to provide a position measuring system, comprising a transmitter, a sensor with an inductive element to which the transmitter is coupled electromagnetically and an evaluating unit, wherein the sensor and the transmitter are adapted to be positioned relative to one another, whereby said position measuring system will be of simple construction and can thus be manufactured economically while being employable universally, provision is made for the inductive element to be coupled to an oscillator which is affected by the Q factor and/or the effective inductance of the inductive element, for the Q factor and/or the effective inductance of the inductive element to be determined by the size of an effective sensor region to which the transmitter is coupled, and/or by the size of an effective transmitter region which is coupled to an effective sensor region, and for the sensor and/or the transmitter to be formed in such a manner that the size of the effective sensor region to which the transmitter is coupled,Type: ApplicationFiled: May 1, 2001Publication date: December 20, 2001Applicant: Balluff GmbHInventor: Manfred Jagiella
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Publication number: 20010052772Abstract: A magnetostrictive application probe is disclosed wherein the probe includes a preassembled sensor element mounted as an application housing installation as an installable unit. The modular nature allows interchanging with various electronic assemblies, and may be an explosion proof installation.Type: ApplicationFiled: March 10, 1997Publication date: December 20, 2001Inventors: RODNEY BARR, MICHAEL L. GLODEN, ARNOLD FRED SPRECHER
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Publication number: 20010052773Abstract: A test simulation circuit includes a simulated read/write head with a magnet shield and a magnetoresistive sensor exposed at a lapped surface. The test simulation circuit also includes first and second electrical test path connected respectively to the magnet shield and the magnetoresistive sensor. The second electrical test path is electrically isolated from the first electrical test path.Type: ApplicationFiled: June 1, 2001Publication date: December 20, 2001Inventors: Kevin R. Heim, Clifton H. Chang, Peter T. Weyandt, Patrick J. Ryan
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Publication number: 20010052774Abstract: Sensors are permanently placed in the ground near observation and injection wells in order to passively and continuously monitor the status of seawater advance toward fresh water aquifers near coastal cities as well as the status of fresh water injected into the injection wells. Such sensor devices are installed in the ground and electrically connected to surface acquisition equipment that would, without human intervention, transmit acquired data to a centralized facility for processing and interpretation. Various types of sensors can be used: the sensors used for general reservoir monitoring and/or the sensors used for leak detection, soil heating, and temperature mapping. Alternatively, a special type of sensor can be designed and provided for the purpose of monitoring the status of seawater advance toward fresh water aquifers.Type: ApplicationFiled: January 29, 2001Publication date: December 20, 2001Inventors: David J. Rossi, Willem A. Wijnberg, Peter V. Howard, Jean-Pierre R. Delhomme, Kamal Babour
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Publication number: 20010052775Abstract: The electronic ignition device comprises: an ignition coil having a primary winding terminal and a secondary winding terminal generating a spark; a power element arranged between the primary winding terminal and ground; a protection circuit issuing a disable signal to the control terminal of the power element in preset conditions; and a voltage limiting circuit having inputs connected to the primary winding terminal and to the battery voltage, and an output connected to the control terminal of the power element. The voltage limiting circuit detects a potential difference between its own inputs and supplies to the control terminal an activation signal for the power element, in presence of the deactivation signal and when the potential difference exceeds the supply voltage by a preset value. Thereby, the voltage limiting circuit limits the voltage on the primary winding terminal to a preset value which depends upon the value of the battery voltage.Type: ApplicationFiled: January 25, 2001Publication date: December 20, 2001Inventor: Antonino Torres
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Publication number: 20010052776Abstract: A contactor comprises a switching circuit for switching a load between one or more electrical supplies, a current detector for detecting the current flowing through the load, a trip circuit for tripping the current after an interval of time which depends upon how much the current flowing through the load exceeds a predetermined amount, and a pre-trip circuit for providing an indication during said time interval that the current exceeds said predetermined amount for providing ‘pre-trip’ or ‘near-trip’ information.Type: ApplicationFiled: March 9, 2001Publication date: December 20, 2001Inventor: Simon Turvey
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Publication number: 20010052777Abstract: The resistance value and the leakage current of a load can be measured simultaneously. A load current is fed, mirrored by electrical power supplies (1, 3, 36), into a resistance measuring circuit (13, 30) and a leakage current measuring circuit (14 to 16). This permits rapid, precise measurement of a plurality of loads by a single measuring circuit connected via one multiplexer. The firing transistors can be distributed among different ASICs or provided jointly for a plurality of firing caps.Type: ApplicationFiled: March 9, 2001Publication date: December 20, 2001Inventors: Horst Belau, Stefan Hermann, Marten Swart
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Publication number: 20010052778Abstract: A system and method that detects and locates defects in solid insulation is disclosed. The system and method solves difficult detection and location problems, such as when the break is not close enough to another exposed conductor to fail a high-voltage breakdown test. The system tests insulated conductors using a high-voltage breakdown tester, a connection integrity tester capable of identifying unintended connections, a means of connecting the tester to the conductors, and an inflatable bladder that causes a conductive material attached to the two testers to conform to the shape of the conductor. The inflatable bladder may be used as part of a gas or liquid dispensing system for enhancing the effectiveness of the test.Type: ApplicationFiled: June 4, 2001Publication date: December 20, 2001Inventor: Paul Samuel Smith
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Publication number: 20010052779Abstract: An apparatus to enable any person without measuring skills to measure an electromagnetic radiation of over 1 GHz very accurately and in a short period of time is provided, in which: rotary drive means drives and turns electronic equipment per predetermined angle, and whenever such rotation stops after covering the preceding angle, means of detecting radiation is shifted vertically by perpendicular drive means to the extent of a predetermined height; during the upward shift, detection signals continuously check and calculate the frequency spectrum that recorded the maximum field intensity of each frequency by the operation of field intensity measuring means per rotational stop, and this frequency spectrum makes it possible for data analysis means to analyze the maximum field intensity of each frequency with respect to all measured data and the directional characteristic of the field intensity at each frequency mentioned above and to output the results accordingly.Type: ApplicationFiled: June 1, 2001Publication date: December 20, 2001Applicant: Sony CorporationInventor: Masahiro Okazaki
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Publication number: 20010052780Abstract: A metallic leadframe for use with a semiconductor chip intended for operation in a changing magnetic field comprises a chip mount pad having at least one slit penetrating the whole thickness of the pad and substantially traversing the area of the pad from one edge to the opposite edge. This slit is wide enough to interrupt electron flow in the pad plane, but not wide enough to significantly reduce thermal conduction in a direction normal to the pad plane, whereby the slit is operable to disrupt eddy currents induced in the pad by the changing magnetic field.Type: ApplicationFiled: June 2, 2001Publication date: December 20, 2001Inventor: Kambiz Hayat-Dawoodi
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Publication number: 20010052781Abstract: Electron beam is irradiated to a wafer in the midst of steps at predetermined intervals by a plurality of times under a condition in which a junction becomes rearward bias and a difference in characteristic of a time period of alleviating charge in the rearward bias is monitored. As a result, charge is alleviated at a location where junction leakage is caused in a time period shorter than that of a normal portion and therefore, a potential difference is produced between the normal portion and a failed portion and is observed in a potential contrast image as a difference in brightness. By consecutively repeating operation of acquiring the image, executing an image processing in real time and storing a position and brightness of the failed portion, the automatic inspection of a designated region can be executed. Information of image, brightness and distribution of the failed portion is preserved and outputted automatically after inspection.Type: ApplicationFiled: June 15, 2001Publication date: December 20, 2001Inventors: Mari Nozoe, Mitsuo Suga, Yoichiro Neo, Hidetoshi Nishiyama
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Publication number: 20010052782Abstract: An on-board tester (referred to as a “test fixture”) for testing integrated circuit chips, particularly ball grid array (BGA) chips. The test fixture of the present invention eliminates many of the problems associated with presently available test fixtures, particularly the lack of control in mounting the chips to the test fixture, and the unpredictable testing results. The present test fixture has an upper assembly and a lower assembly. A circuit board containing the BGA chip to be tested is mounted between the upper and lower assemblies. The lower assembly has guide pins extending toward the upper assembly which allows any circuit board having alignment holes that match the configuration of the guide pins to be mounted to the lower assembly. Moreover, the present test fixture has a unique latching mechanism which uses rotational movement to latch and unlatch the test fixture.Type: ApplicationFiled: May 8, 2001Publication date: December 20, 2001Inventor: David Alan Brule
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Publication number: 20010052783Abstract: According to the invention, one or more external test connection contact points (pads; pins; balls), are provided in an integrated circuit component (chip) (1), through which signals (4, 5, 6) that are to be measured or analyzed are selectively fed, e.g. by means of a multiplex circuit (7, 8), and wherein the signals may be connected by means of routes located internally in the component from switch points that are not directly accessible, e.g. points inside the chip (15 to 20) or covered contact points. The device according to the invention is particularly useful for highly integrated semiconductor chips.Type: ApplicationFiled: December 18, 2000Publication date: December 20, 2001Inventors: Wilhelm Schmid, Carsten Dorrhofer
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Publication number: 20010052784Abstract: A voltage detecting circuit includes first and second reference voltage generating circuits. The first reference voltage generating circuit provides a reference voltage during a normal operation mode. The second reference voltage generating circuit provides a reference voltage during a test mode. A comparison voltage generating circuit is also included and provides a comparison voltage during both modes in response to a boosted voltage. A differential amplifier circuit is further included in the voltage detecting circuit. The differential amplifier generates an amplified difference signal that is used to generate a voltage level detection signal. The voltage level detection signal controls a pumping operation for generating the boosted voltage level. A bypass circuit may also be provided to lower a detected boosted voltage level and allow operation at lower voltage levels.Type: ApplicationFiled: December 22, 2000Publication date: December 20, 2001Applicant: Samsung Electronics Co., LtdInventors: Jae-Yoon Sim, Jei-Hwan Yoo
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Publication number: 20010052785Abstract: A test carrier and an interconnect for testing semiconductor components, such as bare dice and chip scale packages, are provided. The carrier includes a base on which the interconnect is mounted, and a force applying mechanism for biasing the component against the interconnect. The interconnect includes interconnect contacts configured to make temporary electrical connections with component contacts (e.g., bond pads, solder balls). The interconnect also includes support members configured to physically contact the component, to prevent flexure of the component due to pressure exerted by the force applying mechanism. The support members can be formed integrally with the interconnect using an etching process. In addition, the support members can include an elastomeric layer to provide cushioning and to accommodate Z-direction dimensional variations.Type: ApplicationFiled: July 6, 1998Publication date: December 20, 2001Inventors: WARREN M. FARNWORTH, MIKE HESS, DAVID R. HEMBREE, JAMES M. WARK, JOHN O. JACOBSON, SALMAN AKRAM
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Publication number: 20010052786Abstract: One embodiment of the present invention concerns an integrated circuit that includes bond pads and special contact pads or points. The bond pads are for interfacing the integrated circuit as a whole with an external circuit, and are to be bonded to a package or circuit board. The bond pads are disposed on the die in a predetermined alignment such as a peripheral, grid, or lead-on-center alignment. The special contact pads are used to provide external test patterns to internal circuits and/or to externally monitor results from testing the internal circuits. The special contact pads may be advantageously located on the integrated circuit with a high degree of positional freedom. For one embodiment, the special contact pads may be disposed on the die at a location that is not in the same alignment as the bond pads. The special contact pads may be smaller than the bond pads so as not to increase the die size due to the special contact pads.Type: ApplicationFiled: December 29, 2000Publication date: December 20, 2001Applicant: FormFactor, Inc. a Delaware coporationInventors: Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten
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Publication number: 20010052787Abstract: Integrated circuit die on wafer are tested individually, without probing any of the die, using circuitry (TC1-8, BC1-8, LR1-8, RR1-8, PA1-PA4) provided on the wafer.Type: ApplicationFiled: April 16, 2001Publication date: December 20, 2001Inventor: Lee D. Whetsel
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Publication number: 20010052788Abstract: Each of analogue switches (ASW1 to ASWn) enters a non-conductive state (namely, Off state) by using two kinds of off-voltages Vbs which are different voltages. In this state, a test signal stored in a supplemental capacity (13) is kept during a desired time period and then red it. The waveforms of the two test signals corresponding to the two kinds of the off-voltages Vbs are compared to each other. By using the comparison result, it is possible to detect a presence of off-leak defect in an array substrate fabrication process and to easily distinguish the off-leak defect from other types of defects.Type: ApplicationFiled: May 22, 2001Publication date: December 20, 2001Applicant: KABUSHIKI KAISHA TOSHIBAInventor: Satoru Tomita
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Publication number: 20010052789Abstract: Circuit configurations for testing transistors are arranged in the scribe line between integrated circuits on a semiconductor wafer. In order to increase the number of testable transistors while consuming little surface area, the transistors are arranged in a matrix in at least two rows. The drain-source paths of the transistors in the first row are connected between pads, and their gate connections are connected to a common pad. The drain-source paths of the transistors in the second row are connected firstly to one of the pads, and are secondly jointly connected to a further pad. Their gate connections are likewise connected to a further pad. The matrix-like arrangement of the transistors can be extended by using additional rows.Type: ApplicationFiled: June 7, 2001Publication date: December 20, 2001Inventors: Gunter Gerstmeier, Valentin Rosskopf
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Publication number: 20010052790Abstract: An on-chip circuit for defect testing with the ability to maintain a substrate voltage at a level more positive or more negative than a normal negative operating voltage level of the substrate. This is accomplished with a chain of MOSFETs that are configured to operate as a chain of resistive elements or diodes wherein each element in the chain may drop a portion of a supply voltage coupled to a first end the chain. The substrate is coupled to a second end of the chain. The substrate voltage level is essentially equivalent to the supply voltage level less the voltage drops across the elements in the diode chain. A charge pump maintains the substrate voltage level set by the chain. Performing chip testing with the substrate voltage level more negative than the normal negative voltage level facilitates detection of devices that will tend to fail only at cold temperatures.Type: ApplicationFiled: August 22, 2001Publication date: December 20, 2001Applicant: Micron Technology, Inc.Inventor: Gary Gilliam