Abstract: A sensor device primarily for sensing current in a primary source, including a primary conductor forming at least one winding on a magnetic material toroid. A secondary source of electrical current from a signal having a frequency f1 forms a plurality of winding on the toroid. An output reader measures the instantaneous loading of the signal passing through the plurality of windings as a function of the primary source current. The device includes a resistor form measuring the resulting voltage or current instantaneous loading for detecting said resulting signal at the frequency twice that of f1 by demodulation of the signal to capture the resulting pulses, the polarity of the primary magnetic field being determined by the polarity of the resulting pulse aligned either at the rising or trailing slope of the applied signal at frequency f1. The primary source of electrical current is AC or DC current.

Abstract: A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force microscope.

Abstract: Described are system for recording piston rod position information in a magnetic layer on the piston rod. A piston rod has a magnetically hard layer formed thereon to provide a recording medium. A magnetic pattern is recorded in the magnetically hard layer. A magnetic field sensor disposed adjacent to the piston rod senses the recorded magnetic pattern while the piston rod is moving and generates signals in response to the magnetic pattern that are used to determine a position of the piston rod.

Abstract: A sensor assembly is disclosed for measuring the position of a target object as it traverses a linear path of travel within a defined range of measurement. The sensor assembly comprises a ferromagnetic magnetic flux concentrator assembly. The flux concentrator assembly is configured as a generally u-shaped structure including a permanent magnet with elongated ferromagnetic flux concentrator elements affixed at the poles thereof and extending in substantially parallel fashion there from. A galvanomagnetic sensing element is disposed within an air gap between the free end portions of the flux concentrator elements and is displaceable along the longitudinal axis of the flux concentrator assembly. The galvanomagnetic sensing element is configured to provide an output signal indicative of the measured linear position as it travels along the longitudinal axis of the flux concentrator assembly.

Abstract: An apparatus and method is discussed for characterizing a fluid sample downhole of aliphatic hydrocarbon compounds, aromatic hydrocarbon compound, or connate mud filtrates containing carbon-13 isotopes using an enhanced nuclear magnetic resonance (NMR) signal on a measurement-while-drilling device. To enhance the carbon-13 NMR signal these nuclei are being hyperpolarized. Either the Overhauser Effect (OE) or the Nuclear Overhauser Effect or optical pumping and the Spin Polarization Induced Nuclear Overhauser Effect (SPINOE) can serve as a mechanism for hyperpolarization of the carbon-13 nuclei.

Abstract: A magnetic resonance system and method are described for performing an improved magnetic resonance ductography which gives better resolution and higher signal to noise ratio than known systems and methods. Use is made of a small coil together with a post processing technique addressed to the improvement of the sensitivity of the coil. The magnetic resonance sequence used is a fat suppressed T2 weighted turbo spin echo sequence.

Abstract: The invention relates to an MRI system (1) comprising an examination volume (11), a main magnet system (13) for generating a main magnetic (field (B0) in the examination volume, a gradient magnet system (19) for generating gradients of the main magnetic field, and an anti-vibration system (39) for reducing vibrations of the gradient magnet system. According to the invention the anti-vibration system comprises a gyroscope (41) which is mounted to the gradient magnet system. As a result of the gyroscopic effect of the gyroscope, the vibrations of the gradient magnet system are effectively reduced. In an open type MRI system (1) according to the invention, a separate gyroscope (41, 43) is mounted to each of the two portions (21, 23) of the gradient magnet system (19), and each gyroscope has an axis of rotation (61) parallel to the main direction (Z) of the main magnetic field (B0).

Abstract: An apparatus for determining a quantitative property of a sample substance by means of magnetic resonance is disclosed. The apparatus comprises a conveyor for conveying sample containers containing the sample substance through a measuring station. The measuring station comprises a magnet system for generating a constant magnetic field of high homogeneity. The measuring station, further, comprises a probe head adapted for letting sample containers be conveyed therethrough and for generating a high frequency magnetic field. A magnetic resonance measuring unit determines the quantitative property of the sample substance contained in the probe head. The probe head excites and detects, resp., the magnetic resonance essentially only within that section of the sample container which contains the sample substance. The probe head comprises a split-ring resonator which, as seen in a conveying direction of the conveyor, has a passage cross-section for letting run the sample containers therethrough.

Abstract: A magnetic resonance imaging method comprising a step for applying one or more gradient magnetic field pulses continuously, a step for calculating a residual magnetic field being generated from a magnet by an gradient magnetic field pulse based on a residual magnetic field response function representing the relation between the strength of the gradient magnetic field pulse being applied and the strength of a residual magnetic field being generated, and a step for correcting the residual magnetic field thus calculated. The magnetic resonance imaging method is further provided with a step for updating the residual magnetic field response function with time depending on the application history of the gradient magnetic field pulses being applied continuously.

Abstract: The present invention relates to devices and methods for melting a solid polarised sample while retaining a high level of polarisation. In an embodiment of the present invention a sample is polarised in a sample-retaining cup in a strong magnetic field in a polarising means in a cryostat and then melted inside the cryostat by melting means such as a laser connected by an optical fibre to the interior of the cryostat.

Abstract: Cross-component measurements made with a dual-transmitter configuration are processed to estimate a distance to an interface in an anisotropic earth formation. Distance to a boundary having an anisotropy contrast may be determined for reservoir navigation. Optionally, measurements may be made with two receivers, also in the dual transmitter configuration.

Abstract: An electromagnetic logging tool includes a support configured for disposal in a well; at least one antenna mounted on the support; and a plurality of coils mounted on the support proximate the at least one antenna, wherein the plurality of the coils are configured for selective connection with the at least one antenna. A methods for balancing an induction array on an electromagnetic logging tool includes measuring a mutual coupling between a transmitter and a receiver on the electromagnetic logging tool; and selectively connecting a subset of a plurality of coils on the electromagnetic logging tool to the transmitter or the receiver based on the measured mutual coupling.

Abstract: An electromagnetic logging tool is disclosed that includes a support; and at least one four-coil array disposed on the support, wherein the at least one four-coil array comprises: a transmitter, a bucking coil, a receiver, and a trim coil. A method for balancing an induction array is disclosed that includes applying an alternating current to a transmitter of the induction array that comprises the transmitter, a bucking coil and a receiver; measuring a mutual coupling between the transmitter and the receiver; and adding an extra bucking coil, if the mutual coupling exceeds a selected criterion.

Abstract: A method and system for measuring the amount of energy released by a spark ignition system. This energy can be quantified spectroscopically by measuring the emission of cyanogen radicals in the presence of a ignition event and a known A/F ratio.

Abstract: Methods and systems are provided for monitoring replacing of a previously purchased storage battery with a replacement storage battery. A battery tester is coupled to the replacement storage battery. A replacement storage battery identifier is entered into the battery tester that identifies the replacement storage battery. The battery tester performs a battery test on the replacement storage battery. A replacement battery test code is generated using the battery test and the replacement storage battery identifier. The replacement battery test code is communicated to a centralized database. The replacement battery test code is associated with a battery test code related to the previously purchased storage battery in the centralized database.

Abstract: A potential sensor (101) including first and second detection electrodes (121 a, b) opposed to an object of which a potential is to be measured, and a movable shutter (125) so positioned between the detection electrodes and the potential-measured object with gaps thereto; wherein the movable shutter can assume a first state and a second state, the first detection electrode is exposed to the potential-measured object wider when the movable shutter assumes the first state than when the movable shutter assumes the second state, and the second detection electrode is exposed to the potential-measured object narrower when the movable shutter assumes the first state than when the movable shutter assumes the second state.

Abstract: A continuity testing device has a probe element for contacting a conductor. A continuity testing circuit is coupled to the probe element. The continuity testing circuit will indicate continuity when a resistance level below a predetermined set-point is monitored. The continuity testing circuit has at least one of a vibrating or audible sensor to indicate electrical continuity of the conductor. The vibrating and/or audible sensor indicates a strength of the resistance level of the circuit tested by a quality of vibration or sound from the vibrating and/or audible sensor. A grounding wire is coupled to the continuity testing circuit. The grounding wire has a magnetic contact coupled thereto to ground the continuity testing device to any ferrous metallic grounded element. A housing is provided for holding and storing the probe element and the continuity testing circuit.

Abstract: A system for determining the depth of a fluid in a storage tank. The depth of the fluid is determined after the detection of a pulsed wave that is reflected from the top surface of the fluid. The system includes a transducer, an analog-to-digital converter, and a filter. The transducer is configured to sense the reflected pulsed wave and to generate an analog input signal that corresponds to the reflected pulsed wave. The analog-to-digital converter is coupled to the transducer, and configured to convert the analog input signal into a digital input signal. The filter is coupled to the analog-to-digital converter. The filter includes a finite impulse response filter that is configured to receive the digital input signal and to generate a digital output signal.

Abstract: A method and a system is provided that includes a multifrequency generator supplying signals of at least three different frequencies to an electrode assembly, the capacitance of which is detected for a plurality of different frequency points. In this way, the capacitance of the electrode assembly, which is influenced by a substance present in the vicinity of the electrode assembly, may be reliably identified. Preferably, the conditions of a road surface may be reliably monitored.

Abstract: Cost-effective methods and apparatus are disclosed for measuring both absolute position and fluctuations using a moving dielectric medium between fixed electrodes. A position sensor according to the invention includes a pair of spaced-apart electrodes, an elongated dielectric that moves between the electrodes, and electrical circuitry interconnected to the electrodes to determine the position of the dielectric relative to the electrodes. To realize a linear position sensor, the electrodes are electrically conductive rods or wires, and the dielectric is also an electrically non-conductive rod or wire. The dielectric may be flexible or stiff, in which case the dielectric and the electrodes are preferably substantially parallel to one another. Alternatively, the spaced-apart electrodes may be concentric tubes, with the dielectric being an electrically non-conductive tube slideably disposed between the electrodes. In different embodiments, the dielectric is a liquid-receiving tube.

Abstract: An apparatus for monitoring wearing or consumable parts 18, especially parts of internal combustion engines, in which monitoring verifies that the consumable part 18 is functioning and also ensures that a consumable part 18 conforming to specifications is used. The device has a maintenance switch 10, which is provided with a voltage supply 12 and a data line 13, which in turn is connected to a display 14, on which the monitoring result of the maintenance switch 10 is displayed. A chip 22 identifiable by a chip reader 23 is disposed in the consumable part 18. The chip reader 23 is integrated into the maintenance switch 10 and connected to the voltage supply 12 of the maintenance switch 10. This enables simple and cost-effective monitoring both of the functioning of the part and of the use of properly specified wearing or consumable parts.

Abstract: A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device, an error amplifier selectable to control the controlled current or voltage, the error amplifier providing an error signal for the control, and a floating buffer driving the series combination in response to the error signal.

Abstract: A structure and a method for measuring the bonding resistance are provided. The structure for measuring a bonding resistance between a first object and a second object is provided, wherein the first object has a plurality of first pins and a reference pin, and the second object has a plurality of second pins corresponding to the plurality of first pins and the reference pin. The structure further includes a first circuit formed by electrically connecting the reference pin to the first pin adjacent to the reference pin in a first direction, and a second circuit formed by electrically connecting a second pin corresponding to the reference pin to the adjacent second pin in a second direction. By connecting the first and the second circuits in series, the value of the bonding resistance is easily measured.

Abstract: The invention relates to a method for determining a characteristic of a semiconductor sample forming a surface. The method comprises the steps: simultaneously illuminating an area on the surface of a semiconductor sample with superimposed exciting light beams with a plurality of wavelengths, modulating the light beam of the different wavelengths with the same frequency, but different phases, selecting a modulation function and its phases in such a way, that the sum of the photon fluxes of all light beams at all times lies within a tolerance range, the tolerance range being considerably smaller than the sum of all photon fluxes, simultaneously phase-dependent measuring of the components of the surface photo voltage caused by the different light beams and determining the characteristic of the semiconductor sample from the relationships between the components and the respective wavelengths. Furthermore a device for carriying out such a method is described.

Abstract: A probe navigation method, a navigation device, and a defect inspection device wherein in a charged particle beam system provided with probes for electrical characteristics evaluation, probing can be easily carried out regardless of the equipment user's level of skill are provided. To attain this object, probes and a test piece stage on which a test piece is placed are driven by independent driving means. Further, a large stage driving means which integrally drives the probes and the test piece stage is provided. In addition, CAD navigation is adopted. This enhances the equipment users' convenience during probing.

Abstract: A probe card, and a probe sheet used for the method of testing (producing) a semiconductor device using the probe card, include first contact terminals in electrical contact with the electrodes of a test object formed at a narrow pitch, wires connected with and led from the first contact terminals, and second contact terminals in electrical contact with the wires. The first and second contact terminals are formed using the etching holes of a crystalline member and lined with a metal sheet.

Abstract: A control unit of a wafer prober for implementing wafer examination, using a probe card including a multiple number of probes, executes a multiple number of measuring operations by bringing the probes of the probe card into contact with bonding pads formed on a wafer and by measuring the electric characteristics between predetermined pads of the bonding pads, each of the measuring operations being implemented after varying the relative position between the probe card and the wafer, in directions parallel to the face of the wafer. The control unit, upon execution of each of the measuring operations, implements the measuring operation after adjusting the relative position between the probe card and the wafer so that the contact position of each probe of the probes against each pad of the bonding pads is separated from all the positions at which the probes have already touched that pad of the bonding pads for a predetermined number of different times.

Abstract: An anisotropic conductivity sheet (10) comprising an insulating sheet (11) having a number of through-holes (12) and a number of conductive bodies is provided. The insulating sheet (11) has an inner layer (11A) of a heat resistant fuloro-elastomer and surface thin layers (11B, 11C) of heat-resistant engineering plastics. Each of the conductive bodies is a wire loop (13) formed to generally elliptic shape. They are arranged within each of the through-holes (12) so that long axis of each wire loop (13) extends in the thickness direction of the insulating sheet (11). The anisotropic conductivity sheet (10) is suitable to use for electrical test of a semiconductor devise (16), such as IC. A signal waveform-rectifying sheet (20) is preferably arranged on the anisotropic conductivity sheet (10). The signal waveform-rectifying sheet (20) has though-holes (22) in which electrical components for rectifying signals and currents, such as resistors (23A), LEDs (23B), LR circuits (23C) and capacitors (23D), are filled up.

Abstract: Disclosed is an inspection method for inspecting the electrical characteristics of a device by bringing an inspecting probe into electrical contact with an inspection electrode. An insulating film formed on the surface of the inspection electrode is broken by utilizing a fritting phenomenon so as to bring the inspection electrode into electrical contact with the inspection electrode.

Abstract: Techniques for automating probing location selection during printed circuit board (PCB) and corresponding PCB tester fixture design are presented. The invention includes a system and algorithm for selecting a probe layout comprising a set of probing locations for a printed circuit board design having a plurality of nets, at least some of which have a number of alternative possible probing locations. The system and algorithm iteratively generates a potential probe layout comprising one or more probing locations per net, and based on the potential probe layout, determines one or more regions of maximum deflection. A probing location from the potential probe layout that is located in a region of maximum deflection and is associated with a net having one or more alternative probing locations is removed from the potential probe layout and replaced in the with one of the one or more alternate probing locations associated with the net.

Abstract: There is provided a heat transferring object for transferring heat generated by a object to be cooled to a cooling unit, having a plurality of thermal transferring plates each having elasticity and provided in lamination and adhesive materials having thermal conductivity and provided between the thermal transferring plates so as to slidably hold the thermal transferring plates. Preferably, each of the thermal transferring plates has almost the same shape. Each of the thermal transferring plates may have a cooling unit fixing portion to be secured to the cooling unit and a plurality of extensions extending respectively from the cooling unit fixing portion and secured to the objects to be cooled independently from each other.

Abstract: Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In representative embodiments, a part of the beam portion is bent, e.g., such that the beam portion is zigzagged one or more times. A projection may be formed around a proximal end of the tip portion.

Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.

Abstract: A test tray for a handler for testing semiconductor devices is disclosed which is capable of reducing the costs and time taken for replacement of carrier modules, and achieving an enhancement in workability.

Abstract: Method and test structures for determining heating effects in a test semiconductor device (10) are provided. The test device may include a first conductive metal structure (151-156) for accepting a flow of electric current that causes a heating effect. The test device may further include a second conductive metal structure proximate (121-126) the first conductive structure for obtaining resistivity changes in response to the heating effect. The resistivity changes are indicative of temperature changes due to the heating effect.

Abstract: The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the first switches are between the first test pads and the IC pads, wherein the number of the first test pads is less than the number of the IC pads.

Abstract: A cell element field for data processing, having function cell means for execution of algebraic and/or logic functions and memory cell means for receiving, storing and/or outputting information is described. Function cell-memory cell combinations are formed in which a control connection leads from the function cell means to the memory cell means.

Abstract: A voltage level translator circuit is selectively operable in one of at least two modes in response to a control signal. In a first mode, the voltage level translator circuit is operative to translate an input signal referenced to a first source providing a first voltage to an output signal referenced to a second source providing a second voltage. In a second mode, the voltage level translator circuit is operative to provide a signal path from an input of the voltage translator circuit to an output thereof without translating the input signal. The control signal is indicative of a difference between the first voltage and the second voltage.

Abstract: A differential output circuit first and second transistors forming a differential pair and having control electrodes input with binary signals, a constant current circuit supplying a constant current to the first and second transistors, and a protection circuit protecting the first and second transistors from external noise. The protection circuit has transistors respectively coupled in parallel to the first and second transistors and input with a first power supply voltage, and transistors respectively coupled between a second power supply voltage and first and second output terminals of the differential output circuit.

Abstract: An inverter apparatus is composed of a power MOSFET having a source/drain connected to an output terminal, and a gate drive circuit driving a gate of the power MOSFET. The gate drive circuit includes a discharging path connected with the gate of the power MOSFET. The discharging path includes a set of serially-connected diodes which are forward-connected in a direction of a discharge current from the gate of the power MOSFET.

Abstract: A differential switching circuit has a first transistor connected between a first output node and a common node and a second transistor connected between a second output node and the common node. A switching driver generates first and second driving signals in response to an input data signal so as to complementarily drive the first and second transistors. A voltage level of at least one of the first and second driving signals is maintained so as to cause at least one of the first and second transistors to operate in a saturation region regardless of a voltage variation of at least one of the first or second output nodes when the at least one of the first and second transistors is turned on. Output impedance of the device is enhanced because the first and second transistors operate in the saturation region.

Abstract: A family of logic circuits, called gated diode logic circuits, is disclosed wherein small amplitude signals, typically a fraction of the supply voltage, can be sensed and amplified by applying a small amplitude signal to a gate of a gated diode in a sampling mode and changing a voltage of a source of the gated diode in an evaluation mode. One or more isolation devices may be connected between each small amplitude signal and a gate of the gated diode, wherein the isolation device passes the small amplitude signal to the gate of the gated diode in the sampling mode, and isolates the small amplitude signal from the gate in the evaluation mode for amplification and performing fast logic operations (logic functions). The disclosed gated diode logic circuits overcome the Vt variation problem in FETs by detecting and amplifying the small logic signals utilizing gated diodes that have relatively low Vt variation.

Abstract: With the circuit arrangement and the associated method a start or announcement signal indicating a data transmission is sampled with a module-specific clock and on detection of the beginning of a start signal sent along with the payload data to be transmitted, the payload data to be transmitted is forwarded synchronously with the module-specific clock to the downstream processing units.

Abstract: Methods and apparatus are provided for counter-based digital frequency lock detection. A counter-based digital frequency lock detector in accordance with the present invention comprises a reference counter clocked by a reference clock and a target counter clocked by a target clock. The target counter is n bits and n is less than a number of bits of the reference counter. A frequency offset violation of the target clock is detected by comparing a value of the target counter to an n bit counter.

Abstract: Linear phase detectors comprising circuits (1,2) receiving first and second clock signals (CLKOO, CLK90) for generating first and second control signals (UP,DOWN) for use in clock extractors and data regenerators have large delays due to long path lengths and many operations between input and output (insight). They can be made faster by providing each circuit (1,2) with two parallel latches (10,11,20,21) and a multiplexer (12,22) for multiplexing latch output signals (basic idea). A data signal is supplied to the first circuit (1), and a first circuit output signal is supplied to the second circuit (2). By introducing a third and a fourth circuit (3,4) each also comprising two latches and a multiplexer, a fast linear phase detector has been constructed having a gain which is independent from the number of transitions in the data signal, which is advantageous. Logical circuitry (13,23) of each circuit (1,2,3,4) is coupled to an adder/subtracter (5).

Abstract: A sense amplifier includes at least two field effect transistors of identical conductivity type, each including a gate terminal, a source terminal, a drain terminal and a bulk terminal. The two field effect transistors are connected such that they are coupled back-to-back between a bit line and a reference line. The bit line is connected to a memory node via a selection transistor. The field effect transistors include bulk or substrate terminals formed in mutually insulated, different wells. The substrate bias voltages and thus the threshold voltages can be set independently via the body effect, so that the threshold voltages that are fundamentally different on account of stochastic effects in the different wells can be adapted to one another. Thus, compensating for the disadvantages that occur in conventional wells, on account of scattering effects during implantation or on account of mechanical stresses which act differently on transistors that are otherwise formed uniformly in the same well.

Abstract: An integrated circuit (70) includes a first power supply bus (72) and a second power supply bus (74). The first power supply bus (72) provides a first power supply voltage (VDD) to a first plurality of circuit elements (12 and 76). The second power supply bus (74) provides a second power supply voltage (LVDD) to a second plurality of circuit elements (14), where the second power supply voltage is lower than the first power supply voltage. During a normal operating mode of the integrated circuit (70), the first power supply bus (72) provides the first power supply voltage to the first plurality of circuit elements (12 and 76) and the second power supply voltage is not provided to the second plurality of circuit elements (14). During a low power operating mode, the second power supply bus (74) provides the second power supply voltage to the second plurality of circuit elements (14) and the first power supply voltage is not provided to the first plurality of circuit elements (12 and 76).

Abstract: Temperature sensing circuits are disclosed. One embodiment of a temperature sensing circuit includes a voltage divider and an analog multiplexer. The voltage divider network divides an analog voltage into multiple derived analog voltages. The analog multiplexer receives at least two of the derived analog voltages and a control signal, and is configured to produce one of the received derived analog voltages dependent upon the control signal. Temperature detection circuits including the temperature sensing circuits are also disclosed.

Abstract: A technique for expanding an input signal includes receiving the input signal at a first node of a voltage expander and generating a plurality of expanded signals on different outputs of the voltage expander responsive to the input signal. In certain embodiments, each of the expanded signals has a different magnitude at a respective fixed offset from the input signal.

Abstract: A drive circuit for a firing element of an occupant protection system comprises first and second supply potential terminals and first and second firing element terminals. A first semiconductor switching element is integrated in a first semiconductor body and has a first load terminal coupled to the first supply potential terminal and a second load terminal coupled to the first firing element terminal. A second semiconductor switching element is integrated in a second semiconductor body and has a first load terminal coupled to the second firing element terminal and a second load terminal coupled to the second supply potential terminal. The first and second semiconductor bodies are applied to a thermally conductive carrier element and commonly housed. A temperature detector is integrated in the second semiconductor body and provides an overtemperature signal at an output of the drive circuit upon detection of an overtemperature of the first semiconductor switching element.