Abstract: A protection system for an electrical device may include at least one temperature sensitive element located in a region adjacent to a component of the electrical device and configured to provide an output related to an actual temperature in the region. The system may also include a controller configured to determine the actual temperature in the region based on the output of the at least one temperature sensitive element and to determine a predicted temperature of the component based on the actual temperature in the region and on a predetermined heat dissipation characteristic of the electrical device.

Abstract: A driving unit of the present invention comprises a moving element, an elastic body configured to support the moving element, a permanent magnet fixed on said moving element, an electromagnet disposed to be opposed to said permanent magnet, and a controller. The moving element and the elastic body constitute a resonance system. The electromagnet includes a magnetic material and a coil wounded around the magnetic material. The controller magnetizes the magnetic material by feeding a current through the coil and gives a vibration force to the moving element by magnetic force acting between the magnetic material and the permanent magnet. The feature of the present invention resides in that the controller determines a current waveform necessary for an intended motion of the moving element, and applies a voltage to the coil intermittently so that a current in the form of the current waveform flows through said coil.

Abstract: A image processing device includes a first module, a motor system connected to the first module and capable of pushing the first module to move forward, a selector connected to a plurality of loading circuits included in the motor system and capable of selecting a loading circuit among the plurality of loading circuits and setting the selected loading circuit as a loading of the motor system, and a controller electrically connected to a driver included in the motor system and capable of controlling a speed of the motor system pushing the first module.

Abstract: Certain exemplary embodiments comprise a system comprising a plurality of Active Front End units adapted to be electrically coupled to a direct current (DC) bus. Each of the plurality of Active Front End units can be adapted to be electrically coupled to a separate winding of a transformer of a plurality of transformers. Each of the plurality of Active Front End units can be adapted to convert alternating current (AC) voltage to a DC voltage. Each of the plurality of Active Front End units can be adapted to supply the DC voltage to the DC bus. The DC bus can be adapted to be electrically coupled to a plurality of inverters.

Abstract: A variable frequency drive including a plurality of power cells that are configured as three phases of series-connected cells to deliver power to a load. The drive is operated to increase the output voltage of each power cell using overmodulation.

Abstract: PWM methods and apparatus are provided for loss minimized control of AC motors taking into consideration inverter non-linear limitations. The method comprises providing a voltage to the AC motor based on a switching cycle, adding a duty cycle of a zero vector to each phase leg of the switching cycle when a duty cycle of a first phase leg of the switching cycle is less than a minimum duty cycle, and subtracting the duty cycle of the zero vector from each phase leg of the switching cycle when a second duty cycle of a second phase leg is greater than a maximum duty cycle. The minimum duty cycle and maximum duty cycle indicate distortion regions.

Abstract: A method of charging an electrochemical generator having a plurality of electrochemical cells. The method includes the step of charging the plurality of electrochemical cells such that the total voltage of the generator reaches a predetermined voltage level, followed by the steps of selecting a particular electrochemical cell and charging the particular electrochemical cell to its respective maximum voltage, such that the cathode(s) of the particular electrochemical cell is(are) restored to a fully-charged state. Once it has been restored to its fully-charged state, the particular electrochemical cell is allowed to discharge itself down to a nominal voltage. Each of the plurality of electrochemical cells of the generator is selected and charged to its respective maximum voltage in turn, according to a predetermined selection sequence.

Abstract: A system and method is provided for generating DC power using a synchronous reluctance machine (12) or a salient-pole synchronous machine (102) and a power converter (110). The present invention can be used to achieve power production for a synchronous reluctance machine (12), or can be used to achieve partial production of power from a traditional salient-pole synchronous machine/starter (102) in the case where the salient-pole synchronous machine/starter has degenerated into a synchronous reluctance machine due to, for example, a loss of excitation. In a power generation system, a control system and method can include a power converter (110), controlled by a voltage command and at least one of a measured DC link (120) voltage or DC link (120) current, for use with a synchronous reluctance machine armature winding (102A) and a prime mover (116), such that movement of the synchronous reluctance machine rotor of the synchronous reluctance machine can be used to produce at least partial DC power generation.

Abstract: A generator controller for controlling a permanent magnet generator where each phase of the generator is connectable to a DC link via electrically controllable switches, the controller characterised by a data processor adapted to receive a measurement of generator current output and a demand current, and to form a current error between the demanded value and the measured generator current; derive a target voltage as a function of the current error; and form control signals for the electrically controllable switches as a function of the target voltage.

Abstract: A transition mode operating device for the correction of the power factor in switching power supply units includes a converter for receiving an input voltage and for providing a regulated output voltage, and a coupled control device. The converter includes a power transistor, a rectifier, and an inductor and auxiliary winding arranged between the rectifier and a power transistor. The control device includes a circuit for generating an error signal, a multiplier for receiving the error signal, and a driving circuit coupled to the multiplier to determine the on time period and the off time period of the power transistor. The control device includes circuitry coupled to the auxiliary winding of the inductor to generate a signal proportional to the input voltage during the on time of said power transistor.

Abstract: A capacitor is disposed between the output side and the ground potential of an inductor which creates an output voltage. A first switch element supplies a current from an input voltage to an input side of the inductor, and a second switch element which is turned on when the first switch element is off sets the input side of the inductor to a prescribed potential. A control circuit detects the arrival of the voltage on the input side of the inductor at a high voltage corresponding to the input voltage when the load circuit is in a light load state and the second switch element is off, and turns on the first switch element. It invalidates the detection output of the voltage detecting circuit when the load circuit is in a heavy load state and, after the second switch element is turned off, turns on the first switch element.

Abstract: In a power supply apparatus, in a standby mode, control signals for controlling a first MOSFET of a power supply apparatus to be turned on and a second MOSFET to be turned off are supplied to the gates of the first and second MOSFETs from a control circuit, respectively. The emitter of a PNP transistor is connected to the gate of the second MOSFET through a diode of a switch circuit and the collector is connected to the ground. A power supply operation control signal is input to the base of the PNP transistor. When a power supply operation control signal in a Low state is input to the base in a standby mode, the emitter and the collector are connected to each other. Accordingly, the gate of the second MOSFET has a potential substantially the same as a ground potential and the second MOSFET is turned off irrespective of the control signal.

Abstract: A device for identifying individual cables communicating between many remote locations to one central location using the building AC ground circuit to communicate between the remote location and the central location. The device includes a plurality of tubes adapted to engage individual cables and corresponding light-emitting diodes (LED) adjacent to each tube. A needle in the tube provides communication with the wire of the insulated cable. A remote interconnection cable provides connection between cable remote ends, and the building ground circuit concurrently providing a means to prevent engagement with the energized AC circuits.

Abstract: A transportable measuring probe is provided having a transmitting and receiving module for wireless transmission of information, wherein the transmitting and receiving module is suitable for detection and transmission of positional data of the measuring probe to an evaluation device.

Abstract: The AC detection coil is a toroidal coil and includes plural radial-line conductors which are formed on a front face and a rear face of a substrate, conductive connection parts and conductive through-holes which connect electrically each end of radial-line conductors, wherein plural winding turns are consecutively formed by a connection of each radial-line conductor on the front and the rear faces, respectively, and include a forward coil and a backward coil, and each shape on the front and the rear faces of the radial-line conductors and the conductive connection parts are identical with each other. Consequently, when seen from a thickness direction of the substrate, areas of the forward coil and the backward coil are equal to each other, and an external, unneeded to be detected, magnetic field can be canceled each other by the forward coil and the backward coil, then a current detection accuracy can be improved.

Abstract: A apparatus and method for creating a universally usable and configurable sensor platform which is used in conjunction with various sensor and sensing elements to sense and measure environmental conditions which incorporates inputs from multiple sensors 6-9 and 12-14. The apparatus incorporates an oscillator 3 which provides a signal whose frequency varies according to the inputs from sensors 6-9 and 12-14 in combination with a microprocessor 1. A cordic block 61 allows for supplemental calculations of trigonometric operations and functions. An output unit 2 converts the signals received from microprocessor 1 into a variety of serial protocols.

Abstract: A system and method measures parameters associated with an inductor such as in a switching converter. The inductance value can be determined by monitoring voltages and currents associated with the inductor when a measurement mode is activated. In one example, the measurement is provided by a signal processing system that includes an analog differentiator. In another example, the measurement is provided by a signal processing system that converts the analog measurement voltages into digital quantities that are analyzed in the digital domain. The value of the inductance value is determined by calculating of ?VL and ?IL/?t. The saturation point in the inductance is located by measuring the change in slew rate of the inductance during the measurement mode. Average values for the inductor and the slew rate can be determined using digital techniques. Other parameters such as current limit and on-time of the inductor can be adjusted by this methodology.

Abstract: A device which uses a detection circuit to determine whether an output current thereof is source-induced or load-induced, and the method therefor. The device which performs some type of operation based upon the determination as to whether the output current thereof is source-induced or load-induced, and method therefor. The detection circuit determines whether polarities of the output current and an output voltage are the same, and determines the output current to be source-induced if the polarities are the same and load-induced if the polarities are opposite each other. Such a device may have many applications, including use in systems where distinctions between source and load-induced currents are employed in feedback systems to control the system voltage source, systems where the system voltage source is not controlled, but other sources are controlled to influence a summation of voltages and currents at sensing locations, and systems for measurement instrumentation.

Abstract: To provide a bearing with integrated rotation sensor capable of detecting the rotational speed and the origin position without being affected by an external magnetic field, the bearing includes a rotating ring, a magnetic encoder 7 mounted on the rotating ring, and a stationary ring. The magnetic encoder 7 includes a ring shaped rotational speed to-be-detected member 7A having a plurality of magnetic poles alternating with each other, and a origin position to-be-detected element 7Ba arranged axially in a portion of the circumferential direction of the to-be-detected member 7A. Rotational speed and origin position magnetic sensors are mounted on the stationary ring so as to respectively confront the rotational speed and origin position to-be-detected elements. A magnetized restoration element 7Bb is disposed in a circumferential portion of the magnetic encoder 7, where it confronts the origin position magnetic sensor, and except the second to-be-detected member 7Ba.

Abstract: A contactless rotary shaft position sensor provides for precision computation of shaft angle for a wide range of input shaft rotational angles. The sensor includes two annular two-pole magnets which are connected by a precision, motion-transmitting gear train. An optional second gear train between one of the magnets and the input shaft can provide additional angular rotation scaling to accurately measure either fractional or a large number of multiple turns of the input shaft. The gear ratios are selected such that one of the magnets does not rotate more than one revolution. Pairs of ratiometric Hall-effect or magnetoresistive sensors provide differential voltage signals which are used for sensing angular position of each magnet over a full 360 degrees of rotation. The single-turn magnet provides an absolute, coarse indication of input shaft rotation with a typical accuracy of 2%. The gear ratio between the magnets produces several turns of the second magnet for each turn of the single-turn magnet.

Abstract: Disclosed herein, in an exemplary embodiment, is a position sensor assembly including a circular-shaped or rhombus-shaped magnet and at least one magnetic flux density sensor, such as a Hall effect sensor, wherein rotation of the magnet is detected by the at least one sensor. The magnet may be positioned coaxially with the longitudinal axis of a rotor shaft of a motor and provided within a support. A position extraction algorithm may be employed using the output from the sensors to detect the position of the rotor shaft.

Abstract: A rotation detecting device for detecting a rotating object includes a housing having a bearing and an mounting surface, a rotor member having magnetic peripheral portion and a rotary shaft that is supported by the bearing, a biasing permanent magnet for providing magnetic field around the mounting surface and the magnetic peripheral portion, an IC sensor chip including plural magnetic sensor elements disposed on the mounting surface to provide a sensing signal related to change in magnetic field around the sensor elements, and an IC signal processing chip that provides a rotation signal according to the sensing signal. In this device, the bearing and the mounting surface are integrally formed into the housing at a prescribed distance to secure an unchanged air gap distance.

Abstract: Described are system for recording piston rod position information in a magnetic layer on the piston rod. A piston rod has a magnetically hard layer formed thereon to provide a recording medium. A magnetic pattern is recorded in the magnetically hard layer. A magnetic field sensor disposed adjacent to the piston rod senses the recorded magnetic pattern while the piston rod is moving and generates signals in response to the magnetic pattern that are used to determine a position of the piston rod.

Abstract: A magnetic resonance imaging (MRI) system and method is provided. The MRI system comprises a plurality of transmit coils arranged spatially distinct from each other and configured for inducing a nuclear magnetic resonance (NMR) excitation. The NMR excitation is selective both in spatial dimensions and in a chemical shift spectrum. The plurality of transmit coils are driven by a plurality of radio frequency (RF) pulses, and a gradient module is driven by a plurality of gradient pulses.

Abstract: A method for simultaneously tracking an invasive device disposed within a patient and acquiring an imaging signal of the patient with a magnetic resonance imaging (MRI) system during a single echo acquisition time period (46) of the MRI system. The method includes applying a radio frequency excitation pulse (26) to a patient to start an echo acquisition time period of an MRI system. The method then includes acquiring a tracking signal (54) from the invasive device during the echo acquisition time period and also acquiring an imaging signal (36) of the patient proximate an end of the same echo acquisition time period.

Abstract: An MRI apparatus having a configuration that reduces vibration of a static magnetic field generating source is provided. A closed vessel 2 of the static magnetic field generating source is provided with a rigid structure 4 for preventing transmission of vibration generated from a gradient magnetic field generating part 21 to other members via the closed vessel 2. The rigid structure 4 uses, for example, a connecting part 4 that connects a face 25 on the imaging space side and a face 26 confronting it. The rigidity of the closed vessel is thereby increased, and therefore vibration transmitted from the gradient magnetic field generating part can be reduced. The connecting part can have a through-hole structure, and in such a case, internal space of through-hole can be used for drawing cables.

Abstract: An MRI system (1) comprises a housing (10) defining an examination space (2) for receiving a body for examination, a patient table (3) being displaceable into and out of the examination space (2), a magnetic field generating system (4) for generating a magnetic field in the examination space (2), and an electromagnetic resonance receive system (5) which comprises a set of dedicated receive coils (20). According to the invention at least one dedicated receive coil (20) is fixedly attached to the housing (10).

Abstract: A magnetic resonance elastography (MRE) scan is performed using an array of transducers for applying a strain wave to tissues in a region of interest. A calibration process is performed prior to the scan in which the strain wave produced by each transducer in the array is imaged using an MRE pulse sequence so that information may be acquired that enables each transducer to be properly driven during a subsequent MRE scan.

Abstract: An electromagnetic survey method for surveying an area that potentially contains a subterranean hydrocarbon reservoir. The method comprises detecting a detector signal in response to a source electromagnetic signal, resolving the detector signal along at least two orthogonal directions, and comparing phase measurements of the detector signal resolved along these directions to look for a phase separation anomaly indicative of the presence of a buried hydrocarbon layer. The invention also relates to planning a survey using this method, and to analysis of survey data taken using this survey method. The first and second data sets may be obtained concurrently with a single horizontal electric dipole source antenna. The method is also largely independent of a source-detector pair's relative orientation and so provides for good spatial coverage and easy-to-perform surveying.

Abstract: A resistivity tool includes receiver electronics near each receiver antenna loop. Placement of the electronics in this position such as at the circuit card between the terminal ends of the receiver antenna loop improves signal to noise ratio by reducing or eliminating interference, noise, and cross-talk of transmissions from the receiver to a remote microprocessor. By using material such as silicon-on-sapphire, electronics can be miniaturized and operate reliably at when exposed to high temperatures, even for long periods.

Abstract: A method and apparatus for detecting open defects on grounded nodes of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, an accessible signal node that is capacitively coupled the grounded node is stimulated with a known source signal. A capacitive sense plate is capacitively coupled to the stimulated node and grounded node of the electrical device, and a measuring device coupled to the capacitive sense plate capacitively senses a resulting signal. The value of the capacitively sensed signal is indicative of the presence or non-presence of an open defect on one or both of the grounded node and stimulated signal node.

Abstract: A method and apparatus is presented for gaining socket testability through the use of a capacitive interposer engineered to create capacitive coupling between signal nodes of a circuit assembly that the tester has access to and nodes of the socket that would not otherwise have any coupling to a testable signal node of the socket. Generally, coupling capacitance is engineered into the interposer by trace and via routing between the signal node of the socket and a location in close proximity to the inaccessible socket node such that their proximity to each other couples them together.

Abstract: A single ended line testing method for qualifying an electrically conducting line, including the steps of sending a plurality of randomized excitation signals from a first end of the line towards a second end of the line, subsequently taking measurements, at the first end of the line, of each reflection of the plurality of randomized excitation signals, and then inversely randomizing the measurements. Line qualification is determined based on an average of the inversely randomized measurements.

Abstract: A test apparatus tests an arc fault circuit breaker with an arc fault generator having an input and an output. The test apparatus includes a first electrical connector electrically connected to the load side of an arc fault circuit interrupter. A second electrical connector is electrically connected to the input of the arc fault generator. A third electrical connector is electrically connected to the output of the arc fault generator. A plurality of fourth electrical connectors are electrically connected to one or more of a plurality of masking loads. A fifth electrical connector is electrically connected to another load. A two pole, plural position rotary selector switch provides a plurality of different configurations of at least the arc fault generator and the one or more masking loads downstream of the load side of the arc fault circuit breaker.

Abstract: A method for finding the impedance of a device under test using an impedance measuring apparatus having a modem-type auto-balancing bridge, two or more measurement signals, each of which has a different phase with respect to the reference signals supplied to the modem inside said auto-balancing bridge, are applied to a device under test; the impedance of this device under test is measured when each of the measurement signals is applied to the device under test; and the impedance of this device under test is found using the above-mentioned phase and the impedance measurement value of each of these measurements.

Abstract: A system and method for inspecting a composite structure, such as to assess thermal degradation or resin curing, are provided in which the dielectric constant of the composite structure is determined using a microwave inverse scattering technique. The dielectric constant of the composite structure may be compared to the dielectric constant of one or more sample structures to determine the presence of thermal degradation or improper curing in the structure. In this regard, a system for inspecting a composite structure comprises a transmitter, a receiver, and a controller. The transmitter may be capable transmitting microwave energy directed toward the structure. The receiver may be capable of receiving microwave energy scattered from the structure. The controller may be capable of determining a dielectric constant of the structure using an inverse scattering algorithm and comparing the dielectric constant of the structure to a dielectric constant of at least one sample structure.

Abstract: An optical sampling apparatus has an electron beam generating apparatus which generates an electron beam by irradiating a cathode with an optical signal, a deflection electrode which deflects the generated electron beam, a sampling slit which transmits a part of the deflected electron beam, and a charge detection section which detects the quantity of charges or accumulated current of the transmitted electron beam. It is possible to perform accurate sampling in a high band.

Abstract: A probe card for a wafer test system is provided with a number of on board features enabling fan out of a test system controller channel to test multiple DUTs on a wafer, while limiting undesirable effects of fan out on test results. On board features of the probe card include one or more of the following: (a) DUT signal isolation provided by placing resistors in series with each DUT input to isolate failed DUTs; (b) DUT power isolation provided by switches, current limiters, or regulators in series with each DUT power pin to isolate the power supply from failed DUTs; (c) self test provided using an on board micro-controller or FPGA; (d) stacked daughter cards provided as part of the probe card to accommodate the additional on board test circuitry; and (e) use of a interface bus between a base PCB and daughter cards of the probe card, or the test system controller to minimize the number of interface wires between the base PCB and daughter cards or between the base PCB and the test system controller.

Abstract: The voltage application probe (54) and the voltage measurement probe (56) are connected to the voltage application pad (74) and the voltage measurement pad (76) of the semiconductor device (70). The voltage application pad (74) and the voltage measurement pad (76) are connected by the conductor (78), measuring the voltage applied to the voltage application pad (74) through the voltage measurement probe (56). The voltage compensation circuit (14) in the voltage development device (10) operates to make the voltage applied to the voltage application pad (74) equal to the set voltage for the voltage development device (10). Even when the resistance between the voltage application probe (54) and the voltage application pad (74) increases, the accurate setting voltage is applied to the voltage application pad (74).

Abstract: A probe card includes a main substrate, a main reinforcing plate attached to the upper surface of the main substrate, a sub-reinforcing plate attached to the upper surface of the main reinforcing plate, and coupling force adjusting means that couples the main reinforcing plate with the sub-reinforcing plate and adjusts the coupling force therebetween. The coupling force adjusting means has a plurality of threaded holes provided at intersections of a plurality of imaginary concentric circles, which is provided with a distance from a center of a probe card on a surface of the sub-reinforcing plate, and a plurality of imaginary straight lines, which is provided radially from the center at an predetermined angle; a plurality of screw holes provided at same intersections on a surface of the main reinforcing plate; and a plurality of coupling screws threaded selectively into the threaded holes 23a and the screw holes.

Abstract: An electrical feedback detection system for detecting electrical contact between a multi-point probe and an electrically conducting material test sample surface. The electrical feedback detection system comprises an electrical detector unit connected to a multitude of electrodes in the multi-point probe, and optionally directly to the test sample surface. The detector unit provides an electrical signal to a multi-point testing apparatus, which can be used to determine if the multi-point probe is in electrical contact with the test sample surface. The detector unit comprises an electrical generator means for generating an electrical signal that is driven through a first multitude of electrodes of the multi-point probe, and a second multitude of switched impedance detection elements. The electrical potential across the impedance detection elements determines the electrical contact to the test sample surface.

Abstract: A plurality of conductive pads of an apparatus in one example are disposed on a circuit board in a predetermined arrangement compatible with an arrangement of probes on an external test connector. One or more of the plurality of conductive pads is disposed on an embedded layer of the circuit board.

Abstract: There is provided a heat transferring object for transferring heat generated by a object to be cooled to a cooling unit, having a plurality of thermal transferring plates each having elasticity and provided in lamination and adhesive materials having thermal conductivity and provided between the thermal transferring plates so as to slidably hold the thermal transferring plates. Preferably, each of the thermal transferring plates has almost the same shape. Each of the thermal transferring plates may have a cooling unit fixing portion to be secured to the cooling unit and a plurality of extensions extending respectively from the cooling unit fixing portion and secured to the objects to be cooled independently from each other.

Abstract: A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

Abstract: A test head for an integrated circuit tester includes a main chassis defining a chamber that is open at the top. Tester modules are installed in the chamber, each tester module being removable as a unit from the chamber and including a tester module chassis, multiple pin electronics cards, and a tester module interface structure exposed at the top of the chamber. A test head interface structure is engageable with the tester module interface structures of the tester modules for connecting the tester module interface structures to a device interface unit.

Abstract: Integrated circuit chips include an internal circuit including interconnected semiconductor devices that are configured to provide integrated circuit functionality, and a Test Element Group (TEG) circuit that is configured to allow measuring of electrical characteristics of the semiconductor devices. By providing a TEG circuit in the same integrated circuit chip as the internal circuit, the TEG circuit may accurately represent the electrical characteristics of the interconnected semiconductor devices of the internal circuit of the associated integrated circuit chip. The integrated circuit chip may be coupled to a test apparatus. The test apparatus includes a test probe that is configured to simultaneously contact the internal circuit and the TEG circuit. The test apparatus also can simultaneously test the integrated circuit functionality of the internal circuit, and measure the electrical characteristics of the semiconductor devices via the TEG circuit.

Abstract: Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between an automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test the integrated circuit at a higher clock frequency than the automated testing equipment is configured to operate. In order to do so, the testing interface includes components configured for generating addresses and test data to be provided to the integrated circuit. A variety of test data patterns can be produced and the test data can be address dependent.

Abstract: A test socket for an integrated circuit, wherein the test socket has a first plurality of test points for making electrical contact with contacts of a laminate package and a second plurality of test points for making electrical contact with contacts of a lead frame package. The test socket is suitable for testing, at one time: a laminate package, or a lead frame package, or both a laminate package and a lead frame package.

Abstract: The present invention provides a technique enabling the amount of time required to evaluate the light fastness of a liquid crystal panel to be shortened. A method of testing the light fastness of a liquid crystal panel comprising a pair of substrates and a liquid crystal layer interposed between the substrates comprises the steps of: irradiating a test subject area of the liquid crystal panel with a laser beam, with at least one of the wavelength, the irradiation energy, and the irradiation duration of the laser beam set as a variable parameter; irradiating the liquid crystal panel with an observation beam and detecting the condition of the observation beam after passing through the liquid crystal panel; and evaluating the light fastness of the liquid crystal panel on the basis of a difference in the condition of the observation beam corresponding to the setting of the variable parameter of the laser beam.

Abstract: An integrated circuit (IC) includes mechanisms for adjusting or setting the gate bias of one gate of one or more multi-gate transistors. The IC includes a gate bias generator. The gate bias generator is configured to set a gate bias of one gate of the one or more multi-gate transistors within the IC. More specifically, the gate bias generator sets the gate bias of the transistor(s) so as to trade off performance and power consumption of the transistor(s).