Abstract: A test for measuring the contrast sensitivity of a patient uses a set of card that each include a stimulus, such as a square wave grating, presented at a single low-spatial frequency. The gratings vary in contrast from card to card. The test allows for the determination of the maximum contrast sensitivity of the patient in a single measurement, without knowing the spatial frequency at which that maximum occurs, which is possible because the spatial frequency is low enough that it is most likely below the maximum of the contrast sensitivity function in patients of any age.

Abstract: A system for projecting stereoscopic images is provided. The system includes a light source configured to provide light energy to a length of film having frames each comprising two sideframes oriented off axis, or side-by-side, from a preferred viewing orientation, an image receiving lens configured to receive light energy transmitted through the length of film, and an optical arrangement configured to receive images as light energy from the image receiving lens. The optical arrangement may include an afocal extender and means for reorienting images to the preferred viewing orientation and registering images reoriented to the preferred viewing orientation to a screen. The means for reorienting and registering include a plurality of optical refractive elements. Polarization, such as linear polarization, may be employed.

Abstract: There is disclosed a stereographic camera system including a first camera and a second camera including respective first and second lenses. A zoom mechanism may synchronously set focal lengths of the first and second lenses to a selected focal length of a plurality of predetermined focal lengths.

Abstract: A projector includes: a light source that emits light having an asymmetric illuminance distribution; a light modulation device that modulates the light emitted from the light source; and an optical member disposed in an optical path between the light source and the light modulation device, the optical member changing the illuminance distribution of the light from the light source, wherein the optical member changes the illuminance distribution of the light passing therethrough in such a way that a highest illuminance area in the illuminance distribution of the light after passing through the optical member is shifted toward the center of the optical member as compared with the position of the highest illuminance area in the illuminance distribution of the light before incident on the optical member.

Abstract: A multicolour LED, in which layers for generating light of different colours are arranged one above the other, is used as the light source in a projector.

Abstract: A projector includes: first and second light blocking members adapted to partially block a light beam from a light source, and a drive section adapted to make the first and second light blocking members perform an opening and closing operation. When the corresponding first and second light blocking members are located at a maximum blocking state, with respect to an opening and closing direction of the first and second light blocking members perpendicular to a system optical axis, a first and second support sections support the first and second light blocking members at predetermined positions on the system optical axis side from intermediate positions corresponding to midpoints of areas between edge portions of the first and second light blocking members on the system optical axis side and parts, to which outer edges of the light beam to be blocked are input.

Abstract: A projection system including a light valve, a lens, an arc reflector, and an arc screen is provided. The light valve is capable of providing an image beam. The lens is disposed in the transmission path of the image beam. The arc reflector has an arc reflective surface. The arc reflective surface is disposed in the transmission path of the image beam from the lens, so as to reflect the image beam. The arc reflective surface is curved in a first direction and not curved in a second direction substantially perpendicular to the first direction. The arc screen is disposed in the transmission path of the image beam reflected by the arc reflective surface. The arc screen is curved in the first direction and not curved in a third direction substantially perpendicular to the first direction. A projection apparatus and an imaging module are also provided.

Abstract: A light source device includes: a microwave generating section generating microwaves; a central conductor connected to the microwave generating section and emitting the microwaves; a discharge lamp connected to the central conductor and emitting light by the microwaves; and a reflector surrounding the discharge lamp, the reflector which has an opening at one end thereof and is formed of conductor material, wherein the relationship between a wavelength ? of the microwaves, an inside surface length D which is an inside diameter of the opening of the reflector or a maximum length of a cross-sectional shape of the opening of the reflector, and a length L from a first end of the discharge lamp opposite to a second end connected to the central conductor to the opening of the reflector is D??/2 and L/D?0.8.

Abstract: A light source device includes: an arc tube; a first reflection mirror which surrounds a part of the entire circumference of the arc tube around an optical axis; and a second reflection mirror disposed oppositely to the first reflection mirror, wherein the curvature at the cross point of a fourth plane extending in parallel with a plane extending perpendicular to the optical axis and containing the light emission area and the cross-sectional shape on a third plane passing through the light emission area, extending in parallel with the optical axis, and crossing a first plane passing through a light emission area and extending in parallel with the optical axis in the first reflection mirror is larger than the curvature at the cross point of the fourth plane and the cross-sectional shape on the first plane in the first reflection mirror.

Abstract: In various embodiments, output beams of multiple seed lasers differing in at least one beam characteristic are combined, amplified, and separated according to the beam characteristic(s) for use in, e.g., plateless lithographic printing.

Abstract: A wafer is loaded on a wafer stage and unloaded from a wafer stage, using a chuck member which holds the wafer from above in a non-contact manner. Accordingly, members and the like to load/unload the wafer on/from the wafer stage do not have to be provided, which can keep the stage from increasing in size and weight. Further, by using the chuck member which holds the wafer from above in a non-contact manner, a thin, flexible wafer can be loaded onto the wafer stage as well as unloaded from the wafer stage without any problems.

Abstract: An illumination optical system for microlithography is used to guide an illumination light bundle from a radiation source to an object field in an object plane. A field facet mirror has a plurality of field facets to predetermine defined illumination conditions in the object field. A following optical system is arranged downstream of the field facet mirror to transfer the illumination light into the object field. The following optical system has a pupil facet mirror with a plurality of pupil facets. Some of the field facets are divided into individual mirrors, which predetermine individual mirror illumination channels. The latter illuminate object field portions, which are smaller than the object field. At least some of the individual mirrors are configured as individual correction mirrors.

Abstract: A vibration control apparatus suppresses a vibration of a structure which is vibrated. The vibration control apparatus includes: a vibration isolation apparatus that supports the structure and suppresses a transmission of a vibration to the structure, the vibration having an amplitude equal to or less than a first amplitude in a predetermined direction; and a damping apparatus that damps a vibration of the structure vibrating in the predetermined vibration direction with a second amplitude larger than the first amplitude, to thereby reduce the vibration to equal to or less than the first amplitude.

Abstract: A distance measuring device is provided. The distance measuring device includes: a distance sensing unit, for sensing a distance value of a target object; a drive unit, for driving the distance sensing unit to rotate according to a rotation angle; and a compensation unit, for providing a compensation value according to the rotation angle and obtaining an actual distance according to the compensation value and the distance value.

Abstract: Fiber optic scanner and method for transmitting and receiving optical signals and range imaging camera including fiber optic scanner. The fiber optic scanner includes a light guide array including individual light guides arranged such that a first end has first ends of the individual light guides arranged in an image plane of collimating optics and a second end has second ends of the individual light guides arranged in a circular manner. A central light guide includes a first end arranged at a center of the circularly arranged second ends of the individual light guides and a motor driven reflector arranged to guide light emerging from the circularly arranged ends of the individual light guides into the central light guide.

Abstract: A compact LADAR transmitting and receiving apparatus includes a pulse laser generating pulses of light; a transmitter collimating and directing the pulses of light toward a target; a receiver collecting reflected pulses of light, the reflected pulses of light having been reflected from the target, the receiver comprising a tapered fiber bundle; a sensor operatively connected to the tapered fiber bundle, where the sensor comprises a photosensitive region and outputs a photocurrent; an amplifier amplifying the photocurrent; and a power divider splitting the amplified photocurrent between a high gain channel and a low gain channel; a RF interface accepting the high gain channel, the low gain channel, and an undelayed sample of a pulse of light generated from the pulse laser as input; a processing unit accepting output from the RF interface; and a display unit displaying output from the processing unit.

Abstract: A vibration detector (1) comprising at least one fibre optic sensor (2) mechanically coupled to a flexible support member (3). The vibration detector (1) is mounted on the outside of the pipeline and a signal from the fibre optic sensor is measured. This signal is indicative of whether the vibration detector is experiencing vibrations due to collisions of contaminant particles with each other and/or with the walls of the pipeline. A method for detecting particulate contaminants in a fluid flowing in a pipeline is also provided.

Abstract: There is described a sensor device for spectrally resolved capture of optical detection radiation which emanates from a value document transported through a capture area of the sensor device in a predefined transport direction, comprising a detection device for spectrally resolved detection of the detection radiation in at least one predefined spectral detection range and emission of detection signals which represent at least one, in particular spectral, property of the detected detection radiation, at least one reference radiation device which emits optical reference radiation which is coupled into a detection beam path of the detection device at least partly in dependence on the position of a value document relative to the capture area, and which has a spectrum with a narrow band which is within the predefined spectral detection range, and/or at least one spectrum with an edge which is within the predefined spectral detection range, and a control and evaluation device which is configured for employing the d

Abstract: An apparatus for fiber optic testing is presented. In one exemplary embodiment, the apparatus may comprise a plurality of fiber optic connectors for coupling to one or more fiber optic cables, one or more photodetectors operatively connected to the plurality of fiber optic connectors, an optical power measurement module operatively connected to the one or more photodetectors, a display for displaying information received from the optical power measurement module, and one or more user controls for accepting user input.

Abstract: A fiber optic end face inspection probe that includes a power control, an image control; a probe adaptor and probe end extending from a housing; an electronics module that includes a microprocessor, a memory and an optional wireless transmitter; and an autofocus camera system that includes a lens, a motor adapted to move the lens in order to focus the image through the lens, and an image sensor that is adapted to accept the image passing through the lens and transmit this image to the electronics module.

Abstract: A detector for receiving light impinging at a reception point and for measuring, for a plurality of angles of incidence, at least one property of the light. The detector includes a plurality of light sensors, each of which is associated with an acceptance interval (which defines the angle of incidence which a light beam must have to reach the light sensor) and at least two acceptance intervals are different from one another. The detector further includes an optical conductor for conducting a light beam from the reception point to a particular light sensor, but only if the angle of incidence of the light beam belongs to the acceptance interval associated with the particular light sensor.

Abstract: A device for detecting soiling, having a light source, which emits a light beam, and an opaque layer having a first boundary surface and a second boundary surface, whereby the light beam emitted by the light source first impinges on the first boundary surface, and part of a light beam fraction, which is scattered at the second boundary surface, impinges on a receiver and forms a measuring signal, and hereby the first boundary surface is set up to scatter part of the incident light beam, and the part impinging on the receiver of the light beam, scattered at the first boundary surface, forms a reference signal, and the device is set up further to determine a measure for the soiling of the second boundary surface from the comparison of the reference signal and measuring signal.

Abstract: A method and apparatus is used for inspection of devices to detect processing faults on semiconductor wafers. Illuminating a strip of a die along a scan path with a moving measurement spot. Detecting scattered radiation to obtain an angle-resolved spectrum that is spatially integrated over the strip. Comparing the scattering data with a library of reference spectra, obtained by measurement or calculation. Based on the comparison, determining the presence of a fault of the die at the strip. The measurement spot is scanned across the wafer in a scan path trajectory comprising large (constant) velocity portions and the acquisition of the angle-resolved spectrum is taken, and comparisons are done, at full scan speed. If a long acquisition is performed along a strip across the die in the Y direction, then variation in the acquired spectrum resulting from position variation will primarily depend on the X position of the spot.

Abstract: A method of measuring a relative phase of a bio-cell using a digital image sensor, comprising the steps of firstly filtering a light emitted from a light source, using a first polarizer and a first wave plate, which are arranged in order in a optical path, exposing a bio-cell to the firstly filtered light, secondly filtering the light passing through the bio-cell, using a second wave plate and a second polarizer, which are arranged in order in the optical path, and sensing an intensity of the secondly filtered light, by each of pixels of the image sensor, wherein, as conditions of the second filtering are varied, optical properties of the bio-cell are calculated using the intensity of the light in a pixel-wise manner.

Abstract: A method and apparatus for automated spectral calibration of a spectroscopy device. A method for simultaneous calibration and spectral imaging of a sample by: simultaneously illuminating the sample and a calibrant with a plurality of illuminating photons; receiving, at the spectrometer, a first plurality of photons collected from the sample and a second plurality of photons collected from the calibrant; forming a calibrant spectrum from the first plurality of collected photons and a sample spectrum from the second plurality of collected photons; comparing the calibrant spectrum with a reference spectrum of the calibrant to determine a wavelength-shift in the calibrant spectrum; applying the wavelength-shift to the sample spectrum to obtain a calibrated sample spectrum.

Abstract: A system and method for detection and identification of unknown samples using a combination of Raman and LIBS detection techniques. A first region of a sample and a second region of a sample are illuminated using structured illumination to thereby generate a first plurality of interacted photons and a second plurality of interacted photons. This first plurality and second plurality of interacted photons may be passed through a fiber array spectral translator device. Said first plurality of interacted photons are assessed using Raman spectroscopy to thereby generate a Raman data set. Said second plurality of interacted photons are assessed using LIBS spectroscopy to thereby generate LIBS data set. These data sets may be analyzed to identify the sample. These data sets may also be fused for further analysis.

Abstract: Provided herein are new methods and apparatus for quantitative measurement and analysis of particles, including new apparatus systems to process and detect nanoparticles in suspension. By focusing a laser beam at the center of a reservoir, nanoparticles are concentrated by optical energy, and fluorescent intensity at the focal point of the laser is measured to quantify particle concentration in the reservoir. The techniques may be applied to the analysis of suspensions of nanoparticles, including natural particles (e.g., microorganisms including whole viruses, bacteria, animal cells, and proteins) and synthetic particles (e.g., colloidal latexes, paints, pigments, and metallic or semiconductor nanoparticles) for medical and industrial applications, among others.

Abstract: Instruments and methods relating to surface plasmon imaging are described. An instrument comprises a semi-circular rail and a driving mechanism. The driving mechanism is attached to a light source mount and a detector mount, and both the light source mount and the detector mount are attached to the semi-circular rail with connectors. Each connector allows the light source mount and detector mount to slide along the rail. The synchronous movement of the light source mount and the detector mount changes the angle of incidence of a light beam from the light source with respect to the plane of the sample surface on the sample stage.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: The invention relates to a method of determination of a matching variant of a standard colour of a repair paint matching the effect colour of an object to be repaired, the method comprising the steps of a) determination of the standard colour of the colour of the object to be repaired, and b) determination of the best matching variant of the standard colour from a given number of variant colours, wherein • a swatch coated with the colour of the standard colour is visually compared under at least two different angles of illumination and/or observation with the colour to be matched, • the visual deviation from the standard colour and the colour of the object to be matched being evaluated on the basis of predetermined deviations for the visual properties, wherein the predetermined visual properties comprise at least one colour property and at least one texture property, •based on the predetermined deviations for the visual properties of the standard colour and the colour of the object to be matched, the best mat

Abstract: A platform able to vary a plasma resonance frequency applies to a prism of a conventional surface plasma resonance system and comprises at least one platform and a plurality of metal lines. The platform is a plate-like structure having two faces—a detection face and a connection face. The metal lines are arranged on the detection face. Each metal line has a width of 20-500nm and a thickness of 20-100nm. The spacing between two adjacent metal lines is 50-1000nm. The prism of the conventional surface plasma resonance technology is an application of the refraction technology. The optical grating technology is another application of the diffraction technology. However, the present invention is different from the abovementioned two technologies. The present invention increases the wavelength range of the absorption spectrum to the mid-infrared ray to promote the detection application of the surface plasma resonance technology.

Abstract: This invention provides methods of array reading and readers of assay result arrays wherein light can be scanned onto analytical region array members from a light source and/or light can be scanned from array members to a detector. One or more mirrors can have one of more pivotable axes enabling scanning light paths to be established between assay result arrays and other components of an analytical device.

Abstract: A visualized plasmon resonance biodetector utilizes the surface plasmon resonance to detect a plurality of biochemical molecules, and comprises a substrate, a silver-gold dual-layer structure, and a visible light source. The silver-gold dual-layer structure is formed on the substrate and has an optical grating structure on one side far away from the substrate. In a test, the biochemical molecule combines with the silver-gold dual-layer structure, and the visible light source emits a visible light to illuminate the substrate. Then the silver-gold dual-layer structure on the substrate generates surface plasmon resonance and a reflected light. The user can use his naked eyes to discriminate the reflected lights and learn the component and concentration of the biochemical molecule. Therefore, the biodetector can provide a low-cost and easy-to-operate detection instrument for biotests.

Abstract: Phase differences associated with a defocused wavefront can be determined from a single color image. The color image, which is a measurement of intensity as a function of wavelength, is used to calculate the change in intensity with respect to wavelength over the image plane. The change in intensity can then be used to estimate a phase difference associated with the defocused wavefront using two-dimensional fast Fourier transform solvers. The phase difference can be used to infer information about objects in the path of the defocused wavefront. For example, it can be used to determine an object's shape, surface profile, or refractive index profile. It can also be used to calculate path length differences for actuating adaptive optical systems. Compared to other techniques, deriving phase from defocused color images is faster, simpler, and can be implemented using standard color filters.

Abstract: A transversal change of the position of a measured sample surface exposed to the influence of visible radiation for example actinic light, is measured interferometrically by a reflecting target, which is in mechanical contact with the measured sample surface, and reflects a measuring beam, generated together with a reference beam by a laser source, and the transversal change of the position of the measured sample surface is detected from the phase difference of harmonic waves in the beam of interfering radiation. The device involves, for example, a special detection connection of photodetectors, a measuring unit and a basic module with a computer, the design of reflecting targets for liquid and solid samples, an optomechanical dimension transmitter and a holder of solid samples.

Abstract: Systems, processes, articles of manufacture, and techniques may be used to measure a surface to be machined. In particular implementations, a representation of a surface to be machined may be determined. Measuring the surface may include measuring a plurality of surface points at each of a plurality of surface measurement locations with a measurement system moving over a surface and measuring the position of the measurement system. Determining a representation of the surface to be machined may include determining an estimated shape for the surface based on the surface measurements at the surface measurement locations. The surface measurements, the surface measurement locations, and the estimated shape may be stored in computer memory for future retrieval and use.

Abstract: A system and method determine an approximate structure of an object on a substrate. This may be applied in model based metrology of microscopic structures to assess critical dimension or overlay performance of a lithographic apparatus. A scatterometer is used to determine approximate structure of an object, such as a grating on a stack, on a substrate. The wafer substrate has an upper layer and an underlying layer. The substrate has a first scatterometry target region, including the grating on a stack object. The grating on a stack is made up of the upper and underlying layers. The upper layer is patterned with a periodic grating. The substrate further has a neighboring second scatterometry target region, where the upper layer is absent. The second region has just the unpatterned underlying layers.

Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.

Abstract: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe is provided. The method includes: setting on a stage a calibration chart that includes not less than two non-parallel linewidth patterns being disposed relative to a reference position of the calibration chart and each having a known width and a level difference; capturing an image of the linewidth patterns of the calibration chart by an image probe to obtain the reference position of the calibration chart; measuring at least two of the linewidth patterns of the calibration chart by a contact-type detector to obtain the reference position of the calibration chart; and calculating a difference between the reference position obtained by using the image probe and the reference position obtained by using the contact-type detector to obtain the offset amount.

Abstract: An apparatus (10) for microlithographic projection exposure, which includes: an optical system (18) for imaging mask structures (16) onto a surface (21) of a substrate (20) by projecting the mask structures (16) with imaging radiation (13), the optical system (18) being configured to operate in the EUV and/or higher frequency wavelength range, and various structure defining a measurement beam path (36) for guiding measurement radiation (34), the measurement beam path (36) extending within the optical system (18) such that the measurement radiation (34) only partially passes through the optical system (18) during operation of the apparatus (10).

Abstract: A position measurement system configured to measure a position quantity of a movable object in a measurement direction, the system including a radiation source, a beam splitter to split the radiation beam in a measurement beam and a reference beam, a first reflective surface mounted on the movable object to receive the measurement beam, a second reflective surface mounted on a reference object to receive the reference beam, and a detector arranged to receive a first and second reflected beam reflected by the first and second reflective surface, respectively, and configured to provide a signal representative of the position quantity of the movable object based on the first and the second beam, wherein the radiation source and detector are mounted on an object that is different from the movable object and the reference object.

Abstract: A chassis measuring system comprises an illumination device for producing a structured illumination (38, 58, 78, 98), which is developed in such a way that it produces a structured image on a measuring head (32, 52; 72, 92) situated opposite in the transverse vehicle direction, a reference surface (40, 60, 80, 100) facing in the same direction as the illumination device (38, 58, 78, 98), on which a structured image produced by an illumination device (38, 58; 78, 98) of the measuring head (32, 52; 72, 92) situated opposite in the transverse vehicle direction may be projected, and at least one measuring camera (34, 36; 54, 56; 74, 76; 94, 96) facing in the same direction as the illumination device (38, 58, 78, 98), which is developed in such a way that it detects the structured image on the reference surface (40, 60; 80, 100) of the opposite measuring head (32, 52; 72, 92) in order to determine the position parameters of the measuring head (32, 52, 72, 92).

Abstract: An image forming apparatus includes: a functional element substrate to which a pixel is formed in a predetermined cycle; an opposed substrate formed on the functional element substrate; and an optical device arranged on the opposed substrate, which includes a transparent layer and an optical absorption layer arranged in a cycle of 1/n (n is an integer number) of the cycle of arranging the pixel, and restricts spread of transmitted light.

Abstract: Inputted image data is converted to M number of multi-value data having a lower resolution than the inputted image data, and after quantization processing has been performed for each of the M number of multi-value data, an image is printed by M number of relative movements (M-pass printing) that corresponds to the M number of quantized data. By doing so, when compared with the case in which a resolution reduction process is not performed, it is possible to suppress the number of pixels that become the object of quantization processing, and it becomes possible to output an image with no fluctuation in image density or density unevenness without a decrease in the processing speed.

Abstract: A dot position measurement method includes: a line pattern forming step of forming a measurement line pattern including a plurality of lines of rows of dots corresponding to a plurality of recording elements arranged in a first direction of a recording head respectively, on a recording medium, while causing relative movement between the recording head and the recording medium in a second direction perpendicular to the first direction, the measurement line pattern including a plurality of line blocks each including a group of the lines recorded by the recording elements spaced at a prescribed interval in the first direction, and a plurality of common line blocks each including the lines recorded by the recording elements which are same as the recording elements recording the lines included in the plurality of line blocks respectively; a reading step of reading an image of the measurement line pattern formed on the recording medium in the line pattern forming step, by an image reading apparatus; a line position

Abstract: Techniques are disclosed for stitching images printed by a multi-head printer in a manner that is relatively insensitive to misregistration of the image segments. When a pair of overlapping print heads print a pair of adjacent image segments which meet in a stitching region, printing at each location in the stitching region is accomplished by both print heads with a weighting that depends on the location being printed within the stitching region. In one embodiment, for example, the output of each print head is weighted by a linear function of horizontal pixel position. Techniques are also disclosed for selecting screening patterns for use when stitching is performed with variable-dot printers. Such screening patterns are selected to minimize variations in density that may arise as the result of cross-web and/or down-web misregistration.

Abstract: A de-skew method of an image forming apparatus is provided which includes reading an image on a print medium fed through an automatic document feeder (ADF); detecting a leading edge of the print medium and calculating a skew angle of the read image; comparing the calculated skew angle to a first threshold and determining whether to perform a de-skew operation; and setting skew compensation levels based on the calculated skew angle and performing different de-skew operations according to the set skew compensation levels to output a de-skewed image when the absolute value of the calculated skew angle is equal to or greater than the first threshold.

Abstract: An image forming apparatus and an auto color registration method thereof. The automatic color registration method of the image forming apparatus, the method includes transferring a plurality of first patterns synchronized with a phase of an image receptor, detecting the transferred first patterns, and performing an automatic color registration (ACR) by controlling a driving speed of the image receptor based on the detected first pattern. With this, the apparatus and method controls a driving speed of an image receptor by using a pattern synchronized with a phase of the image receptor and improves accuracy of the ACR.

Abstract: An image formation device includes an image reading unit, a control unit, and a displaying unit. The image reading unit reads a document according to a scan parameter to obtain an image data having a first data size. The control unit controls changing the first data size to the second data size due to change of the scan parameter, and calculates the second data size based on the changed scan parameter. The displaying unit displays the second data size and a preview of image based on the second data size.

Abstract: Provided is an image processor and image processing method that are capable of suppressing both density unevenness and graininess that occur due to deviation of the printing position of dots that are printed by a plurality of relative movements (or a plurality of printing element groups). In order to accomplish this, the dot overlap rate of an image characteristic in which density unevenness stands out is made higher than the dot overlap rate of an image characteristic in which other defects stand out more than the density unevenness. By doing so, it is possible to suitably adjust the dot overlap rate according to an image characteristic, and to output an image having no density unevenness or graininess.