Patents Issued in July 29, 2014
  • Patent number: 8791391
    Abstract: A disk processing system having a plurality of processing chambers, a load chamber comprising a heater, and a disk transport system coupled to the plurality of processing chambers and the load chamber to transport a disk there among.
    Type: Grant
    Filed: February 28, 2013
    Date of Patent: July 29, 2014
    Assignee: WD Media, LLC
    Inventor: Allen J. Bourez
  • Patent number: 8791392
    Abstract: Described herein is a method of detecting fault conditions in a multiplexed multi-heater-zone heating plate for a substrate support assembly used to support a semiconductor substrate in a semiconductor processing apparatus.
    Type: Grant
    Filed: October 22, 2010
    Date of Patent: July 29, 2014
    Assignee: Lam Research Corporation
    Inventor: Harmeet Singh
  • Patent number: 8791393
    Abstract: A heating control system for controlling heating of a fluid within an associated fluid vessel includes a first sensor responsive to a low fluid level in the fluid vessel and a second sensor responsive to a temperature of the fluid within the fluid vessel. The heating control system also includes a control circuit electrically connected with the first sensor and the second sensor to control electrical power to a heating unit for heating the fluid within the fluid vessel. The control circuit allows electrical power to be connected to the heating unit upon a first predetermined condition of the first sensor and a first predetermined condition of the second sensor. The control circuit disconnects power to the heating unit upon either a second predetermined condition of the first sensor or a second predetermined condition of the second sensor.
    Type: Grant
    Filed: January 10, 2012
    Date of Patent: July 29, 2014
    Assignee: Oshkosh Corporation
    Inventors: Daniel John Worden, Karl James Bauer
  • Patent number: 8791394
    Abstract: The present invention is to provide a heating substrate equipped with a conductive thin film and electrodes. The heating substrate includes a transparent substrate, a plurality of electrodes formed on a first face of the substrate, and a conductive thin film formed on the first face of the substrate and including a plurality of regions electrically connected each other in parallel by the plurality of electrodes. Furthermore, a method of manufacturing a heating substrate equipped with a conductive thin film and electrodes according to an exemplary embodiment of the present invention includes forming the conductive thin film on a substrate, forming main electrodes so as to extend on the substrate while being adjacent to edges of the conductive thin film, and forming branched electrodes that are extended from the conductive thin film across one side of the conductive thin film while coming in contact with the conductive thin film.
    Type: Grant
    Filed: August 7, 2008
    Date of Patent: July 29, 2014
    Assignee: Korea Institute of Machinery & Materials
    Inventors: Chang-Soo Han, Jin-Won Song, Joon-Dong Kim, Yu-Hwan Yoon
  • Patent number: 8791395
    Abstract: An embodiment of the present disclosure relates to a heating device comprising a carbon nanotube, which comprises a carbon nanotube layer containing aligned carbon nanotube carpet, a first electrode and a second electrode having a predetermined distance between each other and electrically connected to the carbon nanotube layer respectively, wherein a current produced by applying a voltage to the first electrode passes laterally via the diameter direction of the aligned carbon nanotubes from the first electrode to the second electrode. The present disclosure also includes methods for manufacturing the aligned carbon nanotube carpet.
    Type: Grant
    Filed: April 5, 2012
    Date of Patent: July 29, 2014
    Assignee: National Taiwan University
    Inventors: Shuo-Hung Chang, Chih-Chung Su
  • Patent number: 8791396
    Abstract: A heating system for a subsurface formation includes a conduit located in a first opening in the subsurface formation. Three electrical conductors are located in the conduit. A return conductor is located inside the conduit. The return conductor is electrically coupled to the ends of the electrical conductors distal from the surface of the formation. Insulation is located inside the conduit. The insulation electrically insulates the three electrical conductors, the return conductor, and the conduit from each other.
    Type: Grant
    Filed: April 18, 2008
    Date of Patent: July 29, 2014
    Assignee: Shell Oil Company
    Inventors: David Burns, Charles R. Goodwin
  • Patent number: 8791397
    Abstract: The present invention provides an induction heating device for a fuel cell system, which can rapidly heat coolant during cold start-up, control the power consumption depending on the voltage of a fuel cell stack, and ensure the insulation resistance by separating a heating unit, which is in contact with the coolant, from the outside.
    Type: Grant
    Filed: June 28, 2011
    Date of Patent: July 29, 2014
    Assignee: Hyundai Motor Company
    Inventors: Seong Kyun Kim, Haeng Jin Ko, Su Dong Han, Gi Young Nam, Yun Seok Kim
  • Patent number: 8791398
    Abstract: An induction cooktop includes a cooking zone, and a circuit arrangement for operating the cooking zone. The circuit arrangement has a parallel circuit, in which two inductors are connected in parallel manner. An apparatus is configured to detect occupancy of at least one cooking sub-zone of the cooking zone by a food preparation vessel and includes a current measuring element which is connected in series to the parallel circuit.
    Type: Grant
    Filed: February 9, 2011
    Date of Patent: July 29, 2014
    Assignee: BSH Bosch und Siemens Hausgeraete GmbH
    Inventors: Jose Maria De la Cuerda Ortin, Ignacio Garde Aranda, Oscar Gracia Campos, Pablo Jesus Hernandez Blasco, Sergio Llorente Gil, Paul Muresan
  • Patent number: 8791399
    Abstract: An object of the invention is to accurately detect a state of an object to be heated in a cooking vessel and effectively avoid cooking failure. An induction heating section (13) inductively heats a cooking vessel (11). A vibration detecting section (14) detects a vibration of the cooking vessel (11) via a top plate (12). A vibration waveform extracting section (15) extracts a vibration waveform of a frequency component having a frequency equal to a predetermined multiplication product of an induction heating frequency, from a waveform of the vibration detected by the vibration detecting section (14). A determining section (16) determines a state of an object to be heated, based on the vibration waveform extracted by the vibration waveform extracting section (15).
    Type: Grant
    Filed: May 1, 2007
    Date of Patent: July 29, 2014
    Assignee: Panasonic Corporation
    Inventors: Sachio Nagamitsu, Makiko Noda
  • Patent number: 8791400
    Abstract: An image sensor includes a dummy pixel array with at least one dummy pixel, a pixel array with a plurality of main pixels, and a data processing unit configured to process a signal provided from the main pixels. The dummy pixel includes: a first switch having a first terminal receiving a first voltage and a second terminal coupled to a floating node; a second switch having a first terminal receiving a second voltage; a third switch coupled between a second terminal of the second switch and the floating node; and a driving element configured to drive a first terminal thereof according to a voltage level applied to the floating node.
    Type: Grant
    Filed: June 14, 2011
    Date of Patent: July 29, 2014
    Assignee: SK Hynix Inc.
    Inventors: Kwang Jun Cho, Tae Woo Kim
  • Patent number: 8791401
    Abstract: A method for controlling a pixel may include first and second photosites, each having a photodiode and a charge-transfer transistor, a read node, and an electronic read element, all of which are common to all the photosites. The method may include an accumulation of photogenerated charges in the photodiode of the first photosite during a first period, an accumulation of photogenerated charges in the photodiode of the second photosite during a second period shorter than the first period, a selection of the signal corresponding to the quantity of charges accumulated in the photodiode of a photosite having the highest unsaturated intensity or else a saturation signal, and a digitization of the selected signal.
    Type: Grant
    Filed: May 31, 2012
    Date of Patent: July 29, 2014
    Assignees: STMicroelectronics (Crolles 2) SAS, STMicroelectronics SA
    Inventors: Frederic Barbier, Frederic Lalanne
  • Patent number: 8791402
    Abstract: A detector device is configured to receive light and generate electrical signals. The detector device includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component is at least one of: positioned so as to have a light path extend through the cooling component, where the light path is defined by light that is received for detection; designed so as to include a thermally conductive, electrically insulating intermediate element; and disposed, in direct contact a light sensor of the detector and/or a substrate bearing the light sensor.
    Type: Grant
    Filed: December 14, 2011
    Date of Patent: July 29, 2014
    Assignee: Leica Microsystems CMS GmbH
    Inventor: Bernd Widzgowski
  • Patent number: 8791403
    Abstract: An apparatus includes an image sensor having N image sensor regions arranged thereon. A lens array having a including N lens structures is disposed proximate to the image sensor. Each one of the N lens structures is arranged to focus a single image onto a respective one of the N image sensor regions. The N lens structures include a first lens structure having a first focal length and positioned the first focal length away from the respective one of the N image sensor regions. A second lens structure having a second focal length is positioned the second focal length away from the respective one of the N image sensor regions. A third lens structure having a third focal length is positioned the third focal length away from the respective one of the N image sensor regions. The first, second and third focal lengths are different.
    Type: Grant
    Filed: June 1, 2012
    Date of Patent: July 29, 2014
    Assignee: OmniVision Technologies, Inc.
    Inventors: Chia-Wei Wang, Jau-Jan Deng, Yun-Chiang Hsu
  • Patent number: 8791404
    Abstract: Techniques are described to furnish an IR suppression filter that is formed on a glass substrate to a light sensor. In one or more implementations, a light sensor includes a substrate having a surface. One or more photodetectors are formed in the substrate and configured to detect light and provide a signal in response thereto. An IR suppression filter configured to block infrared light from reaching the surface is formed on a glass substrate. The light sensor also includes a plurality of color pass filters disposed over the surface. The color pass filters are configured to filter visible light to pass light in a limited spectrum of wavelengths to the one or more photodetectors. A buffer layer is disposed over the surface and configured to encapsulate the plurality of color pass filters and adhesion layer. The light sensor further includes through-silicon vias to provide electrical interconnections between different conductive layers.
    Type: Grant
    Filed: December 27, 2011
    Date of Patent: July 29, 2014
    Assignee: Maxim Integrated Products, Inc.
    Inventors: Nicole D. Kerness, Arkadii V. Samoilov, Zhihai Wang, Joy T. Jones
  • Patent number: 8791405
    Abstract: Optical waveguide and coupler devices and methods include a trench formed in a bulk semiconductor substrate, for example, a bulk silicon substrate. A bottom cladding layer is formed in the trench, and a core region is formed on the bottom cladding layer. A reflective element, such as a distributed Bragg reflector can be formed under the coupler device and/or the waveguide device. Because the optical devices are integrated in a bulk substrate, they can be readily integrated with other devices on a chip or die in accordance with silicon photonics technology. Specifically, for example, the optical devices can be integrated in a DRAM memory circuit chip die.
    Type: Grant
    Filed: October 25, 2010
    Date of Patent: July 29, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ho-chul Ji, Ki-nam Kim, Yong-woo Hyung, Kyoung-won Na, Kyoung-ho Ha, Yoon-dong Park, Dae-lok Bae, Jin-kwon Bok, Pil-kyu Kang, Sung-dong Suh, Seong-gu Kim, Dong-jae Shin, In-sung Joe
  • Patent number: 8791406
    Abstract: The invention provides an apparatus and method for measuring a property of a gas, such as the amount of liquid in a stream of the gas. The apparatus comprises a source of beta particles (20), a detector (23) capable of detecting beta particles, means (18) to support said source and said detector spaced apart from each other such that gas may enter the space between the source and detector and that the source is positioned to emit beta particles towards said detector; wherein said detector comprises a scintillation material in optical communication with a photodetector (26), and means (24) to physically isolate said photodetector from said gas.
    Type: Grant
    Filed: September 28, 2010
    Date of Patent: July 29, 2014
    Assignee: Johnson Matthey, PLC
    Inventors: Magne Kjetil Husebo, Tor Magnus Saevareide
  • Patent number: 8791407
    Abstract: A downhole gamma ray density measurement system is described. The gamma ray density measurement system includes a pressure housing and a gamma ray source within the pressure housing. One or more detectors within the pressure housing detect gamma radiation. One or more low-attenuation inserts may be located in the pressure housing near the gamma ray source and/or one or more of the detectors. One or more high-attenuation inserts may be located in the pressure housing near the gamma ray source and/or one or more of the detectors.
    Type: Grant
    Filed: February 17, 2011
    Date of Patent: July 29, 2014
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Gordon Layne Moake, Daniel P. Kusmer, Wesley Neil Ludwig
  • Patent number: 8791408
    Abstract: The present invention is concerned with methods and apparatuses for generating mass spectrum data using a mass spectrometer by subtracting noise mass spectrum data representative of noise in the mass spectrometer from signal mass spectrum data representative of the mass/charge ratio of ions in a sample material. This produces a modified signal mass spectrum data representative of the mass/charge ratio of ions in the sample material. The method includes acquiring and subtracting noise mass spectrum data representative of noise in the mass spectrometer or alternatively subtracting noise mass spectrum data from a previously acquired or pre-stored noise spectrum data. Embodiments demonstrate reduced noise and in particular reduced systematic noise compared with the originally acquired signal mass spectrum data.
    Type: Grant
    Filed: July 28, 2011
    Date of Patent: July 29, 2014
    Assignee: Kratos Analytical Limited
    Inventor: Andrew Bowdler
  • Patent number: 8791409
    Abstract: A method for mass analyzing multiply-charged ions is provided as well as a mass analyzer suitable for performing the method, the method comprising: introducing multiply-charged ions into an electrostatic mass analyzer where ions undergo multiple changes of direction of motion; detecting the ions in the analyzer; and determining the mass-to-charge ratio of at least some of the detected ions; wherein the absolute velocity in the analyzer of at least some of the ions whose mass-to-charge ratio is determined is not greater than 8,000 m/s and the average path length over the duration of detection of such ions is longer than required for detecting such ions with a mass-to-charge ratio resolving power of 1,000. High resolution mass spectra of high m/z protein complexes, for example in a native state and with low charge, can be achieved.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: July 29, 2014
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Alexander Alekseevich Makarov, Eduard V. Denisov, Nicolaie Eugen Damoc
  • Patent number: 8791410
    Abstract: A mass spectrometry system based on the general principle of accelerator mass spectrometry (AMS) is disclosed. An ion source (10) generates a beam (B) of ions having a negative charge state. A first mass analyzer (20) transmits only ions having a predetermined mass. The ions are passed through a stripper target (80) comprising helium and/or hydrogen as a stripping gas to change the charge state of said ions from negative to positive charge and to dissociate molecular ions by collisions. A second mass analyzer (110, 130) transmits ions in charge state 1+ having the predetermined mass, which are detected by a detector (140). By using helium and/or hydrogen gas and detecting ions in charge state 1+, it becomes possible to use kinetic energies below 200 keV without excessive transmission losses due to angular straggling. At sufficiently low energies, no additional acceleration is required after ions have been extracted from the ion source.
    Type: Grant
    Filed: April 7, 2011
    Date of Patent: July 29, 2014
    Assignee: Eth ZĂ¼rich, Eth Transfer
    Inventors: Hans-Arno Synal, Tim Schulze-König, Martin Suter
  • Patent number: 8791411
    Abstract: An ionic liquid ion source can include a microfabricated body including a base and a tip. The body can be formed of a porous material compatible with at least one of an ionic liquid or room-temperature molten salt. The body can have a pore size gradient that decreases from the base of the body to the tip of the body, such that the at least one of an ionic liquid or room-temperature molten salt is capable of being transported through capillarity from the base to the tip.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: July 29, 2014
    Assignee: Massachusetts Institute of Technology
    Inventors: Paulo C. Lozano, Natalya Anna Brikner, Chase Spenser Coffman
  • Patent number: 8791412
    Abstract: A sample processing apparatus (102) includes a reference carrier region (106) that supports a reference carrier (108), which includes one or more reference substances that emit radiation with unique and known spectral characteristics in response to being irradiated with radiation having a wavelength in a predetermined range of interest. The sample processing apparatus further includes a carrier receiving region (110) configured to alternatively receive a sample carrier (104) or the reference carrier for processing by the apparatus. The sample processing apparatus further includes an optical component (114, 116, 118) that emits radiation, having a wavelength in a predetermined range of interest, that irradiates the carrier in the carrier receiving region, and that detects the radiation emitted from the carrier. The apparatus moves the reference carrier from the reference carrier region to the carrier receiving region for processing by the apparatus.
    Type: Grant
    Filed: September 1, 2010
    Date of Patent: July 29, 2014
    Assignee: Analogic Corporation
    Inventor: Gilbert W. McKenna
  • Patent number: 8791413
    Abstract: Provided is a charged particle beam device that outputs both an ion beam and an electron beam at a sample, has a common detector for both the ion beam and the electron beam in the charged particle beam device that processes and observes the sample, and is able to provide a detection unit to an appropriate position corresponding to the process details and observation technique of the sample.
    Type: Grant
    Filed: August 2, 2011
    Date of Patent: July 29, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Shinya Kitayama, Wataru Suzuki, Satoshi Tomimatsu
  • Patent number: 8791414
    Abstract: The present invention generally relates to dynamic focus adjustment for an image system. With the assistance of a height detection sub-system, present invention provides an apparatus and methods for micro adjusting an image focusing according the specimen surface height variation by altering the field strength of an electrostatic lens between objective lens and sample stage/or a bias voltage applied to the sample surface. Merely by way of example, the invention has been applied to a scanning electron inspection system. But it would be recognized that the invention could apply to other system using charged particle beam as observation tool with a height detection apparatus.
    Type: Grant
    Filed: April 21, 2010
    Date of Patent: July 29, 2014
    Assignee: Hermes Microvision, Inc.
    Inventors: Joe Wang, Van-Duc Nguyen, Yi-Xiang Wang, Jack Jau, Zhongwei Chen
  • Patent number: 8791415
    Abstract: The present invention provides an electron microscope device, comprising a scanning electron microscope 2 provided with scanning means 10 for scanning an electron beam and an electron detector 12 for detecting an electron 11 issued from a specimen 8 where the electron beam is projected for scanning, wherein a scanning electron image is acquired based on a detection result from the electron detector, wherein the electron detector comprises a fluorescent substance layer for performing photoelectric conversion, a wavelength filter giving restriction so that all or almost all of wavelength ranges of fluorescent lights from the fluorescent substance layer can be transmitted, and a wavelength detecting element for receiving the fluorescent light transmitted through the wavelength filter and for performing photoelectric conversion.
    Type: Grant
    Filed: December 11, 2009
    Date of Patent: July 29, 2014
    Assignee: Horiba Ltd.
    Inventor: Hisashi Isozaki
  • Patent number: 8791416
    Abstract: The present invention provides an on-chip thin film phase plate for a releasing charging, comprising a chip substrate having one or more apertures; and a thin film layer attached to the top surface of the chip substrate. The present invention also provides a method for observing organic material by TEM, which uses the above-mentioned on-chip thin film phase plate in a TEM system.
    Type: Grant
    Filed: December 16, 2013
    Date of Patent: July 29, 2014
    Assignee: Academia Sinica
    Inventors: Yunn-Shin Shiue, Pai-Chia Kuo, Chih-Ting Chen, Yuh-Lin Wang, Yong-Fen Hsieh
  • Patent number: 8791417
    Abstract: Methods, apparatus, and systems are provided for measuring the supply of a consumable product/energy source, such as electrical power, to a facility over time and analyzing the measurements to determine the consumption or supply of the product by one or more loads and/or sources in the facility, and to determine induced and residual heat flow through the facility's envelope. Various aspects compare the measured supply of the consumable product to a database of consumption signatures, which characterize access to the consumable product by particular users. Operating conditions and facility characteristics, such as temperatures, load factors, insulation factors, etc., may be further considered in determining a particular user's access of the consumable product. To aid in the controlling of energy use, thermal resistance factors of the building are determined, which are based on the induced and residual heat flow through the facility.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: July 29, 2014
    Assignee: Netesco LLC
    Inventors: Michael Craig Scelzi, James Scelzi, Allan H. Vaitses, William Shawn Bonwell, Mark Christopher Hartman
  • Patent number: 8791418
    Abstract: A two-dimensional array of memory cells may be used to implement a spatial dosimeter. The two-dimensional array of cells may be implemented by an integrated circuit memory. Because of the relatively small size of the integrated circuit memory, the resolution of the resulting array may be less than 100 nanometers. The change in threshold voltage of each of the cells, as a result of radiation exposure, may be used to calculate the dose seen at each cell, allowing dose profiles in two dimensions with sub-micrometer resolution.
    Type: Grant
    Filed: December 8, 2008
    Date of Patent: July 29, 2014
    Assignee: Micron Technology, Inc.
    Inventors: Angelo Visconti, Mauro Bonanomi, Giorgio Cellere, Alessandro Paccagnella
  • Patent number: 8791419
    Abstract: Embodiments of methods and apparatus are disclosed for obtaining an imaging array or a digital radiographic system including a plurality of pixels where at least one pixel can include a scan line, a bias line, a switching element including a first terminal, a second terminal, and a control electrode where the control electrode is electrically coupled to the scan line; and a photoelectric conversion element including a first terminal electrically coupled to the bias line and a second terminal electrically coupled to the first terminal of the switching element, and a signal storage element formed in the same layers as the scan line, bias line, the data line, the switching element and the photoelectric conversion element. An area of one terminal of the signal storage element can be larger than a surface area of the pixel.
    Type: Grant
    Filed: December 15, 2010
    Date of Patent: July 29, 2014
    Assignee: Carestream Health, Inc.
    Inventors: Jeff Hsin Chang, Timothy J. Tredwell, Gregory N. Heiler
  • Patent number: 8791420
    Abstract: An electronic cassette has a top plate, an anisotropic heat transfer plate, a detection panel, and a scintillator disposed in this order from an X-ray irradiation side. The scintillator converts X-rays transmitted through the top plate, the anisotropic heat transfer plate, and the detection panel into visible light. The detection panel performs photoelectric conversion of the visible light. The anisotropic heat transfer plate is composed of a lamination of first prepregs in which all carbon fibers are oriented in a heat flow direction. The top plate is composed of an alternate lamination of the first prepregs and second prepregs that have carbon fibers oriented in a signal line direction. Body heat of a patient is transferred to the top plate, and is transferred in the heat flow direction in the anisotropic heat transfer plate, and then is released from a housing through heat absorbing members.
    Type: Grant
    Filed: April 25, 2012
    Date of Patent: July 29, 2014
    Assignee: Fujifilm Corporation
    Inventors: Fumito Nariyuki, Haruyasu Nakatsugawa
  • Patent number: 8791421
    Abstract: The present invention provides a boron-containing gas film fast-neutron detector. The fast-neutron detector comprises a package piece having a hollow cavity; a plastic scintillator array provided in the cavity and comprising a plurality of plastic scintillator units, a gap existing between adjacent plastic scintillator units; and a boron-containing gas filled into and gas-tightly sealed in the hollow cavity, the boron-containing gas forming a boron-containing gas film in the gap between the adjacent plastic scintillator units. The fast-neutron detector of the present invention completely does not require use of scarce and expensive 3He gas, nor needs a complicated boron film coating process, improves credibility of signal coincidence, and is adapted for measurement of environment background neutrons and extensively adapted for detection of radioactive substance at sites such as customs ports, harbors and the like.
    Type: Grant
    Filed: March 28, 2013
    Date of Patent: July 29, 2014
    Assignees: Nuctech Company Limited, Tsinghua University
    Inventors: Yuanjing Li, Yigang Yang, Qinjian Zhang, Yi Liu, Yang Tai
  • Patent number: 8791422
    Abstract: Provided is a charged particle beam writing apparatus including a stage which a sample can be mounted thereon, an irradiation unit which emits a charged particle beam to be irradiated on the sample, and an aperture plate which includes a first opening portion to shape the charged particle beam. The aperture plate has a stacked structure of a first member and a second member, and a position of an end portion of the first opening portion in the second member is recessed from the position of the end portion of the first opening portion in the first member.
    Type: Grant
    Filed: December 6, 2012
    Date of Patent: July 29, 2014
    Assignee: Nuflare Technology, Inc.
    Inventors: Takanao Touya, Munehiro Ogasawara
  • Patent number: 8791423
    Abstract: An aberration correction device includes, between a TEM objective lens and an STEM objective lens, a transfer lens group for transferring a coma-free surface of the TEM objective lens to a multipolar lens, a transfer lens group for transferring the coma-free surface of the TEM objective lens to a multipolar lens, and a transfer lens for correcting fifth-order spherical aberration of the STEM objective lens.
    Type: Grant
    Filed: July 26, 2011
    Date of Patent: July 29, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Yoichi Hirayama
  • Patent number: 8791424
    Abstract: The invention relates to a control grid for an electron beam generating device, wherein the control grid comprises apertures arranged in rows in a width direction and columns in a height direction, wherein a majority of the apertures in a row have the same size, and wherein the size of the apertures of at least one row differs from the size of the apertures of another row.
    Type: Grant
    Filed: August 24, 2011
    Date of Patent: July 29, 2014
    Assignee: Tetra Laval Holdings & Finance S.A.
    Inventor: Dominique Cloetta
  • Patent number: 8791425
    Abstract: The present invention provides two ways to form a special permeability discontinuity unit inside every sub-lens of a multi-axis magnetic lens, which either has a simpler configuration or has more flexibility in manufacturing such as material selection and mechanical structure. Accordingly several types of multi-axis magnetic lens are proposed for various applications. One type is for general application such as a multi-axis magnetic condenser lens or a multi-axis magnetic transfer lens, another type is a multi-axis magnetic non-immersion objective which can require a lower magnetomotive force, and one more type is a multi-axis magnetic immersion objective lens which can generate smaller aberrations. Due to using permeability-discontinuity units, every multi-axis magnetic lens in this invention can also be electrically excited to function as a multi-axis electromagnetic compound lens so as to further reduce aberrations thereof and/or realize electron beam retarding for low-voltage irradiation on specimen.
    Type: Grant
    Filed: May 16, 2013
    Date of Patent: July 29, 2014
    Assignee: Hermes Microvision, Inc.
    Inventors: Weiming Ren, Zongwei Chen
  • Patent number: 8791426
    Abstract: A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.
    Type: Grant
    Filed: November 1, 2010
    Date of Patent: July 29, 2014
    Assignee: Lawrence Livermore National Security, LLC.
    Inventors: John W. Elmer, Alan T. Teruya
  • Patent number: 8791427
    Abstract: The distribution of a fluorescent material in a specimen can be observed and the fluorescent material can be obtained as clear, highly quantitative image data.
    Type: Grant
    Filed: December 16, 2008
    Date of Patent: July 29, 2014
    Assignee: Olympus Corporation
    Inventors: Susumu Honda, Chika Nakajima
  • Patent number: 8791428
    Abstract: A value document authentication system comprising a value document substrate having a luminescent compound disposed on or in at least a portion of the value document substrate, wherein the luminescent compound (i) comprises a host lattice having at least one metallic ion with magnetic properties and is doped with at least one rare earth ion capable of emitting infrared radiation with at least one distinct infrared wavelength when excited with an exciting light source having sufficient energy to excite emission from the luminescent compound and (ii) has a pre-determined ratio of metallic ions to rare earth ions such that the ratio corresponds to a parameter of a pre-selected decision criteria, both of which properties are measured at the same location on the value document and used to authenticate the value document.
    Type: Grant
    Filed: September 29, 2010
    Date of Patent: July 29, 2014
    Assignee: Honeywell International Inc.
    Inventors: Carsten Lau, James Kane, William Ross Rapoport
  • Patent number: 8791429
    Abstract: A method for automated microscopic analysis wherein the test protocol is obtained from interrogatable data affixed to each microscope slide. The method further comprises the algorithms that implement the test protocol.
    Type: Grant
    Filed: August 3, 2007
    Date of Patent: July 29, 2014
    Assignee: Ikonisys, Inc.
    Inventors: Young Min Kim, Yanning Zhu, Yash Agarwal, Xiuzhong Wang, Aaron Armstrong, Robert Borgerding, Andrew Macginitie, Antti Seppo, Ilia Ichetovkin, Michael Kilpatrick, Petros Tsipouras, Triantafyllos P. Tafas
  • Patent number: 8791430
    Abstract: Disclosed are an apparatus, system, and method for scanning a substrate or other workpiece through a gas-cluster ion beam (GCIB), or any other type of ion beam. The workpiece scanning apparatus is configured to receive and hold a substrate for irradiation by the GCIB and to scan it through the GCIB in two directions using two movements: a reciprocating fast-scan movement, and a slow-scan movement. The slow-scan movement is actuated using a servo motor and a belt drive system, the belt drive system being configured to reduce the failure rate of the workpiece scanning apparatus.
    Type: Grant
    Filed: March 2, 2012
    Date of Patent: July 29, 2014
    Assignee: TEL Epion Inc.
    Inventors: Matthew C. Gwinn, Avrum Freytsis, Jay R. Wallace
  • Patent number: 8791431
    Abstract: The present invention provides a drawing apparatus for performing drawing on a substrate with a charged particle beam, the apparatus including a first member in which an aperture, through which the charged particle beam passes, is formed, a chamber including a first space and a second space which are partitioned by the first member, and a removing device including a first supply device configured to supply a first gas containing unsaturated hydrocarbon to the first space and a second supply device configured to supply a second gas containing ozone to the second space, and configured to remove contamination on the first member by active species generated by reaction of the first gas with the second gas.
    Type: Grant
    Filed: December 13, 2013
    Date of Patent: July 29, 2014
    Assignee: Canon Kabushiki Kaisha
    Inventor: Ichiro Tanaka
  • Patent number: 8791432
    Abstract: A beam writing apparatus according to an embodiment includes a selection unit configured to select a dose equation from a plurality of dose equations for calculating a dose of a beam, for each small region of a plurality of small regions made by virtually dividing a writing region of a target workpiece into mesh-like regions, a dose calculation unit configured to calculate a dose of a beam which is shot into a small region of the plurality of small regions, by using a selected dose equation, for the each small region, and a writing unit configured to write a desired pattern in the small region, by using a calculated dose, for the each small region.
    Type: Grant
    Filed: April 19, 2011
    Date of Patent: July 29, 2014
    Assignee: NuFlare Technology, Inc.
    Inventor: Hironobu Matsumoto
  • Patent number: 8791433
    Abstract: An ion implanting apparatus is provided, which can accurately measure a quantity of atoms that are implanted. The ion implanting apparatus according to the present invention has an object to be measured, and the object to be measured is arranged in an irradiating range in which ions are irradiated. When atoms are implanted into an object to be processed by irradiating ions of a processing gas and neutralized particles thereof, the object to be measured is heated through the irradiation with the processing gas ions and the neutralized particles. A control unit determines a quantity of the atoms that are implanted into the object to be processed from the temperature of the object to be measured.
    Type: Grant
    Filed: April 28, 2011
    Date of Patent: July 29, 2014
    Assignee: Ulvac, Inc.
    Inventors: Tsutomu Nishihashi, Kazuhiro Watanabe, Tadashi Morita, Kenji Sato, Tsutomu Tanaka, Takuya Uzumaki
  • Patent number: 8791435
    Abstract: The invention relates generally to treatment of solid cancers. More particularly, the invention relates to a multi-field charged particle cancer therapy method and apparatus coordinated with negative ion beam creation, ion beam focusing, charged particle acceleration, patient rotation, and/or patient respiration. Preferably, the charged particle therapy is performed on a patient in a partially immobilized and repositionable position. Proton delivery is preferably timed to patient respiration via control of charged particle beam injection, acceleration, and/or targeting methods and apparatus.
    Type: Grant
    Filed: March 4, 2009
    Date of Patent: July 29, 2014
    Inventor: Vladimir Egorovich Balakin
  • Patent number: 8791436
    Abstract: Methods and systems for tracing circuitry on integrated circuits using focused ion beam based imaging techniques. A first component or node on an integrated circuit is coupled to a second component or node on the same integrated circuit. After an external bias is applied to the first component or node, a focused ion beam is applied to the integrated circuit and an image is taken using an electron detector. The features or components on the integrated circuit which are coupled to the second component or node will show up in high contrast on the resulting image. The method may also involve applying a bias to a node or component and then using focused ion beam imaging techniques (through an electron detector) to arrive at an image of the integrated circuit. Components coupled to the node will appear in high contrast in the resulting image.
    Type: Grant
    Filed: April 24, 2013
    Date of Patent: July 29, 2014
    Inventors: Chris Pawlowicz, Alexander Sorkin, Michael W. Phaneuf, Alexander Krechmer, Ken G. Lagarec
  • Patent number: 8791437
    Abstract: The present invention concerns a device for shaping an electron beam of a machine for intraoperative radiation therapy (IORT—Intra Operative Radiation Therapy) using a tubular applicator (3) having a duct through which the electron beam is transmitted, the device being characterised in that it comprises a slab (1), provided with a hole (2) corresponding to the duct of the tubular applicator (3), and at least one planar element (10) comprising an upper plate (11) and a lower plate (12) removably attachable to each other through first mechanical coupling means (13), said at least one planar element (10) being removably attachable to the slab (1) through second mechanical coupling means (13, 14) so that the arrangement of said at least one planar element (10) with respect to the slab (1) is adjustable so as to define an aperture (20) of lower area than that of the section of the duct of the tubular applicator (3), the upper plate (11) of each planar element (10) being made of a first sterilisable biocompatible m
    Type: Grant
    Filed: October 13, 2011
    Date of Patent: July 29, 2014
    Assignee: S.I.T.—Sordina IORT Technologies S.p.A.
    Inventors: Giuseppe Felici, Alessia Ciccotelli, Vincenzo Iacoboni, Fabio De Angelis, Nicola Mangiaracina, Aquilino Gava
  • Patent number: 8791438
    Abstract: Disclosed are embodiments of an ion beam sample preparation apparatus and methods. The apparatus has disposed in a vacuum chamber at least one tilting ion beam irradiating means with intensity control, a rotation stage with rotation control, a sample holder, and an adjustable positioning stage that has two axes of positional adjustment that are operable to move the region of the sample being prepared by the ion beam relative to the ion beam. The apparatus may also include a vacuum-tight optical window for observing the sample and a shutter for protecting the optical window from debris while the sample is prepared in the ion beam.
    Type: Grant
    Filed: July 24, 2013
    Date of Patent: July 29, 2014
    Assignee: Gatan Inc.
    Inventors: Steven Thomas Coyle, John Andrew Hunt, Michael Patrick Hassel-Shearer
  • Patent number: 8791439
    Abstract: A particulate composition comprises a plurality of particles wherein at least one of the particles comprises at least two different crystalline and/or glass phases, each phase comprising a host lattice and a dopant sensitive to electromagnetic radiation. The different phases simultaneously produce different responses on exposure to photons of the same energy, whereby the output from the particulate composition when exposed to said photons is the sum of the responses from the different phases.
    Type: Grant
    Filed: October 1, 2010
    Date of Patent: July 29, 2014
    Assignee: Cabot Security Materials, Inc.
    Inventors: Scott Haubrich, Jainisha Shah, Steven R. Cordero
  • Patent number: 8791440
    Abstract: Techniques for forming a target and for producing extreme ultraviolet light include releasing an initial target material toward a target location, the target material including a material that emits extreme ultraviolet (EUV) light when converted to plasma; directing a first amplified light beam toward the initial target material, the first amplified light beam having an energy sufficient to form a collection of pieces of target material from the initial target material, each of the pieces being smaller than the initial target material and being spatially distributed throughout a hemisphere shaped volume; and directing a second amplified light beam toward the collection of pieces to convert the pieces of target material to plasma that emits EUV light.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: July 29, 2014
    Assignee: ASML Netherlands B.V.
    Inventors: Yezheng Tao, Robert J. Rafac, Igor V. Fomenkov, Daniel J. W. Brown, Daniel J. Golich
  • Patent number: 8791441
    Abstract: The present invention provides an ultraviolet radiation system which generates UVC radiation with maximal radiation output and little or no degradation in radiation output during operation of the lamps. The system provides UVC radiation at a wavelength of 253.7 nm, which is effective to kill or deactivate pathogens on surfaces irradiated by the emitted UVC radiation and is simultaneously effective to decontaminate air which passes uniformly over the entire length of the UVC lamps. Uniformly flowing air cools the lamps to maximize the conversion efficiency of power input to the lamps to UVC radiation from the lamps, and at the same time decontaminates the flowing air such that air in the room is also decontaminated.
    Type: Grant
    Filed: October 8, 2013
    Date of Patent: July 29, 2014
    Inventor: George Jay Lichtblau