Abstract: A current sensor includes: two cores that configure closed magnetic circuits surrounding a conductor where a current to be measured flows and are arranged adjacent to each other; two coils that are wound respectively around the two cores and are connected in series to generate a magnetic flux in surrounding directions opposite to each other in the two cores; an excitation power supply that applies an alternating current with a superimposed direct current to the two coils; and a detection circuit that is connected to a connection point of the two coils. It is possible to obtain the current sensor being capable of high precision measurement up to high frequencies and also capable of reducing power consumption.

Abstract: A current detection busbar has a penetrating portion that penetrates a hole portion of a magnetic core and two flat plate-like terminal portions that are respectively continuous with opposite sides of the penetrating portion. The terminal portions have a larger width and a smaller thickness than the penetrating portion. An insulating casing has busbar holes that are penetrated by the respective terminal portions of the current detection busbar. An edge portion of each busbar hole is constituted by flat surfaces that face the terminal portion with a gap left between each flat surface and the terminal portion, a plurality of projecting portions that sandwich the terminal portion while coming into contact with the front and back surfaces of the terminal portion, and curved surfaces that face respective corner portions of the terminal portion with a gap left between each curved surface and the corresponding corner portion.

Abstract: A magnetic field verifier apparatus includes a magnetic field detection element configured to produce a voltage signal in response to an applied magnetic field wherein the voltage signal corresponds to the strength of the applied magnetic field. Substantially identical circuit boards or units are connected to a central unit or mother board to place magnetic field detection elements of each board or unit in an mutually approximately orthogonal relationship. A microcontroller is in communication with the voltage signal. The magnetic field verifier apparatus is configurable to sense particular field strengths at various frequencies and store the readings to provide the user with a reliable verification that a particular magnetic field strength has been produced in a particular environment.

Abstract: A method of magnetic resonance imaging includes performing a first magnetic resonance scan sequence which saves a data store, and performing a second magnetic resonance scan sequence which uses a data store from the first magnetic resonance scan sequence. A magnet (10) generates a B0 field in an examination region (12), a gradient coil system (14, 22) creates magnetic gradients in the examination region, and an RF system (16, 18, 20) induces resonance in and receives resonance signals from a subject in the examination region. One or more processors (30) are programmed to perform a magnetic resonance pre-scan sequence to generate pre-scan information, perform a first sequence to generate first sequence data, refine the pre-scan information with the first sequence data, perform a second imaging sequence to generate second sequence data. Further, the second sequence data is either reconstructed using the refined pre-scan information or performed using the refined pre-scan sequence information.

Abstract: In one embodiment, an MRI apparatus (10) includes a gap calculating unit (65), a candidate calculating unit (66) and a sequence setting unit (61). The gap calculating unit calculates a gap between the center frequency of an RF pulse and a resonance center frequency, after start of a pulse sequence. The candidate calculating unit calculates a plurality of candidate timings so as to avoid influence of a CF scan for measuring the resonance center frequency on MR signals, when the CF scan is inserted in the pulse sequence. The sequence setting unit sets the pulse sequence so that CF scans are inserted in the pulse sequence at the timings according to the gap and the candidate timings. Each time the CF scan is executed, the center frequency of an RF pulse is updated and the pulse sequence is continued. Thereby, the MR signals are acquired.

Abstract: The invention relates to a method of MR imaging of an object (10) placed in an examination volume of a MR device (1). It is an object of the invention to enable improved electrical properties tomography. The invention proposes that the method comprises the steps of:—subjecting the object (10) to two or more imaging sequences for acquiring MR signals, wherein the imaging sequences each comprise at least one RF pulse and at least one switched magnetic field gradient; reconstructing two or more MR phase images from MR signals acquired by means of imaging sequences comprising switched magnetic field gradients of opposed polarity; deriving a spatial distribution of electrical properties of the object (10) from the MR phase images.

Abstract: Provided is a magnetic resonance imaging (MRI) apparatus. The MRI apparatus includes a magnet configured to generate a magnetic field; a magnetic field coil configured to generate a gradient magnetic field and the magnetic field coil is disposed inside the magnet; and a radio-frequency (RF) coil unit comprising RF coil elements and the RF coil unit is disposed inside the magnetic field coil.

Abstract: A multiple-channel antenna includes a first loop resonator including a radiating element forming a loop; a second resonator adjacent to the first loop resonator including a radiating element; wherein the radiating element of the first loop resonator has a main surface defined along a first median plane; a secondary surface defined along a second median plane, the secondary surface delimiting an appendix of the radiating element placed facing the second resonator and having an inclination relative to the median plane of the main surface and wherein the second resonator is a linear resonator with a straight radiating element.

Abstract: Disclosed is a gradient generator system arranged around a volume of interest of axis Oz. The system includes z-gradient coils of axis Oz; z-gradient tubes of axes parallel to the axis Oz including coils arranged in a ring outside the z-gradient coils; x-gradient coils and y-gradient coils of saddle shape arranged around the z-gradient coils; and x and y-gradient tubes of axes parallel to the axis Oz and situated in a ring outside the z-gradient coils, being interposed between the z-gradient tubes, with each of the x and y gradient tubes including coils.

Abstract: A system for detecting a location of a subsurface channel may include a portable frame and a plurality of magnetic coils supported by the frame. The magnetic coils may be spaced apart from one another and ends of each of the magnetic coil are unobstructed by other of the magnetic coils.

Abstract: A surface electromagnetic survey system and method for detecting a fracture or fracture zone in a rock formation are provided. The system includes an electromagnetic source configured to generate an electromagnetic field in the vicinity of or at a surface of the rock formation. The electromagnetic source includes one or more electric dipole sources that are arranged so as to generate a substantially vertical electric field. The system also includes an electromagnetic receiver associated with the electromagnetic source, the electromagnetic receiver being configured to measure a component of the electromagnetic field at the surface of the rock formation; and a processor configured to convert the measured component of the electromagnetic field measured at the electromagnetic receiver into an electromagnetic field response per unit moment of the electromagnetic source. The electromagnetic field response provides information about characteristics parameters of the fracture or fracture zone.

Abstract: A method for mapping a subterranean formation having an electrically conductive wellbore casing therein may include using a low frequency electromagnetic (EM) transmitter and EM receiver operating at a low frequency of less than or equal to 10 Hertz to perform a first EM survey of the subterranean formation, and with either the low frequency EM transmitter or EM receiver within the electrically conductive well-bore casing. The method may further include injecting a magnetic fluid into the subterranean formation, and using the low frequency EM transmitter and EM receiver to perform a second EM survey of the subterranean formation after injecting the magnetic fluid.

Abstract: Disclosed are methods and apparatus for adaptive source electromagnetic (EM) surveying. In accordance with one embodiment, a source waveform signal is generated, and an outgoing EM signal which is based on the source waveform signal is transmitted using an antenna. A responsive electromagnetic signal is detected using at least one electromagnetic sensor, and a receiver waveform signal based on the responsive electromagnetic signal is obtained. A feedback control signal which depends on at least one input signal is determined. Based on the feedback control signal, the source waveform signal is adapted. Other embodiments, aspects, and features are also disclosed.

Abstract: A system for use in downhole detection comprises a downhole arrangement defining a throughbore and a tool deployable through the throughbore of the downhole arrangement. The system further comprises a primary electromagnetic element provided on one of the downhole arrangement and the deployable tool and a secondary electromagnetic element provided on the other of the downhole arrangement and the deployable tool, wherein the primary and secondary electromagnetic elements are configurable for electromagnetic coupling therebetween. Such a system may be used for determining a status and/or an identity of a downhole tool in an oil or gas well from a determined degree of electromagnetic coupling between the primary and secondary electromagnetic elements.

Abstract: A system and method for imaging properties of subterranean formations in a wellbore is provided. The system comprises a formation sensor for collecting currents injected into the subterranean formations, the formation sensor positionable on a downhole tool deployable into the wellbore. The system comprises a controller for controlling the formation sensor and a formation imaging unit. The formation imaging unit comprises a current management unit for collecting data from the currents injected into the subterranean formations, the currents having at least two different frequencies. The formation imaging unit comprises a drilling mud data unit for determining at least one drilling mud parameter, a formation data unit for determining at least one formation parameter from the collected data, and an inversion unit for determining at least one formation property by inverting the at least one formation parameter.

Abstract: Checking failures in transistors including driving transistors, switching transistors, and sampling transistors before light emitting elements are formed in a display device. I-V characteristics including threshold voltage of the driving transistor 10C in one pixel circuit can be detected. In a pixel circuit, the sampling transistor 10A and switching transistor 10D are made conductive and the signal potential is given to the gate electrode of the driving transistor 10C from the signal line DTCm. At this time, the current which flows between the drain electrode and source electrode of driving transistor 10C flows through the switching transistor 10D and a reference potential line Vref_r to a test point, and is measured by a current measuring device connected to the test point.

Abstract: A fuel cell inspection method includes: applying DC voltage of a first voltage value, in a first period, to a power generation element that has an electrolyte membrane, an anode-side catalyst layer disposed on one side of the electrolyte membrane, and a cathode-side catalyst layer disposed on the other side of the electrolyte membrane; and applying, to the power generation element, DC voltage of a second voltage value that is lower than the first voltage value, in a second period after the first period; and detecting a value of current flowing in the power generation element.

Abstract: A non-aqueous electrolyte secondary battery according to the present invention includes a positive electrode, a negative electrode, and a non-aqueous electrolyte solution. The negative electrode includes a coating derived from lithium bis(oxalate)borate. Assuming that an intensity of a peak attributable to a three-coordinate structure of the coating measured by an XAFS method is represented by a and an intensity of a peak attributable to a four-coordinate structure of the coating measured by the XAFS method is represented by ?, the coating formed on the surface of the negative electrode satisfies a condition of ?/(?+?)?0.4. Accordingly, it is possible to provide a non-aqueous electrolyte secondary battery capable of reliably obtaining the effect due to the formation of a coating.

Abstract: A system and method for monitoring the status of a system of battery strings is described. The battery string current is measured by a current sensor urged into contact with a metallic element in which the battery string current is flowing. The time history of the battery string current and voltage is interpreted to determine whether the battery string is discharging, charging or in a fully charged state. A moving average current in the charging state is used to establish a threshold for determining whether a thermal runaway condition exists. The moving average is maintained at the value that existed at a time when the battery string has been disconnected from the system current bus.

Abstract: Systems and methods for scanning a battery cell to identify internal faults are disclosed. In certain embodiments, a method for scanning a battery cell for faults may comprise generating an input signal across first and second charge plates disposed on each side of the battery cell. An open circuit voltage of the battery cell generated in response to the input signal may be measured. The measured open circuit voltage may be compared with a reference signal associated with a reference battery cell having no faults. Based on the comparison, a fault and/or a possible fault within the battery cell being scanned may be identified.

Abstract: The voltage measuring apparatus is connected to a plurality of battery cells connected to each other in series to measure respective voltages of the battery cells. The voltage measuring apparatus includes a sample/hold amplifier configured to sample and hold positive electrode and negative electrode voltages of the battery cells to generate first and second output voltages, a differential voltage converter configured to generate a battery cell voltage according to a voltage difference between a positive input terminal and a negative input terminal, and a switching unit configured to control the first and second output voltages and connection between the positive input terminal and the negative input terminal so that a polarity of the voltage difference is constant. The sample/hold amplifier electrically insulates the switching unit from the battery cells.

Abstract: A ground fault detection circuit comprising a fuse and a fuse detect circuit. The fuse and the fuse detect circuit are arranged to be coupled in parallel between a reference point and a second point of a monitored circuit for which ground faults are to be detected. The fuse detect circuit is further arranged to detect a fuse break indicative of a ground fault condition and disable at least a portion of the monitored circuit.

Abstract: A first predetermined point of a photovoltaic circuit insulated with respect to a ground is grounded to the ground by a first electrical ground path, a first direct current voltage value is applied to the first measurement point by a first direct current power supply, and a first current value flowing in the first electrical ground path is measured in this state. Further, a second predetermined point of the photovoltaic circuit insulated with respect to the ground is grounded to the ground by a second electrical ground path, a second direct current voltage value different from the first direct current voltage value is applied to the second predetermined point by a second direct current power supply, and a second current value flowing in the second electrical ground path is measured in this state.

Abstract: The invention relates to a method and a device for locating an event transmitting a signal, including a set of sensors (Ai-Am) to measure the response times of the said signal, and processing means (3) to solve a system of equations defining distances between the said sensors and the said event as a function of a speed of propagation of the said signal and of an offset of the said response times relative to a reference time, where the device also includes: processing means (3) to recommence multiple times the solution of the system of equations, each time modifying the response time of at least one of the said sensors according to a local variation, and processing means (3) to determine the location of the event as a function of the positions obtained when the different solutions of the system of equations are found.

Abstract: A method for detecting an open-circuit in an external thermocouple network includes these steps: (a) injecting a current pulse of a predetermined duration into the external thermocouple network; and (b) measuring the voltage across the pair of terminals after a time period following the predetermined duration. In one example, the time period is sufficiently long to allow the current pulse to dissipate from the external thermocouple circuit when a thermocouple in the external thermocouple network does not have an open circuit. The thermocouple network may include a resistor-capacitor network provided between the thermocouple and one of the terminals.

Abstract: A debugging circuit outputs a plurality of control signals to a chip, the chip outputs a data signal according to the plurality of control signals. The debugging circuit comprises a resistor unit and an adjusting unit. The resistor unit comprises a plurality of resistors, each resistor is electrically connected to one input pin of the chip. The adjusting unit comprises a plurality of control terminals and a switch sub-unit.

Abstract: A splice monitoring apparatus and method of use is capable of determining splice characteristics by means of dynamic reactance through waveform shifts and harmonic distortions in comparison to a base frequency.

Abstract: A printed board includes an insulated base, a wiring pattern, and an inspection interrupting portion. The wiring pattern is disposed on a first surface of the insulated base, and includes a wiring portion, a land, and an interrupting portion disposed between the wiring portion and the land. The inspection interrupting portion is made of a same material with the interrupting portion and has a same pattern with the interrupting portion. In order to assure an interrupting performance of the interrupting portion, the inspection interrupting portion is inspected instead of the interrupting portion by applying an inspection current to the inspection interrupting portion.

Abstract: A measuring kit for contactless measuring of the air gap distance between a frame mounted pole and core of a rotor includes a capacitance sensor which generates a signal proportional to the measured air gap, a panel meter in communication with the capacitance sensor which interprets the signal and displays the minimum air gap distance, an A/D converter also in communication with the capacitance sensor which converts the signal to a digitized signal, and a control panel which takes the digitized signal from the A/D converter, processes the digitized signal, and then displays the minimum air gap measurement. The control panel shows a graphic of the core and its surrounding poles to track the progress of the testing, and when the testing between the core and one of the surrounding poles is complete, the graphic of the pole tested visually darkens to indicate that portion of the test is complete.

Abstract: Method of searching for a variation in capacitance of a capacitive sensor, includes a phase of searching for variation in capacitance and, when a capacitance variation has been detected, a phase of verifying the variation in capacitance. The search phase includes a recurrent step of searching for variation in capacitance including steps of measuring the duration of a first measurement sequence and determining, according to the measured duration, whether a first predefined detection criterion for variation in capacitance is verified. The verification phase includes steps of measuring the duration of a second measurement sequence and determining, according to the measured duration, whether a second predefined detection criterion for variation in capacitance is verified.

Abstract: An auxiliary test apparatus for electromagnetic compatibility includes two substantially parallel side plates and a dividing plate substantially perpendicularly connected between centerlines of the side plates. A through hole is defined in a center portion of the dividing plate. Top and bottom surfaces of the dividing plate and the inner surfaces of the side plates are covered by conductive foam.

Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.

Abstract: A device can include a radio frequency (RF) signal input, a local oscillator (LO) signal input, a mixer to receive the RF signal and LO signal and translate a frequency of the RF signal based on the LO signal, a strobe pulsing component to provide a timed strobe pulse, and a second mixer to receive a leakage signal, LO signal, and timed strobe pulse, and also to translate a frequency of the leakage signal to baseband. The device can also include a coupling component configured to allow the leakage signal to pass between the mixers. An output signal output can provide a measured value of the leakage signal.

Abstract: A packaged capacitive MEMS sensor device includes at least one capacitive MEMS sensor element with at least one capacitive MEMS sensor cell including a first substrate having a thick and a thin dielectric region. A second substrate with a membrane layer is bonded to the thick dielectric region and over the thin dielectric region to provide a MEMS cavity. The membrane layer provides a fixed electrode and a released MEMS electrode over the MEMS cavity. A first through-substrate via (TSV) extends through a top side of the MEMS electrode and a second TSV through a top side of the fixed electrode. A metal cap is on top of the first TSV and second TSV. A third substrate including an inner cavity and outer protruding portions framing the inner cavity is bonded to the thick dielectric regions. The third substrate together with the first substrate seals the MEMS electrode.

Abstract: A capacitance type occupant detection sensor includes (i) a capacitive sensor, (ii) a voltage application portion, (iii) a current detector, (iv) a capacitance detector, and (v) a determination portion. The capacitive sensor includes a detection electrode and is disposed to a seat. The voltage application portion applies a detection voltage to the detection electrode, and provides an electric field between the detection electrode and a reference electrode, which is applied with a reference voltage. The current detector detects a current, which is provided by the detection voltage, flowing through the detection electrode. The capacitance detector detects a capacitance between the detection electrode and the reference electrode. The determination portion determines an occupant. The capacitive sensor has a first charging electrode and a second charging electrode. The first charging electrode is disposed apart from the detection electrode and applied with a charging voltage from the voltage application portion.

Abstract: A locator for capacitively sensing an object includes a transmission electrode to which an excitation signal can be applied, a reception electrode, a sensing region in the region of the transmission electrode and the reception electrode, and a measuring device for sensing a capacitance between the transmission electrode and the reception electrode. The locator further includes a processing device for determining the presence of the object in the sensing region if the sensed capacitance differs from a reference capacitance, and a screening electrode that is arranged in the region of the transmission electrode and the reception electrode. The screening electrode is connected to a potential so as to reduce the base capacitance between the transmission electrode and the reception electrode.

Abstract: A wearable device includes a capacitive sensor and capacitance sensing and calibration logic operative to determine that component drift for a capacitive sensor cannot be determined based on a capacitance sensed by the capacitive sensor. The capacitance sensing and calibration logic deactivates a drift calibration operation for the capacitive sensor while the capacitive sensor senses the capacitance. The capacitance sensing and calibration logic is further operative to determine that the capacitance sensed by the capacitive sensor is within a detection threshold that indicates that a conductive surface is within proximity of the capacitive sensor. The capacitance sensing and calibration logic can also determine that a wearable device, that includes the capacitive sensor, is in motion based on sensed intermittent changes in the capacitance. Various other methods of operation are disclosed.

Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.

Abstract: One example disclosed wearable device includes a first housing portion having a conductive section and a non-conductive section. The conductive section is connected to ground. A second housing portion includes a printed circuit board (PCB) with a conductor on the PCB surface positioned beneath the non-conductive section. The conductor on the PCB surface and the conductive section form a capacitor of a capacitive sensor. The wearable device may also include a first adhesive layer between a surface of the non-conductive section of the first housing portion and the PCB surface. A second adhesive layer, coplanar with the first adhesive layer, may be applied between a surface of the conductive section of the first housing portion and the PCB surface. The first adhesive layer and the second adhesive layer form a water tight seal that prevents liquids from penetrating into at least the second housing portion.

Abstract: An alternating current (AC) to direct current (DC) power converter may have a connector with a pair of power supply contacts and a pair of data contacts. An electronic device may be connected to the connector of the power converter. The power converter may supply DC power to the electronic device using the power supply contacts. The power converter may include control circuitry that has a resistor coupled across the data contacts. When the electronic device and the power converter are connected to each other, each may advertise to the other that capabilities are present that exceed industry standards. At the same time, standard-compliant discovery operations may be performed to probe the value of the resistance of the resistor that is coupled across the data contacts. When extended capabilities are discovered, extended functions may be performed including accelerated charging functions and data communications functions.

Abstract: The present disclosure provides a biosensor device wafer testing and processing methods, system and apparatus. The biosensor device wafer includes device areas separated by scribe lines. A number of test areas that allow fluidic electrical testing are embedded in scribe lines or in device areas. An integrated electro-microfluidic probe card includes a fluidic mount that may be transparent, a microfluidic channels in the fluidic mount in a testing portion, at least one microfluidic probe and a number of electronic probe tips at the bottom of the fluidic mount, fluidic and electronic input and output ports on the sides of the fluidic mount, and at least one handle lug on the fluidic mount. The method includes aligning a wafer, mounting the integrated electro-microfluidic probe card, flowing one or more test fluids in series, and measuring and analyzing electrical properties to determine process qualities and an acceptance level of the wafer.

Abstract: A system and method for determining operational robustness of a system on a chip (SoC) includes modifying one or more internal states of the SoC, during operation of the SoC, to mimic an effect which one or more disturbances have on the SoC, generating one or more signal traces that correspond to at least one internal state of the SoC after modifying the one or more internal states of the SoC, and determining if the operation of the SoC is stable based on the one or more generated signal traces.

Abstract: A semiconductor device includes: a drive circuit; a standby circuit; and a detection circuit. The drive circuit turns on an output transistor connected to a load based on an active input signal. The standby circuit intermittently outputs an output signal based on a non-active input signal. The detection circuit measures voltage of a load side of the output transistor based on the output signal and output a measurement result.

Abstract: A semiconductor device is capable of detecting a power supply voltage abnormality without degrading the performance of internal circuits. The semiconductor device includes a plurality of power supply inspection circuits and a result storage register. The power supply inspection circuits detect a power supply voltage abnormality in each pad that couples an internal wiring disposed in the semiconductor device to another part disposed outside of the semiconductor device. The result storage register stores inspection results indicated by result signals output from the power supply inspection circuits.

Abstract: A testing container includes a right-parallelepiped-like container, electrical components of a transformer test system which are arranged in the container and which represent a respective heat source during a testing operation, and a cooling system including at least one heat exchanger. In addition, the testing container includes a movement apparatus configured to move the at least one heat exchanger from a transport position within the container into a working position which is located at least partially outside the container. Thus, the at least one heat exchanger is movable by means of the movement apparatus from the transport position within the container into the working position which is located at least partially outside the container.

Abstract: A method and an apparatus for verifying or testing test substrates, i.e. wafers and other electronic semiconductor components, in a prober under defined thermal conditions. Such a verifying apparatus, known to the person skilled in the art as a prober, has a housing having at least two housing sections, in one housing section of which, designated hereinafter as test chamber, the test substrate to be verified is held by a chuck and is set to a defined temperature, and in the other housing section of which, designated hereinafter as probe chamber, probes are held. For verification purposes, the test substrate and the probes are positioned relative to one another by means of at least one positioning device and the probes subsequently make contact with the test substrate.

Abstract: A probe card including a multi-layered substrate, a plurality of needles, and a temperature controlling unit may be provided. The multi-layered substrate may include a test pattern through which a test current passes. The needles may be provided on the multi-layered substrate. The needles may be electrically connected to the test pattern and may be configured to contact an object so that the test current may be supplied to the object. The temperature controlling unit may provide the multi-layered substrate with at least one of a first temperature and a second temperature, the first temperature being higher than the second temperature. Thus, a time for setting a test temperature may be shortened. As a result, thermal deformation of the probe card and/or the object may be reduced or suppressed, and thus reliability of test result may be improved.

Abstract: Disclosed herein is a socket device for an integrated circuit (IC) test. The device includes: a socket which is provided with a pin guide plate that can guide and protect a spring contact so as to prevent damage to or breakage of the spring contact that electrically connects an IC lead to a PCB; and an IC insert provided with a guide plate. According to said configuration, ball grid array (BGA) ICs in which IC leads are balls can be more efficiently tested. Particularly, contact pins of the socket and the IC leads can be mechanically and electrically more precisely positioned for narrow pitches of the IC leads such as 0.4 mm, 0.35 mm, and 0.3 mm. Thereby, damage to or breakage not only of the ICs to be tested but also of the socket can be minimized.

Abstract: A printed circuit board has first terminals for contacting terminals of a socket, second terminals for contacting terminals of a test fixture of an automatic test equipment, which are adapted for contacting the terminals of the socket of a device under test, transmission lines for connecting the first terminals and the terminals, and an extracting circuit electrically coupled to one of the transmission lines and configured to extract the signal being exchanged between the device under test and the automatic test equipment. The extracting circuit has a resistor or an electrical resistor network, wherein a loss added on the signal being exchanged between the device under test and the automatic test equipment over the one transmission line due to the presence of the printed circuit board is smaller than 6 dB.

Abstract: The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.