Abstract: Apparatus and methods for current sensing in switching regulators are disclosed. In certain implementations, a current sensing circuit senses current of a power stage of a power converter. The power converter can include first and second transistors. The current sensing circuit comprises a transistor that is a scaled version of one of the transistors of the power converter. A circuit of the current sensing circuit matches a drain-to-source voltage of the transistor of the current sensing circuit to the corresponding transistor of the power converter. A current mirror generates a current that mirrors the current flowing through the transistor of the current sensing circuit. A first resistor converts the mirrored current to a current sensed signal.

Abstract: A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD testing processes. The system and method also uses a relay station to place a DUT after an ESD testing process is performed on one major side of the DUT so the ESD testing can be performed on the other major side of the DUT.

Abstract: An exemplary printed circuit board testing method includes determining whether there is an open shielding box every a time interval. The method then transmits a first control signal including a first predetermined path to a robot when there is an open shielding box. Next, the method obtains an image captured by a camera and recognizes a unique identifier of a to-be-tested PCB in the obtained image. The method then determines a second predetermined path corresponding to the determined open shielding box, and transmits a second control signal comprising the determined second predetermined path to the robot. Next, the method closes the determined shielding box when a duration after transmitting the second control signal reaches a predetermined time, and controls a testing software to test the to-be-tested PCB, to generate a testing result corresponding to the unique identifier of the to-be-tested PCB.

Abstract: A semiconductor device assessment apparatus that electrically assesses a semiconductor device formed on a semiconductor substrate includes a holding unit having a surface to hold the semiconductor substrate thereon, and a detection unit to detect irregularity on the surface of the holding unit. The holding unit on the surface includes a plurality of grooves formed such that when the semiconductor substrate is held on the surface, the grooves overlap a periphery of the semiconductor substrate and also have a portion located outer than the periphery of the semiconductor substrate.

Abstract: A test socket for connecting a device under test (DUT) electrically to a high-frequency power source comprises a plurality of pogo pins each having an electrode, an electron-to-heat conversion plate supporting bottoms of the pogo pins, the electron-to-heat conversion plate configured to convert kinetic energy of free electrons emitted from the pogo pins to thermal energy, and a heat sink wall formed on the electron-to-heat conversion plate, the heat sink wall having a predetermined height and isolating the plurality of pogo pins from one another.

Abstract: A circuit for testing a floating body field-effect transistor (FET), and a related method, are provided. Embodiments of this invention include a circuit including a contacted-body FET structure that can be operated in a floating body mode or a body-contacted mode, and a passgate FET. A body of the contacted-body FET structure is connected to the drain of the passgate FET. Voltage can be applied to the passgate FET to either allow or restrict current flow through the passgate FET, to operate the contacted-body FET structure in body contacted mode or floating body mode. Data can be taken in each mode and compared to extract a floating body voltage.

Abstract: A method for testing a semiconductor device is disclosed. The method comprises positioning a probe card comprising a plurality of probes above the semiconductor device and moving the probe card in a vertical direction towards the semiconductor device. The plurality of probes are moving in a vertical direction towards a plurality of electrical structures of the semiconductor device until each probe of the plurality of probes has made mechanical contact with a corresponding electrical structure of the plurality of electrical structures with a minimum quantity of force. The each probe of the plurality of probes absorbs a portion of vertical overdrive after contacting their corresponding electrical structures. The probe card absorbs any remaining vertical overdrive. The vertical overdrive is a continuing vertical movement of the plurality of probes after a first probe of the plurality of probes mechanically contacts a first corresponding electrical structure.

Abstract: A testing probe card for wafer level testing semiconductor IC packaged devices. The card includes a circuit board including testing circuitry and a testing probe head. The probe head includes a probe array having a plurality of metallic testing probes attached to a substrate including a plurality of conductive vias. In one embodiment, the probes have a relatively rigid construction and have one end that may be electrically coupled to the vias using a flip chip assembly solder reflow process. In one embodiment, the probes may be formed from a monolithic block of conductive material using reverse wire electric discharge machining.

Abstract: An apparatus, suitable for coupling a pads of integrated circuits on wafer to the pogo pins of a pogo tower in a test system without the need of a probe card, includes a body having a first surface and a second surface, the body having a substantially circular central portion, and a plurality of bendable arms extending outwardly from the central portion, each bendable arm having a connector tab disposed at the distal end thereof; a first plurality of contact terminals disposed on the second surface of the central portion of the body, the first plurality of contact terminals arranged in pattern to match the layout of pads on a wafer to be contacted; at least one contact terminal disposed on the first surface of the plurality of connector tabs; and a plurality of electrically conductive pathways disposed in the body such that each of the first plurality of contact terminals is electrically connected to a corresponding one of the contact terminals on the first surface of the connector tabs.

Abstract: The present invention relates to a bar for the electrical contacting of an electrically conductive substrate in the form of a thin, electrically conducting and resilient contact. The bar comprises a current-collecting bar on which a plurality of contact fingers is fitted. The invention is distinguished by the contact fingers being configured resiliently in the direction of the contact to be produced.

Abstract: Various aspects of the disclose techniques relate to techniques of testing interconnects in stacked designs. A single-pulse signal, generated by a first circuit state element on a first die, is applied to a first end of an interconnect and captured at a second end of the interconnect using a clock port of a second circuit state element on a second die. A faulty interconnect may cause the single-pulse signal too distorted to reach the threshold voltage of the second circuit element.

Abstract: A system and a method are disclosed for testing thru-silicon vias (TSVs) in a silicon die. A silicon die containing multiple TSVs is mounted on a wafer tape. Two probe points are probed on the exposed side of the silicon die. A resistance is measured between the two probe points and an electrical integrity is determined based on the measured resistance.

Abstract: A testing system includes a layout information obtaining module, a first power pin sorting module, a transmission line sorting module, a power pin filtering module, a distance calculating module, a comparing module, and a report generating module. The layout information obtaining module obtains layout information. The first power pin sorting module sorts a power pin from a plurality of pins of a IC. The transmission line sorting module sorts transmission lines. The power pin filtering module filters power pins from a plurality of pins of capacities in same transmission line. The distance calculating module calculates distances between the power pin of the IC and each of the power pins of the capacities. The comparing module compares each of the distances with a threshold distance. The report generating module generates a testing report to depict whether or not the sorted power pins of the IC are qualified.

Abstract: The present invention relates to a device for detecting a partial discharge for a power transformer which detects an electromagnetic signal occurring due to faulty insulation. The device includes an antenna unit receiving electromagnetic waves, an insulator including the antenna unit, a metallic air-tight unit that seals a connector connected to the insulator and connecting a coaxial cable, and the coaxial cable exposed to the outside of the metallic air-tight unit. Thus, it is possible to enhance broadband properties through an internal conductor of a drain valve.

Abstract: Alternating on-die termination impedances are applied within an integrated circuit device to up-convert signal reflections to higher frequencies that are attenuated by the signaling channel as the reflections propagate toward an intended signal receiver. Through this approach, the disruptive effect of reflected signals may be significantly reduced with relatively little overhead within the interconnected integrated circuit devices and little or no change to the printed circuit board or other interconnect medium. Changes to the printed circuit board or other interconnect medium can be made to further increase attenuation over the frequency band of the up-converted reflection and outside of the transmission band of signals of interest.

Abstract: An internal voltage generation circuit of a semiconductor apparatus includes: an active driver configured to output an internal voltage to an output node; a standby driver configured to output the internal voltage to the output node; and a voltage stabilizer connected to the output node. The voltage stabilizer starts a voltage stabilization operation of supplying or receiving electric charges to or from the output node when an active enable signal is disabled, and stops the voltage stabilization operation in a predetermined time after the active enable signal is enabled.

Abstract: A reconfigurable circuit block includes a rate-conversion circuit, a processing circuit, a first asynchronous interface circuit, and a second asynchronous interface circuit. The rate-conversion circuit converts a first input signal into a first output signal. The processing circuit processes a second input signal to generate a second output signal. The first asynchronous interface circuit outputs a third output signal asynchronous with the first output signal. The second asynchronous interface circuit outputs a fourth output signal asynchronous with the second output signal. The controllable interconnection circuit transmits the third output signal to the processing circuit to serve as the second input signal when controlled to have a first interconnection configuration, and transmits the fourth output signal to the rate-conversion circuit to serve as the first input signal when controlled to have a second interconnection configuration.

Abstract: Bidirectional buffer 20D includes: multiplexer 30 that is equipped with rewriteable variable-resistance nonvolatile switch elements for each input terminal; tristate buffer 51 that is equipped with rewriteable variable-resistance nonvolatile switch elements for each output terminal and that receives the output of multiplexer 30 as input; demultiplexer 31 that receives the output of tristate buffer 51 as input; programming transistor tr0 whose drain terminal is connected to the input terminal of tristate buffer 51; and programming transistor tr1 whose drain terminal is connected to the output terminal of tristate buffer 51. Input terminals i1 and i3 of multiplexer 30 are connected to respective output terminals t1 and t2 of demultiplexer 31.

Abstract: New logic blocks capable of replacing the use of Look-Up Tables (LUTs) in integrated circuits, such as Field-Programmable Gate Arrays (FPGAs), are disclosed herein. In one embodiment, the new logic block is a tree structure comprised of a number of levels of cells with each cell consisting of a logic gate or the functional equivalent of a logic gate, one or more selectable inverters, and wherein the inputs of the logic block consist of the inputs to the logic gate or functional equivalent of the logic gate and inputs to the selectable inverters. The new logic blocks can map circuits more efficiently than LUTs, because they include multi-output blocks and can cover more logic depth due to the higher input and output bandwidth.

Abstract: A multi-rail module having mutually exclusive outputs. The module includes first and second-rail logic circuits, first and second-rail driver circuits, and a PMOS transistor sourcing VDD to both the first and second driver circuits. The first-rail logic circuit is coupled to VDD and ground and has a first logic input and a first logic output. The second-rail logic circuit is coupled to VDD and ground and has a second logic input and a second logic output. The first-rail driver circuit is coupled to ground, receives the first logic output, and has a first-rail output Q1. The second-rail driver circuit is coupled to ground, receives the second logic output, and has a second-rail output Q0. The PMOS transistor has a gate driven by a SLEEP signal.

Abstract: Systems and methods are provided for a receiver device for receiving data signals from devices of disparate types. An amplifier is configured to receive a voltage reference signal and a data signal, the data signal being received from a device, the amplifier being configured to output an output signal based on a comparison of the data signal to the voltage reference signal. A voltage reference level shifter is configured to selectively level shift the voltage reference signal supplied to the amplifier based on a type of device with which the receiver is communicating. A data signal level shifter is configured to selectively level shift the data signal supplied to the amplifier based on the type of device with which the receiver is communicating.

Abstract: Apparatuses, circuits, and methods are disclosed for reducing or eliminating unintended operation resin ling from metastability in data synchronization. In one such example apparatus, a sampling circuit is configured to provide four samples of a data input signal. A first and a second of the four samples are associated with a first edge of a latching signal, and a third and a fourth of the four samples are associated with a second edge of the latching signal. A masking circuit is configured to selectively mask a signal corresponding to one of the four samples responsive to the four samples not sharing a common logic level. The masking circuit is also configured to provide a decision signal responsive to selectively masking or not masking the signal.

Abstract: A low-power method and apparatus is provided for adapting to time-varying limitations of a power source, such as a vehicle power source which is in a more-limited state when the engine is off. The supply voltage is monitored for changes using an unclocked, low-power first stage having an analog section, a voltage comparator. Upon detecting voltage changes reflective of a potential power source state change, the first stage generates an interrupt. In response, a second stage transitions from a low-power standby mode to a higher-power active mode. The second stage may include a microprocessor and is configured to confirm or disconfirm the state change. Upon confirmation, further operations are triggered. Upon disconfirmation, the second stage returns to standby mode. The first stage may include an operational amplifier whose two inputs are indicative of the supply voltage, one input having a different response rate to voltage variations than the other.

Abstract: The invention relates to a method of opening a shunt switch carrying a current, the switch being connected in parallel with at least one thyristor of a high voltage DC network, interruption of the current flowing through the switch being initiated at the time of a current zero of the current flowing through the switch, the method being characterized in that it includes, based on a measurement effected by means for measuring the current flowing through the switch, a step of adjusting a control angle of the thyristor to position the current zero in a zone in which the time derivative of the measured current is a continuous function and the absolute value of a peak value of the measured current is substantially equal to the absolute value of the inaccuracy of the measurement of the current zero.

Abstract: Automatic and robust anti-shoot-through glitch-free operation of half-bridge control pre-driver and power stage circuits have been achieved by using multiple feedback control signals. These feedback signals are taken both from the gates of power devices on high side and low sides and from the gates of one or more devices on both high side and low side that enable power device ON state. No duty cycle limitation is required of the input signal. The control logic uses NAND/NOR RS latches.

Abstract: We describe a fault-tolerant power semiconductor switching device control system (100), the control system comprising: a coordinating control system (110); and a plurality of switching device controllers (120) each coupled to said coordinating control system and each configured to control a respective power semiconductor switching device (130); wherein said coordinating control system is configured to send real time switching control data to said switching device controllers to control switching of said power semiconductor switching devices, and to receive real time acknowledgement data from said switching device controllers; wherein a said switching device controller is configured to receive said real time switching control data from said coordinating control system, to control a said power semiconductor switching device responsive to said real time switching control data, and to provide said real time acknowledgement data confirming said switching device control to said coordinating control system; and wher

Abstract: A circuit for generating a voltage waveform at an output node. The circuit includes a voltage rail connected to the output node via a voltage rail switch; an anchor node connected to the output node via an inductor and a bidirectional switch, wherein the bidirectional switch includes two or more transistors connected in series; and a control unit configured to change the voltage at the output node by controlling the voltage rail switch and the bidirectional switch so that, if a load capacitance is connected to the output node, a resonant circuit is established between the inductor and the load capacitance. The circuit may be included in an apparatus for use in processing charged particles, e.g. for use in performing mass spectrometry or ion mobility spectrometry.

Abstract: Various configurations and arrangements of systems and methods for compensating for variations in VCO output frequencies are described. A system in accordance with the disclosure can include an oscillator circuit including an oscillator, a first variable capacitance diode coupled to the oscillator and a second variable capacitance diode coupled to the oscillator. The system further includes a voltage source configured to apply a first voltage to the oscillator circuit to cause the output signal to comprise a selected frequency, the selected frequency being based on a received reference voltage. The system further includes a controller circuit configured to compare an operating voltage of the oscillator to the reference voltage while the first voltage is applied to the oscillator; and apply a second voltage to the oscillator circuit based on the comparison. The second voltage compensates for a difference between the reference voltage and the first voltage.

Abstract: A delay-locked loop (DLL) operation mode control circuit and corresponding method are provided in which one of the output values from a display driver IC (DDI) is detected to switch a DLL block to standby mode. In examples, a CLKP/N frequency and CLKP/N common terminal voltage status are used to switch mode. Accordingly, since inoperable frequency domains otherwise present in a normal mode interval of the DLL block is included into standby mode, more stable operation of the DLL circuit is provided.

Abstract: A DLL circuit apparatus and a DLL locking method are provided. A control signal voltage value corresponding to a DLL locking state is stored, and a DLL unlocking state is detected when a change in control signal voltage value or a phase difference of clock signals occurs. When the DLL unlocking occurs, the DLL is locked again using the stored control signal voltage value. Accordingly, DLL unlocking from DLL locking state is quickly detected, and a fast DLL locking time occurs.

Abstract: A low-power, high-performance source-synchronous chip interface which provides rapid turn-on and facilitates high signaling rates between a transmitter and a receiver located on different chips is described in various embodiments. Some embodiments of the chip interface include, among others: a segmented “fast turn-on” bias circuit to reduce power supply ringing during the rapid power-on process; current mode logic clock buffers in a clock path of the chip interface to further reduce the effect of power supply ringing; a multiplying injection-locked oscillator (MILO) clock generator to generate higher frequency clock signals from a reference clock; a digitally controlled delay line which can be inserted in the clock path to mitigate deterministic jitter caused by the MILO clock generator; and circuits for periodically re-evaluating whether it is safe to retime transmit data signals in the reference clock domain directly with the faster clock signals.

Abstract: A circuit may include an oscillator configured to generate an output signal based on an analog signal and a digital signal and a controller configured to generate an offset signal based on a comparison of a first analog control signal and a second analog control signal. The circuit may also include a divider configured to generate a feedback signal based on the output signal and the offset signal. The circuit may also include an analog control signal unit configured to generate the second analog control signal based on the feedback signal and a reference signal and a coupling unit configured to select either the first analog control signal or the second analog control signal as the analog signal.

Abstract: A circuit includes a capacitive-load voltage controlled oscillator having an input configured to receive a first input signal and an output configured to output an oscillating output signal. A calibration circuit is coupled to the voltage controlled oscillator and is configured to output one or more control signals to the capacitive-load voltage controlled oscillator for adjusting a frequency of the oscillating output signal. The calibration circuit is configured to output the one or more control signals in response to a comparison of an input voltage to at least one reference voltage.

Abstract: A reference output device includes a low side selector configured to select a first voltage level as an output signal. The output signal is a reference voltage. The reference output device also includes a high side selector configured to select a second voltage level as the output signal. The reference output device also includes a slew rate control configured to switch the output signal between the first voltage level and the second voltage level at a constant slew rate.

Abstract: The present invention concerns a signal generator circuit powered by a supply voltage and including flip flop means including a first input to which is connected a continuous input signal whose amplitude is defined, a second input to which is connected a clock signal whose duty cycle is defined, and a third, reset input, and outputting an output signal whose duty cycle is that of the clock signal and whose amplitude is that of the input signal, characterized in that said circuit further includes regulating means arranged to compare the output signal to a set point signal representative of the desired duty cycle and to deliver a control signal connected to the third input of the flip flop means so as to activate the reset to modify the duty cycle of the output signal.

Abstract: In an embodiment of the invention, a flip-flop circuit contains a 2-input multiplexer, a master latch, a transfer gate and a slave latch. The scan enable control signals SE and SEN of the multiplexer determine whether data or scan data is input to the master latch. The clock signals CLK and CLKN and retention control signals RET and RETN determine when the master latch is latched. The slave latch is configured to receive the output of the master latch, a second data bit D2, the clock signals CLK and CLN, the retain control signals RET and RETN, the slave control signals SS and SSN. The signals CLK, CLKN, RET, RETN, SS and SSN determine whether the output of the master latch or the second data bit D2 is latched in the slave latch. Control signals RET and RETN determine when data is stored in the slave latch during retention mode.

Abstract: In an embodiment of the invention, a flip-flop circuit contains a 2-input multiplexer, a master latch, a transfer gate and a slave latch. The scan enable control signals SE and SEN of the multiplexer determine whether data or scan data is input to the master latch. The clock signals CLK and CLKN and retention control signals RET and RETN determine when the master latch is latched. The slave latch is configured to receive the output of the master latch, a second data bit D2, the clock signals CLK and CLN, the retain control signals RET and RETN, the slave control signals SS and SSN. The signals CLK, CLKN, RET, RETN, SS and SSN determine whether the output of the master latch or the second data bit D2 is latched in the slave latch. Control signals RET and RETN determine when data is stored in the slave latch during retention mode.

Abstract: A voltage level translator includes an inverter circuit configured to switch an output of the inverter circuit between a first voltage level and a second voltage level. The voltage level translator also includes a capacitor connected to the output of the inverter circuit. The voltage level translator also includes a load connected to the capacitor. The capacitance of the capacitor is approximately 10 times larger than a capacitance of the load. An output signal of the voltage level translator has at least one of a different voltage swing and a different voltage domain than an input signal to the inverter circuit.

Abstract: A level shift circuit of an embodiment includes first and second MOSFETs using signals with phases same as and opposite to the phase of an input signal as gate inputs; first and second resistance elements, each having one end connected to a shift level power terminal that supplies high-level output voltage of a level-shifted output signal, and each having the other end connected to a corresponding drain of the first and second MOSFETs; a comparator having a pair of differential input terminals, individually connected to respective drains of the first and second MOSFETs; and a current control circuit that controls an amount of first current flowing through the first MOSFET via the first resistance element and an amount of second current flowing through the second MOSFET via the second resistance element in synchronization with a rising and a falling of a signal level of the input signal.

Abstract: An impedance transformer for use with a quadrature passive mixer is disclosed. In an exemplary embodiment, an apparatus includes a mixer configured to generate an up-converted signal at a mixer output port in response to local oscillator (LO) signals, and an impedance transformer configured to provide a complex impedance at the mixer output port. The complex impedance configured to generate a selected level of the reverse isolation for the mixer thereby generating a selected amplitude flatness symmetry characteristic for the up-converted signal.

Abstract: An electronic switch contains an input terminal, and output terminal and at least one first switch element, which provides a voltage-dependent characteristic. In this context, the first switch element connects the input terminal to the output terminal in a selective manner. The electronic switch further comprises a compensation element, which provides a voltage-dependent characteristic. In this context, the compensation element is arranged in such a manner that it at least partially compensates the frequency-dependent characteristic of the switch element.

Abstract: A circuit arrangement including a first transistor, a second transistor and a third transistor. The first transistor and the second transistor are configured so that the current flowing through the first transistor is proportional to the current flowing through the second transistor and the third transistor. The first transistor, the second transistor and the third transistor are configured to operate in an ohmic mode. The second transistor and the third transistor are coupled in series to each other. The first transistor, the second transistor and the third transistor match each other in at least one characteristic.

Abstract: Systems and methods of the invention generally relate to altering the functionality of a non-transient electronic device. A container holding an agent is located proximal to a non-transient electronic device capable of performing at least one function. The agent is capable of rendering the device incapable of performing the at least one function. The container is configured to controllably release the agent to the electronic device in a variety of passive and active eventualities.

Abstract: Self-biasing transistor switching circuitry includes a main transistor, a biasing transistor, a first capacitor, and a second capacitor. The body of the main transistor is isolated from the gate, the drain, and the source of the main transistor by an insulating layer. The first capacitor is coupled between the source and the gate of the main transistor. The second capacitor is coupled between the source and the body of the main transistor. The body and the drain of the main transistor are coupled together. The gate and the drain of the biasing transistor are coupled to the gate of the main transistor. The drain of the biasing transistor is coupled to the drain of the main transistor. The self-biasing transistor switching circuitry is adapted to receive an oscillating signal at the drain of the main transistor, and use the oscillating signal to appropriately bias the main transistor.

Abstract: A periodically resetting integration angle demodulation device and a method using the same is disclosed, which uses a waveform multiplier and a periodically resetting integrator to modulate a continuous-time angle modulation signal into a discrete-time signal. The waveform multiplier multiplies the continuous-time angle modulation signal by a square wave signal whose frequency is integer times a carrier frequency, and then transmits the continuous-time angle modulation signal to a periodically resetting integrated circuit. The periodically resetting integrated circuit performs integration during a carrier period to generate a discrete-time angle modulation output signal. The present invention can greatly reduce the difficulty for designing an optical sensing system in the front end without limiting a modulation depth. Besides, the present invention achieves a small volume, high speed, high sensitivity, high reliability, high performance and high condition-adapting properties.

Abstract: An amplifier (1) is provided, in particular, wideband amplifier with an input (4) and an output (5) comprising a first amplifier stage (2) and a second amplifier stage (3), wherein the first amplifier stage (2) has an active power splitter with at least one injection point, wherein this injection point corresponds to the input (4) of the amplifier, and at least two discharge points (9a, 9b), wherein this active power splitter is formed according to a traveling wave amplifier principle and the second amplifier stage (3) has at least two injection points (11a, 11b) and at least one discharge point, wherein this discharge point corresponds to the output (5) of the amplifier and is formed as a power coupler. It is essential that the second amplifier stage (3) is formed as a power coupler, wherein this power coupler is formed according to the principle of a reactively matched amplifier.

Abstract: Circuits for reducing power consumption in power amplifier circuits are disclosed. In certain embodiments, a circuit for power control in the transmitter includes a coupling circuit, a first power amplifier circuit and a second power amplifier circuit. The coupling circuit includes a primary winding inductively associated with a first secondary winding and a second secondary winding. The coupling circuit provides a signal at output terminals of the first secondary winding and the second secondary winding in response to a signal at the primary winding. A first power amplifier circuit is coupled with output terminals of the first secondary winding, and a second power amplifier is coupled with output terminals of the second secondary winding. The first power amplifier circuit and second power amplifier circuit are configured to be enabled or disabled based on a bias voltage.

Abstract: Embodiments of a Doherty power amplifier that maintain efficiency over a large operating average power range are disclosed. In one embodiment, the Doherty power amplifier includes reconfigurable main and auxiliary output matching networks and a fixed combining network. The reconfigurable main and auxiliary output matching networks can be reconfigured such that together the reconfigurable main output matching network, the reconfigurable auxiliary output matching network, and the fixed combining network provide proper load modulation for multiple different back-off power levels. As a result, the Doherty power amplifier maintains high efficiency over an extended back-off power level range.

Abstract: Systems and methods are disclosed for digital predistortion for a concurrent multi-band transmitter using a single adaptor and a same set of predistortion coefficients for separate digital predistorters for each band. In one embodiment, the single adaptor is configured to adaptively configure a set of predistortion coefficients based on a memory polynomial digital baseband model of the digital predistorters having a same set of predistortion coefficients for each of the digital predistorters. By using the same set of predistortion coefficients for the separate digital predistorters for each band, a complexity of the digital predistortion is substantially reduced.

Abstract: A switching power amplifier includes: a first transistor controlled by a first digital signal to selectively output a first output signal; a second transistor controlled by a second digital signal to selectively output a second output signal; and a control circuit arranged to generate the second digital signal according to the first digital signal and a third digital signal; wherein the first output signal and the second output signal are outputted on a common connected node of the first transistor and the second transistor.