Patents Issued in July 13, 2017
  • Publication number: 20170199209
    Abstract: Provided herein are methods and systems of molecular profiling of diseases, such as cancer. In some embodiments, the molecular profiling can be used to identify treatments for a disease, such as treatments that were not initially identified as a treatment for the disease or not expected to be a treatment for a particular disease.
    Type: Application
    Filed: January 4, 2017
    Publication date: July 13, 2017
    Inventors: Daniel D. Von Hoff, David M. Loesch, Arlet Alarcon, Robert J. Penny, Alan Wright, Matthew J. McGinniss, Ryan P. Bender, Traci Pawlowski
  • Publication number: 20170199210
    Abstract: Detection apparatus includes a microfluorometer having an objective, an excitation radiation source, and a detector. The detection apparatus also includes a fluidic system for delivering reagents from a reagent cartridge to a flow cell. The fluidic system includes a manifold body having a plurality of fluidic channels configured for fluid communication between the reagent cartridge and the flow cell. The fluidic system also includes a plurality of reagent sippers. The fluidic system also includes a valve configured to mediate fluid between reagent reservoirs and the flow cell. The detection apparatus also includes a flow cell latch clamp module having a clamp cover for holding the flow cell. The objective is configured to direct excitation radiation from the radiation source to the flow cell and to direct emission from the flow cell to the detector. The microfluorometer is movable to acquire wide-field images of different areas of the flow cell.
    Type: Application
    Filed: January 11, 2017
    Publication date: July 13, 2017
    Applicants: Illumina, Inc., Illumina Singapore Pte Ltd
    Inventors: Beng Keong Ang, Heng Kuang Cheng, John M. Beirle, Brad Drews, David Kaplan
  • Publication number: 20170199211
    Abstract: The present invention provides improved methods, facilities and systems for parallel processing of biological cellular samples in an efficient and scalable manner The invention enables parallel processing of biological cellular samples, such as patient samples, in a space and time efficient fashion. The methods, facilities and systems of the invention find particular utility in processing patient samples for use in cell therapy.
    Type: Application
    Filed: July 21, 2015
    Publication date: July 13, 2017
    Inventors: Firman Ghouze, Philip Vanek
  • Publication number: 20170199212
    Abstract: A flexible instrument control and data storage/management system and method for representing and processing assay plates having one or more predefined plate locations is disclosed. The system utilizes a graph data structure, layer objects and data objects. The layer objects map the graph data structure to the data objects. The graph data structure can comprise one node for each of the one or more predefined plate locations, wherein the nodes can be hierarchically defined according to a predefined plate location hierarchy. Each node can be given a unique node identifier, a node type and a node association that implements the predefined plate location hierarchy. The layer objects can include an index that maps the node identifiers to the data objects.
    Type: Application
    Filed: March 24, 2017
    Publication date: July 13, 2017
    Inventors: Craig P. Lovell, Thomas Lucas Hampton, III
  • Publication number: 20170199213
    Abstract: A container inspection device includes an inlet conveyor, an outlet conveyor, a mounting table having a mounting surface a chamber portion having an opening in a section of the chamber portion, in which a receiving space is formed when the mounting surface contacts the chamber portion to close the opening, and a transfer. The transfer is movable in the certain direction at a speed greater than the conveying speed of the cartons by the inlet conveyor. The transfer holds multiple ones of the cartons that have been conveyed by the inlet conveyor collectively and conveys the cartons to the mounting surface of the mounting table, and holds the multiple ones of the cartons mounted on the mounting surface collectively and conveys the cartons to the outlet conveyor.
    Type: Application
    Filed: June 4, 2015
    Publication date: July 13, 2017
    Applicants: Kabushiki Kaisha N-Tech, Kabushiki Kaisha Yakult Honsha, Tohoshoji Kabushiki Kaisha
    Inventors: Osamu YOSHIDA, Chizuka KAI, Kunimitsu TOYOSHIMA
  • Publication number: 20170199214
    Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.
    Type: Application
    Filed: January 23, 2017
    Publication date: July 13, 2017
    Applicant: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
  • Publication number: 20170199215
    Abstract: The calculation of the speed of a moving train is critical to being able to capture high speed resolution images of the undercarriage of a moving train using a camera in an associated application. The measurement must be extremely accurate and in real time so that an appropriately placed camera can capture images and transmit those images to a remote location.
    Type: Application
    Filed: January 13, 2016
    Publication date: July 13, 2017
    Inventors: GIANNI ARCAINI, WILLIAM SCOTT CARNS, CHARLES HOEPPNER, ISRAEL UMBEHANT
  • Publication number: 20170199216
    Abstract: A MEMS chip for wind speed measurements is provided. The chip integrates one or multiple embedded channels and a pressure sensor. The pressure sensor consists of a sensing membrane with a cavity beneath it. Each channel has one end connects to the cavity while the other end opens on the edge of the chip. To measure the wind speed, the membrane faces the wind and the air stagnates onto it while the channel connects the cavity to the static pressure. And the membrane deforms according to the wind pressure. The wind speed is then derived from the measured wind pressure.
    Type: Application
    Filed: January 22, 2013
    Publication date: July 13, 2017
    Inventor: Mingqiang Yi
  • Publication number: 20170199217
    Abstract: An electronic device includes a package; and a functional element, in which a side surface of the functional element is fixed to a side wall of the package on an inner side thereof via an adhesive.
    Type: Application
    Filed: December 29, 2016
    Publication date: July 13, 2017
    Inventors: Atsuki NARUSE, Shota KIGURE
  • Publication number: 20170199218
    Abstract: An angle of attack sensing system includes a rotatable vane, a first pressure sensing port, a second pressure sensing port, a vane position sensor, and a fault detector. The rotatable vane includes a first surface and a second surface opposite the first surface. The first pressure sensing port is disposed in the first surface. The second pressure sensing port is disposed in the second surface. The vane position sensor is configured to output a rotational position signal of the rotatable vane. The fault detector is configured to output an indication of a rotational fault condition based on a difference between a first sensed pressure from the first pressure sensing port and a second sensed pressure from the second pressure sensing port.
    Type: Application
    Filed: January 8, 2016
    Publication date: July 13, 2017
    Inventor: Kevin Benning
  • Publication number: 20170199219
    Abstract: A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.
    Type: Application
    Filed: July 14, 2015
    Publication date: July 13, 2017
    Applicant: Rutgers, The State University of New Jersey
    Inventors: Qingze Zou, Juan Ren, Jiangbo Liu
  • Publication number: 20170199220
    Abstract: Aspects of the present invention include systems and devices useful for surface chemical analysis of solid samples by Tip Enhanced Raman Spectrometry (“TERS”), and particularly it relates to devices useful for chemical analysis of molecular compounds located either on or within thin surface layer of solid samples. Even more particularly, aspects of the present invention relate to systems, and devices for non-destructive analysis combining both high sensitivity and high spatial resolution of analysis of chemical compounds located or distributed on the surface of solid samples with obtaining important information regarding vibration spectra of atoms and molecular groups contained in a thin surface layer of solid samples. These objectives are realized by implementation of computer-assisted systems that use sensors to carefully regulate the motion of, and force applied to, probes of atomic force microscopes.
    Type: Application
    Filed: February 9, 2017
    Publication date: July 13, 2017
    Applicant: AIST-NT, Inc.
    Inventors: Sergey A. Saunin, Andrey V. Krayev, Vladimir V. Zhishimontov, Vasily V. Gavrilyuk, Leonid N. Grigorov, Alexey V. Belyaev, Dmitry A. Evplov
  • Publication number: 20170199221
    Abstract: A mode-locked laser injects pulses of minority carriers into a semiconductor sample. A microwave frequency comb is then generated by the currents formed in the movement of majority carriers native to the semiconductor and the injected minority carriers. These carriers move to cause dielectric relaxation in the sample, which can be used to determine carrier density within the sample. Measurements require close proximity of transmitter and receiver contacts with the sample and may profile a semi-conductor with a resolution of approximately 0.2 nm.
    Type: Application
    Filed: December 5, 2016
    Publication date: July 13, 2017
    Inventor: Mark J. Hagmann
  • Publication number: 20170199222
    Abstract: A test probe structure having a planar surface and contact locations matched to test hardware is provided. The fabrication of the test probe structure addresses problems related to the possible deformation of base substrates during manufacture. Positional accuracy of contact locations and planarity of base substrates is achieved using dielectric layers, laser ablation, injection molded solder or redistribution layer wiring, and planarization techniques.
    Type: Application
    Filed: March 25, 2017
    Publication date: July 13, 2017
    Inventors: Bing Dang, John U. Knickerbocker, Jae-Woong Nah, Robert E. Trzcinski, Cornelia Kang-I Tsang
  • Publication number: 20170199223
    Abstract: An adapter for receiving at least one integrated circuit with a Hall sensor in a housing. The adapter has a cavity for receiving the at least one integrated circuit in the housing, at least one opening connected with the cavity, and a magnetic-field generating apparatus for generating a magnetic field in the cavity. The adapter is used in a system for detecting the strength of a magnetic field.
    Type: Application
    Filed: January 10, 2017
    Publication date: July 13, 2017
    Inventors: Stefan Albrecht, Christian Schladebach, Dominik Zimmermann
  • Publication number: 20170199224
    Abstract: A two-piece spring probe in electrical contact with a piece of testing equipment is used for probing an object to be tested. The two-piece spring probe includes a coiled compression spring and a conductive element. The coiled compression spring has a non-uniform outer diameter and is used to electrically contact the object. The conductive element is directly connected to the coiled compression spring and in electrical contact with the testing equipment.
    Type: Application
    Filed: January 12, 2016
    Publication date: July 13, 2017
    Inventors: Chyi-Lang LAI, Po-Hong CHEN, Chun-Kiu TAN, Chia-Pin SUN
  • Publication number: 20170199225
    Abstract: A probe position inspection apparatus which incorporates a rotatable internal prism is attached to a supporting unit for supporting semiconductor device, thus making it possible to accurately inspect in-plane positions of tips of probes in a short time and also making it possible to adapt the probe position inspection apparatus to a double-sided prober.
    Type: Application
    Filed: October 3, 2016
    Publication date: July 13, 2017
    Applicant: Mitsubishi Electric Corporation
    Inventors: Norihiro TAKESAKO, Akira OKADA, Takaya NOGUCHI
  • Publication number: 20170199226
    Abstract: The present disclosure describes a semiconductor wafer testing environment for routing signals used for testing integrated circuits formed onto a semiconductor wafer. The semiconductor wafer testing environment includes a semiconductor wafer tester to control overall operation and/or configuration of the semiconductor wafer testing environment and a semiconductor wafer prober to test the integrated circuits formed onto the semiconductor wafer. The semiconductor wafer prober includes a probe card having a transmission line coupler formed onto a flexible substrate. The transmission line coupler includes multiple transmission line coupling blocks that extend radially from a central point of the flexible substrate in a circular manner.
    Type: Application
    Filed: February 23, 2016
    Publication date: July 13, 2017
    Applicant: Broadcom Corporation
    Inventors: Timothy SCRANTON, Michael BOERS, Seunghwan YOON, Jesus CASTANEDA
  • Publication number: 20170199227
    Abstract: A test probe structure having a planar surface and contact locations matched to test hardware is provided. The fabrication of the test probe structure addresses problems related to the possible deformation of base substrates during manufacture. Positional accuracy of contact locations and planarity of base substrates is achieved using dielectric layers, laser ablation, injection molded solder or redistribution layer wiring, and planarization techniques.
    Type: Application
    Filed: March 25, 2017
    Publication date: July 13, 2017
    Inventors: Bing Dang, John U. Knickerbocker, Jae-Woong Nah, Robert E. Trzcinski, Cornelia Kang-I Tsang
  • Publication number: 20170199228
    Abstract: A device is disclosed that includes a control circuit, a scope circuit and a time-to-current converter. The control circuit configured to delay a voltage signal for a delay time to generate a first control signal, and to generate a second control signal according to the first control signal and the voltage signal. The scope circuit configured to generate a first current signal in response to the second control signal and the voltage signal. The time-to-current converter configured to generate a second current signal according to the first control signal and the voltage signal.
    Type: Application
    Filed: January 9, 2016
    Publication date: July 13, 2017
    Inventors: Chung-Peng HSIEH, Chih-Chiang CHANG, Chung-Chieh YANG
  • Publication number: 20170199229
    Abstract: An interconnect device includes a body portion with conductors passing through the body portion. An energy harvesting device, a power controller device and a rechargeable DC power source are configured such that the power controller device includes instructions programmed thereon for controlling the flow of power between the energy harvesting device, the DC power source, and a microcontroller. Sensor devices are in electrical communication with the microcontroller. The sensors are arranged to detect parameters associated with the interconnect device and communicate the parameters to the microcontroller. An output device communicates data from the microcontroller associated with the at least one sensor.
    Type: Application
    Filed: January 11, 2016
    Publication date: July 13, 2017
    Inventors: Alexander Raymond KING, Mohammad Siddique AHMED, Raymond Howard KOHLER, Ganesh Shivaram BHATT, Robert Joseph BARAGONA
  • Publication number: 20170199230
    Abstract: A Rogowski coil in a sensor unit has voltage induced by a conductor surrounded by the Rogowski coil. The voltage is integrated to represent current which is converted to digital data representing current in the conductor and sent wirelessly to a multimeter. The sensor unit may receive control signals from the multimeter and a remote control apparatus. A plurality of sensor units may be networked and controlled by the remote control apparatus.
    Type: Application
    Filed: March 27, 2017
    Publication date: July 13, 2017
    Inventors: Matthew Carl-Robert Bannister, David Lawrence Epperson, Clark N. Huber
  • Publication number: 20170199231
    Abstract: A coil arrangement comprises an electrical coil and an armature movable between a first end position (I) and a second end position, an electronic switch switchable between at least two switch states, a control and monitoring circuit for producing a switching signal actuating the electronic switch and an operating circuit for providing an operating voltage and an electrical current measurement signal representing an electrical current flowing as a function of time in a coil electrical current circuit formed with the coil. The control and monitoring circuit is additionally adapted using the electrical current measurement signal to perform a checking of the coil, for example, namely to detect, whether an inductance, of the coil has a dependence on the switching signal as a function of time, respectively a behavior as a function of time corresponding with the switching signal as a function of time.
    Type: Application
    Filed: May 27, 2015
    Publication date: July 13, 2017
    Inventors: Adrian Brunner, Matthias Brudermann, Christoph Werle
  • Publication number: 20170199232
    Abstract: A shaft grounding and monitoring system may include a grounding member slidingly engageable with a rotating shaft. An electrical sensor may be configured to be coupled with the grounding member in order to detect an electrical parameter that provides an indication of electricity flowing from the rotating shaft to ground through the grounding member. A processor may be operably coupled with the electrical sensor and may receive and analyze data from the electrical sensor. The processor may be configured to periodically analyze the data representing the electrical parameter from the electrical sensor at a sampling rate and for a sampling period that is related to a rotation speed of the rotating shaft. A memory may be operably coupled with the processor and may be configured to store data processed by the processor that is representative of the data provided by the electrical sensor.
    Type: Application
    Filed: January 10, 2017
    Publication date: July 13, 2017
    Applicant: CUTSFORTH, INC.
    Inventors: DAVID A. JAHNKE, ROBERT S. CUTSFORTH, DUSTIN L. CUTSFORTH
  • Publication number: 20170199233
    Abstract: A power-generation-amount estimation apparatus estimating photovoltaic power generation amount carried along a power distribution line in a high-voltage system to which loads and photovoltaic power generation equipments are connected, includes: a communication unit receiving voltage and active power at the end point on the upstream side of a power distribution line and voltage and active power at the end point on the downstream side; a load/power-generation center calculator calculating impedance at a load center point based on contract information and the connection position of each load and calculating impedance at a power generation center point based on the connection position and the power generation capacity of each photovoltaic power generation equipment; and a load/power-generation-amount calculator estimating the photovoltaic power generation amount based on the impedance at the load center point, the impedance at the power generation center point, and the voltages and active powers received by the c
    Type: Application
    Filed: June 13, 2014
    Publication date: July 13, 2017
    Applicant: MITSUBISHI ELECTRIC CORPORATION
    Inventor: Nobuhiko ITAYA
  • Publication number: 20170199234
    Abstract: Embodiments of the present invention provide apparatus comprising: at least one motor vehicle switchpack, the switchpack comprising input means operable to control the switchpack to provide a switchpack control output to a motor vehicle control system; and motor vehicle test apparatus, the test apparatus comprising: a test apparatus control system comprising computing means; test apparatus switching means operable under the control of the test apparatus control system to control the at least one switchpack to provide the switchpack control output to the vehicle control system, the test apparatus control system being operable to monitor a response by the vehicle control system to the switchpack control output.
    Type: Application
    Filed: February 14, 2017
    Publication date: July 13, 2017
    Inventors: Alexandros Mouzakitis, Ian Smith
  • Publication number: 20170199235
    Abstract: Disclosed herein is a cable fault diagnosis system and method, wherein when an application signal and a reflected signal overlap each other due to the proximity of a fault location to an application location or when the intensity of the reflected signal is weak and thus falls outside of a prescribed fault diagnosis range due to remoteness of the fault location from the application location, a correction location, at which a correlation function value has a global maximum, is derived on the basis of a prescribed correlation function for an application signal applied to a cable to be inspected and an acquired reflected signal, a correction signal, which is a reflected signal from which the application signal is removed at the derived correction location, is calculated, the distance between the correction location and the acquisition location is derived on the basis of a time delay, which is calculated on the basis of the calculated correction signal and the reflected signal at the acquisition location, and a pr
    Type: Application
    Filed: May 7, 2015
    Publication date: July 13, 2017
    Applicant: KOREA ELECTRICAL SAFETY CORPORATION
    Inventors: Jeong-chay JEON, Jae-jin KIM, Myeong-il CHOI, Taek-hee KIM
  • Publication number: 20170199236
    Abstract: A system and method for detecting connector (20) faults in a power conversion system (10). The system (10) comprises a plurality of series of modules (14) operable in a power conversion mode. A loop connection (30) is provided between the output of a final module (14) in the series and a first module (14) in the series and a loop switch (RL3) is provided in the loop connection (30). Loop current circuitry is provided in one or more of the modules (14) to generate a current flow within the loop and voltage measurement circuitry within each of the modules measures voltage of the input of the module relative to a local reference voltage and/or the output of the module relative to a local reference voltage.
    Type: Application
    Filed: June 5, 2015
    Publication date: July 13, 2017
    Inventor: Kevin Stephen Davies
  • Publication number: 20170199237
    Abstract: A fault location of a fault on a line of an electrical energy supply network is determined from measured current and voltage values at the first and second line ends. Highly accurate fault location with measured values from both line ends is provided even in the absence of temporal synchronization of the measurements at the line ends. Characteristics of first and second fictitious fault voltage values present at a fictitious fault location on the line are defined using the first and second current and voltage values. A fictitious fault location is determined for which the characteristic of the first fictitious fault voltage values corresponds most closely to the characteristic of the second fictitious fault voltage values. The fictitious fault location is used as the actual fault location. We also describe a correspondingly configured device and a system for determining a fault location.
    Type: Application
    Filed: January 13, 2017
    Publication date: July 13, 2017
    Inventors: CEZARY DZIENIS, ANDREAS JURISCH
  • Publication number: 20170199238
    Abstract: An apparatus with a burn-in board containing a microcontroller unit and a heater socket for insitu testing of a packaged integrated circuit while under stress. A method for insitu testing of a packaged integrated circuit while under stress. A method for insitu testing of multiple packaged integrated circuits while under stress.
    Type: Application
    Filed: January 11, 2016
    Publication date: July 13, 2017
    Inventors: Ning Tan, Jose Abdiel Rodriguez-Latorre
  • Publication number: 20170199239
    Abstract: Embodiments of the present disclosure provide a repairing system and a repairing method for a CABC module. The system comprising: a CABC module that includes a first register and a second register; an initial value register configured to input a check value or an initial value to the first register; a first logic circuit, a second logic circuit, a third logic circuit and a fourth logic circuit.
    Type: Application
    Filed: August 26, 2016
    Publication date: July 13, 2017
    Inventors: Zhijia CUI, Shuai XU
  • Publication number: 20170199240
    Abstract: A semiconductor apparatus includes a test entry control block configured to generate a plurality of trigger signals and a reset signal according to a test setting command and addresses; and a test entry signal generation block configured to enable a test entry signal when the plurality of trigger signals are sequentially enabled.
    Type: Application
    Filed: March 28, 2017
    Publication date: July 13, 2017
    Applicant: SK hynix Inc.
    Inventor: Soo Young JANG
  • Publication number: 20170199241
    Abstract: Embodiments of the invention provide a scan test system for an integrated circuit comprising multiple processing elements. The system comprises at least one scan input component and at least one scan clock component. Each scan input component is configured to provide a scan input to at least two processing elements. Each scan clock component is configured to provide a scan clock signal to at least two processing elements. The system further comprises at least one scan select component for selectively enabling a scan of at least one processing element. Each processing element is configured to scan in a scan input and scan out a scan output when said the processing element is scan-enabled. The system further comprises an exclusive-OR tree comprising multiple exclusive-OR logic gates. The said exclusive-OR tree generates a parity value representing a parity of all scan outputs scanned out from all scan-enabled processing elements.
    Type: Application
    Filed: November 19, 2015
    Publication date: July 13, 2017
    Inventors: Rodrigo Alvarez-Icaza Rivera, John V. Arthur, Andrew S. Cassidy, Bryan L. Jackson, Paul A. Merolla, Dharmendra S. Modha, Jun Sawada
  • Publication number: 20170199242
    Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
    Type: Application
    Filed: December 22, 2016
    Publication date: July 13, 2017
    Inventors: Haw-Jyh Liaw, Xingchao Yuan, Mark A. Horowitz
  • Publication number: 20170199243
    Abstract: A supply-voltage-fluctuation detecting apparatus includes a first detecting unit, a second detecting unit, a capacitor, and a fluctuation detecting unit. The first detecting unit and the second detecting unit detect fluctuations in voltage at a detected voltage input with respect to a detected ground input. A load unit that operates with power supplied from a battery and the first detecting unit are connected in parallel. A detected voltage input of the second detecting unit connects to a positive electrode of the battery. A detected ground input of the second detecting unit connects to a detected ground input of the first detecting unit via an impedance component. The capacitor is connected in parallel to the second detecting unit. The fluctuation detecting unit detects fluctuations in supply voltage when at least one of the first detecting unit or the second detecting unit detects fluctuations in voltage.
    Type: Application
    Filed: November 16, 2016
    Publication date: July 13, 2017
    Applicant: Alpine Electronics, Inc.
    Inventor: Koichi Narita
  • Publication number: 20170199244
    Abstract: An electronic circuit and method for measuring currents during charging and discharging of a secondary battery are disclosed having a secondary battery, at least one shunt for determining the electrical current during charging and/or discharging of the secondary battery by measuring the voltage drop over the shunt, a switchable electrical load, two connectors for connecting a preferably switchable power supply to the electronic circuit for charging the secondary battery and a voltage measuring device.
    Type: Application
    Filed: January 4, 2017
    Publication date: July 13, 2017
    Inventors: Ferdinand Hermann, Torsten Klemm
  • Publication number: 20170199245
    Abstract: In a method for measuring and testing the performance of accumulators by determining at least one of data or profiles characteristic for accumulators, a plurality of series connected accumulators in a first measurement phase are connected to a power supply unit and a load and are charged and discharged at least once, and first measurement values are detected, from which data or profiles characteristic for the series-connected accumulators are created, the series connection is separated and each individual accumulator one after the other is connected to the power supply unit and the load. In a second measurement phase each accumulator is completely charged and completely discharged at least once and predetermined second measurement values are detected, from which individual data or profiles characteristic for each accumulator are created.
    Type: Application
    Filed: March 24, 2017
    Publication date: July 13, 2017
    Inventors: Roman Schneeweiss, Ina Hahndorf
  • Publication number: 20170199246
    Abstract: The present application discloses an integrated direct current (DC) subsystem monitoring system for monitoring and reporting status of a utility substation, the DC subsystem monitoring system having the ability to actively monitor and report on changes in the float current and current capacity of the system, as well as to monitor for ground faults.
    Type: Application
    Filed: May 10, 2016
    Publication date: July 13, 2017
    Applicant: Hindle Power, Inc.
    Inventors: William A. Hindle, Nicholas C. Hindle, Robert Beck, Larry S. Meisner
  • Publication number: 20170199247
    Abstract: Apparatus for estimating charge state of secondary battery and method therefor are disclosed. The apparatus includes a control unit configured to estimate the state of charge of the secondary battery by repeatedly performing an algorithm of the Extended Kalman Filter by using a state equation that time-updates a state parameter including the state of charge of the secondary battery and a polarization voltage of the secondary battery, and an output equation that predicts the voltage of the secondary battery using an open circuit voltage according to the state of charge, the polarization voltage, and an internal resistance voltage generated by an internal resistance of the secondary battery, and the control unit increases a difference between state of charge noise and polarization voltage noise of the Extended Kalman Filter when the secondary battery becomes key-off state.
    Type: Application
    Filed: October 21, 2015
    Publication date: July 13, 2017
    Applicant: LG CHEM, LTD.
    Inventor: Won-Tae JOE
  • Publication number: 20170199248
    Abstract: The present disclosure discloses an apparatus and method for estimating a remaining service life of a battery that enables providing a relatively exact remaining service life of the battery to a user even when a parameter of the battery does not change sufficiently enough to enable measurement of the remaining service life due to reasons such as the battery not being used or the like.
    Type: Application
    Filed: July 13, 2015
    Publication date: July 13, 2017
    Applicant: LG CHEM, LTD.
    Inventors: Hyun-Chul LEE, Ki-Wook JANG, Jong-Min PARK
  • Publication number: 20170199249
    Abstract: Embodiments of the disclosure provide systems and methods for estimating battery discharge time duration during high-rate battery discharging. Generally speaking, embodiments of the present disclosure are directed to a prediction of battery run times for short duration, high-current discharge events that are scaled in seconds rather than minutes, and which are continuously compensated for ambient temperature which can alter discharge times as a result of reaching thermal limitations before chemical capacity has actually been exhausted.
    Type: Application
    Filed: January 13, 2017
    Publication date: July 13, 2017
    Inventors: James P. Novak, Robert L. Myers, Alexei Tikhonski
  • Publication number: 20170199250
    Abstract: The present disclosure relates to an open circuit voltage estimating apparatus capable of estimating an open circuit voltage even when a battery cell does not have a rest time.
    Type: Application
    Filed: October 30, 2015
    Publication date: July 13, 2017
    Applicant: LG CHEM, LTD.
    Inventors: Sung-Yul YOON, Jeong-Seok PARK, Gyong-Jin OH, Young-Bo CHO
  • Publication number: 20170199251
    Abstract: A magnetism measuring device which measures a magnetic field, includes: a gas cell including a cell portion which includes a main chamber, a reservoir that communicates with the main chamber and has a longitudinal direction, and an opening that is provided in the longitudinal direction of the reservoir on a side opposite to the main chamber, a sealing portion which seals the opening, and an alkali metal gas filling the main chamber and the reservoir; and a holding portion provided in the reservoir along the longitudinal direction.
    Type: Application
    Filed: December 27, 2016
    Publication date: July 13, 2017
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Eiichi FUJII, Kimio NAGASAKA
  • Publication number: 20170199252
    Abstract: A Hall sensor includes a Hall element and a heat source element in a circuit configured to drive the semiconductor Hall element, and capable of eliminating an offset voltage without increasing a chip size. In the Hall sensor, a Hall element control current flowing between one pair of terminals out of two pairs and a Hall element control current flowing between another pair of terminals cross each other as vectors, the Hall element has a shape that is line-symmetrical to the straight line along a vector sum of the Hall element control current and the Hall element control current, and the heat source element is arranged so that the center of the heat source is positioned on the straight line along the vector sum of the Hall element control current and the Hall element control current.
    Type: Application
    Filed: March 27, 2017
    Publication date: July 13, 2017
    Inventors: Takaaki HIOKA, Tomoki HIKICHI
  • Publication number: 20170199253
    Abstract: A magnetic sensor device including: a board mounted with a magnetoresistive effect element, a magnet to form a bias magnetic field for the magnetoresistive effect element, an enclosure having an opening on a side of a conveyance path where a to-be-detected object is conveyed, also including a housing portion to house the magnet and the board, and a cover to cover a surface on a side of the opening of the housing portion. The enclosure includes step portions on which the board is supported such that the board lies across the opening and extends parallel to the conveyance path, and grooves, continuous with the step portions, extending from the opening to an outer surface of the enclosure on a side of the conveyance direction.
    Type: Application
    Filed: July 13, 2015
    Publication date: July 13, 2017
    Applicant: Mitsubishi Electric Corporation
    Inventors: Masaaki OKADA, Hideki MATSUI, Tomokazu OGOMI, Sadaaki YOSHIOKA
  • Publication number: 20170199254
    Abstract: Magnetometers, atomic sensors and related systems, methods and devices are disclosed.
    Type: Application
    Filed: March 28, 2017
    Publication date: July 13, 2017
    Inventors: Elizabeth L. Foley, Thomas W. Kornack
  • Publication number: 20170199255
    Abstract: Fluid channeling system (150) for NMR system (100), characterized in that the channeling system (150) includes an exhaust circuit (160) of the NMR system (100) comprising a first fluid circulation branch (161) and a second fluid circulation branch (162).
    Type: Application
    Filed: January 11, 2017
    Publication date: July 13, 2017
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: Eric Bouleau, Daniel Lee
  • Publication number: 20170199256
    Abstract: An embodiment provides a radio frequency (RF) receiving coil unit for a magnetic resonance imaging (MRI) system. The RF receiving coil unit includes an RF coil and a circuit. The circuit is configured to monitor a current flowing through the RF coil by using electromagnetic coupling between the RF coil and the first coil.
    Type: Application
    Filed: January 8, 2017
    Publication date: July 13, 2017
    Inventor: George Verghese
  • Publication number: 20170199257
    Abstract: Some embodiments of the present disclosure relate to a displacer for reducing the consumption of a cryogen used in a superconductive magnet device. The displacer may occupy some space within the cryogen storage cavity or limit the cryogen into a relatively small space surrounding a superconductive coil in the cryogen storage cavity. The displacer may also include a displacer cavity that may be vacuum or contain a cryogen or another substance.
    Type: Application
    Filed: March 29, 2017
    Publication date: July 13, 2017
    Applicant: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
    Inventors: Jianfeng LIU, Xingen YU, Lijun ZOU, Jin QIAN, Yong JIANG, Qing NI
  • Publication number: 20170199258
    Abstract: The invention relates to a method of MR imaging of at least an object (10) placed in an examination volume of a MR device (1). It is an object of the invention to enable fast MR imaging using a multi-echo imaging technique which is robust with respect to motion. The method of the invention comprises the steps of:—generating echo signals by subjecting the object (10) to an imaging sequence,—acquiring the echo signals, each echo signal being attributed to a k-space line, wherein a number of k-space lines, which are adjacently arranged in a part of k-space, are repeatedly sampled, with said number of k-space lines being sampled in a different sequential order per repetition, and—reconstructing a MR image from the acquired echo signals. Moreover, the invention relates to a MR device for carrying out this method as well as to a computer program to be run on a MR device.
    Type: Application
    Filed: May 22, 2015
    Publication date: July 13, 2017
    Inventors: GABRIELE MARIANNE BECK, ALAN JERRY HUANG, GERRIT HENDRIK VAN IJPEREN