Abstract: A method for detecting a malfunction or defect of a sensor of a vehicle safety device uses a control unit of the vehicle safety device and at least one self-testing sensor which is separate from the control unit and transmits measuring values to the control unit.

Abstract: One embodiment includes a method for dynamic self-calibration of an accelerometer system. The method includes forcing a proof-mass associated with a sensor of the accelerometer system in a first direction to a first predetermined position and obtaining a first measurement associated with the sensor in the first predetermined position via at least one force/detection element of the sensor. The method also includes forcing the proof-mass to a second predetermined position and obtaining a second measurement associated with the sensor in the second predetermined position via the at least one force/detection element of the sensor. The method further includes calibrating the accelerometer system based on the first and second measurements.

Abstract: A scanning probe microscope that includes a probe, a positioning unit configured to position a probe on a measurement sample, an excitation unit configured to excite the measurement sample at a predetermined frequency, a resonance unit configured to output a frequency modulation signal by converting a change of a capacitance of the measurement sample, a lock-in amplifier configured to output a differential capacitance signal obtained by extracting a predetermined frequency component and a harmonic component of the predetermined frequency of the demodulated signal, a conversion unit configured to output data indicative of a relationship between a voltage applied to the measurement sample and the capacitance, a detecting unit that detects a voltage value corresponding to a feature point of the relationship data, and a main measurement control unit that measures electrical characteristics of the measurement sample subjected to a DC bias voltage substantially equal to the feature point voltage.

Abstract: The present disclosure provides a test device and a test method using the test device. The test device includes a first fastener structure for fastening a to-be-tested substrate with first touch lines, a second fastener structure for fastening a test match panel with second touch lines, and the first touch lines and the second touch lines forming a touch module, a third fastener structure for supporting a change-over flexible printed circuit board, a signal input structure for electrically connecting to one of a circuit board in the test match panel and the first touch lines through the change-over flexible printed circuit board, and inputting trigger data signals, a sensing signal capture structure for capturing touch sensing signals in the first touch line or the second touch lines.

Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.

Abstract: A probe card device includes a testing circuitry board, a flexible probe needle, a first solder portion, a second solder portion and an interconnected holder electrically connected to the testing circuitry board and the flexible probe needle in which one end of the interconnected holder is coupled to the flexible probe needle with the first solder portion, and the other end of the interconnected holder is coupled to a conductive pad of the testing circuitry board with the second solder portion. A first desoldering melting point of the first solder portion is higher than a second desoldering melting point of the second solder portion.

Abstract: A three-phase toroidal current transducer comprises a cuboid detector body (12), having three cylindrical passages (14) each for receiving a single-phase cable of a three-phase load (not shown). Each of the three passages (14) has an embedded toroidal winding (not shown) which is used to detect a current in the load cable (also not shown). Signals representing the current in each of the three individual load cables are sent to a meter (not shown), which may be located remotely. The signals are transmitted along a multi-core signal cable (16), which has a standard connector (18) for a plug-in connection to the meter. One of the wires in the multi-core signal cable (16) is connected to a component in the transducer (10) that identifies the rating of the transducer, so that the meter can determine this automatically when the signal cable is plugged in.

Abstract: Method and device for determining the absence of voltage in electrical equipment. An installed device is electrically connected to a power source. The installed device has circuitry capable of detecting voltage, performing self-diagnostics, and testing for connectivity to the power source. In one embodiment, the device can also check to see if the voltage is at a deenergized level, recheck for continuity and repeat the self-diagnostics. In another embodiment, the installed device can be electrically connected to the line and load side of a disconnect and have circuitry configured to check the status of the disconnect. In another embodiment, the device can be configured to communicate with a portable reader in order to transfer information to the portable reader. In yet another embodiment, the device can be configured to interact with a controller that controls access to the panel in which the device is installed.

Abstract: A system for the verification of the absence of voltage includes a first impedance, an amplitude limiter electrically connected to the first impedance, a second impedance electrically connected to the first impedance and the amplitude limiter, a varactor circuit electrically connected to the second impedance, an isolation capacitor electrically connected to the second impedance and varactor circuit, an envelope circuit with a voltage detection circuit connected to the isolation circuit via a buffer, and an RF oscillator. The amplitude limiter configured to limit the voltage applied to the varactor circuit. The RF oscillator configured to interact with the varactor circuit in order to create a modulated circuit for the buffer and envelope circuit. The envelope circuit is configured to demodulate the signal for the voltage detection circuit.

Abstract: A clip-on ammeter includes a current measurement unit, an evaluation unit and a USB interface. The current measurement unit records current values and provides the current values as measurement values for transfer purposes. The evaluation unit includes an ND converter and is connected to the current measurement unit. The evaluation unit allows the measurement values to be transmitted in a processable form as USB compatible digital data to the USB interface. The USB interface is connected to the evaluation unit and the USB interface allows the USB compatible data to be made available for transfer purposes to be further processed. The evaluation unit is energized via the USB interface. The clip-on ammeter includes a voltage transformer. The voltage transformer provides a stabilized voltage as a reference voltage for the current measurement unit.

Abstract: According to one embodiment, an electronic device includes a transformer connected to a power supply device, a super capacitor chargeable with an output of the transformer, a voltage converter connected to the transformer, a processor having a power supply terminal supplied with an output of the voltage converter, first and second photo-couplers connected to the power supply device, and a capacitor connected to a primary side of the second photo-coupler through a resistor. The primary side of the second photo-coupler is grounded via a pull-down resistor. The processor includes first and second terminals connected to the first and second photo-couplers and a third terminal supplied with a charging voltage of the super capacitor.

Abstract: A computer-implemented method, computer program product, and system for determining electrical power levels using one or more sensors on a computing device including: determining threshold levels and alert criteria, receiving electrical power level data from one or more sensors of a computing device, determining if the electrical power level data exceeds the alert criteria, and sending an alert to the appropriate parties if the electrical power level data exceeds the alert criteria.

Abstract: A diagnostic apparatus that diagnoses a cutter tool or a rotating machine based on electric power supplied to the rotating machine, includes: an electric power measurement unit that measures the electric power; and a filtering unit that filters noises input from an input side and an output side of the electric power measurement unit, the electric power measurement unit including a Hall element, and applied voltage of an electric power supply line, that supplies the electric power to the rotating machine from an inverter or a servo amplifier, is input in the Hall element, wherein the electric power is calculated based on Hall voltage that is generated, when Hall current flows through the Hall element and magnetic flux is applied to a sensor surface of the Hall element, the Hall voltage being proportional to a product of the magnetic flux and the Hall current.

Abstract: A system such as an electric meter includes a single-ended analog-to-digital converter which is susceptible to crosstalk. Methods and apparatus are disclosed to calibrate and cancel crosstalk effects. The system determines whether voltage-induced cross-talk is in-phase or out-of-phase with respect to voltage. The system determines a first calibration factor based on minimum and maximum measured current values and voltage. If the cross-talk is in-phase, the system sets a second calibration factor to 0. If the cross-talk is out-of-phase, the system computes the second calibration factor based on a measured current when a power factor angle is set to 90 degrees. Calibration factors may be stored in the multi-channel system. In use, the system measures current and voltage and computes the actual current, voltage and power based on the measured current and voltage by employing a crosstalk cancellation technique using the calibration factors.

Abstract: An electric energy meter for a poly-phase electricity network includes a power transformer having a primary side and a secondary side, a first analog front end (AFE) unit is coupled to the secondary side of the power transformer, and a microcontroller coupled to the primary side of the power transformer. The first AFE unit is to be coupled to a first phase of the poly-phase electricity network. The microcontroller is configured to transmit a digitized request signal to, and to receive a measurement signal from, the first AFE unit via the power transformer. More specifically, the first AFE unit, upon receiving the digitized request signal, is to extract information from the digitized request signal.

Abstract: Technologies for verifying a de-embedder for interconnect measurement include a verification compute device. The verification compute device is to measure a first signal transmitted through a single device under test and measure a second signal transmitted through a duplicated set of devices under test. Each device under test in the duplicated set is substantially identical to the single device under test. Additionally, the verification compute device is to apply a de-embedder to the measured first signal to remove an effect of test fixtures on the measured first signal, apply the de-embedder to the measured second signal to remove the effect of the test fixtures on the measured second signal, concatenate the de-embedded first signal with itself to generate a concatenated de-embedded first signal, and compare the concatenated de-embedded first signal with the de-embedded second signal to determine whether the concatenated de-embedded first signal matches the de-embedded second signal.

Abstract: A method for determining at least one lineal parameter of a transmission line comprises the following steps: determining at least one measurement of the complex propagation factor ? as a function of frequency on the basis of at least one measurement carried out on the transmission line, determining at least one measurement of the lineal attenuation ? of the transmission line equal to the real part of the measurement of the complex propagation factor ? and/or at least one measurement of the phase factor ? of the transmission line equal to the imaginary part of the measurement of the complex propagation factor ?, filtering the measurement of the lineal attenuation ? and/or the measurement of the phase factor ? on the basis of a polynomial frequency regression model dependent on the physical characteristics of the transmission line.

Abstract: A visual display of the modulation envelope of an amplitude-modulated RF electric field produced by a field analyzer comprising a field sensor for generating sequential digital samples of the field, a field processor connected to the field sensor for generating a web page, and a personal computer for retrieving and displaying the web page. By using a web page and displaying the web page on a personal computer, it is possible to carry out tasks, such as correcting for nonlinearity of a detector in the field sensor, in the personal computer where they can be performed more efficiently. The sequential samples, which represent the amplitude of the field received by the antenna, are held in a buffer memory, and a bit alignment correction circuit, responsive to the buffer memory, detects and corrects misalignment of the data bits in the buffer memory.

Abstract: An arc fault circuit interrupter detector circuit including a super regenerative high frequency receiver is described herein. In one exemplary, non-limiting embodiment, a current measure component determines that a current noise signal within a circuit breaker is occurring at a particular frequency of interest. The super regenerative high frequency receiver receives the current noise signal and, via an oscillator circuit, causes the signal to ramp to a quench voltage, dissipate, and repeat. A microcontroller in communication with the super regenerative high frequency receiver measures a time period of the oscillator circuit's oscillations, and determines an amplitude of the current noise signal based, at least in part, on the time period. If it is determined that the amplitude of the input current signal at the frequency of interest corresponds to an arc fault event, a trip signal is generated to trip the circuit, quenching the arc fault event.

Abstract: A system for use in a wellbore can include a supercapacitor health measurement device including circuitry for determining a capacitance of a supercapacitor that is positionable in the wellbore. The supercapacitor health measurement device can also include circuitry for determining an equivalent series resistance (ESR) value of the supercapacitor. The supercapacitor health measurement device can further include circuitry for transmitting the capacitance and the ESR value. The system can also include a remote device that is positionable aboveground for receiving the capacitance and ESR value.

Abstract: Systems, methods, and apparatus for testing devices adapted for connection to other devices using universal serial bus (USB) are disclosed. Devices to be tested are caused to enter a special mode of operation when a resistance measured across two terminals of a USB Type-C connector has a value associated with the special mode of operation. One or more operations of the device are automatically initiated when the resistance between the two terminals has a measured value that matches one of a set of resistance values maintained by the device. The one or more operations may include configuring a power management circuit based on the measured value, and entering a special or factory boot mode that controls startup of at least one processor on the device based on the measured value. Each of the set of resistance values exceeds a minimum open-circuit resistance value specified for the connector.

Abstract: For testing the connections (13) of batteries (8) that are connected in a battery module (5) to several bus bars (6, 7) that are electrically in parallel with their battery electrodes (10, 11) by a resistance measurer (16) comprising a pair of contact pins (17, 18), during a measurement a first batten? electrode (10) is contacted by a first contact pin (17) and a point on the conductor arrangement (13, 6, 13, 10) connected to the first battery electrode (10) is contacted by the second contact pin.

Abstract: Systems and methods presented herein are generally directed to the location and/or identification of a circuit within a circuital system. In one embodiment, a transmitter is configured for inducing signals upon a plurality of circuit lines (e.g., power lines, communication lines, lighting circuits, etc.) with each circuit line having a unique signal to identify it from other circuit lines. Each signal may be induced upon an individual circuit line by means of a inductive coupling clip coupled about the circuit line. The transmitter may be used at a distribution point of the circuit lines, such as circuit breaker box. A receiver can then receive a signal from a distal point on the circuit line to acquire the unique signal induced thereon and identify determine which inductive coupling clip is coupled thereto. For example, the signal may be decoded to display a number of the circuit line being tested.

Abstract: Embodiments relate to a method, apparatus, and system for passively detecting strength of an electromagnetic field. An electroactive polymer (EAP) is configured with an antenna in communication with an RC circuit. The EAP is positioned proximal to a sensor. In response to receipt of a transient electromagnetic pulse due to an electrostatic discharge, the circuit captures the received pulse and transmits the pulse to the EAP. The EAP reacts to the pulse in the form of a deflection. The magnitude of the deflection correlates to the field strength which caused the received pulse. As deflection of the EAP is communicated to the proximally positioned sensor, a recording of the electrostatic discharge takes place.

Abstract: A test control port (TCP) includes a state machine SM, an instruction register IR, data registers DRs, a gating circuit and a TDO MX. The SM inputs TCI signals and outputs control signals to the IR and to the DR. During instruction or data scans, the IR or DRs are enabled to input data from TDI and output data to the TDO MX and the top surface TDO signal. The bottom surface TCI inputs may be coupled to the top surface TCO signals via the gating circuit. The top surface TDI signal may be coupled to the bottom surface TDO signal via TDO MX. This allows concatenating or daisy-chaining the IR and DR of a TCP of a lower die with an IR and DR of a TCP of a die stacked on top of the lower die.

Abstract: A method for identifying a short in a first light emitting diode element may include providing a first actuating circuit being a switched-off condition, wherein an output thereof is coupled to a first electrode of the first light emitting diode element, providing a second actuating circuit being a switched-off condition, wherein an output thereof is coupled to a first electrode of a second light emitting diode element and wherein inputs of the first and second actuating circuits, second electrodes of the first and second light emitting diode elements are electrically coupled to a first node, coupling the first electrode of the first light emitting diode element to a first connection of a test energy source, operating the first light emitting diode element in the off-state region using the test energy source, performing a check whether an electric current flows via the first light emitting diode element, and identifying the short.

Abstract: Systems and methods for testing and/or operating remote devices are disclosed. The embodiments provide cost-effective, convenient, and flexible means for the sensing and/or probing of remote devices. Signals generated by remote devices may be received, analyzed, logged, and displayed, i.e., enhancements to the functionalities of an oscilloscope are achieved. Signals to remote devices may be provided, i.e. enhancements to the functionalities of a wave generator, logic analyzers, bus analyzers, and the like are achieved. More particularly, enhancements to the operability, capabilities, and functionality of such previously available testing equipment, are provided, via the operation of a remote, portable, and lightweight test bed. The test bed may be operated and controlled remotely via a user-computing device. The test bed senses, probes, and/or controls a remote device and test data is generated and/or acquired.

Abstract: Systems, methods, and apparatus for testing devices adapted for connection to other devices using universal serial bus (USB) are disclosed. Devices to be tested are caused to enter a special mode of operation when resistance measured at one or more terminals of a USB Type-C connector have values associated with the special mode of operation. One or more operations of the device are automatically initiated when the resistance coupled to the at least one terminal of the connector has a measured value that matches one of a set of resistance values maintained by the device. The one or more operations may include configuring a power management circuit based on the measured value, and entering a mode of operation that controls startup of at least one processor on the device when the measured value matches a first resistance value.

Abstract: In a test system that provides a high fidelity output signal, a transition driving circuit can selectively enable multiple, parallel current paths based on a desired voltage transition. The transition driving circuit can include a first switch configured to switch a first current path between an output node and a first current source/sink, and a second switch configured to switch a second current path between the output node and the first current source/sink. The transition driving circuit can include a control circuit that is configured to receive information about a desired voltage transition and, depending on a magnitude of the desired voltage transition, to selectively turn on one or both of the first and second switches to enable one or both of the first and second current paths to provide respective portions of the output signal from the first current source/sink to the output node of the test system.

Abstract: Disclosed are a circuit for testing and analyzing a through-silicon via (TSV) and a method of testing the same. The circuit according to the present disclosure is capable of measuring a voltage applied to a first comparator after passing through a TSV and subsequently determining whether the TSV has a short-circuit fault, measuring the voltage applied to a second comparator after passing through the TSV and subsequently determining whether the TSV has an open-circuit fault, and determining whether the TSV is faulty based on an output from each of the first and second comparators.

Abstract: A method to control aging of a system on chip comprising one or more devices including semiconductor circuit components and at least one aging controller monitoring electrical signals circulating inside the system on chip. The method comprises steps of stressing at least one device of the system on chip by varying hardware parameters related to its operating mode, comparing at least one parameter associated with an electrical signal produced by the at least one device with a reference parameter to determine a difference corresponding to an operating age value of the at least one device, if the operating age value equals or exceeds a threshold age value, determining a stress state value and modifying the operating mode of the at least one device according to the stress state value. A system on chip performing the method is also disclosed.

Abstract: Embodiments include methods, and systems of an integrated circuit having electromigration wearout detection circuits. Integrated circuit may include a detection element and a reference element. Detection element is subject to normal operation current. Reference element is not subject to normal operation current. A resistance of detection element is monitored to detect electromigration wearout. The electromigration wearout detection monitoring circuit may be configured to perform: periodically measuring resistance of detection element, calculating resistance change of detection element over a predetermined time period, comparing resistance change of detection element calculated to a predetermined safety threshold, and take mitigation actions when resistance change of detection element exceeds predetermined safety threshold. The mitigation actions may include switching to a redundant circuit of the integrated circuit, shutting down the integrated circuit, and sending a signal to initiate a service call.

Abstract: A semiconductor device is capable of detecting a power supply voltage abnormality without degrading the performance of internal circuits. The semiconductor device includes a plurality of power supply inspection circuits and a result storage register. The power supply inspection circuits detect a power supply voltage abnormality in each pad that couples an internal wiring disposed in the semiconductor device to another part disposed outside of the semiconductor device. The result storage register stores inspection results indicated by result signals output from the power supply inspection circuits.

Abstract: An apparatus according to an embodiment comprises: a laser source that outputs a laser beam; an optical system that modifies the laser beam, and directs the modified laser beam onto a test object; a signal detector that detects a change of signal in the process of irradiating the test object with the modified laser beam; and a computer system that performs a failure analysis based on the change detected by the signal detector, wherein the optical system modifies the laser beam so that the modified laser beam generates an irradiation zone that includes a first intensity component of which peak intensity is near an irradiation axis and a second intensity component of which peak intensity is around the irradiation axis.

Abstract: Described is an apparatus which comprises: a state detector which is operable to detect logic states of zero and one in response to a clock edge; and an error detector coupled to the state detector, wherein the error detector is to detect an error in the detected logic states.

Abstract: A scan chain for testing a combinatorial logic circuit includes a first scan chain path of flip-flops connected to the combinatorial logic circuit for functional mode operation during runtime of the combinatorial logic circuit. A second scan chain path of flip-flops is also connected to the combinatorial logic circuit and supports both a shift mode and a capture mode. The second scan chain path operates in shift mode while the first scan chain path is connected to the combinatorial logic circuit for functional mode operation. The second scan chain is then connected to the combinatorial logic circuit when run time is interrupted and operates in capture mode to apply the test data to the combinatorial logic circuit.

Abstract: A processor includes logic to implement a reconfigurable test access port with finite state machine control. A plurality of test access ports may each include a finite state machine for enabling implementation of different test interfaces to the processor, including JTAG IEEE 1149.1, JTAG IEEE 1149.7, and serial wire debug.

Abstract: A Scan-BIST architecture is adapted into a low power Scan-BIST architecture. A generator 102, compactor 106, and controller 110 remain the same as in the known art. The changes between the known art Scan-BIST architecture and the low power Scan-BIST architecture involve modification of the known scan path into scan path 502, to insert scan paths A 506, B 508 and C 510, and the insertion of an adaptor circuit 504 in the control path 114 between controller 110 and scan path 502.

Abstract: This disclosure describes die test architectures that can be implemented in a first, middle and last die of a die stack. The die test architectures are mainly the same, but for the exceptions mentioned in this disclosure.

Abstract: The following steps are performed in order to test a tap changer (20) of a transformer (5; 6) which tap changer is designed to change a transmission ratio of the transformer (5; 6): generating a test signal which is supplied to a winding (1-3; 10) of the transformer (5; 6) and to the tap changer (20). Repeatedly actuating the tap changer (20) in order to change the transmission ratio with each actuation. Determining a curve of an electrical measurement variable (I; I1; I2) of the transformer (5; 6) over time (t) respectively during the step of actuating the tap changer (20) depending on the test signal. automatically illustrating the curves (41, 42) in a temporally-superimposed manner.

Abstract: A synthetic test circuit, for performing an electrical test on a device under test, is provided. The circuit includes a terminal connectable to the device under test; a voltage injection circuit-operably connected to the terminal, the voltage injection circuit including a voltage source, the voltage source including a chain-link converter, the chain-link converter including a plurality of modules, each module including a plurality of module switches connected with at least one energy storage device; and a controller-configured to operate each module of the voltage injection circuit to selectively bypass the or each corresponding energy storage device and insert the or each corresponding energy storage device into the chain-link converter so as to generate a voltage across the chain-link converter and thereby operate the voltage injection circuit to inject a unidirectional voltage waveform into the device under test.

Abstract: A pluggable state-of-charge (SOC) indicator and methods of use are disclosed. The pluggable SOC indicator includes at least one voltage input jack for connecting to a battery, at least one instance of control electronics, and at least one SOC indicator, such as a 5-bar liquid crystal display (LCD). Embodiments of the pluggable SOC indicator include, but are not limited to, a pluggable single-connector SOC indicator, a pluggable dual-connector SOC indicator, and a pluggable quad-connector SOC indicator. Further, the control electronics are programmable for any input voltage range and/or battery discharge characteristics.

Abstract: Embodiments of the present disclosure provide a method and apparatus for testing a condition of a battery. In one embodiment, a testing instruction for the battery is received from a controller of a device. In response to reception of the instruction, the battery is caused in a testing mode in which the battery and a power supply of the device concurrently provide power to the device, a first voltage provided by the battery being greater than a second voltage provided by the power supply. A condition of the battery is determined by monitoring an output current of the battery. Through the method and apparatus of the embodiments of the present disclosure, consumption for battery test may be reduced without a need of interrupting operations of the apparatus.

Abstract: A method for estimating state-of-charge of a battery cell includes suppressing full execution of a capacitance-estimation algorithm for as long as a parameter does not exceed a certain threshold. The parameter is either a measured voltage value across the cell's terminals, the cell's estimated state-of-charge, or an amount of charge passing in or out of the cell during some interval. A battery-management system triggers full execution when the parameter falls below the threshold, or, if the parameter is the amount of charge passing, when it rises above the threshold.

Abstract: Problem: To accurately detect the state of charge of a secondary battery regardless of the state of the same. Resolution Means: A secondary battery state detection device 1 for detecting the state of a secondary battery 14 has a measurement unit (voltage sensor 11) for measuring or estimating the open-circuit voltage of the secondary battery, a determination unit (control unit 10) for determining a state of charge by applying the open-circuit voltage measured or estimated by the measurement unit to a correlation equation expressing the relationship between the open-circuit voltage and state of charge, a calculation unit (control unit 10) for calculating a state of charge on the basis of the internal resistance of the secondary battery, and a correction unit (control unit 10) for correcting the correlation equation of the determination unit if the values of the state of charge determined by the determination unit and the state of charge calculated by the calculation unit differ.

Abstract: According to an embodiment, a system includes a switching regulator and an electrochemical storage test circuit. The switching regulator is coupled to a power supply input and configured to supply a regulated voltage to a regulated supply terminal that is configured to be coupled to a device. The electrochemical storage test circuit is configured to be coupled to an electrochemical storage unit. The electrochemical storage test circuit includes a bidirectional switch with a first switch terminal coupled to the regulated supply terminal, a second switch terminal configured to be coupled to the electrochemical storage unit, and a switch control terminal. The electrochemical storage test circuit also includes a built-in self-test (BIST) circuit configured to be coupled to the electrochemical storage unit and to the switch control terminal.

Abstract: Trigger pull tracking, charge time estimation, and other features for a power tool battery pack with wireless communication. A battery pack system includes a power tool battery pack and a processor. The battery pack includes a plurality of cells and a voltage sensor connected to the plurality of cells. The processor is in communication with the voltage sensor that detects a voltage across the plurality of cells using the voltage sensor. The processor further converts the voltage across the plurality of cells to a state of charge; determines a charge rate of a charger charging the battery pack; and determines a conversion factor based on the charge rate. The processor then generates a time to full charge of the battery pack based on the state of charge, the charge rate, and the scalar conversion factor. The processor may further generate current traces for the battery pack.

Abstract: An islanding operation detection device for a distributed power supply comprising an inverter connected to a commercial system power supply comprises: a commercial system frequency measurement circuitry; a reactive power injection amount calculation circuitry to calculate an amount of reactive power injection; a feedback signal generation circuitry; a reactive current control circuitry to feedback-control an output current command value to the inverter; an output current control circuitry to update the reactive current command value when a phase angle of the commercial system voltage is in the range of 90N°±?? so as to control an output current value of the inverter to follow the output current command value; and an islanding operation detection circuitry to detect whether or not the distributed power supply is in islanding mode, based on a commercial system frequency when the reactive power corresponding to the calculated amount of reactive power injection is injected.

Abstract: The magnetic sensor includes a semiconductor substrate having Hall elements on a front surface of the semiconductor substrate, an adhesive layer formed on a back surface of the semiconductor substrate, and a magnetic flux converging plate formed on the adhesive layer. The magnetic flux converging plate is formed on the back surface of the semiconductor substrate through formation of the magnetic flux converging plate by electroplating on a base conductive layer formed on a plating substrate prepared separately from the semiconductor substrate, application of an adhesive for forming the adhesive layer onto a surface of the magnetic flux converging plate so that the magnetic flux converging plate adheres to the back surface of the semiconductor substrate, and peeling off of the plating substrate afterward from the base conductive layer formed on the magnetic flux converging plate.

Abstract: A magnetic field probe and a probe head thereof are disclosed herein. The probe head includes an inner metal layer, a shielding unit, and a filtering unit. The inner metal layer receives a magnetic field to be measured. The shielding unit, including a first shielding metal layer and a second shielding metal layer, shields the inner metal layer. The first and the second shielding metal layer are respectively stacked above and below the inner metal layer. The filtering unit, including a first filtering metal layer and a second filtering metal layer, filters out an electric field interfering with the inner metal layer. The first filtering metal layer is stacked between the first shielding metal layer and the inner metal layer. The second filtering metal layer is stacked between the second shielding metal layer and the inner metal layer.