Abstract: An in vitro method for therapy follow-up in septic patients wherein the concentration of mature ADM 1-52 and/or mature ADM 1-52-Gly in a sample of bodily fluid of said septic patient is determined using an assay containing two binders that bind to two different regions within the region of mature adrenomedullin and/or adrenomedullin-Gly that is aminoacid 21-52-amid SEQ ID No. 1 or aminoacid 21-52-Gly SEQ ID No. 2 wherein each of said regions contains at least 4 or 5 amino acids, and further assays and calibration methods.

Abstract: The invention relates to the detection of vitamin D metabolites. In a particular aspect, the invention relates to methods for detecting derivatized vitamin D metabolites by mass spectrometry.

Abstract: A sample changer for a thermoanalytical instrument is provided. The sample charger includes a camera and image processing capabilities which provide improved positional control when depositing a sample object on or picking up a sample object from a sample support. The sample charger includes a moveable member driven for movement between at least a receiving position to pick up the sample object at a releasing sample support and a releasing position to deposit the sample object at a receiving sample support. The camera is mounted to the moveable member for movement therewith. The camera includes a field of view and a depth of focus adapted to capture an at least partial image of the sample object, the releasing or receiving sample support.

Abstract: Features are disclosed for managing slides of tissue sample bocks to be mapped to staining instruments by a slide management apparatus. Each staining instrument may be associated with particular features or characteristics identifying capabilities of the staining instrument. The slide management apparatus can generate groups of slides based on the features or characteristics of each staining instrument. Each group of slides may share the same or similar characteristics. Further, the slide management apparatus can dynamically map the groups of slides to the staining instruments. The slide management apparatus may map the groups of slides based on a staining completion time. The slide management apparatus can generate a recommendation for a user based on mapping the groups of slides. For example, the recommendation may include a recommendation to place a first group of slides in a first staining instrument for staining.

Abstract: A drug processing system includes a workstation, at least one deck module movably positionable within the workstation, at least one filter plate operably coupled with the at least one deck module, an agitating member, and a liquid handler member. The at least one filter plate has a plurality of wells to receive a fluid therein. The agitating member is adapted to move the at least one filter plate according to an agitation system. The liquid handler member is adapted to selectively add a fluid to at least one of the plurality of wells and/or remove a fluid from the at least one of the plurality of wells according to a liquid handling system. The agitating member is adapted to move the at least one filter plate while the liquid handler member selectively adds and/or removes the fluid from the at least one of the plurality of wells.

Abstract: An apparatus for detecting defects includes a first conveyor for transporting finished reflective elements; a 3D inspection zone including a second conveyor, a first robot for picking one reflective element and placing same on the second conveyor, two side-lit panels at either side of the second conveyor, and two first digital cameras each between the side-lit panels of the same side for taking 3D images of the reflective element and sending same to an image processor for detecting defects; a 2D inspection zone including a third conveyor for receiving the reflective element, a backlit panel at either side of the third conveyor, and two second digital cameras for taking 2D images of the reflective element and sending same to the image processor for detecting defects. There are further provided a microcontroller, a fourth conveyor, a fifth conveyor, and a second robot.

Abstract: To provide an automatic analyzer which stabilizes light quantity before measurement in a short period while prolonging a long life of light source. An automatic analyzer of the present invention includes a light source with two or more LED elements each having a different wavelength, an analysis section for executing analysis based on light radiated to a reaction vessel, and a current adjustment section for adjusting quantity of current supplied to each of the LED elements. The current adjustment section reduces the quantity of current to each of the LED elements in a non-analytical state individually to be smaller than the quantity of current in an analytical state.

Abstract: An analyzer and a method for reading a test result of a test apparatus are provided. The analyzer includes an analyzer (1) housing, and a drive system, a photoelectric system, a data processing system and a result output system disposed in the analyzer (1) housing. The test apparatus is carried by an objective stage (10) of the drive system to get in and out of the analyzer (1) to read the test result. The analyzer (1) compact in size and stable in operation is applicable to testing of various biochemical indicators and can improve the efficiency of medical testing.

Abstract: There are provided a sample conveying device and a sample conveyance method capable of determining a cause of an abnormality in a conveyance speed more quickly than in the related art. In a conveying device 501, a general conveyance speed of a conveying container 102 is obtained from a position of the conveying container 102 detected by a position detection unit 110 to determine whether the general conveyance speed is abnormal, and when it is determined that the general conveyance speed is abnormal, an inspection conveying container 105 is conveyed, and the cause of the abnormality in the general conveyance speed is determined based on the conveyance speed of the inspection conveying container 105.

Abstract: A sample rack recovery method after an accidental interruption of operation of a sample rack manipulation device (10), a sample rack manipulation device (10) capable of performing the method, an automatic detection system (1) comprising the device (10), and a computer-readable medium in which a program for executing the method is stored. The device (10) comprises a conveying device (103) adapted to move in a transport area (TB) to convey a sample rack (30) between a loading/unloading area (TA), sampling areas (TD, TE) and a buffer area (TC). The method comprises: a conveying device detection step of detecting the state of a conveying device (103); a sample rack detection step of detecting the position of a sample rack (30) in a sample rack manipulation device (10); and a sample rack recovery step of conveying the sample rack (30) to a loading/unloading area (TA) by the conveying device (103) according to the detection results of the conveying device (103) and the sample rack (30).

Abstract: A sample rack manipulation device (10), a testing system (1) and a testing method using the sample rack manipulation device (10), and a computer-readable medium implementing the testing method. The sample rack manipulation device (10) comprises: a loading/unloading zone (TA) in which a plurality of sample racks (50) carrying sample containers (51) containing samples can be arranged side by side; a sampling zone (TD, TE) in which samples in each sample container (51) on the sample racks (50) are sampled by an automatic testing apparatus; and a docking device (114) configured to transfer the sample racks (50) between the loading/unloading zone (TA) and the sampling zone (TD, TE). The docking device (114) is configured to be able to remove the sample racks (50) loaded in the loading/unloading zone (TA) in any order and to transfer the removed test sample racks (50) to the sampling zone (TD, TE) for sampling.

Abstract: There is provided an optical encoder including a phase shifter circuit and a multiple hysteresis comparators. The phase shifter circuit receives four input signals, and outputs multiple phase shifted signals based on the four input signals. Each of the multiple hysteresis comparators uses a changeable operation hysteresis level to compare a couple of phase shifted signals among the multiple phase shifted signals, wherein the changeable operation hysteresis level is determined corresponding to a signal frequency of the four input signals.

Abstract: A wind estimation apparatus includes an acquisition unit and an estimation unit. The acquisition unit acquires a target image of a target region. The estimation unit estimates at least one of a direction and strength of wind in the target region by using the target image.

Abstract: [Object] To provide a method of manufacturing a low heat-resistant sensor that has high chemical resistance, excellent drip-proof properties, and excellent dust-proof properties.

Abstract: A micromechanical component, in particular, an inertial sensor, including a seismic mass, a substrate, and a cap. The component includes a reference electrode, which is in a first electrode layer and is connected to the substrate, and a further reference electrode, which is in a second electrode layer and is connected to the cap. The seismic mass is deflectable on two sides, in a direction perpendicular to the major plane of extension of the reference electrode. The seismic mass includes a flexible limit stop in the direction of deflection towards the first electrode layer. The flexible limit stop is connected to the main part of the seismic mass using a spring element. The spring element is in an elastic layer, which is positioned between a layer of the main part of the seismic mass and the first electrode layer.

Abstract: A method, sensor, and non-transitory computer-readable storage medium are provided for estimating actual amplitudes of a waveform. A machine learning model may be trained for an embedded system of a first three-axes sensor having a limited range to estimate the actual amplitudes of a waveform that saturates the first three-axes sensor in a direction of one of the three axes. The embedded system acquires a second waveform during use of a tool including the first three-axes sensor. The second waveform that occurs after a second waveform producing event is isolated. The embedded system extracts a multi-dimensional feature from the isolated second waveform and estimates, using the machine learning model, the actual amplitudes of the second waveform based on the extracted multi-dimensional feature.

Abstract: Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system configuration adapter includes a tester side socket, a break out pin, and a device under test side slot. The tester side socket is configured to couple with a test equipment socket. The break out pin is configured to couple with the supplemental equipment. The device under test side slot is configured to couple with the tester side socket, the break out pin, and a device under test, wherein the tester side socket. The test system configuration adapter is configured to enable communication between test equipment coupled to the test equipment socket and supplemental equipment coupled to the breakout pin while the device under test remains coupled to the device under test side slot. In one exemplary implementation, the breakout pin and tester side socket are selectively coupled to the device under test side slot.

Abstract: Probe structures, arrays, methods of using probes and arrays, and/or methods for making probes and/or arrays wherein the probes include at least one flat tensional spring segments and in some embodiments include narrowed channel passage segments (e.g. by increasing width of plunger elements or by decreasing channel widths) along portions of channel lengths (e.g. not entire channel lengths) to enhance stability or pointing accuracy while still allowing for assembled formation of movable probe elements.

Abstract: A test tool includes an operating portion with a first end used for hand-holding, and a profiling connector adapted to a socket to be detected and plugged. An elastic probe is provided in a jack of the profiling connector, and the profiling connector is arranged at a second end of the operating portion opposite to the first end. The profiling connector is configured to be inserted into the socket by holding the operating portion with hand, with the elastic probe abutting against and electrically connected with a probe in the socket.

Abstract: Vertical probes, formed of at least one layer that longitudinally includes a first and a second end and a central portion, with the central portion including at least three compliant arms wherein each of the two outer arms include a material having a yield strength greater than a first amount and the at least one intermediate arm is formed of a material having a yield strength less than the first yield strength amount wherein a yield strength of the material of the intermediate arm has a ratio to that of an outer arm of less than 1, more preferably less than 0.8, even more preferably less than 0.6, and most preferably less than 0.4.

Abstract: A device and method for determining a property of an electric field are herein described. The device comprises: a housing having a biocompatible outer surface; a plurality of electrodes supported by the housing; and a controller supported within the housing, the controller comprising a processor, a communication device, and a non-transitory computer-readable medium storing processor-executable code that when executed causes the processor to: measure a potential difference between a first electrode and a second electrode of the plurality of electrodes, the first electrode and the second electrode being spaced a predetermined distance apart; and transmit, with the communication device, data indicative of the potential difference.

Abstract: Probes for contacting electronic components include compliant modules stacked in a serial configuration, which are supported by a sheath, exoskeleton, or endoskeleton which allows for linear longitudinal compression of probe ends toward one another wherein the compliant elements within the compliant modules include planar springs (when unbiased). Alternatively, probes may be formed from single modules or back-to-back modules that may share a common base/standoff. Modules may allow for lateral and/or longitudinal alignment relative to array structures or other modules. Planar springs may be spirals, interlaced spirals having common or offset longitudinal levels, with similar or different rotational orientations that are functionally joined. Compression of probe tips toward one another may cause portions of spring elements to move closer together or further apart.

Abstract: The present disclosure provides a measurement application device comprising at least one signal acquisition interface configured to acquire an analog input signal and output a digital input signal, a first decimator for each signal acquisition interface, each one of the first decimators being configured to reduce the number of samples of the respective digital input signal and output a first decimated digital input signal, at least one second decimator for each signal acquisition interface, each one of the second decimators being configured to reduce the number of samples of the respective digital input signal and output a second decimated digital input signal, and at least one decoder for each one of the second decimators, each one of the decoders being configured to decode the respective second decimated digital input signal according to a respective protocol and provide a respective decoded input signal.

Abstract: An example non-contact voltage detector may include a sensor plate. In the presence of a source voltage associated with a voltage source a current is induced in the sensor plate. The non-contact voltage detector may include a fixed frequency resonator proximate the sensor plate and having a pair of plates each configured to oscillate. The non-contact voltage detector may include a current to voltage converter connected with the sensor plate and configured to convert the current induced in the sensor plate into a voltage. The non-contact voltage detector may include an analog to digital converter connected with the current to voltage converter configured to convert the voltage into a digital signal. The non-contact voltage detector may include a controller connected with the analog to digital converter and configured to receive the digital signal from the analog to digital converter and detect the source voltage.

Abstract: A system includes an inverter including: a first galvanic isolator separating a low voltage area from a high voltage area, the first galvanic isolator having a first galvanic isolator output path; a second galvanic isolator having a second galvanic isolator output path; an amplifier connected to the first galvanic isolator via the first galvanic isolator output path, and connected to the second galvanic isolator via the second galvanic isolator output path, the amplifier having a first amplifier output path and a second amplifier output path; a comparator connected to the amplifier via the first amplifier output path and the second amplifier output path, the comparator having a first comparator output path and a second comparator output path; and a pulse reshape and envelope detector connected to the comparator via the first comparator output path and the second comparator output path.

Abstract: A pre-driving stage drives one or more Field Effect Transistors in a power stage driving a load. A method for measuring current flowing in the Field Effect Transistors includes: measuring drain to source voltages of the one or more Field Effect Transistor; and measuring an operating temperature of the one or more Field Effect Transistor. The current flowing in the Field Effect Transistors is measured by: calculating the respective on drain to source resistance at the operating temperature as a function of the measured operating temperature and obtaining the current value as a ratio of the respective measured drain to source voltage over the calculated drain to source resistance at the operating temperature.

Abstract: An electro-wetting on dielectric (EWOD) device, comprises first and second substrates defining a fluid chamber therebetween, a plurality of electro-wetting electrodes on the first substrate, and at least one first electrode and at least two second electrodes on the second substrate. The device further includes a current sensor for sensing a difference between (1) a first current flowing between the first electrode and one of the second electrodes via a first fluid package in the fluid chamber of the EWOD device and (2) a second current flowing between the first electrode and another of the second electrodes via a second fluid package in the fluid chamber of the EWOD device.

Abstract: The invention relates to a device for detecting a voltage drop between an anode connection and a cathode connection, comprising: a control capacitor, of which the first electrode is connected to the anode connection and the second electrode is connected to the cathode connection; a measuring device, which is designed to output a discharge signal depending on a potential difference detected between the anode connection and the cathode connection and a first threshold value for the potential difference on a discharge control line; a discharge circuit which is connected to the discharge control line and is designed to discharge the control capacitor depending on the discharge signal; and a control device, which is designed to detect the voltage drop by evaluating the state of charge of the control capacitor.

Abstract: This disclosure is directed towards systems and methods that may prevent backpowering of a voltage source during a current monitoring operation. In a first example circuit, a switch may be used to mitigate an offset voltage of an operational amplifier. In a second and third example, a resistor may be used to generate an opposing voltage to the offset voltage to mitigate the offset voltage of the operational amplifier. Other examples are described that may mitigate sensing dead zones of some of the solutions and/or that may mitigate temperature variations changing an effectiveness of the mitigation.

Abstract: The present disclosure provides an alternating current (AC)/direct current (DC) voltage detection circuit, which includes a rising edge trigger circuit and a detection and output circuit connected to an output terminal of the rising edge trigger circuit. When the operating voltage is higher than the preset voltage, the determination circuit activates the detection and output circuit to detect the change of the operating voltage and the target flip.

Abstract: A carbon dioxide (CO2) emissions state transition prediction system executing on a unified endpoint management platform information handling system may comprise a network interface device to receive operational telemetry measurements for a first client device during routine monitoring intervals, including a determined CO2 emissions value, and a non-eco-friendly state transition threshold determined for the first client device, a hardware processor to predict, via a neural network modeling relationships between changes in CO2 emissions values over a most recent monitoring period and changes in user-adjustable operational telemetry measurements over a prior monitoring period, that a future determined CO2 emissions value for the first client information handling system determined based on operational telemetry measurements recorded during the current routine monitoring interval will exceed the non-eco-friendly state transition threshold value, and the network interface device to transmit an indication for user d

Abstract: The present invention relates to the cross field of smart grid and artificial intelligence, provides a non-intrusive load monitoring method and device based on physics-informed neural network, comprising the following steps: Step 1, obtaining a total load data and an equipment load data of a building in a certain period of time, and using a sliding window method to cut to construct a training data. Step 2, designing a deep learning neural network model to learn the equipment load characteristics contained in the total load data, and outputting the equipment load forecasting. Step 3, based on a physics-constrained learning framework, training the deep learning neural network model by iteratively optimizing the training loss to obtain a trained physics-informed neural network model. Step 4, monitoring the equipment's power consumption in the building according to the output results of the physics-informed neural network model.

Abstract: Position sensing and verification modules and a meter are provided. A module is configured to determine a position of one or more switch poles by measuring a current across the one or more switch poles. If a current is greater than or equal to a predetermined current threshold, the position is closed. If a current is less than the predetermined current threshold, the position is open. The module is configured to determine a line voltage with respect to a first reference value, determine a load voltage with respect to the first reference value, compare the line voltage to the load voltage to determine if the line voltage and the load voltage are within a predetermined threshold, and confirm the position of the one or more switch poles based on the comparison of the line voltage to the load voltage for the one or more line phases.

Abstract: Systems and methods for coordinating data sampling among devices include a set of electronic devices that may periodically sample energy data from a smart meter according to sample timing information. The sample timing information may specify a set of times to sample energy data for each electronic device. The set of electronic devices may take turns in sampling energy data from the smart meter so that individual electronic devices may reduce power consumption by sampling less frequently. A server may determine the sample times for the electronic devices and may instruct the electronic devices to sample energy data. Additionally, each individual electronic device may leave and/or join wireless communication networks less frequently than if each individual electronic device performed every sample. Accordingly, the coordinated sampling may decrease the radio resource usage and/or bandwidth usage of any individual electronic device.

Abstract: Provided is a modular sensor platform apparatus. The modular sensor platform apparatus includes at least one first terminal capable of being coupled to a power sensor, a plurality of second terminals capable of being coupled to an external sensor module and a communication module, and a micro-control unit (MCU) configured to execute a predefined algorithm.

Abstract: The present disclosure provides a method for processing acquired RF spectrum data that represents an RF signal, the method comprising acquiring at least one graphical representation of the RF spectrum data, and extracting at least one signal property of the RF signal from the graphical representation. Further, the present disclosure provides a respective signal processing device, and a respective measurement application device.

Abstract: An apparatus (100) to generate an alert based on a health of an earthing system is provided. The apparatus includes a single electrode arrangement comprising a single electrode (102) having one or more sensors (106a-106b) mounted thereon and configured to measure (402) a resistance of an earth pit existing within the earthing system during normal and fault time. The apparatus (100) further includes an electronic module (104) that is communicatively coupled between the one or more sensors (106a-106b) and a communication system (116), and that is configured to communicate (406) the resistance of the earth pit as recorded by the one or more sensors (106a-106b) to the communication system (116); and generate (406) an alert when the resistance of the earth pit exceeds a threshold value. The single electrode (102) is connected via one or more communication means to the electronic module (104).

Abstract: A semiconductor device is tested by disposing an antenna-in-package (AiP) module under a test antenna. A first signal is transmitted with a first antenna of the AiP module. The test antenna is moved to a power output peak of the first signal. A second signal is transmitted with a second antenna of the AiP module. The test antenna is moved along a first directional axis from the power output peak of the first signal to a power output peak of the second signal while a second directional axis of the test antenna is held static. The first antenna of the AiP module is tested while the test antenna is at the power output peak of the first signal. The second antenna of the AiP module is tested while the test antenna is at the power output peak of the second signal.

Abstract: Systems, methods and apparatus for automatic alarm management in a radio-frequency (RF) environment are disclosed. An apparatus calculates a power distribution by frequency of the RF environment in real time or near real time, including a first derivative and a second derivative of FFT data of the RF environment. The apparatus then creates a baseline based on the power distribution by frequency of the RF environment in a period of time, identifies at least one alarm situation based on a multiplicity of alarm triggering conditions by comparing the power distribution in real time or near real time to the baseline of the RF environment, identifies at least one signal based on the first derivative and the second derivative of FFT data in the at least one alarm situation, and sends at least one alarm comprising details of the at least one signal identified in the at least one alarm situation.

Abstract: An information processing apparatus includes a processor configured to: obtain electrical noise generated from a memory included in a target product; determine, for each of frequencies obtained by dividing a frequency spectrum of the electrical noise, whether the electrical noise falls within a predetermined range, which is determined in advance for the frequency; determine, if the electrical noise falls outside the predetermined range, whether the electrical noise falls within an enlarged range, which is obtained by enlarging the predetermined range; and determine that the target product is a genuine product if a sum of a number of frequencies at which the electrical noise falls within the corresponding predetermined ranges and a number of frequencies at which the electrical noise falls outside the corresponding predetermined ranges but falls within the corresponding enlarged ranges is larger than a number of frequencies at which the electrical noise falls outside the corresponding enlarged ranges.

Abstract: A system for monitoring electrical contacts for an overhead trolley line may include a wear sensor arranged such that an electrical contact on a vehicle or work machine for contacting the overhead trolley line is continually or periodically in its line of sight. The wear sensor may be configured to capture spatial data defining the surface profile of the electrical contact. The system may also include a data processing module configured to receive the spatial data and identify a defect in the electrical contact based on the spatial data.

Abstract: A method of inspection for a group of a same type of capacitors includes: a step of applying a DC bias voltage equal to or lower than the rated value of the group to a capacitor; and a vibration response voltage generating step of inputting an electric signal whose frequency continuously changes with time to a capacitor, causing mechanical vibration in the capacitor, generating a vibration response voltage from the capacitor, and outputting superposition of the DC bias voltage and the vibration response voltage as reaction voltage.

Abstract: A method for inspecting electronic components and an electronic device are provided. The electronic device includes electronic elements, signal lines, an inspection structure, a substrate and a first driving element electrically connected to the signal lines. The signal lines include a first and a second signal lines. The electronic components include a first group of electronic components electrically connected to the first signal line and a second group of electronic components electrically connected to the second signal line. The first signal line has a first portion overlapping a first inspection region and a second portion overlapping the first driving element. The second signal line has a third portion overlapping a second inspection region and a fourth portion overlapping the first driving element. A distance between the second portion and the fourth portion is smaller than a distance between the first portion and the third portion.

Abstract: A product line testing method includes acquiring identity information of at least one to-be-tested product and identity information of a current testing station; acquiring target testing station information of the at least one to-be-tested product according to the identity information of the at least one to-be-tested product; and comparing the target testing station information with the identity information of the current testing station to generate a comparison result and, according to the comparison result, executing the testing flow of the current testing station or outputting testing prompt information. The technical solutions improve the efficiency of product testing.

Abstract: A semiconductor integrated circuit device includes: an active bridge; a first chiplet and a second chiplet mounted onto the active bridge; and a short-to-long converter circuit (SLCC) that has analog and digital portions. The active bridge includes at least the analog portion of the SLCC, which is electrically connected to at least the first chiplet; and a short-reach physical layer that electrically connects the first chiplet and the second chiplet. The first chiplet includes a first logic core; a first chiplet interface that is electrically connected between the first logic core and the SLCC; and a second chiplet interface that is electrically connected between the first logic core and the second chiplet. The second chiplet includes a second logic core; and a third chiplet interface that is electrically connected between the second logic core and the second chiplet interface. The active bridge also can include a built-in-self-test (BIST) circuit.

Abstract: According to various embodiments, a circuit is described including a plurality of scan flip-flops including a sequence of input wrapper scan flip-flops and including, for each input wrapper scan flip-flop of at least a subset of the input wrapper scan flip-flops, at the input wrapper scan flip-flop's test input a respective test input circuit configured to, when supplied with a mode control signal having a first value, connect the test input to the output of the preceding input wrapper scan flip-flop such that the test input of the flip-flop is supplied with the content of the preceding input wrapper scan flip-flop and when supplied with the mode control signal having a second value, connect the test input to an output of a part of the circuit such that the test input of the flip-flop is supplied with a value depending on a test result.

Abstract: According to various embodiments, a circuit is described including a plurality of scan flip-flops including a sequence of scan flip-flops, wherein at least some scan flip-flops of the sequence are wrapper scan flip-flops, and including, for each scan flip-flop of at least a subset of the scan flip-flops, at the wrapper scan flip-flop's test input a respective test input circuit configured to, when supplied with a mode control signal having a first value, connect the test input to the output of the preceding wrapper scan flip-flop such that the test input of the flip-flop is supplied with the content of the preceding wrapper scan flip-flop and when supplied with the mode control signal having a second value, connect the test input to an output of a part of the circuit such that the test input of the flip-flop is supplied with a value depending on a test result.

Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Abstract: An electrical test of a semiconductor device is conducted by electrically connecting a plurality of leads of the semiconductor device with a plurality of electrodes of a test board via a plurality of socket terminals of a socket of a test apparatus, respectively. At least a part of the socket is disposed inside a chamber of the test apparatus, and the test board is disposed outside the chamber. The semiconductor device is to be cooled by a cool air circulating in the chamber. The socket has a cavity portion through which the cool air circulating in the chamber can pass, and a part of each of the plurality of socket terminals is exposed in the cavity portion of the socket. The plurality of socket terminals is to be cooled by the cool air passing through the cavity portion of the socket.

Abstract: Provided is a semiconductor device including a substrate including an element region and a scribe lane region defining the element region, and one or more test element groups arranged on the substrate and including one or more test elements for characteristic evaluation and one or more test pads for applying a test signal for testing the one or more test elements, wherein all of the one or more test pads are spaced apart from the element region in a horizontal direction.