Abstract: Among the various aspects of the present disclosure is the provision of methods for detecting cancer in Neurofibromatosis Type 1 (NF1) patients.

Abstract: Kits containing a chemiluminescent detection system and microfluidics devices and methods for determining the concentration of biotin in a sample are disclosed. The kits, microfluidics devices, and methods utilize a sensitizer capable of generating singlet oxygen in its excited state and having avidin or an analog thereof directly or indirectly bound thereto, as well as a singlet oxygen-activatable chemiluminescent compound having biotin or an analog thereof directly or indirectly bound thereto.

Abstract: Provided are methods for determining the amount of thyroglobulin in a sample using various purification steps followed by mass spectrometry. The methods generally involve purifying thyroglobulin in a test sample, digesting thyroglobulin to form peptide T129, purifying peptide T129, ionizing peptide T129, detecting the amount of peptide T129 ion generated, and relating the amount of peptide T129 ion to the amount of thyroglobulin originally present in the sample.

Abstract: Disclosed herein are methods and compositions for the detection of biomarkers for cardiac diseases. Disclosed herein are sample collection devices comprising detection devices for heart failure. Disclosed herein are methods of detecting, monitoring, preventing, or treating heart failure.

Abstract: Provided herein are methods for high throughput quantitation of testosterone utilizing at least two different derivatizing agents of different masses. In another aspect, provided herein are methods for determining the amount of testosterone in each of a plurality of human samples with a single mass spectrometric assay by subjecting each of a plurality of human samples to a different derivatizing agent to generate a differently derivatized testosterone in each of the plurality of samples; combining the plurality of samples to form a multiplex sample; and quantifying the amount of testosterone in each sample by mass spectrometry.

Abstract: Disclosed is a method for measuring activated partial thromboplastin time, the method comprising: mixing: a blood sample; a first reagent comprising an ellagic acid compound and a compound represented by Formula (I); and a second regent comprising a calcium ion; and measuring activated partial thromboplastin time using the mixture prepared in the mixing step, wherein the compound represented by Formula (I) is shown below wherein X is a hydrogen atom, —(C?O)—Y, or —(C?O)—OZ, Y is a hydroxyl group, a hydrogen atom, a linear or branched alkyl group having a carbon number of 1 or more and 6 or less, or a phenyl group, and Z is an alkali metal.

Abstract: A computer-implemented method of automatically managing calibration of an in-vitro diagnostic system is provided comprising determining a lot calibration time period in which a lot calibration is applicable to reagent containers of the same lot, having a predefined time length starting from the time when the lot calibration becomes available, upon making a reagent container of the lot available to the system, determining whether a lot calibration that has not exceeded the lot calibration time period is available and linking the reagent container to the available lot calibration or most recent available lot calibration if more than one lot calibration is available, wherein if a new lot calibration for the same lot becomes available the method comprises replacing the existing link to the previous lot calibration with a link to the new lot calibration.

Abstract: Device information representing a configuration of each analysis device is acquired by a device information acquirer. Schedule information representing a use schedule of each analysis device is acquired by a schedule information acquirer. A sample analysis method is acquired by an analysis method acquirer. An analysis device that is fitted to the analysis method acquired by the analysis method acquirer and is usable is selected by a device selector from among a plurality of analysis devices based on the device information acquired by the device information acquirer and the schedule information acquired by the schedule information acquirer. Identification information for identifying the analysis device selected by the device selector is presented by a presenter.

Abstract: Provided is a dispensing device that can dispense at a high speed and with high precision and that can be miniaturized. This dispensing device suctions a liquid sample into a disposable tip and discharges the suctioned liquid sample, the dispensing device being provided with: a piston receiving part into which a piston is inserted; a tip detachment part that detaches the disposable tip mounted on the front end of the piston receiving part by pressing down the disposable tip; and a force action part that works in tandem with the tip detachment part and moves in the direction opposite to the movement direction of the tip detachment part.

Abstract: The present disclosure relates to a system and to a method for measuring Brix of a liquid such as sap, syrup or taffy. The system for measuring Brix of a liquid comprises: a tank for receiving a volume of the liquid; a temperature reading apparatus for measuring a temperature of the liquid; a weighing apparatus for measuring a weight of the volume of liquid received in the tank; a volume measurement system for measuring the volume of the liquid received in the tank; and a computer operatively connected to the apparatuses and using the data received from the same to determine the Brix of the liquid. The method comprising providing the Brix measuring system; measuring the temperature, weight, volume of the liquid received in the tank, and determining the Brix measurement based on the data received and using the computer.

Abstract: A measuring device with a measuring tube is disclosed. The measuring device includes a sensor unit for capturing a parameter of a medium, a control and evaluation unit, and a deflectable measuring sensor with a cavity and a base unit. The sensor unit is at least partially integrated in the wall of the measuring tube. The measuring sensor is connected to the base unit via a spring element. The base unit is arranged outside of the measuring tube. A side of the measuring sensor is in contact with the medium during operation. The cavity is arranged on the side of the measuring sensor facing the medium. The measuring sensor is integrated into the measuring tube wall in such a way that it can be deflected at least in the plane of the measuring tube wall. The sensor unit has a means for capturing the deflection of the measuring sensor.

Abstract: An example accelerometer includes a first excitation ring comprising a first material having a first coefficient of thermal expansion (CTE), a second excitation ring comprising the first material having the first CTE; and a proof mass assembly disposed between and in contact with the first excitation ring and the second excitation ring. The proof mass assembly comprises a second material having a second CTE, wherein a difference between the first CTE and the second CTE is equal to or less than 0.5 parts per million per degree Celsius (ppm/° C.).

Abstract: A method or system configured for assessing the integrity of a sensor module mounted in a tire of a wheel or on an inner surface of the tire of the wheel.

Abstract: Systems, devices, and methods for: an unmanned aerial vehicle (UAV); at least one sensorless motor of the UAV, the at least one sensorless motor comprising a set of windings and a rotor; at least one propeller connected to the at least one sensorless motor; a microcontroller in communication with the at least one sensorless motor, wherein the microcontroller is configured to: determine a rotation rate of the at least one propeller; determine a rotation direction of the at least one propeller; provide an output to stop the at least one propeller if at least one of: the determined rotation rate is not a desired rotation rate and the determined rotation direction is not a desired rotation direction; and provide an output to start the at least one propeller if the at least one propeller is stopped at the desired rotation rate and the desired rotation direction.

Abstract: Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a testing system comprises: a loadboard including multiple universal interfaces with the same coupling configuration, a plurality of devices under test (DUTs) including a plurality of DUT interfaces respectively, and a plurality of universal adapters including a plurality of matching universal interfaces that match the plurality of universal interfaces in the loadboard and a plurality of matching DUT interfaces that match the plurality of DUT interfaces in the respective DUT. The plurality of universal adapters are selectively coupled to the loadboard and the plurality of universal adapters are selectively coupled to the DUTs, respectively. A first one of the plurality of DUT interfaces includes a different coupling configuration than a second one of the plurality of DUT interfaces.

Abstract: A test carrier carried in a state of accommodating a device under test (DUT) includes: a carrier body that holds the DUT; and a lid member that covers the DUT and is attached to the carrier body. The lid member includes a through-hole for sucking the DUT that is provided to face the DUT and penetrating through the lid member.

Abstract: A protection device protects an AC device, in particular an inductive voltage converter, electrically connected to an AC line, from damage caused by direct currents flowing in the AC line. In this case, at least one current transfer coil, which runs around a magnetic core section of a magnetic core, is connected to the AC line in parallel with the AC device.

Abstract: A current detection device includes a main busbar and a semiconductor chip. A detected current flows through the main busbar. The semiconductor chip is spaced apart from the main busbar. The semiconductor chip includes a branch busbar, a detection part, and an output part. The branch busbar is connected in parallel with the main busbar. The detection part is arranged adjacent to the branch busbar and detects a first magnetic field generated based on a branch current flowing from the main busbar to the branch busbar. The output part calculates and outputs a current value based on the first magnetic field detected by the detection part.

Abstract: A power conversion apparatus includes a power conversion circuit configured to convert DC power into three-phase AC power; and a control device configured to generate a two-phase negative-phase current from a three-phase AC current output from the power conversion circuit, and to detect an open phase on an output side of the power conversion circuit based on a magnitude of an amplitude of the two-phase negative-phase current. The control device may be configured to determine an occurrence of the open phase when the magnitude of the amplitude of the two-phase negative-phase current increases, and an electric current of at least one phase of the three-phase AC current decreases.

Abstract: An energy storage apparatus 20 includes: energy storage devices B1 to B4; a cutoff switch 40 that cuts off current of the energy storage device; a parallel circuit 70 including a rectifier element 75 in which a discharge direction is set to a forward direction, the parallel circuit 70 being connected in parallel to the cutoff switch 40; a first current sensor 50 that measures the current of the energy storage devices B1 to B4; a discharge circuit 90 that discharges an inspection current to the first current sensor 50 through a discharge path including the parallel circuit 70 using the energy storage device as a power source; and a controller 80. The controller 80 determines whether the first current sensor 50 correctly measures the current based on a measurement value of the inspection current Ib.

Abstract: Improved power line management is provided by the systems and methods disclosed herein that accurately measures voltage in a power distribution system. In various embodiments, the system may include one or more sensor units, each coupled to the power lines using a capacitive or resistive voltage divider to yield a voltage at a sensor unit that is within a measurable range. In one aspect, this voltage may also be used to power the sensor unit and/or other devices coupled to it.

Abstract: Power estimation method, implemented in a three-phase electricity meter, includes the steps of detecting a fraud which falsifies measurements of a first phase voltage present on a first phase, without falsifying measurements of a second phase voltage present on a second phase; reconstituting first estimated voltage samples, images over time of the first phase voltage, from second voltage samples, images over time of the second phase voltage; and estimating at least one first electrical power consumed on the first phase by using the first estimated voltage samples.

Abstract: An absorber device for absorbing signals is described. The absorber device has a housing with inner sides having an absorbing material. The housing is adaptable with regard to its geometry. The absorber device is portable. Moreover, a test system for testing radio frequency characteristics of a device under test is described.

Abstract: A probe cleaning sheet for preventing a probe pin damage and manufacturing method thereof, during the process of a probe pin puncturing the cleaning layer, the material of the cleaning layer and the plurality of high and low density cleaning particles of abrasive material contained in the high density cleaning material and the low density cleaning material are able to efficiently scrape away foreign material from the surface of the probe pin. In addition, the negative charge carried by the silicone itself and its lipophilic characteristics are used to transfer the foreign material on the probe pin to the cleaning layer, and the protective layer is used to prevent overpressure from the probe pin directly impacting the substrate and causing damage to the tips of the probe pin.

Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.

Abstract: A system for monitoring electrical contacts for an overhead trolley line may include a wear sensor arranged such that an electrical contact on a vehicle or work machine for contacting the overhead trolley line is continually or periodically in its line of sight. The wear sensor may be configured to capture spatial data defining the surface profile of the electrical contact. The system may also include a data processing module configured to receive the spatial data and identify a defect in the electrical contact based on the spatial data.

Abstract: A method is provided for generating a multi-carrier reflectometry signal intended to be injected into a transmission line in order to identify a presence of at least one possible fault on the transmission line. The method includes: generating, in the frequency domain, a phase-modulated multi-carrier digital signal by: generating a digital signal, phase-modulating the digital signal based on a constellation of symbols, rounding the obtained phase to the phase of the symbol of the constellation that is closest, and converting the generated signal into the time domain.

Abstract: A semiconductor structure for measuring a breakdown voltage of a pn-junction, said semiconductor structure comprises: a substrate; a sensor device comprising an optical active region comprising said pn-junction in said substrate, wherein said sensor device is configured to apply a reverse bias voltage to said pn-junction; and an emitter located adjacent to said optical active region in said substrate and configured to provide charge carriers to said optical active region in order to trigger breakdown of said pn-junction when said reverse bias voltage is equal to or greater than said breakdown voltage.

Abstract: A testing apparatus includes a circuit board, a probe station and a probe array. The circuit board includes a plurality of contacts. The probe station includes a platform located on the circuit board and used for carrying a device under test (DUT), and a plurality of probe holes formed on the platform and arranged in an array. The probe array includes a plurality of telescopic probes respectively linearly inserted into the probe holes. One end of each of the telescopic probes is contacted with one of the contacts, and the other end thereof is contacted with one of solder balls of the DUT. Each of the probe holes includes an elongated groove penetrating through the platform. Each of the telescopic probes is provided with a fin protruding outwardly and inserting into the elongated groove.

Abstract: The degree of freedom of an abnormality detection target location in a solid-state imaging device in which a plurality of substrates are joined is improved. A semiconductor device includes a connection line and a detection circuit. A plurality of semiconductor substrates are joined in the semiconductor device. Then, in the semiconductor device, the connection line is wired across the plurality of semiconductor substrates. The detection circuit detects the presence or absence of an abnormality in a joint surface of the plurality of semiconductor substrates based on an energization state of the connection line when enable has been set by a predetermined control signal.

Abstract: An alignment mechanism is disclosed which includes a mount, a beam having a first end affixed to the mount and a second end. The beam is an order of magnitude more rigid along its longitudinal axis than along an axis orthogonal to its longitudinal axis. The second end of the beam is affixed to a first device having a surface configured to contact a second device. The beam applies a normal force component to the second device through the first device and allows movement at the second end in directions orthogonal to the normal force component.

Abstract: Provided herein may be a test circuit of an electronic device, the electronic device including the test circuit, and an operating method thereof. The electronic device may include analog circuits, a control circuit configured to connect, to an output terminal, each of a plurality of nodes respectively included in the analog circuits to an output terminal, a control signal generator configured to generate a control signal for controlling the control circuit based on an input signal received from an external device, and a switching circuit disposed on an electrical path for connecting the plurality of nodes and the control circuit to each other and configured to be electrically open during a preset time amount from a time point at which a voltage from an external power source starts to be applied to the control circuit.

Abstract: An apparatus for avoiding a collision between data. The apparatus includes a plurality of integrated circuits (ICs) configured to mutually perform insulation communication, an amplitude detection module configured to detect amplitudes of transmission data and reception data that are input and output through pins of the IC during the insulation communication between the plurality of ICs, and a signal pattern error detection module configured to determine a collision situation between the transmission data and the reception data by comparing an amplitude of transmission data, which is generated by a processor in a TX mode of the IC, and the amplitude of the transmission data, which is detected through the pins of the IC by the amplitude detection module.

Abstract: A method or system for estimating delays in design under tests (DUTs) using machine learning. The system accesses multiple DUTs, each comprising various logic blocks. For each DUT, a combinatorial path is identified, connecting one or more logic blocks. A feature vector is generated, including values of orthogonal features representing the combinatorial path's characteristics. Each DUT is compiled for emulation, and the delay of its combinatorial path is measured. These measured delays, along with the corresponding feature vectors, are used to train a machine learning delay model. The trained model is designed to receive a combinatorial path of a DUT as input and generate an estimated wire delay as output. This approach leverages machine learning to predict delays in electronic designs, improving the efficiency and accuracy of delay estimations in complex circuits.

Abstract: A method for repairing a processor. The processor comprises a plurality of processing units and an exchange comprising a plurality of exchange paths for transmitting data between the processing units. Each processing unit is connected to output data to a respective exchange path. An exchange path functional test of at least a portion of the exchange paths is carried out. Based on the exchange path functional test, it is identified that one or more of the exchange paths is defective, and the processing units connected to the one or more defective exchange paths is identified. The identified processing units are switched out of functional operation of the processor and switching in at least one repair processing unit connected to a non-defective exchange path for functional operation of the processor.

Abstract: Embodiments of the present disclosure relate to methods of finding optimized analog measurement hardware settings of a measurement system for a target measurement. The method can include one or more of the following steps: applying initial settings to the measurement system; varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal; performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep; and identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers.

Abstract: A measurement instrument for testing a device under test is described. The device under test has at least two test points. The measurement instrument includes a first measurement channel, a second measurement channel, and a machine-learning circuit. The first measurement channel is configured to process a first input signal associated with one of the at least two test points, thereby generating a first measurement signal. The second measurement channel is configured to process a second input signal associated with another one of the at least two test points, thereby generating a second measurement signal. The machine-learning circuit is configured to determine at least one correlation quantity based on the first measurement signal and based on the second measurement signal, wherein the at least one correlation quantity is indicative of a correlation between the first measurement signal and the second measurement signal. Further, a measurement system and a signal processing method are described.

Abstract: Systems, integrated circuits and methods for synchronizing testing a Device under test (DUT) with an automated test equipment (ATE) is provided. In one example, a method includes transmitting a test packet from an ATE to a first Device Under Test DUT; receiving, at the ATE from the DUT, a result packet; and in response to receiving a Start of Packet (SOP) indicator from the DUT at the ATE, evaluating the first DUT by comparing the result packet to an expected packet associated with the test packet.

Abstract: A system and methods for adaptive bi-direction audio wiring, in which a circuit may be attached via a headset port using RJ9 pin configurations in a phone handset, and dynamically test many different phone handset configurations for optimal audio pathing and processing for speaker and microphone audio generation with minimal noise, static, or power fluctuation.

Abstract: A framework for continuously monitored remote power shutdown. In accordance with one aspect, a monitoring circuit (107, 207) is coupled to a power removal circuit (101). The monitoring circuit (107, 207) may generate an output signal indicative of circuit integrity based on one or more electrical characteristics of the power removal circuit (101). A notification system (110) may further be coupled to the monitoring circuit (107, 207). The notification system (110) may generate a notification (112) based on the output signal.

Abstract: A method and system for status monitoring of transient surge protection devices may display operational status and instantaneously a fault condition of a surge protection device (SPD) induced by transient electromagnetic energy disturbance from high altitude nuclear weapon detonation generating an electromagnetic pulse (EMP), Geo-magnetic disturbance (GMD), solar corona mass ejection (CME), intentional electromagnetic interference (IEMI), natural lightning strikes, or other transient surges due to radiated and conducted EMI. The system monitors operational status and readiness of SPDs installed on electric power networks to protect devices powered by the networks. The status monitoring of SPD has local display and cybersecure, over-the-power-lines communication (OPLC), implemented with analog circuits and instantaneous response.

Abstract: A load test device includes: a resistor unit that includes a plurality of resistors that receive supplied power and a wall (holding frame) that holds opposite ends of each of the plurality of resistors; and an insulating cap that is attached to a portion of a terminal of the resistor that protrudes from the wall. The cap is composed of a material that is deformed by heat. When a temperature of the terminal becomes equal to or higher than a first temperature, the cap is deformed by heat and detached from the terminal.

Abstract: The present disclosure relates to systems and methods for detecting a winding fault and the winding fault severity in a brushless direct current motor before motor failure. Methods for detecting a winding fault include time domain based sequence component analysis, fast Fourier transform analysis, or Hilbert analysis. Methods for detecting the severity of a winding fault include analysis of the standard deviation of real mean squared values determined using motor currents.

Abstract: Disclosed is a method for measuring cell performance. The method for manufacturing performance of a unit cell, in which a first electrode provided with a first electrode tab, a separator, and a second electrode provided with a second electrode tab are alternately laminated to be bonded to each other, comprises an additional lamination step of further laminating counter electrodes, each of which has the same polarity as that of the second electrode and is provided with a third electrode tab, on sides facing the first electrode at the outermost sides of the unit cell with the separator therebetween, and an outer interface analysis step of measuring a different in performance between the first electrode and each of the counter electrodes by electrically connecting the first electrode tab disposed on the first electrode to the third electrode tab disposed on the counter electrode.

Abstract: A measurement device of a negative electrode SEI formation amount of a lithium ion battery includes a charge/discharge controller configured to perform charge/discharge control of the lithium ion battery, a voltage measurement part configured to measure a discharge voltage of the lithium ion battery, a current measurement part configured to measure a discharge current of the lithium ion battery, a discharge time measurement part configured to measure a discharge time of the lithium ion battery, a storage configured to store measurement results of the voltage measurement part, the current measurement part and the discharge time measurement part, and a calculation part configured to calculate a negative electrode SEI formation amount of the lithium ion battery.

Abstract: A sensor arrangement for a network of busbar links of a battery module is provided, the sensor arrangement comprising: an array of sensors, each sensor having an output arranged to provide an indication of current in a respective busbar link of the network; a processor coupled to the outputs of the sensors and configured to: receive data from the sensor outputs; process the data to determine a current in each of a set of busbar links that are connected at a node of the network; and compare the currents in the busbar links of the set to determine an overall current at the node.

Abstract: Methods and systems are provided for key predictors and machine learning for configuring cell performance. One or more parameters relating to the cell may be measured, via a measurement apparatus, with the cell including a cathode, a separator, and a silicon-dominant anode, and the cell may be managed, based on the one or more parameters, with the managing including predetermining cycle life of the cell based on the one or more parameters using a machine learning model. The cell may be within a battery pack that includes a plurality of cells. The battery pack may be in an electric vehicle. At least one parameter may be measured before a formation process of the cell. At least one parameter may be measured during the formation process. At least one parameter may be measured during cycling of the cell.

Abstract: A method for evaluating an electric power storage device includes causing a short circuit by inserting an electrically conductive probe into a stacked portion in a thickness direction of electrode layers; measuring a penetration depth of the probe after the short circuit occurs; and evaluating the number of electrode layers involved in the short circuit based on the penetration depth. The penetration depth is identified by measuring a length of an adhesion portion in an axial direction of the probe. The adhesion portion is a portion of a surface of the probe to which a constituent material of the stacked portion adheres.

Abstract: A system for detecting an electrical grounding inter grid integrity between the earth grids includes a current injection device 108 that provides the low amplitude input current with off-grid frequency to the first earth grid 102 to detect the electrical grounding inter grid integrity between the first earth grid 102 and the second earth grid 104. The system includes a measuring device 106 that is connected to a first reference riser 112A and a second reference riser 112B to measure a drop in voltage or resistance between the first earth grid 102 and the second earth grid 104. The system includes a first bypass conductor 114 that is connected between the first earth grid 102 and the second earth grid 104 to transmit the input current with off-grid frequency to the second earth grid 104 when the electrical grounding inter grid connectivity is damaged.

Abstract: A capacitor inspection method includes applying a direct current (DC) bias voltage to an inspection capacitor with a value which is equal to or lower than a rated value of the inspection capacitor; inputting a first electric signal to the inspection capacitor, switching the input electric signal from the first electric signal to a second electric signal having a different waveform than the first electric signal and thereby generating a vibration containing a transient vibration in the inspection capacitor and eliciting a reaction voltage as an output from the inspection capacitor which contains a vibration response voltage generated by the vibration and the DC bias voltage; and measuring a transient response waveform from the vibration response voltage contained in the reaction voltage. A capacitor inspection apparatus includes a holder for the inspection capacitor; a DC voltage supply device; a signal generator; and a voltage or current measurement device.