Abstract: A microscope apparatus includes an electromagnetic wave source configured to generate an illuminating electromagnetic wave, a first beam splitter configured to split the illuminating electromagnetic wave into a first component along a first path and a second component along a second path, a movable reflector module configured to adjust a portion of the second path, and a second beam splitter configured to recombine the first component and the second component. An observing device is configured to receive the recombined first component and second component and the microscope apparatus is configured acquire a phase image from the observing device based on positioning of the movable reflector module and representative of an electric field distribution near an object located along the first path between the first beam splitter and the second beam splitter.

Abstract: Apparatus and associated methods relate to determining sizes of water particles in a cloud atmosphere based on a detected portion of signals generated from a single monochromatic source and backscattered by water particles in a cloud atmosphere. A backscatter coefficient and an optical extinction coefficient are calculated, based on the detected portion of signals generated from the monochromatic source and backscattered by water particles in the cloud atmosphere. A LIDAR ratio—a ratio of the optical extinction coefficient to the backscatter coefficient, is calculated. Sizes of water particles in the cloud atmosphere are estimated based on the LIDAR ratio. An output signal indicative of the estimated sizes of water particles in the cloud atmosphere is generated. Estimating sizes of water particles using signals from a single monochromatic source advantageously can alert a pilot of an aircraft of cloud conditions, without requiring multi-chromatic sources.

Abstract: A relative positioning system is described. At least one emitter is attached to a first object, where each of the at least one emitters includes: an electromagnetic radiation source configured to generate electromagnetic radiation over a band of wavelengths, and a prism arranged to refract and disperse the electromagnetic radiation from the electromagnetic radiation source according to the wavelength of the electromagnetic radiation. At least one electromagnetic radiation detector is attached to a second object arranged to detect the wavelengths of some of the electromagnetic radiation refracted and dispersed by a respective prism. At least one processor is configured to determine the relative position of the first object and the second object based on the detected wavelengths by the at least one electromagnetic radiation detector.

Abstract: A shaft accuracy measuring device includes: a measurement unit including a light projecting unit that projects a measuring light and a light receiving unit that receives the measurement light projected by the light projecting unit; a motor installation unit that installs the motor such that the output shaft of the motor is disposed between the light projecting unit and the light receiving unit; and a calculation unit that calculates at least one of axial run-out, center run-out, and face run-out of the motor based on a measurement result of the measurement unit.

Abstract: Scanner, method of scanning and system for scanning that allows detecting decay time characteristics of light emitted by a luminescent marking on an item which is transported, even at high speed, on a distribution/production line. The detection zone of the scanner's light sensor has a shape elongated along a path of the moving item, and the responsivity of the light sensor, within the wavelength range of the emitted luminescence light, is uniform over the detection zone. The drive current, or drive voltage, powering the excitation light source is adapted to deliver the intensity of the excitation light to the marking so that its light sensor can reliably measure the corresponding luminescence light response, and thus accurately determine a corresponding decay time value.

Abstract: A lighting fixture varies a beam angle of light emitted by a light source and a beam angle of light to the exterior to provide excellent visual effect by indirect lighting, high in serviceability and safety, and applicable to a wide range of purposes. The lighting fixture comprises a lighting fixture body of substantially L-shaped cross-section, a light source constituting a light radiation unit, a first reflector, a second reflector, and an opening constituting an illumination port. The light source is installed at an innermost center region of the vertical lightguide section to face into the vertical lightguide section. The first reflector is installed obliquely near one corner of the vertical lightguide section and the lateral lightguide section. The second reflector is obliquely installed near an endmost corner of the lateral lightguide section to face the first reflector.

Abstract: A system and method for detecting weapons. A radiofrequency transmitter transmits an RF signal stream into a region of interest. An RF receiver receives a scattered signal stream from the region of interest. The scattered signal stream is generated in the region of interest from the radiofrequency signal stream when a target is at least partially within the region of interest. A plurality of resonant signal components are identified from the scattered signal stream. Preprocessed resonant signal components are generated by removing environmental signal components. A target assessment is determined from the preprocessed resonant signal components using a trained statistical model. A target response is triggered if the target assessment indicates that a weapon is detected on the target.

Abstract: A defect inspection method includes irradiating a sample with laser, condensing and detecting scattered light beams, processing signals that detectors have detected and extracting a defect on a sample surface, and outputting information on the extracted defect. Detection of the scattered light beams is performed by condensing the scattered light beams, adjusting polarization directions of the condensed scattered light beams, mutually separating the light beams depending on the polarization direction, and detecting the light beams by a plurality of detectors. Extraction of the defect is performed by processing output signals from the detectors by multiplying each detection signal by a gain, discriminating between a noise and the defect, and detecting the defect.

Abstract: An arrangement for determining characteristics or parameters of a sample, or a layer formed on or in the sample, has detectors, spatially resolving spectral analysis of electromagnetic radiation within a wavelength interval, provided in rows or in a row and column arrangement, whereby electromagnetic radiation emitted from a broadband radiation source is incident on the detectors after reflecting off, and/or passing through, the sample, or layer formed on or in the sample, upon which is observed a homogeneous intensity of the electromagnetic radiation, and an electronic evaluation unit connected to the detectors compares the spatially-resolved and wavelength-resolved signals detected by the detectors with a theoretical wavelength dependent progression of the respective radiation intensities obtained through simulation or with a progression obtained by calibration on a known sample, in order to obtain information for the measurement position detected, and determine the spatially-resolved distribution of the ch

Abstract: Methods and systems for performing spectroscopic reflectometry measurements of semiconductor structures at infrared wavelengths are presented herein. In some embodiments measurement wavelengths spanning a range from 750 nanometers to 2,600 nanometers, or greater, are employed. In one aspect, reflectometry measurements are performed at oblique angles to reduce the influence of backside reflections on measurement results. In another aspect, a broad range of infrared wavelengths are detected by a detector that includes multiple photosensitive areas having different sensitivity characteristics. Collected light is linearly dispersed across the surface of the detector according to wavelength. Each different photosensitive area is arranged on the detector to sense a different range of incident wavelengths. In this manner, a broad range of wavelengths are detected with high signal to noise ratio by a single detector.

Abstract: Disclosed are a method and a system for estimating an image depth using a birefringent medium. The system for estimating an image depth includes a birefringent medium; and a camera, wherein the camera estimates a depth of a pixel based on an image obtained through the birefringent medium.

Abstract: Provided is a swept light source including one end surface coupled to a wavelength filter constituted of a diffraction grating and an end mirror via a light deflector and another end surface including a gain medium facing an output coupling mirror and which configures a laser cavity between the end mirror and the output coupling mirror, wherein a drive voltage having an AC voltage on which a DC bias voltage is superimposed is output from a control voltage source of the light deflector to an electrode pair of an electro-optic crystal, light is radiated from a light emitter to the electro-optic crystal, and incident light from the gain medium incident along an optical axis perpendicular to a direction of an electric field formed by the control voltage is deflected in a direction parallel to the electric field, so that wavelength sweeping is performed.

Abstract: The flow cell of the present application simultaneously monitors and measures light absorbance and fluorescence of particles in a flowing liquid.

Abstract: A Mach-Zehnder modulator for modulating optical signals, and comprising: a plurality of modulating waveguide sections; at least one bias electrode in electrical communication with at least one modulating waveguide section and configured to apply at least one electrical bias signal to one or more of the modulating waveguide sections; and an output optical combiner comprising a plurality of inputs and a plurality of outputs, wherein the plurality of inputs of the combiner are in optical communication with output sides of the plurality of modulating waveguide sections, and wherein a plurality of the outputs of the combiner are monitor outputs.

Abstract: A device for evaluating crystallinity includes a substrate holder configured to fix a polycrystalline silicon substrate thereon, a light source disposed below the substrate holder, a circular polarizing plate disposed above the polycrystalline silicon substrate, and a camera disposed above the circular polarizing plate and configured to capture an image transmitted through the circular polarizing plate.

Abstract: A power transmitting apparatus includes a power transmitting section that includes an input shaft section and an output shaft section and transmits drive force from the input shaft section to the output shaft section, a first detection section including a polarizing section that rotates when one of the input shaft section and the output shaft section rotates and has a polarization characteristic, a light source section that irradiates the polarizing section with light, and a light detection section that outputs a signal according to the intensity of the light from the polarizing section, a second detection section that outputs a signal according to the rotational state of the other one of the input shaft section and the output shaft section, and a determination section that determines the rotational state of the polarizing section based on the signal from the light detection section and the signal from the second detection section.

Abstract: Reflectometer, spectrophotometer, ellipsometer, and polarimeter systems having a supercontinuum laser source of coherent electromagnetic radiation over a range of about 400-about 2500 nm, a stage for supporting a sample and a detector of electromagnetic radiation, wherein the supercontinuum source provides a coherent beam of electromagnetic radiation which interacts with a sample, and the detector system comprises functional combinations of gratings and/or combination dichroic beam splitter-prisms, which themselves can be optimized as regards wavelength dispersion characteristics, directs wavelengths in various ranges to various detectors that are well suited to detect them.

Abstract: An apparatus and method for determining the concentration of chiral molecules in a fluid includes a first polarizer configure to polarize light in substantially a first plane to provide initially polarized light. A second polarizer is capable of polarizing the initially polarized light in a plurality of planes, at least one of the plurality of planes being different from the first plane, to provide subsequently polarized light. One or more receivers are included for measuring an intensity of the subsequently polarized light in one or more of the plurality of planes.

Abstract: An atomic interferometric accelerometer comprises a laser that emits a pulsed beam at a first frequency, an electro-optic modulator that receives the beam, and a vacuum cell in communication with the electro-optic modulator. The electro-optic modulator outputs a first optical signal corresponding to the beam at the first frequency and a second optical signal having a second frequency different from the first frequency. The vacuum cell has a chamber for laser cooled atoms. The vacuum cell receives the optical signals such that they propagate in a direction that passes through the atoms. A piezo mirror retro-reflects the optical signals back through the vacuum cell in a counter-propagating direction. The piezo mirror is driven with substantially constant velocity during a beam pulse, thereby imparting a Doppler shift to the retro-reflected optical signals to create two non-symmetric counter-propagating lightwave pairs. One of the lightwave pairs supports interferometry while the other is non-resonant.

Abstract: A gas detection device comprising a light emitting source including a first plurality of quantum dots of substantially discrete size and made of a semiconductor material a gas cell to contain the gas to be detected and a light detector.

Abstract: The invention relates to an optical sensor having a light transmitter for transmitting transmitted light into a detection zone, having a first and a second light receiver which are configured for receiving received light from the detection zone which is reflected in a reflective or diffuse manner and for generating received signals from the received light, and having an evaluation unit for generating a detection signal from the received signals. The light receivers are arranged such that each light receiver receives a portion of the received light. Each light receiver has an effective reception surface, with the effective reception surface of the second light receiver being smaller than the effective reception surface of the first light receiver such that the ratio between the received signal generated by the first light receiver and the received signal generated by the second light receiver depends on the sensing distance of the detected object.

Abstract: A position tracking system includes an array of detection pixels coupled to a head-mounted display (HMD) configured to capture light signals reflected from an environment surrounding the HMD. The position tracking system maintains, in a database, signal data related to a plurality of positions of the HMD. The position tracking system determines signal data related to a position of the HMD, based on the light signals captured during a time instant of the position of the HMD. The position tracking system matches the determined signal data to the maintained signal data, determines a present position of the HMD based on the matching, updates position data of the HMD with the determined position, and provides the updated position data of the HMD.

Abstract: An image from a window of a scanner is taken and analyzed to determine whether the image is relevant to dirt or debris on the window. When the image is relevant to dirt or debris, the size and amount of the dirt or debris is compared to a threshold and when the threshold is exceeded an alert is raised to have the window cleaned of the dirt or debris.

Abstract: A touch sensing apparatus includes a group of emitters arranged to emit light to illuminate at least part of the touch surface, a light detector arranged to receive light from the group of emitters, and a processing element. Each emitter is controlled to transmit a code by way of the emitted light such that the code identifies the respective emitter. The codes may at least partly be transmitted concurrently. The codes may be selected such that a value of an autocorrelation of each code is significantly higher than a value of a cross-correlation between any two codes of different emitters. The processing element processes an output signal from the light detector to separate the light received from the individual emitters based on the transmitted codes, and to determine the position of the object/objects based on the light received from the individual emitters.

Abstract: Provided is a displacement sensor assembly which includes a cantilever beam, a reaction block, a strain sensor, and a temperature sensor. The cantilever beam is physically oriented such that the longitudinal axis of the cantilever beam is perpendicular to the direction of displacement. A first end of the cantilever beam is fixably mounted to a fixed reference and a first end of the reaction block is fixably mounted to a moving reference. A second end of the cantilever beam is joined to a second end of the reaction block. The strain sensor is mounted and calibrated to detect displacement between the fixed and moving reference by measuring strain on the second end of the cantilever beam, and the temperature sensor is mounted and calibrated to counteract the effect of thermal strain on the sensor assembly and a method of use therefore.

Abstract: The invention provides a method of sensing a target object due to a change in light intensity detected when the target object passes to cross a light path of circularly polarized light, in a state where circularly polarized light selectively including any one sense of right circularly polarized light and left circularly polarized light is sensed, and a system including: an emission unit which emits circularly polarized light; a target object movement unit; and a detection unit which senses circularly polarized light, in this order, in which the detection unit is at a position where light emitted from the emission unit is incident, a light path of light where the light emitted from the emission unit is incident to the detection unit intersects with the target object movement unit, and the sense of circularly polarized light selectively emitted by the emission unit and the sense of circularly polarized light selectively sensed by the detection unit are the same as each other.

Abstract: A laser level including a housing. A laser generator assembly is housed in the housing and generates a laser beam. A projector projects the beam from the laser generator outside of the housing onto a target surface. The laser is a rotary laser and the projector rotates to rotate projection of the beam. The laser level also includes protective arms extending from the housing, the protective arms blocking projection of the beam along part of its path as the projector rotates. A width of the beam is at least twenty percent greater than a width of the leg where the beam contacts the leg.

Abstract: An optical sensor assembly that senses current in a secondary electrical cable while sensing voltage in a primary electrical cable. The optical sensor assembly may include a sensor body, a concentrator core for measuring current. The concentrator core may be attached to a first end of the sensor body. The optical sensor assembly may include a plurality of extension arms that extend from the sensor body. The extension arms may include clamping devices on one end that are configured to attach to a first electrical cable. The concentrator core may be configured to at least partially surround a second electrical cable and sense the current from that second electrical cable.

Abstract: A time grating linear displacement sensor based on an alternating light field, comprising a fixed pole plate and a movable pole plate, wherein the upper part and the lower part of the fixed pole plate are respectively provided with a row of square fixed pole plate light-transmitting surfaces which are uniformly distributed; the upper part and the lower part at the rear of the fixed pole plate are respectively provided with one group of light-emitting devices; the upper part and the lower part of the movable pole plate are respectively provided with two semi-sinusoidal movable pole plate light-transmitting surfaces; and four light-sensitive receiving units are fixed on the movable pole plate, the photoelectric receiving surfaces of the light-sensitive receiving units covering the movable pole plate light-transmitting surfaces. The two groups of light-emitting devices respectively provide an alternating light field. The movable pole plate moves relative to the fixed pole plate.

Abstract: There is provided an encoder device to measure a relative moving amount between a first and second members. The encoder device includes: a reflective-type diffraction grating on the first member; a light source unit to radiate a measuring light; a first optical member on the second member; a first and second reflecting units on the second member that cause first and third diffracted lights generated via diffraction of the measuring light and having orders different from each other to come into the diffraction grating respectively, and cause second and fourth diffracted lights generated via diffraction of the first and third diffracted lights respectively to come into the first optical member; photo-detectors configured to detect interference lights between two diffracted lights and other light beam respectively; and a measuring unit to obtain the relative moving amount by using detection signals from the photo-detectors.

Abstract: An inspection apparatus includes an inspection unit for inspecting an inspection target, and a positioning unit for supporting the inspection target and positioning the inspection target to an inspection position.

Abstract: A phase separation observation method according to one embodiment includes determining a progress degree of phase separation of a self-assembly material layer. The progress degree is determined based on the birefringence amount of an observation object. The observation object includes a substrate, and a self-assembly material layer formed on the substrate.

Abstract: A novel methodology for detecting cloud particles is disclosed herein. This methodology exploits the optical glory phenomenon. According to one embodiment, a method for detecting clouds includes receiving data from a sensor which is configured to measure polarization of scattered light in a direction substantially opposite to the direction of incident light, and identifying, from the received sensor data, a cloud based on the polarization of the scattered light.

Abstract: An approach to characterizing beams of electromagnetic radiation such as are applied in ellipsometer and the like systems, involving considering the beam to be comprised of a number of spatially distributed beam rays, each of which is represented mathematically as an effectively independent source.

Abstract: A stereoscopic image display includes a display panel; a polarization control panel that is positioned on the display panel and controls the polarization direction of light incident from the display panel; a lens panel positioned on the polarization control panel and having a plurality of lens shaping portions; a first driver for driving the display panel; a second driver for supplying a driving voltage to the polarization control panel; a timing controller for controlling the first driver and the second driver; and a sensing unit that senses the driving voltage supplied to the polarization control panel and outputs a decision signal for deciding whether the sensed driving voltage is in normal condition or abnormal condition.

Abstract: An optical sensor, optical system, and proximity sensor are disclosed. An illustrative proximity sensor is disclosed to include a light source, a photodetector including a photo-sensitive area that receives incident light and converts the received incident light into an electrical signal, and a plurality of polarization layers stacked on the photodetector that limit light from becoming received incident light for the photo-sensitive area to light traveling toward the photodetector along a predetermined path.

Abstract: The present invention provides a liquid crystal panel common electrode voltage adjustment device and a liquid crystal panel common electrode voltage adjustment method. The liquid crystal panel common electrode voltage adjustment device includes a detection unit, a data collection unit, a process unit and an adjustment unit, and the detection unit detects a flicker condition of the liquid crystal panel in an activation state, and the data collection unit collects a common voltage value as the flicker exceeds a predetermined range to obtain a first common voltage, and the process unit obtains a control signal according to the first common voltage, and the adjustment unit sends a corresponding adjustment signal, and the adjustment signal adjusts the common voltage to be a second common voltage, and as the second common voltage is applied to the liquid crystal panel, the flicker of the liquid crystal panel is controlled in the predetermined range.

Abstract: An image pickup apparatus includes an encoder which is arranged on an optical path of light incident from an object and which has a plurality of regions with first light transmittance and a plurality of regions with second light transmittance lower than the first light transmittance, a dispersive element which is arranged on an optical path of at least one part of light after passage through the encoder and which spatially shifts the at least one part of the light in accordance with wavelength, and at least one image pickup device which is arranged to receive light after passage through the dispersive element and light without passage through the dispersive element and which acquires a first image, in which light components for respective wavelengths spatially shifted by the dispersive element are superimposed, and a second image based on the light without passage through the dispersive element.

Abstract: A method (100) of forming an integrated circuit is disclosed. The method comprises: (i) forming at least a pair of optoelectronic devices from at least a first wafer material arranged on a semiconductor substrate, the first wafer material different to silicon; (ii) etching the first wafer material to form a first recess to be filled with a second material; (iii) processing (104) the second material to form a waveguide for coupling the pair of optoelectronic devices to define an optical interconnect; and (iv) bonding (106) at least one partially processed CMOS device layer having at least one transistor to the second semiconductor substrate to form the integrated circuit, the partially processed CMOS device layer arranged adjacent to the optical interconnect. An integrated circuit is also disclosed.

Abstract: The present invention provides a detection apparatus which causes light to be incident obliquely on a substrate including a plurality of layers whose refractive indices are different from each other and detects a height of the substrate using light reflected from the substrate, the apparatus comprising an optical system including a polarizer for reducing s-polarized light and configured to cause light, in which s-polarized light has been reduced by the polarizer, to be incident on the substrate at an angle of incidence within a range of 40° to 55°.

Abstract: The present disclosure is generally directed to methods and systems for measuring the thickness of coatings or thin films on various substrates. For example, one disclosed method includes the steps of providing and directing light waves of varying wavelengths toward a moving substrate comprising a coating, linearly polarizing the light waves, converting the linearly polarized light waves to circularly polarized light waves, analyzing elliptically polarized light waves reflected by the moving substrate, capturing analyzed light waves, generating light wave data based on the captured light waves, and determining a thickness of the coating based on the light wave data.

Abstract: Methods and systems for matching measurement spectra across one or more optical metrology systems are presented. The values of one or more system parameters used to determine the spectral response of a specimen to a measurement performed by a target metrology system are optimized. The system parameter values are optimized such that differences between measurement spectra generated by a reference system and the target system are minimized for measurements of the same metrology targets. Methods and systems for matching spectral errors across one or more optical metrology systems are also presented. A trusted metrology system measures the value of at least one specimen parameter to minimize model errors introduced by differing measurement conditions present at the time of measurement by the reference and target metrology systems. Methods and systems for parameter optimization based on low-order response surfaces are presented to reduce the compute time required to refine system calibration parameters.

Abstract: A photonic analog to digital converter (pADC) includes an electronic I/Q generator, an optical sampler, and an optical detector. The electronic I/Q generator is configured to receive an RF signal and to generate an electronic in-phase signal I and an electronic quadrature-phase signal Q based on the received RF signal. The optical sampler includes one or more optical intensity modulators configured to receive the electronic I and Q signals from the electronic I/Q generator, and to modulate optical pulses to provide modulated optical I and Q signals based on the received electronic I and Q signals from the electronic I/Q generator. The optical detector includes a plurality of photodetectors, and is arranged to receive the modulated optical I and Q signals from the optical sampler and to convert the modulated optical I and Q signals into modulated electronic I and Q signals.

Abstract: An illustrative example embodiment of a device for detecting rain or a substance on a windshield includes at least one radiation source, an internal reflection sensor situated to detect at least some of a first portion of the radiation that reflects from the windshield. The internal reflection sensor provides a first output that has a characteristic that differs based on whether at least one raindrop is on the windshield. A scattered reflection sensor is situated to detect at least some of a second portion of the radiation reflecting from rain near the windshield or a substance on the windshield. The scattered reflection sensor provides a second output indicative of an amount of radiation incident on the scattered reflection sensor. A processor is configured to determine a condition of the windshield based on the first output and the second output.

Abstract: An analysis system comprises a transmitting device (1.1) and a receiving device (1.2). The transmitting devices comprises means for illuminating an object (1.3), or a part of the object, by a first light beam (1.8) consisting of signals with two distinct frequencies and first orthogonal polarisation states. The receiving device comprises means (1.6) for detecting, in a second light beam with second polarisation states and resulting from the illumination of the object to be analysed by the first light beam, a signal at a beat frequency equal to a difference between the two frequencies of the first light beam; and means (1.7) for obtaining information relating to the depolarising or dichroic character of the object, or of the part of the object, according to the detection or not of a signal at the beat frequency.

Abstract: Turbidity measurements are obtained by directing a polarized optical beam to a scattering sample. Scattered portions of the beam are measured in orthogonal polarization states to determine a scattering minimum and a scattering maximum. These values are used to determine a degree of polarization of the scattered portions of the beam, and concentrations of scattering materials or turbidity can be estimated using the degree of polarization. Typically, linear polarizations are used, and scattering is measured along an axis that orthogonal to the direction of propagation of the polarized optical beam.

Abstract: Fiber optic sensors based on multicore optical fibers that are intended for use in harsh environment sensing. This multicore fiber comprises an arrangement of optically coupled cores in a silica background. Sensors are fabricated by splicing a section of multicore fiber between two single mode fibers. This multicore fiber sensor is simple and repeatable to fabricate and multiple sensors can be multiplexed in a chain. These fiber optic sensors are intended for a broad set of sensing applications including temperature, pressure, strain, bending, acoustic vibrations, mechanical vibrations, or combinations thereof.

Abstract: A polarimetry apparatus comprising a plurality of flexible light conduits each having first and second ends, and a respective polarization modulator associated with each light conduit, wherein each light conduit is configured to receive incident light from a different predetermined region in space via the first end, and deliver said light to a detector unit via the second end, and wherein the polarization modulator is configured to modulate the polarization of the light to enable a partial or complete polarization state of the incident light to be determined by the detector unit for each light conduit.

Abstract: The capacity to measure nanoscale features rapidly and accurately is of central importance for the monitoring of manufacturing processes in the production of computer integrated circuits. It is known that far-field scattered light requires a priori sample information in order to reconstruct nanoscale information such as is required in semiconductor metrology. Parameters of interest include, for example, trench depth, duty cycle, wall angle and oxide layer thickness. We describe a scatterometry apparatus and method that uses unconventional polarization states in the pupil of a high NA objective lens, and refer to this as focused beam scatterometry, in which the illumination consists of a focused field with a suitably tailored, spatially-varying polarization distribution. We describe how four or more parameters can be measured and distinguished with an accuracy consistent with the needs laid out in the semiconductor roadmap.

Abstract: An apparatus, configured and operable to determine a state and/or an operation of a powered electrical device, comprises one or more antennas, a receiver operable to receive emission(s) of electromagnetic energy from the electrical device; an illumination device operable to illuminate the electrical device with a pulse of electromagnetic energy; a controller including: one or more processors, a non-transitory computer readable medium comprising executable instructions that, when executed by the one or more processors, cause the one or more processors to perform the steps of selecting a spectral frequency target component of the emission(s), iteratively controlling the illumination device, measuring, at each iteration, a change in characteristic(s) of the spectral frequency target component of the emission(s), assigning a score value to each measurement, and iteratively effecting optimized parameter(s) of the pulse based on the score value until a final score value indicates a desired state, operation of the e