With Time-of-flight Indicator Patents (Class 250/287)
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Patent number: 8436298Abstract: LC/MS data generated by an LC/MS system is analyzed to determine groupings of ions associated with originating molecules. Ions are grouped initially according to retention time, for example, using retention time or chromatographic peaks in mass chromatograms. After initial groupings are determined based on retention time, ion peak shapes are compared to determine whether ions should be excluded. Ions having peak shapes not matching other ions, or alternatively a reference peak shape, are excluded from the group.Type: GrantFiled: August 24, 2010Date of Patent: May 7, 2013Assignee: Waters Technologies CorporationInventors: Scott J. Geromanos, Jeffrey Cruz Silva, Guo-Zhong Li, Marc Victor Gorenstein
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Publication number: 20130105681Abstract: A device and associated method are disclosed for interfacing an ion trap to a pulsed mass analyzer (such as a time-of-flight analyzer) in a mass spectrometer. The device includes a plurality of separate confinement cells and structures for directing ions into a selected one of the confinement cells. Ions are ejected from the ion trap in a series of temporally successive ion packets. Each ion packet (which may consist of ions of like mass-to-charge ratio), is received by the ion interface device, fragmented to form product ions, and then stored and cooled in the selected confinement cell. Storage and cooling of the ion packet occurs concurrently with the receipt and storage of at least one later-ejected ion packet. After a predetermined cooling period, the ion packet is released to the mass analyzer for acquisition of a mass spectrum.Type: ApplicationFiled: November 2, 2011Publication date: May 2, 2013Inventor: Viatcheslav V. KOVTOUN
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Patent number: 8431887Abstract: A mass analyzer comprises a pair of planar electrode structures. The electrode structures are disposed opposite to each other, parallel to each other, and axially offset from each other. The electrode structures are configured to generate, in response to an applied voltage, a cylindrically-symmetric, annular electric field comprising an annular radially focusing central lens region surrounding an axis of symmetry, and an annular mirror region surrounding the annular radially focusing central lens region.Type: GrantFiled: January 31, 2011Date of Patent: April 30, 2013Assignee: Agilent Technologies, Inc.Inventors: Curt A. Flory, Trygve Ristroph
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Publication number: 20130099111Abstract: A time of flight analyser that comprises a pulsed ion source; a non-linear ion mirror having a turn-around point; and a detector. The pulsed ion source is configured to produce an ion pulse travelling along an ion flight axis, the ion pulse comprising an ion group consisting of ions of a single m/z value, the ion group having a lateral spread. The non-linear ion mirror is configured to reflect the ion group, at the turn-around point, along the ion flight axis towards the detector, the passage of the ion group through the non-linear ion mirror causing a spatial spread of the ion group. The time of flight mass analyser has at least one lens positioned between the ion source and the ion mirror, wherein the or each lens is configured to reduce said lateral spread so as to provide a local minimum of lateral spread within the ion mirror.Type: ApplicationFiled: October 18, 2012Publication date: April 25, 2013Applicant: SHIMADZU CORPORATIONInventor: SHIMADZU CORPORATION
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Patent number: 8426809Abstract: An apparatus and a method for trapping charged particles and performing controlled interactions between them are provided. The apparatus includes a substrate and RF electrodes and dedicated DC electrodes arranged on the substrate and configured to generate a trapping potential for trapping the charged particles above the substrate. The RF and dedicated DC electrodes include at least one RF trapping electrode configured to be driven with an RF voltage for contributing to the trapping potential, an array of two or more trapping site DC electrodes configured to be biased with a DC voltage for contributing to the trapping potential, and a first individually drivable RF control electrode arranged between a first pair out of the two or more trapping site DC electrodes.Type: GrantFiled: May 13, 2011Date of Patent: April 23, 2013Assignee: Universität InnsbruckInventor: Muir Kumph
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Patent number: 8426803Abstract: A mass spectrometer is disclosed comprising a quadrupole rod set ion trap wherein a potential field is created at the exit of the ion trap which decreases with increasing radius in one radial direction. Ions within the ion trap are mass selectively excited in a radial direction. Ions which have been excited in the radial direction experience a potential field which no longer confines the ions axially within the ion trap but which instead acts to extract the ions and hence causes the ions to be ejected axially from the ion trap.Type: GrantFiled: July 14, 2008Date of Patent: April 23, 2013Assignee: Micromass UK LimitedInventors: Martin R. Green, Daniel James Kenny, David Langridge, Jason Lee Wildgoose
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Patent number: 8426802Abstract: A mass spectrometer is disclosed comprising a device which is operable in a first mode of operation to separate ions temporally according to their ion mobility by applying a continuous axial electric field. The device is also operable in a second mode of operation wherein ions are separated temporally according to the their mass to charge ratio by pulsing an applied axial electric field ON and OFF.Type: GrantFiled: December 12, 2007Date of Patent: April 23, 2013Assignee: Micromass UK LimitedInventors: Kevin Giles, Steven Derek Pringle, Jason Lee Wildgoose
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Patent number: 8421005Abstract: The present invention is a device to restrict the sampling of analyte ions and neutral molecules from surfaces with mass spectrometry and thereby sample from a defined area or volume. In various embodiments of the present invention, a tube is used to sample ions formed with a defined spatial resolution from desorption ionization at or near atmospheric pressures. In an embodiment of the present invention, electrostatic fields are used to direct ions to either individual tubes or a plurality of tubes positioned in close proximity to the surface of the sample being analyzed. In an embodiment of the present invention, wide diameter sampling tubes can be used in combination with a vacuum inlet to draw ions and neutrals into the spectrometer for analysis. In an embodiment of the present invention, wide diameter sampling tubes in combination with electrostatic fields improve the efficiency of ion collection.Type: GrantFiled: February 19, 2010Date of Patent: April 16, 2013Assignee: Ionsense, Inc.Inventor: Brian D. Musselman
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Publication number: 20130087700Abstract: Disclosed is a mass spectrometer for analyzing a sample that has or is suspected of having microorganisms. The disclosed mass spectrometer has been uniquely configured to include a sample platform which functions as a counter electrode or discharge electrode and a surface to provide the sample to be analyzed. The mass spectrometer also includes an ion source positioned adjacent to the sample platform for ionizing and volatizing molecules within the sample, wherein the sample platform and the ion source are positioned such that during operation of the mass spectrometer an electrical discharge takes place between the ion source and the sample platform. Also disclosed are methods for generating a mass spectrum profile/fingerprint of a sample. The methods include positioning a sample platform having a sample adjacent to an ion source.Type: ApplicationFiled: October 11, 2011Publication date: April 11, 2013Inventors: Pierre Alusta, Cameron Dorey, William Ryan Parker, Jon G. Wilkes, Dan Buzatu
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Patent number: 8415618Abstract: An ion mobility spectrometer is disclosed wherein the potential difference between the exit region of an ion trap arranged upstream of the ion mobility spectrometer and the entrance region to the ion mobility spectrometer is varied temporally with time in order to optimise the transmission of ions from the ion trap into the ion mobility spectrometer so as to avoid fragmentation of the ions.Type: GrantFiled: January 26, 2009Date of Patent: April 9, 2013Assignee: Micromass UK LimitedInventor: John Brian Hoyes
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Patent number: 8410452Abstract: The invention relates to an ion source means comprising at least one holding means for holding at least one sample to expose the sample to a mass spectrometer device, wherein the holding means comprises a structured sample support means for supporting the sample and/or a structured sample or sample comprising a structured surface, respectively.Type: GrantFiled: May 29, 2009Date of Patent: April 2, 2013Assignee: Universitaetsklinikum MuensterInventors: Simone Koenig, Klaus Dreisewerd, Alexander Pirkl
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Patent number: 8410432Abstract: A ion mobility-based analyzer system including a first ion mobility-based filter for passing selected ions through a time-varying field where the time-varying field being compensated by an adjustable compensation setting. The analyzer also includes a second ion mobility-based filter for receiving a first portion of ions from the first ion mobility-based filter. The second ion mobility-based filter includes a voltage gradient for separating ions of the first portion of ions where the ions have associated retention times based on their times of flight through the voltage gradient. The second ion mobility-based filter includes a detector for detecting the ions at their retention times. The analyzer system further includes a display that displays the detected ions in a plot relating the retention times of the ions in the second ion mobility-based filter with compensation settings of the first ion mobility-based filter.Type: GrantFiled: August 8, 2011Date of Patent: April 2, 2013Assignee: DH Technologies Development Pte. Ltd.Inventors: Raanan A. Miller, Evgeny Krylova, Erkinjon G. Nazarov, Gary A. Eiceman, John A. Wright
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Patent number: 8410431Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: October 5, 2009Date of Patent: April 2, 2013Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Patent number: 8410430Abstract: A Time of Flight mass analyser is disclosed wherein the time period between successive orthogonal acceleration pulses is less than the time of flight of ions having the maximum mass to charge ratio of interest. As a result, some ions are subject to wrap-around and will appear in a subsequent mass spectrum. Mass spectra obtained at two different sampling rates may be compared and mass peaks relating to ions which have and have not been subject to wrap-around may be identified.Type: GrantFiled: January 15, 2008Date of Patent: April 2, 2013Assignee: Micromass UK LimitedInventors: Daniel James Kenny, Jason Lee Wildgoose
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Patent number: 8405023Abstract: An ion mobility spectrometer has several electrodes spaced along its ion source region. Voltages are applied to the electrodes to produce a voltage gradient along the length of the ion source region. By varying the voltage gradient, the residence time of ions in the ion source region can be selectively varied. Typically, the spectrometer is arranged to reduce the residence time in response to a decrease in the amplitude, of an ion peak detected at the far end of the drift region.Type: GrantFiled: July 11, 2012Date of Patent: March 26, 2013Assignee: Smiths Detection-Watford LimitedInventor: William Angus Munro
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Publication number: 20130068944Abstract: A mass spectrometer comprises ion pulse means for producing ion pulses in a first vacuum chamber, ion trap means for receiving and trapping the ion pulses for mass analysis in a second vacuum chamber, and ion-optical lens means arranged between the ion pulse means and the ion trap means for receiving the ion pulses and outputting ions therefrom to the ion trap means. A first lens electrode and a second lens electrode collectively define an optical axis and are adapted for distributing a first electrical potential and second electrical potential therealong. Lens control means vary non-periodically with time the first electrical potential relative to the second electrical potential to control as a function of ion mass-to-charge ratio the kinetic energy of ions which have traversed the ion optical lens means. This controls the mass range of the ions receivable by the ion trap from the ion optical lens means.Type: ApplicationFiled: May 23, 2011Publication date: March 21, 2013Inventors: Emmanuel Raptakis, Dimitris Papanastasiou
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Publication number: 20130068942Abstract: Electrostatic trap mass spectrometers are disclosed that may comprise at least two parallel sets of electrodes separated by a field-free space, wherein said at least two parallel electrode sets extend along a curved Z-direction locally orthogonal to said X-Y plane such that each of said two electrode sets define a volume with a two-dimensional electrostatic field in an X-Y plane and define either planar or torroidal field regions; means for adjusting the torroidal field regions to provide both (i) stable trapping of ions passing between said fields within said X-Y plane and (ii) isochronous repetitive ion oscillations within said X-Y plane such that the stable ion motion does not require any orbital or side motion; and an ion bounding means in the curved Z-direction configured to compensate time-of-flight distortions at Z-edges of the trap.Type: ApplicationFiled: November 24, 2010Publication date: March 21, 2013Inventor: Anatoly Verenchikov
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Patent number: 8399828Abstract: A tandem time-of-flight mass spectrometer includes a first pulsed ion source that produces ions with a first mass and charge that directs the ions into a first stage of a tandem TOF mass spectrometer. In addition, a second pulsed ion source produces ions with a second mass and an opposite charge directs the ions into the first stage of the tandem TOF mass spectrometer. A field-free reaction region is positioned in the ion flight path so that ions from first and second pulsed ion source arrive at the entrance of the field-free reaction region substantially simultaneously in at least one of time and space. At least some of the ions from the first and second pulsed ion source are fragmented by ion-ion collision between positive and negative ions. A second stage of the tandem mass spectrometer separates fragment ions produced in the reaction region according to their mass-to-charge ratio.Type: GrantFiled: December 31, 2009Date of Patent: March 19, 2013Assignee: Virgin Instruments CorporationInventor: Marvin L. Vestal
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Patent number: 8395115Abstract: The present invention provides a method of reflecting ions in a multireflection time of flight mass spectrometer comprising providing an ion mirror having a plurality of electrodes, the ion mirror having a cross section with a first, minor axis (Y) and a second, major axis (X) each perpendicular to a longitudinal axis (Z) of the ion mirror which lies generally in the direction of time of flight separation of the ions in the mirror; guiding ions towards the ion mirror; applying a voltage to the electrodes so as to create an electric field which: (a) causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror which contains the longitudinal (Z) and major axes (X) of the mirror; (b) causes the ions to reflect in the ion mirror; and (c) causes the ions to exit the ion mirror in a direction such that the mean trajectory of ions passing through the ion mirror has a component of movement in a direction (Y) perpendicular to and diverging from the said plane of symmetry thereof.Type: GrantFiled: December 22, 2008Date of Patent: March 12, 2013Assignee: Thermo Fisher Scientific (Bremen) GmbHInventors: Alexander A. Makarov, Dmitry E. Grinfield, Mikhail A. Monastyrskiy
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Publication number: 20130056628Abstract: Mass spectrometers ionize samples by matrix-assisted laser desorption (MALDI). The samples are located on a moveable support plate, and irradiated by a pulsed laser. A fast positional control of laser spots is provided via a system of rotatable mirrors to relieve strain on a support plate motion drive. If the spot position is finely adjusted by the mirror system and follows the movement of the sample support plate, the intermittent movement of the sample support can be replaced with a continuous uniform motion. The fast positional control allows more uniform ablation of a sample area. Galvo mirrors with low inertia may be used between the beam generation and a Kepler telescope in the housing of the laser. The positional control can also provide a fully automatic adjustment of MALDI time-of-flight mass spectrometers, at least if the ion-optical elements are equipped with movement devices.Type: ApplicationFiled: September 6, 2012Publication date: March 7, 2013Inventors: Armin Holle, Andreas Haase, Jens Hoehndorf
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Publication number: 20130056629Abstract: A mass spectrometer is disclosed comprising an ion mobility spectrometer or separator and an ion guide arranged downstream of the ion mobility spectrometer or separator. A plurality of axial potential wells are created in the ion guide so that ions received from the ion mobility spectrometer or separator become confined in separate axial potential wells. The potential wells maintain the fidelity and/or composition of ions received from the ion mobility spectrometer or separator. The potential wells are translated along the length of the ion guide.Type: ApplicationFiled: October 29, 2012Publication date: March 7, 2013Applicant: Micromass UK LimitedInventor: MICROMASS UK LIMITED
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Publication number: 20130056627Abstract: An open electrostatic trap mass spectrometer is disclosed for operation with wide and diverging ion packets. Signal on detector is composed of signals corresponding to multiplicity of ion cycles, called multiplets. Using reproducible distribution of relative intensity within multiplets, the signal can be unscrambled for relatively sparse spectra, such as spectra past fragmentation cell of tandem mass spectrometer, past ion mobility and differential ion mobility separators. Various embodiments are provided for particular pulsed ion sources and pulsed converters such as orthogonal accelerators, ion guides, and ion traps. The method and apparatus enhance the duty cycle of pulsed converters, improve space charge tolerance of the open trap analyzer and extends the dynamic range of time-of-flight detectors.Type: ApplicationFiled: December 30, 2010Publication date: March 7, 2013Applicant: Leco CorporationInventor: Anatoly Verenchikov
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Patent number: 8389931Abstract: Methods for fragmentation of large molecular ions, including proteins, nucleic acids, dendromers, and nanomaterials, compatible with several mass spectrometric techniques. The methods involve providing a gas-phase ion and allowing the gas phase ion to undergo collisions with metastable states of noble gases or nitrogen gas.Type: GrantFiled: November 29, 2010Date of Patent: March 5, 2013Assignee: Ohio UniversityInventors: Glen P. Jackson, Olivier Collin
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Patent number: 8389934Abstract: A lens assembly for use in mass spectrometry and a method for reducing contaminant build up on ion optic components in a lens assembly for use in a mass spectrometer are disclosed herein. In various embodiments of applicant's teachings, the lens assembly comprises a plurality of ion optic components assembled to form an ion lens and a heater. The plurality of ion optic components has a generally similar expansion coefficient. The heater is operatively coupled to the ion optic components. The heater heats the ion optic components to reduce the accumulation of debris on the ion optic components. In various embodiments, the method includes receiving, in a lens assembly, ions from an ion source. The lens assembly includes a plurality of ion optic components assembled to form an ion lens, the plurality of ion optic components having a generally similar expansion coefficient. The method also comprises heating the ion optic components to a first temperature.Type: GrantFiled: March 26, 2010Date of Patent: March 5, 2013Assignee: DH Technologies Development Pte. Ltd.Inventors: Mihajlo Dzepina, William Loyd, Gregor Sprah
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Patent number: 8384024Abstract: The invention relates generally to systems, methods and devices for analyzing samples and, more particularly, to systems using a differential mobility spectrometer in combination with a mass analyzer to enhance the analysis process of constituents of a sample.Type: GrantFiled: September 1, 2010Date of Patent: February 26, 2013Assignee: DH Technologies Development Pte. Ltd.Inventors: Raanan A. Miller, Erkinjon G. Nazarov, Paul Vouros
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Patent number: 8384025Abstract: A device for separating, enriching and detecting ions comprises: a gas tube, in which a carrier gas flows at a uniform rate; an ion source; multiple electrodes provided in the gas tube and applied with electric voltages respectively, so that at least an electric field is produced along the axis of the gas tube; an ion detector; and an ion extraction channel, by which specific enriched ions will be guided across the side wall of the gas tube toward the ion detector and be analyzed. The device enriches ions utilizing the following characteristic: compound ions with specific ion mobility maintain a dynamic balance for a period of time in a flow field under the combination of a carrier gas and a suitable electrical field against the direction of the carrier gas. Simultaneously, multiple compound particles with different ion motilities can be separated and enriched at positions with different electrical field intensities in a flow field in the same manner.Type: GrantFiled: November 26, 2009Date of Patent: February 26, 2013Assignee: Shimadzu Research Laboratory (Shanghai) Co. LtdInventors: Wenjian Sun, Li Ding
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Patent number: 8384023Abstract: The present invention relates to a method and apparatus for ionizing a neutral MALDI desorption plume, and in particular, for efficiently measuring the ionized MALDI desorption plume when post-ionization techniques are combined with a medium pressure MALDI-IM-oTOFMS instrument. Additionally, the present disclosure provides a method and apparatus that simultaneously separates tissue-sample MALDI ions by IM-oTOFMS according to their chemical family. After separation, the MALDI ions are directly compared to the ions created by post-ionizing the co-desorbed neutral molecules with a second laser wherein the second laser is delayed by a few hundred microseconds.Type: GrantFiled: January 23, 2010Date of Patent: February 26, 2013Assignee: Ionwerks, Inc.Inventors: J. Albert Schultz, Thomas F. Egan, Kelley L. Waters, Ernest K. Lewis
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Publication number: 20130042703Abstract: An improved sample chamber for laser assisted spectroscopy integrates valve mechanisms into the sample drawer, permitting the sample chamber to automatically bypass, purge and resume flow as the sample drawer is opened and closed to insert samples for processing. Integrating valve mechanisms into the sample drawer in this manner eliminates the need for external valves to be operated to bypass, purge and resume flow, thereby increasing system throughput and reducing system complexity.Type: ApplicationFiled: October 23, 2012Publication date: February 21, 2013Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.Inventors: Robert HUTCHINSON, Leif SUMMERFIELD, Shane HILLIARD, Jay WILKINS
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Publication number: 20130037710Abstract: This invention describes an apparatus and method with a combined primary electrospray and secondary electrospray ionization source used to enhance ionization efficiency. The solid phase as well as liquid phase sampling, ionization, and detection is described.Type: ApplicationFiled: October 15, 2012Publication date: February 14, 2013Applicant: Excellims CorporationInventor: CHING WU
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Patent number: 8368014Abstract: A technique for improving the mass-resolving power of an ion trap time-of-flight mass spectrometer is provided. At the final stage of a cooling process before the ejection of ions from an ion trap, the frequency of a rectangular-wave voltage applied to a ring electrode of the ion trap is increased for a few to several cycles. This operation reduces the confining potential depth of the ion trap and decelerates the captured ions. The turn-around time of the ions is shortened when the rectangular-wave voltage is halted and an accelerating electric field is created. Thus, the variation in the time of flight of the ions with the same mass-to-charge ratio is reduced. The time for increasing the frequency is determined so that a spread of the ions because of the depth reduction of the confining potential will fall within the range that can be corrected in the time-of-flight mass spectrometer.Type: GrantFiled: December 2, 2011Date of Patent: February 5, 2013Assignee: Shimadzu CorporationInventor: Junichi Taniguchi
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Patent number: 8362415Abstract: A method of analyzing biological material by exposing the biological material to a recognition element, that is coupled to a mass tag element, directing an ion beam of a mass spectrometer to the biological material, interrogating at least one region of interest area from the biological material and producing data, and distributing the data in plots.Type: GrantFiled: May 26, 2010Date of Patent: January 29, 2013Assignees: Lawrence Livermore National Security, LLC, Lawrence Berkeley National LaboratoryInventors: James S. Felton, Kuang Jen J. Wu, Mark G. Knize, Kristen S. Kulp, Joe W. Gray
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Patent number: 8362422Abstract: The present invention discloses a sample feeding device for an ion mobility spectrometer, which is adapted to guide a sample to be detected into an inlet of a drift tube of the ion mobility spectrometer.Type: GrantFiled: April 27, 2011Date of Patent: January 29, 2013Assignees: Nuctech Company Limited, Tsinghua UniversityInventors: Qingjun Zhang, Zhiqiang Chen, Shiping Cao, Yuanjing Li, Ziran Zhao, Yinong Liu, Yan Zheng, Shaoji Mao, Xiang Zou, Jianping Chang
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Patent number: 8362414Abstract: The invention relates to a method and an apparatus for providing a sample for a subsequent analysis of the sample, particularly for analyzing biomolecules, comprising the following steps: generating a free micro liquid jet in an environment having a predetermined pressure, wherein the micro liquid jet contains a carrier liquid and the sample to be analyzed, and dispersing the micro liquid jet into droplets containing the sample, wherein the environment surrounding the micro liquid jet is a gaseous environment in which the pressure is above vacuum conditions.Type: GrantFiled: July 14, 2008Date of Patent: January 29, 2013Assignees: Max-Planck-Gesellschaft zur Forderung der Wissenschaften E.V, Georg-August-Universitat Gottingen Stiftung des Offentlichen RechtsInventors: Ales Charvat, Henning Urlaub, Bernd Abel, Erdmann Rapp
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Patent number: 8362420Abstract: An apparatus (10) for separating Ions based on ion mobility includes a conduit (12) defining a closed path. The conduit is configured such that a uniform electric field is produced about the closed path upon application of a voltage causing ions within the conduit (12) to move about the closed path and to separate the ions based upon ion mobility. A method of separating a plurality of ions is also disclosed.Type: GrantFiled: August 31, 2007Date of Patent: January 29, 2013Assignee: Indiana University Research and Technology CorporationInventors: David E. Clemmer, Samuel I. Merenbloom, Stormy L. Koeniger, Stephen J. Valentine
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Patent number: 8362445Abstract: A UV-LED photoemission ionization source and process are disclosed that provide ionization of analytes including volatile molecular species and organic residues for detection with various ion analyzers. The UV-LED source produces low-energy UV light (200 nm to 400 nm) that yields photoemission electrons from various conducting surfaces. These photoemission electrons provide direct and indirect ionization of analytes including trace organic residues without need of high electric fields.Type: GrantFiled: March 30, 2011Date of Patent: January 29, 2013Assignee: Battelle Memorial InstituteInventors: Luke C. Short, Charles J. Barinaga, Robert G. Ewing
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Patent number: 8357892Abstract: A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tube 2 where ions fly is arranged in a vacuum vessel composed of a vacuum flange 6 and a body 1, and an MCP group 4 is attached to a tail end of the flight tube 2 via an MCP-IN electrode 3. A vacuum flange 6 is attachably and detachably attached to the body 1, and the MCP group 4, by a spring 710 provided on a circuit board 7 for detection attached to the vacuum flange 6, is urged toward an end portion of the flight tube 2 so that its orthogonality with respect to an ion flight track is secured.Type: GrantFiled: March 24, 2010Date of Patent: January 22, 2013Assignee: Hamamatsu Photonics K.K.Inventors: Motohiro Suyama, Etsuo Iizuka, Akio Suzuki, Hiroshi Kobayashi
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Patent number: 8357893Abstract: An ion mobility sensor system including an ion mobility spectrometer and a differential mobility spectrometer coupled to the ion mobility spectrometer. The ion mobility spectrometer has a first chamber having first end and a second end extending along a first direction, and a first electrode system that generates a constant electric field parallel to the first direction. The differential mobility spectrometer includes a second chamber having a third end and a fourth end configured such that a fluid may flow in a second direction from the third end to the fourth end, and a second electrode system that generates an asymmetric electric field within an interior of the second chamber. Additionally, the ion mobility spectrometer and the differential mobility spectrometer form an interface region. Also, the first end and the third end are positioned facing one another so that the constant electric field enters the third end and overlaps the fluid flowing in the second direction.Type: GrantFiled: September 23, 2009Date of Patent: January 22, 2013Assignee: UT-Battelle, LLCInventors: Jun Xu, David B. Watson, William B. Whitten
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Patent number: 8354634Abstract: A mass spectrometer is disclosed wherein an ion signal is split into a first and second signal. The first and second signals are multiplied by different gains and are digitised. Arrival time and intensity pairs are calculated for both digitised signals and the resulting time and intensity pairs are combined to form a high dynamic range spectrum. The spectrum is then combined with other corresponding spectra to form a summed spectrum.Type: GrantFiled: May 22, 2008Date of Patent: January 15, 2013Assignee: Micromass UK LimitedInventors: Martin Green, Steven Derek Pringle, Jason Lee Wildgoose
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Patent number: 8354635Abstract: Ions originating from sample components are made to fly along a loop orbit (P) multiple times, and are deviated from the loop orbit (P) when a predetermined period of time has elapsed after the ejection of the ions. A time-of-flight spectrum recording unit (81) creates a time-of-flight spectrum based on the detected signal. If an overtaking of ions occurs on the loop orbit (P), the number of turns of peaks (ions) appearing on the spectrum cannot be determined. Given this factor, an isotopic peak detector (82) finds an isotopic peak group based on the time intervals and intensity ratio of a plurality of peaks appearing on the spectrum. A flight distance computation unit 83 uses the fact that the mass difference between adjacent peaks belonging to an isotopic peak group is 1 Da when ions are singly-charged, and computes the flight distance based on a predetermined formula.Type: GrantFiled: October 30, 2008Date of Patent: January 15, 2013Assignee: Shimadzu CorporationInventor: Shinichi Yamaguchi
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Publication number: 20130009051Abstract: An improved trap-TOF mass spectrometer has a set of electrodes arranged to produce both a quadrupolar RF confining field and a substantially homogeneous dipole field. In operation, ions are first confined by the RF field and then, at a selected time, the RF confining field is discontinued and the dipole field is used to accelerate the ions so as to initiate a TOF MS analysis. The apparatus of the present invention may be used alone or in conjunction with other analyzers to produce mass spectra from analyte ions.Type: ApplicationFiled: September 30, 2011Publication date: January 10, 2013Applicant: BRUKER DALTONICS, INC.Inventor: Melvin Andrew PARK
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Patent number: 8344317Abstract: A novel system and methods for accelerating analytes including, without limitation, molecular ions, biomolecules, polymers, nano- and microparticles, is provided. The invention can be useful for increasing detection sensitivity in applications such as mass spectrometry, performing collision-induced dissociation molecular structure analysis, and probing surfaces and samples using accelerated analyte.Type: GrantFiled: February 2, 2012Date of Patent: January 1, 2013Assignee: Academia SinicaInventors: Chung-Hsuan Chen, Jung-Lee Lin, Nien-Yeen Hsu, Yi-Sheng Wang
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Patent number: 8344318Abstract: A plasma processing apparatus includes a process chamber, a platen positioned in the process chamber for supporting a workpiece, a source configured to generate a plasma in the process chamber, and a monitoring system including an ion mobility spectrometer configured to monitor a condition of the plasma. A monitoring method including generating a plasma in a process chamber of a plasma processing apparatus, supporting a workpiece on a platen in the process chamber, and monitoring a condition of the plasma with an ion mobility spectrometer is also provided.Type: GrantFiled: September 10, 2009Date of Patent: January 1, 2013Assignee: Varian Semiconductor Equipment Associates, Inc.Inventors: Kamal Hadidi, Bernard G. Lindsay
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Patent number: 8344315Abstract: The invention is a process for finding the accurate masses of subfragments comprising an unknown compound from the accurate-mass mass spectral data of the unknown compound obtained on a mass spectrometer. This process generates these accurate masses of subfragments using mass differences of fragment ions and a listing of plausible masses. In this way, the accurate masses of subfragments, useful for generating modular structures, can be obtained very rapidly.Type: GrantFiled: May 27, 2010Date of Patent: January 1, 2013Assignee: Math Spec, Inc.Inventor: Daniel Leo Sweeney
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Patent number: 8330100Abstract: Tandem time-of-flight mass spectrometry method and apparatus permits an ion gate to be time set optimally at all times if the instrumental conditions are modified. Delayed extraction conditions for the mass-to-charge ratios of plural reference substances and optimum values of the time for which the ion gate is opened are measured and stored in a data table. Delayed extraction conditions and opening time of the ion gate which optimize the mass resolution at the mass-to-charge ratio of the desired precursor ions are found based on values stored in the table.Type: GrantFiled: August 31, 2011Date of Patent: December 11, 2012Assignee: JEOL Ltd.Inventor: Takaya Satoh
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Patent number: 8330130Abstract: A charged particle beam device is described. The device includes an emitter unit including an emitter tip; a voltage supply unit adapted for providing a stable voltage to generate a stable extraction field at the emitter tip; a pulsed voltage supply member adapted for providing a pulsed voltage to generate a pulsed extraction field on top of the stable extraction field; a measuring unit for measuring an emitter characteristic; and a control unit adapted for receiving a signal from the measuring unit and for control of the pulsed voltage supply member.Type: GrantFiled: October 16, 2008Date of Patent: December 11, 2012Assignee: ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbHInventors: Dieter Winkler, Udo Weigel, Stefan Grimm
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Patent number: 8330099Abstract: A mass analyzer comprises a pair of planar electrode structures. The electrode structures are disposed opposite one another, parallel to one another, and axially offset from one another. One of the pair of planar electrodes comprises an opening. The mass analyzer comprises an ion mirror disposed between the pair of planar electrodes. A mass spectrometer and a mass spectrometry method are also described.Type: GrantFiled: March 30, 2011Date of Patent: December 11, 2012Assignee: Agilent Technologies, Inc.Inventors: Curt A. Flory, Trygve Ristroph
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Patent number: 8324566Abstract: In an RF quadrupole ion trap having electrodes to which RF voltages are applied, ions having m/z ratios outside of a predefined narrow range of charge-related masses m/z are removed from the trap by applying a DC voltage pulse to at least one of the trap electrodes to remove from the trap the ions with high values of charge-related masses. The DC voltage pulse is preferably applied in combination with a variation of the RF voltage amplitudes to simultaneously remove from the trap ions of low charge-related masses. The DC and RF voltage amplitudes are changed in such a manner that any excitation of ions having charge-related masses within the predefined range by frequency mixtures is avoided.Type: GrantFiled: March 1, 2011Date of Patent: December 4, 2012Assignee: Bruker Daltonik GmbHInventors: Desmond Allen Kaplan, Andreas Brekenfeld, Christoph Gebhardt, Ralf Hartmer
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Patent number: 8324567Abstract: An ion spectrum analysing apparatus (1) comprising an electric field generation arrangement (3, 4, 5) which, in use, is operative to accelerate ions into a flight tube (7), and further comprising a detector (6), and recording apparatus (8) which is operative to record data representative of the spatial distribution of scattered ions impacting on the detector, and in use the recording apparatus is triggered at multiple times to record spatial distribution data relating to respective times-of-arrival of the ions.Type: GrantFiled: December 12, 2008Date of Patent: December 4, 2012Assignee: University of SouthamptonInventors: Mark Brouard, Claire Vallance, Andrei Nomerotski
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Publication number: 20120298855Abstract: A flight-of-time mass spectrometer and method of flight-of-time mass spectrometry. The spectrometer includes a storage portion, a parameter adjusting portion, a parameter setting portion, and a flight time measuring portion. The parameter adjusting portion calculates values of an adjustment parameter correlated with any specified m/z value based on an adjustment table. The parameter setting portion sets the delayed extraction parameters of the ion source based on the values of the adjustment parameters calculated by the parameter adjusting portion.Type: ApplicationFiled: May 22, 2012Publication date: November 29, 2012Applicant: JEOL LTD.Inventor: Takaya SATOH
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Patent number: 8319178Abstract: A mass-spectrometry apparatus includes a substrate for mass spectrometry used in surface-assisted laser desorption/ionization mass spectrometry, a light irradiation means that irradiates sample S in contact with a surface of the substrate with measurement light L1 to desorb analyte R in sample S from the surface, a metal probe that generates near-field light at the leading end thereof by irradiation with measurement light L1, a detector that detects desorbed analyte Ri, and an analysis means that performs mass spectrometry on analyte R based on a detection result by the detector. The leading end of the metal probe is arranged in such a manner that the near-field light generated by irradiation with measurement light L1 is in contact with a measurement light irradiation portion of sample S. The metal probe is arranged, with respect to the measurement light irradiation portion, at a position different from the direction of the detector.Type: GrantFiled: May 21, 2010Date of Patent: November 27, 2012Assignee: Fujifilm CorporationInventor: Naoki Murakami