Plural Diverse-type Static Path-bending Fields Patents (Class 250/296)
  • Patent number: 9934954
    Abstract: In mass spectrometry, ion optics process a received ion beam into an output ion beam travelling in an output direction and having a spatial distribution in a plane perpendicular to the output direction elongated in one dimension of the plane relative to the other dimension of the plane and defines an axis of elongation thereby. A quadrupole ion optical device comprises first and second pairs of opposing elongated electrodes, receiving the output ion beam travelling along the output direction and defining an acceptance axis in a plane perpendicular to the direction of elongation of the first and second pairs of opposing elongated electrodes. The acceptance axis is an axis on which maximum acceptance of ions to the quadrupole ion optical device is attained. The first and second pairs of opposing elongated electrodes are oriented substantially to match the acceptance axis to the axis of elongation defined by the spatial distribution.
    Type: Grant
    Filed: January 24, 2017
    Date of Patent: April 3, 2018
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventor: Hans-Juergen Schlueter
  • Patent number: 9881770
    Abstract: A multi charged particle beam exposing method includes setting, in multiple exposures by a plurality of shots of each beam of multi-beams where the plurality of shots continuously irradiate a same irradiation position, a plurality of clock periods including at least one different clock period where the plurality of clock periods individually control an irradiation time of each beam of the multi-beams such that a clock period of at least one exposure processing differs from clock periods of other exposure processing, and exposing respective corresponding irradiation positions on a target object with the multi-beams by controlling, in each exposure processing of the multiple exposures, the irradiation time in exposure processing concerned using a clock period which has been set in the plurality of clock periods including the at least one different clock period.
    Type: Grant
    Filed: January 13, 2017
    Date of Patent: January 30, 2018
    Assignee: NuFlare Technology, Inc.
    Inventor: Hiroshi Matsumoto
  • Patent number: 9818575
    Abstract: A low profile extraction electrode assembly including an insulator having a main body, a plurality of spaced apart mounting legs extending from a first face of the main body, a plurality of spaced apart mounting legs extending from a second face of the main body opposite the first face, the plurality of spaced apart mounting legs extending from the second face offset from the plurality of spaced apart mounting legs extending from the first face in a direction orthogonal to an axis of the main body, the low profile extraction electrode assembly further comprising a ground electrode fastened to the mounting legs extending from the first face, and a suppression electrode fastened to the mounting legs extending from the second face, wherein a tracking distance between the ground electrode and the suppression electrode is greater than a focal distance between the ground electrode and the suppression electrode.
    Type: Grant
    Filed: November 16, 2015
    Date of Patent: November 14, 2017
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventor: Jeffrey A. Burgess
  • Patent number: 9698000
    Abstract: The disclosure features mass spectrometry systems that include: an ion source; a module featuring an ion trap, an ion detector, and a module housing that at least partially surrounds the ion trap and the ion detector; and a vacuum pump featuring a housing having a recess dimensioned to receive the module, so that when the module is positioned within the recess of the vacuum pump housing, a portion of the module is surrounded by the vacuum pump housing, and during operation of the system, the ion source, ion trap, ion detector, and vacuum pump are connected along a common gas flow path and heat is transferred from the vacuum pump to the module.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: July 4, 2017
    Assignee: 908 Devices Inc.
    Inventors: Tony Liepert, Kevin McCallion, Christopher D. Brown, Kevin J. Knopp, Michael Jobin
  • Patent number: 9594879
    Abstract: A computer implemented system and method for determining the isotopic anatomy of molecules. The system receives a user identified molecule that is to be analyzed, makes an initial guess as to the isotopic anatomy of the molecule, and iteratively refines the initial guess based on one or more observations made by the user. When sufficient iterations have been performed, the system outputs information about the isotopic anatomy of the molecule. The information may then be stored, displayed on a monitor, analyzed for making other conclusions, and/or printed.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: March 14, 2017
    Assignee: California Instutute of Technology
    Inventor: John M. Eiler
  • Patent number: 9564546
    Abstract: An interconnector for electrically connecting a first electronic device element and a second electronic device element includes first and second connection portions which are respectively connected to electrodes of the first and second electronic device elements. A plurality of strip-like intermediate portions are each connected to both the first connection portion and the second connection portion to electrically connect the first connection portion and the second connection portion. The intermediate portions are mutually separated from one another in the width direction and mutually extending in parallel directions. Each intermediate portion has a first curved portion which is curved to be concave at one side of the respective intermediate portion in the width direction, and a second curved portion which is curved to be concave at another side of the respective intermediate portion in the width direction.
    Type: Grant
    Filed: July 10, 2009
    Date of Patent: February 7, 2017
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventor: Mitsuru Okubo
  • Patent number: 9564306
    Abstract: The present invention relates to a compact and portable mass spectrometer device comprising a source of ions, a non-scanning magnetic sector for separating ions originating at the source of ions according to their mass-to-charge ratios, and a detection means. The magnetic sector comprises an ion entrance plane and at least two ion exit planes, which allow to optimize the resolving power of the mass spectrometer for specific mass-to charge ratio sub-ranges.
    Type: Grant
    Filed: January 7, 2014
    Date of Patent: February 7, 2017
    Assignee: Luxembourg Institute of Science and Technology (LIST)
    Inventors: Hung Quang Hoang, David Dowsett, Tom Wirtz
  • Patent number: 8759751
    Abstract: Methods and analyzers useful for time of flight mass spectrometry are provided.
    Type: Grant
    Filed: May 24, 2011
    Date of Patent: June 24, 2014
    Assignee: Thermo Fisher Scientific (Brmen) GmbH
    Inventors: Alexander Makarov, Anastassios Giannakopulos
  • Publication number: 20140145076
    Abstract: A cross-flow ion mobility spectrometer consists of two parallel plates defining a volume between them. Analyte ions flow along an axis from an entrance end to an exit end through the volume. An RF confining field tends to guide ions along the axis. An analytical gas flow is established orthogonal to the axis. A DC electrostatic analytical field is oriented in opposition to the analytical gas flow such that the “drag force” on ions of the selected mobility due to the analytical gas flow is balanced by the force on the ions due to the electrostatic analytical field. The selected ions are thereby able to follow a stable path to the exit end of the cross-flow mobility analyzer. However, the force on ions of other than the selected mobility is unbalanced and these ions are deflected and lost.
    Type: Application
    Filed: November 29, 2012
    Publication date: May 29, 2014
    Applicant: BRUKER DALTONICS, INC.
    Inventor: Melvin Andrew PARK
  • Patent number: 8698072
    Abstract: A high-quality mass spectrum is provided with alleviated mass/charge axis deviation in a triple quadrupole mass spectrometer even when executing a high-speed mass scan with MS/MS analysis. Mass calibration tables which denote relations between m/z and a mass deviation value which scan speed is a parameter are prepared separately for use in MS analyses without involving dissociation operations and MS/MS analyses with involving dissociation operations. According to a measuring mode, such as a product ion scan measurement or a neutral loss scan measurement, when performing MS/MS analysis, a mass deviation value for the minimum scan speed in a table is used for a quadrupole where the selected m/z is fixed, and a mass deviation value for a designated scan speed in a table is used for a quadrupole where the mass scan is performed, thus controlling the operations of each of a pre-stage and a post-stage quadrupoles.
    Type: Grant
    Filed: September 30, 2011
    Date of Patent: April 15, 2014
    Assignee: Shimadzu Corporation
    Inventors: Hiroshi Sugawara, Daisuke Okumura
  • Patent number: 8598516
    Abstract: The present invention relates to the analytical electronics used to identify compositions and structures of substances, in particular, to the analyzers comprising at least one mass-spectrometer (MS) and may be applied in such fields as medicine, biology, gas and oil industry, metallurgy, energy, geochemistry, hydrology, ecology. Technical result provides the increase in MS resolution, gain in sensitivity, precision and measurement rates of substances compositions and structures concurrently with enhancement of analyzer functional capabilities, downsizing and mass reduction. In claimed invention the ion flux generation and its guiding are performed in off-axis single-flow mode; parallel multi-stage mode; through use of three-dimensional field with mean meridian surface including without limitation three-dimensional reflecting and dual-zoned reflecting modes or by method of multi-reflection arrays. Devices to implement the claimed method are embodied.
    Type: Grant
    Filed: January 9, 2013
    Date of Patent: December 3, 2013
    Inventors: Yerbol Aldanovich Sapargaliyev, Aldan Asanovich Sapargaliyev
  • Patent number: 8592757
    Abstract: A mass spectrometer for analyzing isotopic signatures, with at least one magnetic analyzer and optionally with an electric analyzer as well, with a first arrangement of ion detectors and/or ion passages and, arranged downstream thereof in the direction of the ion beam, a second arrangement of ion detectors, with at least one deflector in the region of the two arrangements of ion detectors or between these arrangements. Additionally, a multi-collector arrangement, special uses and a method for analyzing isotopes in a sample. The mass spectrometer according to the invention has a control for the at least one deflector such that ion beams of different isotopes can be routed to at least one ion detector in the second arrangement.
    Type: Grant
    Filed: June 10, 2010
    Date of Patent: November 26, 2013
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Johannes Schwieters, Silke Seedorf, Michael Deerberg
  • Patent number: 8546768
    Abstract: A device for generating an ion beam includes a support; a liquid metal ion source connected to the support at the lower end of the ion source and surrounded by a cryogenic trap which is capable of preventing volatile chemicals from reaching the ion source; an ion extraction means for extracting the ions emitted by the source through an opening disposed near the upper end of the ion source; and means for generating a magnetic field in the opening of the extraction means, the generated magnetic field capable of preventing charged particles from reaching the ion source.
    Type: Grant
    Filed: September 14, 2009
    Date of Patent: October 1, 2013
    Assignee: Centre National de la Recherche Scientifique (C.N.R.S.)
    Inventors: Jacques Gierak, Ralf Jede
  • Patent number: 8536524
    Abstract: Systems and methods for high speed mud gas logging are described. A general workflow of mud gas logging uses tandem mass spectroscopy. The workflow involves first separating the volatile components of the hydrocarbons (typically C8 and below) from the drilling fluid using a fluid extractor (or degaser). Extracted gases are then diluted in air and transported to an analyzer, which measures the concentration of each of those gases in air. A tandem mass spectroscopy-based analyzer is used that is able to quantify each of those hydrocarbon components, including resolving isomeric species, while tolerating the presence of the non-hydrocarbons. According to some embodiments, triple quadrapole mass spectroscopy is used.
    Type: Grant
    Filed: October 6, 2011
    Date of Patent: September 17, 2013
    Assignee: Schlumberger Technology Corporation
    Inventors: Andrew E. Pomerantz, Jerome Breviere
  • Patent number: 8410415
    Abstract: The present disclosure provides an ion detector for improving the effect of electric field for pulling in an ion to be detected to a first-stage electrode of a secondary electron multiplier (SEM), and improving the effect of a stray light reduction. In one example embodiment, an ion detector includes a SEM, and a lead-in electrode for pulling in an ion to a first-stage electrode side of the SEM. At least one of the area of the lead-in electrode and a potential difference between the lead-in electrode and neighboring electrodes of the lead-in electrode, the neighboring electrode being an electrode not of the SEM, is set so that the light amount of internal-stray light generated inside the detector entering the first-stage electrode is not more than that of external-stray light generated outside the detector entering the first-stage electrode, when an ion is introduced into the detector.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: April 2, 2013
    Assignee: Canon Anelva Corporation
    Inventors: Megumi Nakamura, Yoshiro Shiokawa, Qiang Peng
  • Patent number: 8373121
    Abstract: An achromatic magnetic mass spectrometer, for example of the SIMS type with double focusing, comprises means for canceling the four aberrations of the second order, and means for canceling the off-axis achromatism and for modulating the dispersion in mass.
    Type: Grant
    Filed: January 29, 2010
    Date of Patent: February 12, 2013
    Assignee: Cameca
    Inventor: Emmanuel De Chambost
  • Patent number: 8357893
    Abstract: An ion mobility sensor system including an ion mobility spectrometer and a differential mobility spectrometer coupled to the ion mobility spectrometer. The ion mobility spectrometer has a first chamber having first end and a second end extending along a first direction, and a first electrode system that generates a constant electric field parallel to the first direction. The differential mobility spectrometer includes a second chamber having a third end and a fourth end configured such that a fluid may flow in a second direction from the third end to the fourth end, and a second electrode system that generates an asymmetric electric field within an interior of the second chamber. Additionally, the ion mobility spectrometer and the differential mobility spectrometer form an interface region. Also, the first end and the third end are positioned facing one another so that the constant electric field enters the third end and overlaps the fluid flowing in the second direction.
    Type: Grant
    Filed: September 23, 2009
    Date of Patent: January 22, 2013
    Assignee: UT-Battelle, LLC
    Inventors: Jun Xu, David B. Watson, William B. Whitten
  • Patent number: 8294093
    Abstract: An E×B Wien mass filter provides an independently-adjustable electric field combined with the dipole electric field required for mass separation. The independently adjustable electric field can be used provide a larger optical aperture, to correct astigmatism and to deflect the beam in direction parallel and/or perpendicular to the magnetic field.
    Type: Grant
    Filed: April 19, 2011
    Date of Patent: October 23, 2012
    Assignee: FEI Company
    Inventors: David Tuggle, N. William Parker
  • Publication number: 20120211651
    Abstract: An isotope ratio mass spectrometer is described that obtains direct ratios of atomic isotopes in a monoenergetic beam of negative ions by passing them through a collision cell at specific kinetic energies for which the relative production of positive ions from the negative ions is calculable from the isotopic masses.
    Type: Application
    Filed: February 21, 2011
    Publication date: August 23, 2012
    Inventor: John Stephen Vogel
  • Patent number: 8203119
    Abstract: The invention provides a charged particle beam device to inspect or structure a specimen with a primary charged particle beam propagating along an optical axis; a beam tube element having a tube voltage; and a retarding field analyzer in the vicinity of the beam tube element to detect secondary charged particles generated by the primary charged particle beam on the specimen. According to the invention, the retarding field analyzer thereby comprises an entrance grid electrode at a second voltage; at least one filter grid electrode at a first voltage; a charged particle detector to detect the secondary charged particles; and at least one further electrode element arranged between the entrance grid electrode and the at least one filter grid electrode. The at least one further electrode element reduces the size of the stray fields regions in the retarding electric field region to improve the energy resolution of the retarding field analyzer.
    Type: Grant
    Filed: June 10, 2005
    Date of Patent: June 19, 2012
    Assignee: ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
    Inventors: Ralf Degenhardt, Hans-Peter Feuerbaum, Dirk Hambach, Walter Kögler, Harry Munack, Carlo Salvesen
  • Patent number: 8193490
    Abstract: The compensation potentials on the compensation electrodes of an ICR measuring cell are sequentially adjusted so that an ICR measurement with the longest possible usable image current transient is produced. Then, subsequent ICR measurements are made using the ICR cell with the optimally adjusted compensation potentials. Depending on the kind of ion mixture involved, measurements with image current transients from 10 to more than 20 seconds long can be performed, from which mass spectra with a maximum mass resolution without peak coalescence can be obtained.
    Type: Grant
    Filed: December 14, 2009
    Date of Patent: June 5, 2012
    Assignee: Bruker Daltonik GmbH
    Inventors: Roland Jertz, Gökhan Baykut
  • Publication number: 20120097847
    Abstract: The present disclosure provides an ion detector for improving the effect of electric field for pulling in an ion to be detected to a first-stage electrode of a secondary electron multiplier (SEM), and improving the effect of a stray light reduction. In one example embodiment, an ion detector includes a SEM, and a lead-in electrode for pulling in an ion to a first-stage electrode side of the SEM. At least one of the area of the lead-in electrode and a potential difference between the lead-in electrode and neighboring electrodes of the lead-in electrode, the neighboring electrode being an electrode not of the SEM, is set so that the light amount of internal-stray light generated inside the detector entering the first-stage electrode is not more than that of external-stray light generated outside the detector entering the first-stage electrode, when an ion is introduced into the detector.
    Type: Application
    Filed: October 21, 2011
    Publication date: April 26, 2012
    Applicant: CANON ANELVA CORPORATION
    Inventors: Megumi Nakamura, Yoshiro Shiokawa, Qiang Peng
  • Patent number: 8026480
    Abstract: A basic ion optical system (2) in which the temporal focusing of ions is ensured includes a plurality of sector-shaped electrodes (11, 12, 13, and 14), an ion injection slit (15), and an ion ejection slit (16), which are placed on the same plane. A plurality of basic ion optical systems (2) are placed in such a manner as to be mutually separated at predetermined intervals in the direction approximately orthogonal to their planes. The ion ejection slit (16) of the lower-stage basic ion optical system (2) and the ion injection slit (15) of the next-stage basic ion optical system (2) are connected to each other via another basic ion optical system (3) in which the temporal focusing of the ions is ensured. Accordingly, the flight distance can be elongated while assuredly achieving the temporal focusing of the ions as an entire ion optical system (1), and a three-dimensional space can be efficiently utilized to compactify the ion optical system (1).
    Type: Grant
    Filed: May 22, 2007
    Date of Patent: September 27, 2011
    Assignee: Shimadzu Corporation
    Inventors: Shinichi Yamaguchi, Masaru Nishiguchi
  • Patent number: 8013297
    Abstract: Disclosed is an ion gate for a dual IMS and method. The ion gate includes an ion source, a first gate electrode placed on one side of the ion source, a second gate electrode placed on the other side of the ion source, a third gate electrode placed on the side of the first gate electrode away from the ion source, a fourth gate electrode placed on the side of the second gate electrode away from the ion source, wherein during the ion storage, the potential at the position on the tube axis of the ion gate corresponding to the first gate electrode is different from the potentials at the positions on the tube axis corresponding to the ion source and the third gate electrode, and the potential at the position on the tube axis corresponding to the second gate electrode is different from the potentials at the positions on the tube axis corresponding to the ion source and the fourth gate electrode.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: September 6, 2011
    Assignees: Nuctech Company Limited, Tsinghua University
    Inventors: Hua Peng, Qingjun Zhang, Jin Lin, Yuanjing Li, Zhiqiang Chen, Shaoji Mao, Zhude Dai, Dai Hua, legal representative, Shiping Cao, Zhongxia Zhang, Yangtian Zhang, Dexu Lin, Qinghua Wang
  • Patent number: 8013296
    Abstract: Ions and charged droplets move from the nozzle (6) towards the orifice (22) of a charged-particle transport device or the desolvation pipe (7). This particle motion is governed by the distribution of the pseudo-potential along particle trajectories. There are RF-voltages applied to neighboring electrodes (241-246) of the electrode array (24) cause the charged particles to substantially hover above the electrode array (24). Right before the ions come to the electrode array (24) they thus experience a repelling force “F” perpendicular to the surface of the electrode array (24). This force “F” causes an effective barrier (B) right before the electrode array (24) and consequently a pseudo-potential well (A) where the charged particles stop their motion parallel to the plume axis (D). Thus they accumulate around the center line (C) of this well (A).
    Type: Grant
    Filed: May 21, 2007
    Date of Patent: September 6, 2011
    Assignee: Shimadzu Corporation
    Inventors: Hermann Wollnik, Yoshihiro Ueno
  • Patent number: 8013292
    Abstract: One cycle of loop orbit is formed by two identical time-focusing unit structures (T1 and T2). Each of the time-focusing unit structures (T1 and T2) has a time-focusing point (P1) at the injection side and a time-focusing point (P2) at the ejection side. Each of them also has an injection-side free flight space (11) with a length of L1 and an ejection-side free flight space (12) with a length of L1, respectively anterior and posterior to a basic ion optical element (10) for causing ions to fly along a substantially arc-shaped orbit. Another basic ion optical element (30) having the same configuration as that of the basic ion optical element (10) is inserted to the injection-side free flight space (11) so that the distance between the ejection end of the basic ion optical element (30) and the injection end of the basic ion optical element (10) is L1?. The length L0 of the free flight space for injecting ions to the basic ion optical element (30) is set to be the value obtained by L0=2(L1+L2)?(L1?+L2).
    Type: Grant
    Filed: May 9, 2007
    Date of Patent: September 6, 2011
    Assignee: Shimadzu Corporation
    Inventor: Masaru Nishiguchi
  • Patent number: 7932487
    Abstract: A mass spectrometer includes at least one ion selector, at least one collision cell, and an ion path switching device arranged to define a looped ion path around which ions derived from a sample may be sent multiple times (without reversal of ion travel) in order to effect a desired number of isolation/fragmentation cycles for MSn analysis. When the desired number of isolation/fragmentation cycles have been completed, the ion path switching device directs the ions to a detector or a separate mass analyzer for acquisition of a mass spectrum.
    Type: Grant
    Filed: January 11, 2008
    Date of Patent: April 26, 2011
    Assignee: Thermo Finnigan LLC
    Inventors: Viatcheslav V. Kovtoun, Alexander Alekseevich Makarov
  • Publication number: 20110057097
    Abstract: A mass spectrometer is disclosed comprising a 2D or 3D ion trap. The 2D ion trap comprises a quadrupole rod set ion trap wherein a slot is provided in each of the rods 1 to allow ions to be ejected radially from the ion trap. The 3D ion trap comprises a central ring electrode which is radially segmented and wherein a slot is provided in each radial segment to allow ions to be ejected radially from the ion trap. Ions having different mass to charge ratios and/or opposite polarities may be simultaneously ejected from the ion trap via different exit pathways.
    Type: Application
    Filed: February 21, 2008
    Publication date: March 10, 2011
    Applicant: MICROMASS UK LIMITED
    Inventors: Robert Harold Bateman, Martin Green, Jason Lee Wildgoose
  • Patent number: 7842919
    Abstract: A Q-pole type mass spectrometer can be used under a high-pressure atmosphere of more than 0.1 Pa. The Q-pole type mass spectrometer can analyze the mass of gas molecules continuously, and can separate mass properly even if an ion is injected at high speed in order to reduce the influence of an end electric field near an end face (fringing) of the Q-pole. The motion of the ions to be measured in the diameter direction is independent of the motion of ions in the axial direction within the Q-pole region of the Q-pole type mass spectrometer. In the Q-pole type mass spectrometer installed in a reduced pressure atmosphere, the motion of ions to be measured in the axial direction advancing from an ion source toward a collector, is controlled within the Q-pole region so as to separate the mass of the ions to be measured by Coulomb force generated by a quadrupole high-frequency electric field in the diameter direction.
    Type: Grant
    Filed: February 25, 2008
    Date of Patent: November 30, 2010
    Assignee: Canon Anelva Corporation
    Inventor: Yoshiro Shiokawa
  • Patent number: 7755040
    Abstract: An electric field source for a mass spectrometer and a mass spectrometer are described.
    Type: Grant
    Filed: September 24, 2007
    Date of Patent: July 13, 2010
    Assignee: Agilent Technologies, Inc.
    Inventors: Gangqiang Li, Alexander Mordehai
  • Patent number: 7755036
    Abstract: A novel instrument and method for TOF/TOF mass spectrometry is offered. A spiral trajectory time-of-flight mass spectrometer satisfies the spatial focusing conditions for the direction of flight and a direction orthogonal to the direction of flight whenever ions make a turn in the spiral trajectory. An ion gate for selecting precursor ions is placed in the spiral trajectory of the spiral trajectory time-of-flight mass spectrometer. Electric sectors are placed downstream of the ion gate.
    Type: Grant
    Filed: January 10, 2008
    Date of Patent: July 13, 2010
    Assignee: Jeol Ltd.
    Inventor: Takaya Satoh
  • Patent number: 7728290
    Abstract: A method of obtaining a mass spectrum of elements in a sample is disclosed. Sample precursor ions having a mass to charge ratio M/Z are generated, and fragmented at a dissociation site, so as to produce fragment ions of mass to charge ratio m/z. The fragment ions are guided into an ion trap of the electrostatic or “Orbitrap” type, the fragment ions entering the trap in groups dependent upon the precursor ions M/Z. The mass to charge ratio of each group is determined from the axial movement of ions in the trap. The electric field in the trap is distorted. Ions of the same m/z, that are derived from different pre-cursor ions, are then separated, because the electric field distortion causes the axial movement to become dependent upon factors other than m/z alone.
    Type: Grant
    Filed: July 1, 2008
    Date of Patent: June 1, 2010
    Assignee: Thermo Finnigan LLC
    Inventor: Alexander Makarov
  • Patent number: 7679054
    Abstract: The present invention relates to e.g. a charged particle beam energy width reduction system for a charged particle beam with a z-axis along the optical axis and a first and a second plane, comprising, a first element acting in a focusing and dispersive manner, a second element acting in a focusing and dispersive manner, a first quadrupole element being positioned such that, in operation, a field of the first quadrupole element overlaps with a field of the first element acting in a focusing and dispersive manner, a second quadrupole element being positioned such that, in operation, a field of the second quadrupole element overlaps with a field of the second element acting in a focusing and dispersive manner, a first charged particle selection element being positioned, in beam direction, before the first element acting in a focusing and dispersive manner, and a second charged particle selection element being positioned, in beam direction, after the first element acting in a focusing and dispersive manner.
    Type: Grant
    Filed: September 2, 2004
    Date of Patent: March 16, 2010
    Assignee: ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
    Inventors: Jürgen Frosien, Ralf Degenhardt, Stefan Lanio
  • Patent number: 7679051
    Abstract: A system and method for separating ions in an ion mixture, such as a plasma in space. The ion mixture enters an electrostatic analyzer, whose ion path has at least two sections. A first section applies a DC voltage to the ions, and a next section applies an RF frequency voltage to the ions. Appropriate DC and RF voltages are applied, such that at least a portion of the lower mass ions are absorbed into the RF section of the analyzer. The heaver ions are transmitted out of the ion path and are readily available for further analysis.
    Type: Grant
    Filed: May 17, 2006
    Date of Patent: March 16, 2010
    Assignee: Southwest Research Institute
    Inventor: James L. Burch
  • Patent number: 7498572
    Abstract: A deflecting electromagnet has first and second magnetic poles that are opposed to each other via an inter-pole space through which an ion beam passes. The deflecting electromagnet further has: a pair of potential adjusting electrodes which are placed to sandwich a path of the ion beam in the same directions as the magnetic poles in the inter-pole space; and a DC potential adjusting power source which applies a positive voltage to the potential adjusting electrodes. The deflecting electromagnet further has a permanent-magnet group for, in the inter-pole space, forming a mirror magnetic field in which intensity is low in the vicinity of the middle in an ion beam passing direction, and intensities in locations which are respectively nearer to an inlet and an outlet are higher than the intensity in the vicinity of the middle.
    Type: Grant
    Filed: September 12, 2006
    Date of Patent: March 3, 2009
    Assignee: Nissin Ion Equipment Co., Ltd.
    Inventor: Hideki Fujita
  • Publication number: 20090014647
    Abstract: The present invention pertains to a method and apparatus which increases the efficiency with which ions are transported from a first ion trap to a second ion trap, and subsequently trapped in the second ion trap. In one aspect the invention, increased efficiency takes the form or enabling ions of both high and low mass to charge ratios to be trapped in the second ion trap at substantially the same time, or at least within a relatively small window of time. This can be achieved by minimizing the undesirable time-of-flight separation by the high and low mass to charge ratio ions as they are transported from a first ion trap to the second ion trap. This minimization can be realized by adjusting the potential energy applied to ion transfer optics disposed between the two ion traps.
    Type: Application
    Filed: July 13, 2007
    Publication date: January 15, 2009
    Inventor: Michael W. Senko
  • Publication number: 20090014646
    Abstract: The present invention provides a novel approach for reliably and accurately detecting and identifying airborne particles. This is done by providing a novel system which incorporates electrostatic concentrators and/or ion mobility separators with Raman, IR, UV, XRF, LIF and LIBS spectroscopy and/or other spectroscopic techniques.
    Type: Application
    Filed: February 13, 2007
    Publication date: January 15, 2009
    Inventors: Daryoosh Vakhshoori, Peili Chen
  • Patent number: 7476854
    Abstract: A detector system for detecting trace molecules. The detector includes an ion trap that is coupled to an ionizer and a detector. The system also includes a controller that can generate voltage potentials within the ion trap. The controller can generate a voltage waveform to isolate one or more ions within the ion trap. The controller can then generate a voltage to dissociate the isolated ion(s). The controller can vary the dissociating voltage to dissociate and detect different ions. For example, the controller may vary the amplitude of the voltage to dissociate a target ion. Other techniques are described which generally improve the speed of detecting different target ions.
    Type: Grant
    Filed: February 3, 2005
    Date of Patent: January 13, 2009
    Assignee: Syagen Technology
    Inventors: Jack A. Syage, Karl A. Hanold
  • Patent number: 7473905
    Abstract: There is disclosed an electrostatic deflector having four pillar-like identical electrodes spaced from each other by 90°. An even number of pillar-like electrodes are disposed in each space between the four electrodes. Spaces are formed on both sides of each one of the first electrodes and have bent portions. The even number of electrodes are arranged symmetrically relative to a third or fourth vertical plane including an axis spaced from the X-axis by 45° or ?45°, respectively. Holes are formed across each of the third and fourth vertical planes. Rod-like members are inserted in the holes.
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: January 6, 2009
    Assignee: Jeol Ltd.
    Inventor: Kazuya Goto
  • Publication number: 20080185518
    Abstract: A method of aligning sets of cylindrical electrodes in the geometry of a miniature quadrupole electrostatic lens, which can act as a mass filter in a quadrupole mass spectrometer is provided. The electrodes are mounted in pairs on microfabricated supports, which are formed from conducting parts on an insulating substrate. Complete segmentation of the conducting parts provides low capacitative coupling between co-planar cylindrical electrodes, and allows incorporation of a Brubaker prefilter to improve sensitivity at a given mass resolution. A complete quadrupole is constructed from two such supports, which are spaced apart by further conducting spacers. The spacers are continued around the electrodes to provide a conducting screen.
    Type: Application
    Filed: January 29, 2008
    Publication date: August 7, 2008
    Inventor: Richard Syms
  • Patent number: 7402799
    Abstract: A MEMS mass spectrometer having metal walls connected between a lid and base, with the walls defining a plurality of interior chambers including sample gas input chambers, an ionizer chamber, a plurality of ion optics chambers and a ion separation chamber. A detector array at the end of the ion separation chamber includes a plurality of V-shaped detector elements positioned along two parallel lines and arranged to intercept all of the ionized beams produced in the mass spectrometer.
    Type: Grant
    Filed: October 28, 2005
    Date of Patent: July 22, 2008
    Assignee: Northrop Grumman Corporation
    Inventor: Carl B. Freidhoff
  • Publication number: 20080135746
    Abstract: A mass spectrometer is disclosed comprising an ion mobility spectrometer or separator (3) arranged upstream of a collision or fragmentation cell (5). Ions are separated according to their ion mobility within the ion mobility spectrometer or separator (3). The kinetic energy of the ions exiting the ion mobility spectrometer or separator (3) is increased substantially linearly with time in order to optimise the fragmentation energy of ions as they enter the collision or fragmentation cell (5).
    Type: Application
    Filed: September 14, 2005
    Publication date: June 12, 2008
    Applicant: MICROMASS UK LIMITED
    Inventors: Jason Lee Wildgoose, Steven Derek Pringle, Kevin Giles, Robert Harold Bateman
  • Patent number: 7378651
    Abstract: Disclosed is an apparatus for separating ions including a plurality of first electrode portions, each first electrode portion of the plurality of first electrode portions having a first length and an outer surface that is at least partially curved in a direction transverse to the first length. The apparatus also includes a plurality of second electrode portions arranged in an alternating sequence with the plurality of first electrode portions, each second electrode portion of the plurality of second electrode portions having a second length and an outer surface that is curved in a direction transverse to the second length, a space between the outer surface of a first electrode portion and the outer surface of an adjacent second electrode portion defining a portion of an analytical gap for separating ions.
    Type: Grant
    Filed: September 5, 2003
    Date of Patent: May 27, 2008
    Assignee: Thermo Finnigan LLC
    Inventor: Roger Guevremont
  • Patent number: 7351955
    Abstract: A MALDI mass spectrometer includes a radiation source, such as a gas or solid state laser, that emits a beam of radiation (typically in the UV or IR wavelengths) directed along the central axis of a linear ion trap in which analyte ions and matrix cluster ions are confined. The radiation beam has a wavelength that is strongly absorbed by the matrix cluster ions. The absorption of radiation by the matrix cluster ions produces dissociation of the matrix cluster ion into fragments having mass-to-charge ratios that lie below a mass-to-charge ratio range of interest. Thus, chemical noise associated with matrix cluster ions is reduced or eliminated.
    Type: Grant
    Filed: September 9, 2005
    Date of Patent: April 1, 2008
    Assignee: Thermo Finnigan LLC
    Inventor: Viatcheslav V. Kovtoun
  • Patent number: 7211788
    Abstract: A mass filter apparatus for filtering a beam of ions is described. The apparatus comprises an ion beam source and first and second mass filter stages in series to receive the ion beam. A vacuum system maintains the first and second filter stages at substantially the same operating pressure, below 10?3 torr. The first mass filter stage transmits only ions having a sub-range of mass-to-charge ratios including a selected mass-to-charge ratio. The second filter transmits only ions of the selected mass-to-charge ratio. The second mass filter can achieve high accuracy detection without being subjected to problems such as build-up of material on quadrupole rods, resulting in a distorted electric field close to the rods. The first mass filter acts as a coarse filter, typically transmitting 1% of ions received from the ion source. Thus, the detection accuracy and lifetime of mass spectrometers embodying this invention are greatly improved.
    Type: Grant
    Filed: May 13, 2003
    Date of Patent: May 1, 2007
    Assignee: Thermo Fisher Scientific Inc.
    Inventor: Philip Marriott
  • Patent number: 7176452
    Abstract: A beam modulation device gate is constructed from a silicon material, such as a silicon layer on an silicon on insulator wafer. The device further comprises a set of electrical contacts on the layer. The layer defines a set of electrically conducting silicon material fingers forming an array, wherein each of at least some of the fingers is connected electrically to one of the electrical contacts. The gate may be used in a mass or ion mobility spectrometer. Where the gate is constructed from a silicon on insulator wafer, an insulator layer supports the silicon layer and a handle layer supports the insulator layer. When predetermined electrical potentials are applied to the electrical contacts, at least some of the fingers will be substantially at said predetermined electrical potentials to modulate a beam of charged particles that passes through said array of fingers.
    Type: Grant
    Filed: April 15, 2005
    Date of Patent: February 13, 2007
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Ignacio A. Zuleta, Richard N. Zare
  • Patent number: 7115861
    Abstract: A mass spectrometer is provided for identifying mass and velocity distributions in a continuous ion beam is configured with a circular dispersive system creating a rotating electromagnetic field, which is capable of deflecting the ion beam from an initial direction, and a circular position-sensitive detector intercepting the deflected ion beam and providing information from which the ion mass-per-charge ratio is determined
    Type: Grant
    Filed: September 10, 2003
    Date of Patent: October 3, 2006
    Assignee: The Johns Hopkins University
    Inventor: Stefano A. Livi
  • Patent number: 7012248
    Abstract: A CMOS time-of-flight “TOF” system-on-a-chip “SoC” for precise time interval measurement with low power consumption and high counting rate has been developed. The analog and digital TOF chip may include two Constant Fraction Discriminators “CFDs” and a Time-to-Digital Converter “TDC”. The CFDs can interface to start and stop anodes through two preamplifiers and perform signal processing for time walk compensation (110). The TDC digitizes the time difference with reference to an off-chip precise external clock (114). One TOF output is an 11-bit digital word and a valid event trigger output indicating a valid event on the 11-bit output bus (116).
    Type: Grant
    Filed: April 10, 2003
    Date of Patent: March 14, 2006
    Assignee: The Johns Hopkins University
    Inventor: Nicholas P. Paschalidis
  • Patent number: 6984821
    Abstract: A mass spectrometer includes a magnetic sector configured to separate a plurality of ion beams, and an electrostatic sector configured to receive the plurality of ion beams from the magnetic sector and increase separation between the ion beams, the electrostatic sector being used as a dispersive element following magnetic separation of the plurality of ion beams. Other apparatus and methods are provided.
    Type: Grant
    Filed: June 16, 2004
    Date of Patent: January 10, 2006
    Assignee: Battelle Energy Alliance, LLC
    Inventors: Anthony D. Appelhans, John E. Olson, James E. Delmore
  • Patent number: 6924478
    Abstract: Multiply charged ions are trapped and accumulated in a spatially limited region before being injected into an ion trap mass spectrometer such as a Fourier transform ion cyclotron resonance mass spectrometer (FTICR MS). In the ion trap electron capture dissociation (ECD) and vibrational excitation dissociation are sequentially applied on ions of the same ion ensemble. The first dissociation process does not fragment all primary ions. Following the detection of the dissociation products, the primary ions that remain undissociated undergo the vibrational excitation and again, a part of them dissociate, and the fragments are detected. Thus, the same ion ensemble is used for two fragmentation processes. During these processes, further ions generated in the external ion source are accumulated in the spatially limited region for subsequent analyses.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: August 2, 2005
    Assignee: Bruker Daltonik GmbH
    Inventors: Roman Zubarev, Gökhan Baykut, Matthias Witt