Including A Radioactive Source Patents (Class 250/308)
  • Patent number: 9894966
    Abstract: A coin comprises a core made of a first metal, an outer ring surrounding the core concentrically and made of a further metal, and a central ring between the core and outer ring fixedly connected thereto. The central ring consists of an electrically insulating material. Further, the central ring is transparent to electromagnetic waves of a first wavelength range and is less transparent or not transparent to a second wavelength range. Methods for testing the coin are also described.
    Type: Grant
    Filed: July 26, 2013
    Date of Patent: February 20, 2018
    Assignee: Crane Payment Innovations, Inc.
    Inventors: Klaus Meyer-Steffens, Hans-Ulrich Cohrs, Wilfried Meyer
  • Patent number: 9897318
    Abstract: A rotary machine including: a casing providing an annular chamber for rotating components of the machine; a cooling passage extending through the casing or mounted to a surface of casing; a plug assembly connected to the cooling passage and in the casing or mounted to the casing, wherein the plug assembly includes a collar and a conduit aligned with an axis of the collar, and the collar includes a cooling air by-pass passage in fluid communication with the cooling passage such that cooling air from the cooling passage flows through the by-pass passage and returns to the cooling passage, and another cooling passage or a port extending through the conduit of the plug assembly.
    Type: Grant
    Filed: October 29, 2014
    Date of Patent: February 20, 2018
    Assignee: General Electric Company
    Inventors: Sivaraman Vedhagiri, Brian David Moran, Shawn Kelley
  • Patent number: 9869694
    Abstract: An apparatus and method of collecting topography, mechanical property data and electrical property data with an atomic force microscope (AFM) in either a single pass or a dual pass operation. PFT mode is preferably employed thus allowing the use of a wide range of probes, one benefit of which is to enhance the sensitivity of electrical property measurement.
    Type: Grant
    Filed: December 15, 2015
    Date of Patent: January 16, 2018
    Assignee: Bruker Nano, Inc.
    Inventors: Chunzeng Li, Yan Hu, Ji Ma, Jianli He, Lin Huang, Stephen C. Minne, Henry Mittel, Weijie Wang, Shuiqing Hu, Chanmin Su
  • Patent number: 9746432
    Abstract: Disclosed is an attachable spacer applied to the front base plate of a hand-held and self-contained XRF testing device that holds the face plate at a forwards tilt towards a test sample, and ensures that only the top rim of the face plate ever touches a test sample. The resulting triangular gap minimizes contact between the front plate window and the test surface, prevents the transfer of heat to the XRF testing device's circuitry, and locks in a fixed distance between the face plate of the XRF testing device and the sample being tested.
    Type: Grant
    Filed: September 23, 2014
    Date of Patent: August 29, 2017
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Kenneth Lee Smith, Jr., Ted Michael Shields
  • Patent number: 9678220
    Abstract: The present invention relates to an x-ray detector comprising a sensor unit for detecting incident x-ray radiation comprising a number of sensor elements, a counting channel per sensor element for obtaining a count signal by counting photons or charge pulses generated in response to the incident x-ray radiation since a beginning of a measurement interval, an integrating channel per sensor element for obtaining an integration signal representing the total energy of radiation detected since the beginning of the measurement interval, and a processing unit for estimating, from the integration signals of the sensor elements, count signals of sensor elements whose counting channel has been saturated during the measurement interval.
    Type: Grant
    Filed: December 6, 2012
    Date of Patent: June 13, 2017
    Assignee: KONNINKLIJKE PHILIPS N.V.
    Inventor: Christoph Herrmann
  • Patent number: 9606249
    Abstract: Calibration of an analyzing apparatus is performed using appropriate calibration data that reflects actual measurement conditions. The analyzing apparatus includes an emission unit, a collection filter, a calibration base material, a detection unit, and a composition analysis unit. The emission unit emits an exciting X-ray to generate a fluorescent X-ray by exciting particulate matter. The collection filter collects the particulate matter. The calibration base material is provided in a measurement area together with the collection filter when performing the calibration. The detection unit detects X-rays generated from the measurement area. The detection unit detects a calibration X-ray when performing the calibration. The composition analysis unit generates calibration data by using the calibration X-ray when performing the calibration.
    Type: Grant
    Filed: May 14, 2015
    Date of Patent: March 28, 2017
    Assignee: Horiba, Ltd.
    Inventors: Yusuke Mizuno, Tomoki Aoyama
  • Patent number: 9588065
    Abstract: A method and apparatus for determining the concentration of a specific analyte in a sample of biological material are disclosed. The sample is placed in a sample container (10) which provides at least two radiation paths (14) with different lengths through the sample container (10), and is sequentially irradiated with electromagnetic radiation, e.g. X-rays. The amount of radiation penetrating the sample is detected, and absorbance is determined based on the detected radiation. During irradiation, the sample container (10) is moved in relation to the radiation source (1) and detector (5) so that absorbance measurements at different path-lengths are acquired. A regression line from the absorbance values and path lengths is determined, such that a slope of the regression line is obtained, and based on this slope, the concentration of the specific analyte is determined.
    Type: Grant
    Filed: June 12, 2013
    Date of Patent: March 7, 2017
    Assignee: Mantex AB
    Inventors: Ragnar Kullenberg, Ralf Torgrip, Fredrik Danielsson, Eric Landström
  • Patent number: 9562325
    Abstract: A sheet manufacturing apparatus includes a transfer path through which flows at least a portion of a material for a sheet in air and which has a curved section where the transfer path is curved, and a forming unit configured to form the sheet using the material, and an optical detecting unit configured to detect the material and provided at the curved section or at the transfer path more to a downstream side than the curved section in a material transfer direction.
    Type: Grant
    Filed: December 15, 2014
    Date of Patent: February 7, 2017
    Assignee: Seiko Epson Corporation
    Inventor: Hiroshi Tanaka
  • Patent number: 9291640
    Abstract: Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (SPM), such as an atomic force microscope (AFM), using Peak Force Tapping (PFT) Mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined and automatically controls a gain in a feedback loop. A gain control circuit automatically tunes a gain based on separation distances between a probe and a sample to facilitate stability. Accordingly, instability onset is quickly and accurately determined during scanning, thereby eliminating the need of expert user tuning of gains during operation.
    Type: Grant
    Filed: February 11, 2014
    Date of Patent: March 22, 2016
    Assignee: Bruker Nano, Inc.
    Inventors: Chanmin Su, Jian Shi, Yan Hu, Shuiqing Hu, Ji Ma
  • Patent number: 9257208
    Abstract: A system for producing a controllable beam of radiation is controllable electronically, and includes no parts that must move relative to one another while in operation to form the beam. The direction and cross-section of the beam may be controlled electronically by controlling an electron beam. Various embodiments provide an X-ray collimator that allows forming a scanning X-ray beam of desired size and flux independently of the aperture material thickness without requiring movement of the aperture or physical components that create the aperture. Some embodiments provide an X-ray collimator that allows forming a scanning X-ray beam of desired size and flux independently of the beam angle.
    Type: Grant
    Filed: June 26, 2015
    Date of Patent: February 9, 2016
    Assignee: American Science and Engineering, Inc.
    Inventor: Martin Rommel
  • Patent number: 9110172
    Abstract: Portable and versatile X-ray or gamma imaging device for non-destructive examination of suspicious packages, integrating transmission and backscattering imaging. It comprises an X or gamma radiation source (4) adapted to radiography, a large and finely pixelated detector (6) sensitive to X rays or gamma rays adapted to radiography, a removable shielding and collimation accessory (5) to adapt the source to backscattering imaging, a removable accessory (10) comprising a large and finely pixelated coded mask placed in contact with the detector when a backscattering imaging or radioactive source imaging is made, and a synchronized control system (14) for the source, the detector and the latter accessory, and for data acquisition and processing to display an image in real time.
    Type: Grant
    Filed: October 10, 2012
    Date of Patent: August 18, 2015
    Assignee: Commissariat A l'Energie Atomique et aux 'energies alternatives
    Inventors: Anne-sophie Lalleman, Gilles Ferrand
  • Patent number: 9075149
    Abstract: A detector of ionizing radiation comprises a photodetector and a scintillator in the shape of truncated cone comprising a large base, a small base and a lateral surface, the large base of the scintillator being coupled to the photodetector, any half-angle at the apex of the cone being in the range between 5° and 35°, the lateral face being coated with a black coating. The detector in accordance with an embodiment can produce a very short pulse.
    Type: Grant
    Filed: July 19, 2012
    Date of Patent: July 7, 2015
    Assignee: Saint-Gobain Cristaux Et Detecteurs
    Inventors: Jeremy Flamanc, Marie-Virginie Ehrensperger, Michele Schiavoni
  • Patent number: 8963084
    Abstract: A charged particle detector arrangement is described. The detector arrangement includes a detection element and a collector electrode configured to collect charged particles released from the detection element upon impact of signal charged particles.
    Type: Grant
    Filed: March 11, 2014
    Date of Patent: February 24, 2015
    Assignee: ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik GmbH
    Inventor: Stefan Lanio
  • Patent number: 8954292
    Abstract: A system for locating and tracking an object is provided. The system includes a measuring device configured to determine a property of a paving-related material, a locating device configured to determine a location of the measuring device, a tracking system configured to store tracking information associated with the measuring device and one or more properties determined by the measuring device, and a communications system configured to transfer, to a remote device, the location of the measuring device and the tracking information associated with the measuring device.
    Type: Grant
    Filed: March 11, 2013
    Date of Patent: February 10, 2015
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventor: Robert Ernest Troxler
  • Patent number: 8633823
    Abstract: The present invention is directed to an inspection system that has a radiation source, a detector array, an inspection region, and a processing unit, where the processing unit a) obtains a radiographic image, b) segments the radiographic image based on radiation attenuation or transmission, c) identifies at least one segmented area on the radiographic image, d) filters the at least one segmented area using at least one geometric filter, e) generates feature vectors using the filtered segmented area; and f) compares the feature vectors against predefined values to determine whether a high-atomic-number object is present.
    Type: Grant
    Filed: May 16, 2010
    Date of Patent: January 21, 2014
    Assignee: Rapiscan Systems, Inc.
    Inventors: Robert A. Armistead, Jr., William Chang, Edward D. Franco, Joseph Bendahan, Jolyon A. Browne
  • Patent number: 8575546
    Abstract: The invention provides a nondestructive inspection apparatus and nondestructive inspection method for inspecting the inside of a surface layer of a composite structure using cosmic-ray muons.
    Type: Grant
    Filed: February 23, 2009
    Date of Patent: November 5, 2013
    Assignee: Inter-University Research Institute Corporation High Energy Accelerator Research Organization
    Inventor: Kanetada Nagamine
  • Patent number: 8436301
    Abstract: In a spectral image formed by two orthogonal axes, one of which is an axis of the amount of energy loss and the other of which is an axis of positional information, by the use of an electron spectrometer and a transmission electron microscope, distortion in the spectral image of a sample to be analyzed is corrected with high efficiency and high accuracy by comparing electron beam positions calculated from a two-dimensional electron beam position image formed by the two orthogonal axes (the axis of the amount of energy loss and the axis of positional information) with reference electron beam positions, and calculating amounts of the distortion based on the differences of the electron beam positions. Method and apparatus are offered which correct distortion in a spectral image with high efficiency and high accuracy, the image being formed by the two orthogonal axes (the axis of the amount of energy loss and the axis of positional information).
    Type: Grant
    Filed: November 11, 2009
    Date of Patent: May 7, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Shohei Terada, Yoshifumi Taniguchi, Tatsumi Hirano
  • Patent number: 8426811
    Abstract: An electron microscope according to the present invention includes a phase plate (510) having a thickness which changes in a radial direction, and adjusts a phase difference caused by a difference in electron beam path due to an effect of a spherical aberration when an electron beam is converged by a lens or an image of the electron beam is formed. Accordingly, the phase difference caused by the difference in electron beam path is adjusted, to thereby improve the coherence, so that a phase contrast image of transmitted electrons can be obtained at a higher resolution.
    Type: Grant
    Filed: July 10, 2009
    Date of Patent: April 23, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Isao Nagaoki, Toshiaki Tanigaki
  • Patent number: 8428913
    Abstract: A system for locating and tracking an object is provided. The system includes a measuring device configured to determine a property of a paving-related material, a locating device configured to determine a location of the measuring device, a tracking system configured to store tracking information associated with the measuring device and one or more properties determined by the measuring device, and a communications system configured to transfer, to a remote device, the location of the measuring device and the tracking information associated with the measuring device.
    Type: Grant
    Filed: February 23, 2012
    Date of Patent: April 23, 2013
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventor: Robert E. Troxler
  • Patent number: 8415613
    Abstract: The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: April 9, 2013
    Assignee: JPK Instruments AG
    Inventors: Sven-Peter Heyn, Jacob Kerssemakers, Detlef Knebel, Helge Eggert, Torsten Jaehnke, Joern Kamps
  • Patent number: 8324572
    Abstract: A radiometric measuring arrangement for measuring fill level of a fill substance in a container includes: arranged one above the other in measurement operation on a first side of the container, two or more radiometric radiators, which, in measurement operation, send radioactive radiation through the container, and which, in measurement operation, are arranged in a measuring position in the interior of the container in a pressure resistant, protective tube protruding laterally into the container; and, arranged on a second side of the container lying opposite to the radiators, at least one detector, which serves to receive radiation intensity penetrating through the container as a function of fill level and to convert such into a fill level dependent, electrical signal. The measuring arrangement permits achievement of a highly linear dependence of total detected radiation intensity on fill level.
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: December 4, 2012
    Assignee: Endress + Hauser Flowtec AG
    Inventors: Alecsandru Nistor, Jochen Politt, Markus Bühler
  • Patent number: 8299449
    Abstract: Apparatus (1) for environmental monitoring, allowing to determine the mass concentration of air-dispersed particulate matter by operating or spy filters (F1-F6), comprising a beta radiation emitter (16) and detector (18) for detecting the mass of particulate matter settled on the operating or spy filters (F1-F6), wherein it is further provided the same beta measurement on spy filters (S 12-S1 6) exposed to the same environmental conditions of the operating filters (F1-F6) and the determination of in-air particulate matter concentration by compensation of the two measurements.
    Type: Grant
    Filed: August 20, 2007
    Date of Patent: October 30, 2012
    Assignee: FAI Instruments S.R.L.
    Inventor: Antonio Febo
  • Patent number: 8288721
    Abstract: Techniques, apparatus and systems for detecting particles such as muons for imaging applications. Subtraction techniques are described to enhance the processing of the muon tomography data.
    Type: Grant
    Filed: April 23, 2008
    Date of Patent: October 16, 2012
    Assignees: Decision Sciences International Corporation, Los Alamos National Security, LLC
    Inventors: Christopher L. Morris, Alexander Saunders, Michael James Sossong, Larry Joe Schultz, J. Andrew Green, Konstantin N. Borozdin, Nicolas W. Hengartner, Richard A. Smith, James M. Colthart, David C. Klugh, Gary E. Scoggins, David C. Vineyard
  • Patent number: 8276210
    Abstract: A tomographic atom probe uses electrical pulses applied to an electrode in order to carry out evaporation of the sample being analyzed. In order to produce these electrical pulses, the tomographic atom probe comprises a high-voltage generator connected to an electrode by an electrical connection comprising a chip of semiconductor material. The probe also comprises a light source which can be controlled in order to generate light pulses which are applied to the semiconductor chip. Throughout the illumination, the chip is rendered conductive, which puts the high-voltage generator and the electrode in electrical contact so that a potential step is applied to the latter. The probe also comprises means for applying a voltage step of opposite amplitude to the previous step at the end of a time interval ?t0, so that the electrode finally receives a voltage pulse of duration ?t0.
    Type: Grant
    Filed: October 13, 2009
    Date of Patent: September 25, 2012
    Assignees: Cameca, CNRS
    Inventors: François Vurpillot, Alain Bostel
  • Publication number: 20120175510
    Abstract: Devices, methods and related systems are described for measuring a property of a fluid including density in a subterranean environment. A device includes a pressure housing having one or more window formed in the pressure housing, and a flow device arranged in the pressure housing for the fluid to flow through the flow device. Further, a radiation source mounted within the pressure housing approximate a first source window configured to generate particles into the fluid. A detector supported by the pressure housing and positioned approximate a first detector window of the one or more window, the first detector window located between the detector and the flow device. The detector can be a solid state beta particle detector with a wide band gap such as the diamond detector, and the radiation source can be a beta particle source such as a strontium 90 source.
    Type: Application
    Filed: January 10, 2011
    Publication date: July 12, 2012
    Applicant: Schlumberger Technology Corporation
    Inventors: Zilu Zhou, Christopher Harrison, Bradley A. Roscoe, Chloe Coleou, Douglas W. Grant
  • Patent number: 8178839
    Abstract: When an energy of a particle emitted from a radioisotope source is obtained by a detector, a histogram obtained from a relationship between a difference ?E between an energy of a particle emitted outside the radioisotope source and an initial energy which the particle possesses at the time of generation and a count is treated as being asymmetric, and an energy distribution (L1) of the particle emitted outside the radioisotope source is obtained, thereby allowing an energy calibration of a radiation detector, absolute quantitation and resolution measurement to be performed with accuracy.
    Type: Grant
    Filed: October 22, 2008
    Date of Patent: May 15, 2012
    Assignee: National Institute of Radiological Sciences
    Inventor: Hidehito Nakamura
  • Patent number: 8074292
    Abstract: The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an “Einzel” type electrostatic lens consisting of three electrodes arranged inside the chamber between the sample and the detector, to which electrical potentials are applied so as to form an electrical field that strongly focuses the beam of ions emitted by the sample under test when the probe is operating. According to the invention, the geometry of the electrodes is defined precisely so as to greatly limit the effects of the spherical aberration that affects the “Einzel” lens on the beam of ions, said spherical aberration being clearly sensitive when the lens is greatly polarized. The invention applies more particularly to the atom probes known as 3D atom probes.
    Type: Grant
    Filed: October 8, 2008
    Date of Patent: December 6, 2011
    Assignee: Cameca
    Inventors: Alain Bostel, Mikhail Yavor, Ludovic Renaud, Bernard Deconihout
  • Patent number: 8058612
    Abstract: Improved radiation devices and their associated fabrication and applications are described herein. The microirradiators generally include a non-radioactive conducting electrode, an insulating sheath, a radioactive source, and, optionally, a contact electrode. The microirradiators generally produce low absolute radiation levels with high radiation flux densities.
    Type: Grant
    Filed: February 1, 2010
    Date of Patent: November 15, 2011
    Assignee: Georgia Tech Research Corporation
    Inventors: Jiri Janata, Miroslava Josowicz, Jennifer Steeb, William S. Dynan, Wendy Kuhne
  • Patent number: 8053724
    Abstract: An instrumentation setup is provided to process electronic signals in a positron imager functioning in two different modes of operations for scanning both bulk and thin film materials. According to one part of an implementation, an instrumentation setup comprises an XY-rastering stepper motor apparatus coupled with LVDTs (Linear Variable Differential Transformers), and nuclear signal processing and high speed data acquisition sections. Imaging of bulk material samples may be enabled by scanning a positron point source across a surface of samples. In another part of the irnplenientation, the instrumentation setup may comprise an electromagnetic deflection control arrangement in conjunction with a guided monoenergetic positron beam together with nuclear signal processing and data acquisition arrangements. This part of the implementation may scan and produce images for thin film samples. The instrumentation setup is capable of producing high quality real-time S-parameter images.
    Type: Grant
    Filed: June 15, 2010
    Date of Patent: November 8, 2011
    Assignee: The University of Hong Kong
    Inventors: Pranab Sabitru Naik, Christopher David Beling, Stevenson H. Y. Fung
  • Patent number: 8049181
    Abstract: A lithography method and system have means for determining a convergence value dc from a relation of beam current to beam position drift (or beam dimension drift) produced in the past; means for finding a beam current i(t) as a function of the convergence value dc of beam position drift (or beam dimension drift), a measured value dm of beam position drift (or beam dimension drift), a gain constant g, and a convergence value c of beam position drift (or beam dimension drift) per unit beam current and using an equation given by i(t)={(1+g)·dc?g·dm(t)}/c; means for making a check regarding dm and dc as to whether dm approaches dc and, thus, a relationship given by |dm?dc|<? holds, where ? is a positive number providing a decision criterion under the condition where the gain constant g of the beam current i(t) satisfies a relationship given by g>0.
    Type: Grant
    Filed: February 11, 2009
    Date of Patent: November 1, 2011
    Assignee: JEOL Ltd.
    Inventor: Kazuya Goto
  • Patent number: 8009787
    Abstract: Non-destructive testing method may include providing a source material that emits positrons in response to bombardment of the source material with photons. The source material is exposed to photons. The source material is positioned adjacent the specimen, the specimen being exposed to at least some of the positrons emitted by the source material. Annihilation gamma rays emitted by the specimen are detected.
    Type: Grant
    Filed: June 15, 2004
    Date of Patent: August 30, 2011
    Assignee: Battelle Energy Alliance, LLC
    Inventor: Douglas W. Akers
  • Publication number: 20110084208
    Abstract: A photonic sensor system is provided. The system generally includes a beta emission source, optionally, a scintillation layer, and a luminophore-containing sensory layer. The system can be embodied in a particle. Also provided are photonic sensor strategies which are highly accurate and photonic sensors which are highly stable.
    Type: Application
    Filed: April 13, 2010
    Publication date: April 14, 2011
    Inventors: Frank V. Bright, William G. Holthoff, Elizabeth C. Tehan
  • Publication number: 20100330690
    Abstract: Provided are a suspended particulate matter measurement apparatus capable of automatically measuring a nitrate ion content and a sulfate ion content in the atmosphere, and a suspended particulate matter measurement method using the same. The suspended particulate matter measurement apparatus includes a filter, suction part, extraction part, measurement part, and a recording part. The suction part suctions air in the atmosphere at a constant flow rate to cause particulate matter contained therein to be adsorbed onto the filter. The extraction part extracts components of the particulate matter adsorbed onto the filter, by dissolving the particulate matter into a solvent, and collects a resultant solution. The measurement part measures at least one of a nitrate ion content and a sulfate ion content in the solution collected by the extraction part, and outputs the measurement result. The recording part records the measurement result outputted from the measurement part.
    Type: Application
    Filed: April 22, 2010
    Publication date: December 30, 2010
    Applicant: KIMOTO ELECTRIC CO., LTD.
    Inventors: Takashi Kimoto, Yoichi Mitani, Xiang Gao, Akiko Fukunaga, Saori Kitayama
  • Patent number: 7838852
    Abstract: A medical radiation apparatus has a beam source and a deflection apparatus, which can be activated by means of a data processing device according to a radiation schedule generated using a recording of tissue to be irradiated produced using a medical imaging diagnosis device, said data processing device being set up for data purposes such that characteristics of the radiation acting on the tissue according to different irradiation scenarios can be visualized in a common display.
    Type: Grant
    Filed: December 8, 2006
    Date of Patent: November 23, 2010
    Assignee: Siemens Aktiengesellschaft
    Inventor: Eike Rietzel
  • Patent number: 7800061
    Abstract: A method and apparatus for performing a radiation scan of a structure involve arranging a source of penetrating radiation and a radiation detector at opposed ends of a radiation path through the structure, oriented in such a way that the source emits radiation along the path through the structure and the detector is capable of detecting the radiation after it has passed through the structure and monitoring the radiation emitted from the source that is detected by the detector. At least one continuous loop of a cable is mounted on the structure between at least two fixed locations on the structure so that the cable is movable along its length relative to the structure, and the at least one of the source of penetrating radiation and the radiation detector are fixed to the cable.
    Type: Grant
    Filed: November 21, 2006
    Date of Patent: September 21, 2010
    Assignee: Johnson Matthey PLC
    Inventors: Kenneth James, Lee Michael Robins
  • Patent number: 7750294
    Abstract: A photonic sensor system is provided. The system generally includes a beta emission source, optionally, a scintillation layer, and a luminophore-containing sensory layer. The system can be embodied in a particle. Also provided are photonic sensor strategies which are highly accurate and photonic sensors which are highly stable.
    Type: Grant
    Filed: March 10, 2005
    Date of Patent: July 6, 2010
    Assignee: The Research Foundation of State University of New York
    Inventors: Frank V. Bright, William G. Holthoff, Elizabeth C. Tehan
  • Patent number: 7718962
    Abstract: The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.
    Type: Grant
    Filed: May 29, 2007
    Date of Patent: May 18, 2010
    Assignee: Idaho State University and the Board of Educa
    Inventors: Alan W. Hunt, J. Frank Harmon, Douglas P. Wells
  • Patent number: 7671616
    Abstract: A semiconductor probe having an embossed resistive tip and a method of fabricating the semiconductor probe are provided. The semiconductor probe includes a protrusion portion protruded to a predetermined height on a cantilever in a first direction crossing a length direction of the cantilever, an embossed resistive tip formed on the protrusion portion, and first and second semiconductor electrode regions formed at opposite sides of the embossed resistive tip at the protrusion portion, wherein the cantilever is doped with a first dopant, the first and second semiconductor electrode regions and the embossed resistive tip are doped with a second dopant having a different polarity from the first dopant, and the embossed resistive tip is doped with a concentration lower than the first and second semiconductor electrode regions.
    Type: Grant
    Filed: July 2, 2007
    Date of Patent: March 2, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ju-hwan Jung, Jae-hong Lee, Hyung-cheol Shin, Jun-soo Kim, Seung-bum Hong
  • Patent number: 7672712
    Abstract: A device for visualizing structure located on the interior of a biological substance. The device includes a marker member that may be a solid cylinder or lumen having an interior volume having a distal end removably insertable in the biological substance relative to the interior structure to be visualized. An image-enhancing material is contained relative to the marker member in a manner such that the imaging material does not directly contact the biological substance. The imaging material of choice is one capable of producing an emission or signal detectable external to the biological substance by suitable imaging instrumentation. Also disclosed is a method for visualizing critical structures or radiation therapy targets in imaging processes such as positron emission tomography and/or single photon emission computerized tomography, MRI, or ultrasound either used alone or in combination or in registration with anatomical imaging processes such as computed tomography or mammography.
    Type: Grant
    Filed: July 22, 2003
    Date of Patent: March 2, 2010
    Assignee: The Regents of The University of Michigan
    Inventors: Cherry T. Thomas, Richard L. Wahl, Susan J. Fisher
  • Publication number: 20100001185
    Abstract: A photonic sensor system is provided. The system generally includes a beta emission source, optionally, a scintillation layer, and a luminophore-containing sensory layer. The system can be embodied in a particle. Also provided are photonic sensor strategies which are highly accurate and photonic sensors which are highly stable.
    Type: Application
    Filed: March 10, 2005
    Publication date: January 7, 2010
    Inventors: Frank V. Bright, William G. Holthoff, Elizabeth C. Tehan
  • Patent number: 7633062
    Abstract: A portal monitoring system has a cosmic ray charged particle tracker with a plurality of drift cells. The drift cells, which can be for example aluminum drift tubes, can be arranged at least above and below a volume to be scanned to thereby track incoming and outgoing charged particles, such as cosmic ray muons, whilst also detecting gamma rays. The system can selectively detect devices or materials, such as iron, lead, gold and/or tungsten, occupying the volume from multiple scattering of the charged particles passing through the volume and can also detect any radioactive sources occupying the volume from gamma rays emitted therefrom. If necessary, the drift tubes can be sealed to eliminate the need for a gas handling system. The system can be employed to inspect occupied vehicles at border crossings for nuclear threat objects.
    Type: Grant
    Filed: June 29, 2007
    Date of Patent: December 15, 2009
    Assignee: Los Alamos National Security, LLC
    Inventors: Christopher Morris, Konstantin N. Borozdin, J. Andrew Green, Gary E. Hogan, Mark F. Makela, William C. Priedhorsky, Alexander Saunders, Larry J. Schultz, Michael J. Sossong
  • Patent number: 7557345
    Abstract: Some embodiments include methods for fabricating an alpha particle emitter and detector associated with an integrated circuit chip. Some embodiments include an integrated circuit chip comprising an alpha particle emitter and detector supported by a semiconductor substrate. Some embodiments include an apparatus for obtaining backscatter data from a sample utilizing an alpha particle emission and detection system supported by a semiconductor substrate. Some embodiments include methods of backscatter analysis utilizing a semiconductor substrate containing an alpha particle emitter and an alpha particle sensor.
    Type: Grant
    Filed: April 18, 2007
    Date of Patent: July 7, 2009
    Assignee: Micron Technology, Inc.
    Inventors: Mark Williamson, Gurtej S. Sandhu
  • Patent number: 7533000
    Abstract: A method of analyzing a dataset of spectra is provided in which each spectrum has a count value for each of a number of parameter values within a parameter range. The method is for identifying one or more parameter values that exhibit a significant variation within the dataset. A dataset of spectra is obtained and a statistical analysis is applied to the count values for each of the parameter values. The result of the analysis for each parameter value is a function of the variation in the count values. A spectrum that is representative of at least part of the dataset of spectra is then displayed together with the results of the statistical analysis. A corresponding computer program and system for performing the method are also disclosed.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: May 12, 2009
    Assignee: Oxford Instruments Analytical Limited
    Inventors: Peter John Statham, Charles Penman
  • Patent number: 7525325
    Abstract: A passive voltage contrast (PVC) system and method are disclosed for analyzing ICs to locate defects and failure mechanisms. During analysis a device side of a semiconductor die containing the IC is maintained in an electrically-floating condition without any ground electrical connection while a charged particle beam is scanned over the device side. Secondary particle emission from the device side of the IC is detected to form an image of device features, including electrical vias connected to transistor gates or to other structures in the IC. A difference in image contrast allows the defects or failure mechanisms be pinpointed. Varying the scan rate can, in some instances, produce an image reversal to facilitate precisely locating the defects or failure mechanisms in the IC. The system and method are useful for failure analysis of ICs formed on substrates (e.g. bulk semiconductor substrates and SOI substrates) and other types of structures.
    Type: Grant
    Filed: December 18, 2006
    Date of Patent: April 28, 2009
    Assignee: Sandia Corporation
    Inventors: Mark W. Jenkins, Edward I. Cole, Jr., Paiboon Tangyunyong, Jerry M. Soden, Jeremy A. Walraven, Alejandro A. Pimentel
  • Patent number: 7485854
    Abstract: A sampling device, for example a sampling valve, is disclosed for introduction of samples into an analysis system. The sampling device comprises a turning element provided with a sampling area. The sampling area is configured to retain samples to be analysed. The turning element is arranged for movement between a first position where the sampling area is exposed to material to be sampled for collection of samples and a second position where samples are released for use by the analysis system.
    Type: Grant
    Filed: May 23, 2006
    Date of Patent: February 3, 2009
    Assignees: University of Helsinki, Department of Chemistry, Laboratory of Analytical Chemistry, University of Helsinki, Department of Physical Science, division of Atmospheric Sciences, Finnish Meteorological Instutute
    Inventors: Kari Hartonen, Kari Kuuspalo, Heikki Lihavainen, Pasi Aalto, Markku Rasilainen, Marja-Liisa Riekkola, Markku Kulmala, Yrjo Viisanën
  • Patent number: 7476883
    Abstract: A biomarker generator system for producing approximately one (1) unit dose of a biomarker. The biomarker generator system includes a small, low-power particle accelerator (“micro-accelerator”) and a radiochemical synthesis subsystem having at least one microreactor and/or microfluidic chip. The micro-accelerator is provided for producing approximately one (1) unit dose of a radioactive substance, such as a substance that emits positrons. The radiochemical synthesis subsystem is provided for receiving the radioactive substance, for receiving at least one reagent, and for synthesizing the approximately one (1) unit dose of a biomarker.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: January 13, 2009
    Assignee: Advanced Biomarker Technologies, LLC
    Inventor: Ronald Nutt
  • Patent number: 7462836
    Abstract: The present invention relates to the method and equipment for inspecting nuclear experimental locales, and particularly relates to the method and system for separating and measuring 37Ar quickly. The method of the invention comprises the steps of sampling, eliminating impurities, separating, purifying, measuring the sum of Ar, collecting Ar, measuring the activity of 37Ar, etc. The control unit in the system of the invention connects respectively to a sampling unit, a separating-purifying unit, and a radioactivity measuring unit which are connected in turn, and a computer and the software of the control unit are in charge of the automatic operation, measurement and data-collection of the whole system. The method and system for quickly separating and measuring 37Ar of the patent can meet the requirements of locales inspection for Comprehensive Test Ban Treaty (CTBT), the sensitivity of measuring 37Ar is high, so do the production and purity of Ar.
    Type: Grant
    Filed: December 20, 2004
    Date of Patent: December 9, 2008
    Assignee: Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics
    Inventors: Wei Li, Hongxia Wang, Rongliang Duan, Zhishang Bian, Yongchun Xiang, Meiying He, Jian Gong
  • Publication number: 20080258057
    Abstract: Some embodiments include methods for fabricating an alpha particle emitter and detector associated with an integrated circuit chip. Some embodiments include an integrated circuit chip comprising an alpha particle emitter and detector supported by a semiconductor substrate. Some embodiments include an apparatus for obtaining backscatter data from a sample utilizing an alpha particle emission and detection system supported by a semiconductor substrate. Some embodiments include methods of backscatter analysis utilizing a semiconductor substrate containing an alpha particle emitter and an alpha particle sensor.
    Type: Application
    Filed: April 18, 2007
    Publication date: October 23, 2008
    Inventors: Mark Williamson, Gurtej S. Sandhu
  • Patent number: 7429733
    Abstract: A method and sample for radiation microscopy include a sample source that includes an area of interest, an outer side of a sample formed in the sample source adjacent to the area of interest, an inner side of the sample formed inside the sample source wherein at least a portion of the area of interest is included between the inner side of the sample and the outer side, and a particle beam channel formed inside the sample source for conducting a particle beam to or from the inner side of the sample.
    Type: Grant
    Filed: December 29, 2005
    Date of Patent: September 30, 2008
    Assignee: LSI Corporation
    Inventors: Michael B. Schmidt, Tracy D. Myers
  • Patent number: 7420166
    Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations in bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer.
    Type: Grant
    Filed: July 14, 2004
    Date of Patent: September 2, 2008
    Assignee: The University of Hong Kong
    Inventors: Pranab Sabitru Naik, Christopher David Beling, Stevenson H. Y. Fung