Abstract: In some examples, an optically active article includes a retroreflective substrate; and at least one security element disposed at the retroreflective substrate; an article message disposed at the retroreflective substrate, and wherein the at least one security element comprises validation information that is detectable outside a visible light spectrum, and wherein a combination of the article message and the validation information of the at least one security element indicates whether the optically active article is counterfeit.

Abstract: This disclosure relates to a driver assistance system for a motor vehicle comprising a vehicle headlight, which is designed to illuminate the surroundings of the motor vehicle, and an image capture unit, which is designed to evaluate light having a pre-definable first polarization direction for generating image data as a function of the surroundings of the motor vehicle. The vehicle headlight is designed, during normal operations, in which a pre-definable light output is provided by the vehicle headlight, according to a pre-definable modulation pattern and/or with a pre-definable portion of the light output, to generate linearly polarized light with a second polarization direction to provide lighting for the surroundings. In addition, this disclosure relates to a motor vehicle with such a driver assistance system and a corresponding method.

Abstract: An apparatus containing an optical emitter configured to emit optical radiation is provided. Further, the apparatus includes a first hermetically sealed measurement cell filled with a first gas. The first gas is configured to absorb the optical radiation at least partially at one or more predetermined wavelengths. Additionally, the apparatus includes a first microphone arranged in the measurement cell and configured to generate a first microphone signal on a basis of a photoacoustic excitation of the first gas by the optical radiation. The apparatus moreover includes an evaluation circuit configured to take the first microphone signal as a basis for generating a first measurement signal indicating an emission intensity of the optical emitter at the one or more predetermined wavelengths.

Abstract: This invention relates generally to devices and methods for performing optical and electrochemical assays and, more particularly, to test devices, e.g., cartridges, methods and systems, wherein the test devices have an entry port configured to receive a test sample into a holding chamber; a first conduit having at least one lateral flow test strip; and a displacement device, such as a pneumatic pump, configured to move a portion of said test sample from said holding chamber into said first conduit. The present invention is particularly useful for performing immunoassays and/or electrochemical assays at the point-of-care.

Abstract: A method includes providing a photomask having a patterned absorption layer over a substrate. The photomask is irradiated with a beam having a mixture of transverse electronic (TE) waves and transverse magnetic (TM) waves. The irradiating includes generating surface plasmonic polaritons (SPP) on a sidewall of the patterned absorption layer. The SPP is used to suppress the TM waves while reflecting the TE waves. A target substrate is exposed to TE waves.

Abstract: An assembly for testing an infrared (IR) ink print quality of an IR ink print area on an optical component includes a light source including an illuminated periphery and a dark interior, an IR camera having a field of view positioned to image the dark interior without imaging at least a portion of the illuminated periphery, and a component holder configured to hold the optical component between the IR camera and the light source such that IR light emitted from the portion of the illuminated periphery that illuminates the IR ink print area on the optical component is deflected into the field of view of the IR camera if the IR ink print area has defects but is not deflected into the field of view of the IR camera if the IR ink print area does not have defects.

Abstract: A rubbing mura detection device is provided, including an infrared imaging unit used to acquire an infrared thermogram of a surface of the substrate, on which the alignment film is provided; and a rubbing mura detection unit used to detect whether or not the alignment film has the rubbing mura in accordance with an infrared radiation brightness temperature distribution in the infrared thermogram.

Abstract: A vehicle window visible ray transmittance remote sensing system emits a plurality of laser beams to a driving vehicle, estimates transmittance of a window of the vehicle by acquiring a plurality of point data of a plurality of points from which a plurality of laser beams are reflected from a surface of the vehicle, and distinguishes a vehicle that deviates from a transmittance reference based on the estimated window transmittance.

Abstract: An image processing apparatus includes a planar image acquisition unit configured to acquire a planar image of a subject, a tomographic image acquisition unit configured to acquire a tomographic image indicating a polarization state of the subject, and a display control unit configured to cause a display unit to display the planar image and the tomographic image indicating the polarization state side by side.

Abstract: The present invention relates to a spectroscopic imaging system using autofluorescence and reflectance images to diagnose tissue. A preferred embodiment of the invention uses a plurality of light sources to illuminate a tissue region to provide the fluorescence and reflectance images, respectively.

Abstract: An image processing apparatus includes a planar image acquisition unit configured to acquire a planar image of a subject, a tomographic image acquisition unit configured to acquire a tomographic image indicating a polarization state of the subject, and a display control unit configured to cause a display unit to display the planar image and the tomographic image indicating the polarization state side by side.

Abstract: A monitoring device includes a light source, an optical filter, and an optical detector. The monitoring device may monitor curing processes, such as ultraviolet (UV) curing processes to determine the progression of the level of cure of a light-activated material to a substrate. The light source emits light toward a light-activated material, such as a film, and/or a substrate. The optical filter is positioned so that a wavelength of the light is transmitted through the optical filter after the light is reflected off of the substrate and/or the film. The optical detector is positioned to detect the light that is transmitted through the optical filter.

Abstract: An image processing apparatus includes a tomographic image acquisition unit configured to acquire a polarization-sensitive tomographic image of a subject by using a polarization adjustment member which adjusts a polarization state of a measuring beam, and a display control unit configured to cause a display unit to display the polarization-sensitive tomographic image and a display form indicating a state of the polarization adjustment member.

Abstract: A contactless fingerprint acquisition and processing method, includes detecting and acquiring an object image, converting the object image into a fingerprint image and at least one of identifying and verifying the fingerprint image.

Abstract: A method and a system for measuring an optical asynchronous sample signal. The system for measuring an optical asynchronous sampling signal comprises a pulsed optical source capable of emitting two optical pulse sequences with different repetition frequencies, a signal optical path, a reference optical path, and a detection device. Since the optical asynchronous sampling signal can be measured by merely using one pulsed optical source, the complexity and cost of the system are reduced. A multi-frequency optical comb system using the pulsed optical source and a method for implementing the multi-frequency optical comb are further disclosed.

Abstract: There is provided a method and system for real time inspection of a silicon wafer. The method includes using an infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer, the image showing stress patterns; and assessment of the stress patterns. The stress patterns in a form of at least one butterfly pattern indicates a presence of at least one of: at least one trapped particle, trapped gases and at least one de-bonding region. No computer/algorithm processing is carried out to locate defects/de-bondings at the bonded interface. Furthermore, the stress fields being generated can be used to approximate the size of the de-bonding region/trapped particle. The system employs the infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer.

Abstract: Improved methods and systems for inspection imaging for holographic or interferometric semiconductor test and evaluation through all phases of device development and manufacture. Specifically, systems and methods are disclosed for extending the range of optical holographic interferometric inspection for testing and evaluating microelectronic devices and determining the interplay of electromagnetic signals and dynamic stresses to the semiconductor material are provided in which an enhanced imaging method provides continuous and varying the magnification of the optical holographic interferometric images over a plurality of interleaved optical pathways and imaging devices. Analysis of one or more holographic interference patterns displays internal and external stresses and the various effects of such stresses upon the operating characteristics of features within the features, interior structures or within the internal surfaces of the semiconductor device at any stage of development or manufacture.

Abstract: One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.

Abstract: A terahertz temporal and spatial resolution imaging system is provided. The system includes: a sample placing rack; a detection crystal, located on the exit side of the sample placing rack; a pump light generating device, for generating a pump light to irradiate the test sample; a terahertz light generating device, for generating a terahertz light to irradiate the test sample, irradiate the detection crystal after obtaining information about the test sample, and modulate an index ellipsoid of the detection crystal; a detection light generating device, for generating a detection light to irradiate the detection crystal to detect the index ellipsoid of the detection crystal, thereby indirectly obtaining the information about the test sample; and an imaging apparatus, located in an optical path after the detection light passes through the detection crystal, for collecting terahertz images of the test sample.

Abstract: A system and method to measure, with increased precision, the transit time position(s) of pulses in a time domain data. An example data set would be the transit time of pulses in Time-Domain Terahertz (TD-THz) data. The precision of the pulse timing directly affects the precision of determined sample properties measurements (e.g., thickness). Additionally, an internal calibration etalon structure and algorithm method provides for continuous system precision/accuracy check method to increase sample measurement integrity. The etalon structure can improve the precision of sample property measurements (e.g., absolute thickness). Various hardware and system implementations of the above are described.

Abstract: A network for power transmission to a receiver that converts the power into current includes a first node for transmitting power wirelessly in a first area. The first area has a minimum electric or magnetic field strength. The network includes a second node for transmitting power wirelessly in a second area. The second area has a minimum electric or magnetic field strength and overlaps the first area to define an overlap area. In another embodiment, the network includes a source in communication with the first and second nodes which provides power to them. Also disclosed are methods for power transmission to a receiver that converts the power into current.

Abstract: A terahertz ellipsometer, the basic preferred embodiment being a sequential system having a backward wave oscillator (BWO); a first rotatable polarizer that includes a wire grid (WGP1); a rotating polarizer that includes a wire grid (RWGP); a stage (STG) for supporting a sample (S); a rotating retarder (RRET) comprising first (RP), second (RM1), third (RM2) and fourth (RM3) elements; a second rotatable polarizer that includes a wire grid (WGP2); and a Golay cell detector (DET).

Abstract: A measuring method that includes holding a specimen to be measured on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the flat-plate periodic structure, detecting the electromagnetic wave scattered forward or backward by the flat-plate periodic structure, and measuring characteristics of the specimen on the basis of a phenomenon that a dip waveform appearing in a frequency characteristic of the forward-scattered electromagnetic wave or a peak waveform appearing in a frequency characteristic of the backward-scattered electromagnetic wave is changed with the presence of the specimen.

Abstract: One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.

Abstract: A polarization-sensitive infrared image sensor (also termed a snapshot polarimeter) utilizing a 2-D array of polarizers to filter infrared light from a scene according to polarization, and a 2-D array of photodetectors (i.e. a focal plane array) to detect the filtered infrared light and generate polarization information which can be used to form a polarization-sensitive image of the scene. By forming each polarizer on an optical fiber in a fiber optic faceplate, the polarizers can be located facing a 2-D array of retarders to minimize diffraction effects of the infrared light. The optical fibers also guide the filtered infrared light to the photodetectors to reduce cross-talk in the polarization information. The polarizers can be formed as wire grid polarizers; and the retarders can be formed as subwavelength surface-relief gratings.

Abstract: An image is created of blood circulation deep (e.g. a plurality of millimeters) below the surface of living tissue to aid in evaluating a patient. A first beam (26) of circularly polarized light is directed forwardly (F) against an outer surface (14) of the tissue. Light that has penetrated to only a shallow depth before moving rearwardly and out of the tissue remains polarized and is blocked by a filter (38). Light that has penetrated to greater depths (12), is scattered more and becomes depolarized, and a portion of it passes through the depolarizing filter (38) and is focused on a photodetector (48) to create an image. Light spots (54) on the image that move, represent spaces between blood platelets (52) that are moving through a capillary, and indicates the velocity of blood through the capillary.

Abstract: A measuring method that includes holding a specimen to be measured on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the flat-plate periodic structure, detecting the electromagnetic wave scattered forward or backward by the flat-plate periodic structure, and measuring characteristics of the specimen on the basis of a phenomenon that a dip waveform appearing in a frequency characteristic of the forward-scattered electromagnetic wave or a peak waveform appearing in a frequency characteristic of the backward-scattered electromagnetic wave is changed with the presence of the specimen.

Abstract: A method and a device for measuring the thickness of a fountain solution layer or ink emulsion layer on the surface of a cylinder bearing the print image of an offset printing machine is proposed, in which the absorption of reflected near infrared radiation is measured by the dampening water that is applied during print production. Interferences due to optical reflection are eliminated by means of a gloss trap. A position-controlled regulation of the dampening water allocation is reliably maintained by means of machine synchronization of the measuring unit and receiving unit.

Abstract: Multi-band polarized receiver-emitter THz domain visualization device that includes a group of elemental receiver units made from a resonant system sensitive to frequency and polarization, a micro-bead solid-state voltage amplifier in the gate of a differential FET system. The detection is based on the carrier perturbation method detected by a set of double gate comparator circuits that further generates an integrated signal driven to a digital analog converter. The signal from here is accessing event-based memory used to generate the 3D images. Multiple detection modules are coupled into a triangular detection element detecting a multitude of frequencies, in a cascade of bands from 2 mm to 1 micron. This THz chromatic detector is integrated in a surface morph array, or in an image area of a focusing device generating a pixel of information with band, amplitude, polarization and time parameters, driving to a complex 3D substance level visualizations.

Abstract: A network for power transmission to a receiver that converts the power into current includes a first node for transmitting power wirelessly in a first area. The first area has a minimum electric or magnetic field strength. The network includes a second node for transmitting power wirelessly in a second area. The second area has a minimum electric or magnetic field strength and overlaps the first area to define an overlap area. In another embodiment, the network includes a source in communication with the first and second nodes which provides power to them. Also disclosed are methods for power transmission to a receiver that converts the power into current.

Abstract: Fiber distribution characteristics such as the bulk average orientation of fibers in composite fibrous materials can be evaluated based on the variation in the speed with which polarized electromagnetic signals propagate through the material as a function of angle. The electromagnetic radiation may comprise terahertz radiation. The composite fibrous materials may be wood-containing materials such as oriented strand board or particle board.

Abstract: A polarization direction measuring apparatus includes: a first polarizing plate having an unknown polarization direction about a reference axis; a sample whose polarization direction is to be measured; a rotatable sample holder on which the sample is mounted in a first direction and a second direction opposite to the first direction, wherein the sample holder rotates the sample along a reference axis in the azimuth direction; a light source that generates light passing though the first polarizing plate and the sample; and a light detector detecting light generated by the light source that passes though the first polarizing plate and the sample.

Abstract: Fibre distribution characteristics such as the bulk average orientation of fibres in composite fibrous materials can be evaluated based on the variation in the speed with which polarized electromagnetic signals propagate through the material as a function of angle. The electromagnetic radiation may comprise terahertz radiation. The composite fibrous materials may be wood-containing materials such as oriented strand board or particle board.

Abstract: A sample information obtaining apparatus includes an electromagnetic wave generator; a sample holding unit which holds a sample to be tested and serves as a polarizer having a polarization axis which defines how an incident electromagnetic wave is to be divided according to a polarization state of the incident electromagnetic wave; an electromagnetic wave detecting unit which separately detects a transmitted electromagnetic wave transmitted through the sample holding unit and a reflected electromagnetic wave reflected off the sample holding unit, the transmitted and reflected electromagnetic waves being obtained by dividing the incident electromagnetic wave incident on the sample holding unit according to a relative positional relationship between the polarization state of the incident electromagnetic wave and the polarization axis of the sample holding unit; and a processor which processes signals of the electromagnetic waves detected by the electromagnetic wave detecting unit and obtains information about t

Abstract: A reflection-type terahertz spectrometer includes an input optical path through which terahertz waves are propagated, an irradiating mechanism that irradiates a sample with terahertz waves propagated through the input optical path, an output optical path through which terahertz waves exiting from the irradiating mechanism are propagated, and a detector that receives and detects the terahertz waves propagated through the output optical path. The irradiating mechanism has at least one planar interface and a refractive index greater than that of a peripheral region contacting the planar interface and is disposed between the input optical path and the output optical path such that the terahertz waves propagated through the input optical path to be incident on the planar interface undergo total internal reflection at the planar interface, and the sample is disposed in the peripheral region contacting the planar interface of the irradiating mechanism.

Abstract: Parametric processing capability is added to a typical sensor so that a target object can be more clearly distinguished from the background clutter in a given scenery. A polarizer with several segments of different polarization orientations is used to improve the typical sensor. The segments are sequentially advanced to pass therethrough infrared radiation images of pre-selected polarization orientations which are then collected by respective polarized frame grabbers. Image processing circuit processes these images to yield the polarization difference between any given pair of orthogonal polarizations. In a surveillance network, the polarization differences are subsequently used in the control center, to which such sensors are connected, to enhance the distinction of the observed objects against the background clutter suspended in the propagation medium.

Abstract: A method of obtaining a series of images of a three-dimensional object by transmitting pulsed terahertz (THz) radiation through the entire object from a plurality of angles, optically detecting changes in the transmitted THz radiation using pulsed laser radiation, and constructing a plurality of imaged slices of the three-dimensional object using the detected changes in the transmitted THz radiation. The THz radiation is transmitted through the object as a scanning spot. The object is placed within the Rayleigh range of the focused THz beam and a focusing system is used to transfer the imaging plane from adjacent the object to a desired distance away from the object. A related system is also disclosed.

Abstract: A method of measuring a concentration of a component in a subject includes setting an intensity relationship equation between a positive-order beam and a negative-order beam with respect to a reference matter at a particular wavelength, applying a light having a first wavelength band absorbed by the component and detecting an intensity of a positive-order beam output from the subject and an intensity of a negative-order beam output from the reference matter, the positive-order beam and the negative-order beam having a second wavelength band, calculating an intensity of a positive-order beam input to the subject by applying the intensity of the negative-order beam output from the reference matter to the intensity relationship equation, and calculating absorbance using the intensity of the positive-order beam output from the subject and the intensity of the positive-order beam input to the subject and measuring a concentration of the component using the absorbance.

Abstract: Adjacent pixels of an infrared focal plane array (IR FPA) can be configured to have different spectral or polarization responses by adjustment of the lengths or orientations of the antenna arms which couple radiation into the sensors. The manufacturing costs of such an antenna-coupled IR FPA would be much less than integration of spectral or polarization filters onto each pixel, or fabrication of adjacent pixels with materials of different bandgaps. The antenna-coupled pixels can be made smaller than usual pixels, allowing this diversity of spectral or polarization information on the FPA without losing spatial resolution. The infrared (IR) sensors can be tunnel diodes, schottky diodes, photovoltaics, photoconductors, bolometers, and pyroelectrics. Application areas can include military and civilian remote sensing, automotive driving aids, industrial sensing, medical imaging, and general surveillance.

Abstract: Mesoporous silica is shown to be a sample holder for laser desorption/ionization of mass spectrometry. Supported mesoporous silica was prepared by coating an ethanolic silicate solution having a removable surfactant onto a substrate to produce a self-assembled, ordered, nanocomposite silica thin film. The surfactant was chosen to provide a desired pore size between about 1 nanometer diameter and 50 nanometers diameter. Removal of the surfactant resulted in a mesoporous silica thin film on the substrate. Samples having a molecular weight below 1000, such as C60 and tryptophan, were adsorbed onto and into the mesoporous silica thin film sample holder and analyzed using laser desorption/ionization mass spectrometry.

Abstract: A method for detecting and localizing a target tissue within the body in the presence of ambient light in which an optical contrast agent is administered and allowed to become functionally localized within a contrast-labeled target tissue to be diagnosed. A light source is optically coupled to a tissue region potentially containing the contrast-labeled target tissue. A gated light detector is optically coupled to the tissue region and arranged to detect light substantially enriched in target signal as compared to ambient light, where the target signal is light that has passed into the contrast-labeled tissue region and been modified by the contrast agent. A computer receives signals from the detector, and passes these signals to memory for accumulation and storage, and to then to image processing engine for determination of the localization and distribution of the contrast agent.

Abstract: A sensor arrangement and system facilitate the measurement of polarized light intensities for use in object identification and classification. In an example embodiment, an imaging sensor for polarizing light from a light source includes an array of light detecting elements that converts light into a plurality of photocurrent signals. The sensor also includes a rotatable disk positioned between a light source and the light detecting array and parallel to the light detecting array. The rotatable disk includes a plurality of linear members that are opaque and parallel to each other that polarize light from the light source passed to the light-detecting array. The sensor further includes a circuit arrangement configured to generate a data set of polarization vector components, the polarization vector components being generated as a function of a set of the photocurrent signals that are sampled as a function of a position of the rotating disk.

Abstract: In addition to having color, light waves have the attribute of polarization. An apparatus and method to convert circular polarized light into linearly polarized light over a wide range of wavelengths is provided by utilizing a first surface-relief grating functioning as a quarter-wave waveplate and a second surface-relief grating functioning as a half-wave waveplate. A plurality of such devices are arranged in a two-dimensional array and combined with an array of linear polarizers and an array of photodetectors to form a polarization imaging sensor. Such a sensor could have applications in automobiles to alert drivers of the presence of other vehicles, especially at night, in fog, or in rain. Military applications include the detection of vehicles placed among trees and shrubs.

Abstract: A surveillance system uses pulsed laser near infrared light to illuminate a retroreflecting tag attached to a target for providing a return image that pulsates and that can be monitored by a camera for covert tracking of a target. The surveillance system may instead use pulsed near infrared polarized laser light to illuminate a transparent ¼ waveplate tag affixed to a moving vehicle or transitory containers for monitoring enhanced return images reflected from the tags serving to change the polarization of the illuminating laser beam so as to provide a co-located camera with return images that pulsate relative to background images for enhanced viewing and surveillance of the vehicle or container.

Abstract: Disclosed is spectroscopic ellipsometer system mediated methodology for quantifying thickness and impurity profile defining parameters in mathematical models of impurity profile containing thin membranes having two substantially parallel surfaces which are separated by a thickness, wherein the spectroscopic ellipsometer system operates in near-IR and IR wavelength ranges.

Abstract: For quantitative analysis of gas volumes, specifically combustion exhaust gases, by means of emission or absorption spectrometry in the ultraviolet, visible and infrared spectral range, geometrically defined and reproducibly adjustable observation planes are oriented perpendicular to the longitudinal axis of an exhaust stream. In a first series of measurements a number of m spectral measurements is performed, in such a way that the optical axis of a spectrometer is always located in the respective observation level but is shifted in a parallel direction by a first distance from one measurement to the next. In a second series of measurements n measurements are performed, in such a way that the optical axis is again located in the observation plane and is shifted in a parallel direction by a second distance from each measurement to the next. The (m+n) measurements produce two orthogonal sets of line of sights, which form a grid with (m·n) intersecting volumes.

Abstract: A method and apparatus for the determination of parameters of interests of a semiconductor sample is provided. For example, the thickness of an epitaxial or implanted layer, the thickness of a transition layer and the concentration of free carriers in a substrate layer may be determined without having to destroy the semiconductor sample in the process. In an embodiment, a method is provided for determining at least one parameter of a semiconductor. The method starts by measuring an experimental reflectance spectrum of the semiconductor. An analytical model of the semiconductor having a film layer, a transition layer and a substrate layer is then constructed. Next, optical constants n and k for the film layer, transition layer and substrate layer are expressed as a function of doping level. A profile of the transition layer is determined, and if an abrupt profile exists, the transition layer is not included in the semiconductor model.